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公开(公告)号:JPH1063226A
公开(公告)日:1998-03-06
申请号:JP14853097
申请日:1997-05-22
Applicant: MOTOROLA INC
Inventor: HUANG RONG-TING , WRIGHT PHIL , AKHBARI FARID , HALLMARK JERALD A
Abstract: PROBLEM TO BE SOLVED: To obtain a matrix, in which the novel and improved drive of light emitting devices formed by using digital drivers is executed, by providing a driving device with a data driver and fewer I/O terminals. SOLUTION: A stationary power source 50 is included in a silicon driver integrated circuit and is connected as a power source to a column decoding circuit 12. A constant current synchronizing circuit 51 is included in the silicon driver integrated circuit and is connected as a return circuit of the electric power from a low decoding switch 15. All column decoding switches 12 have common address lines. Consequently, the columns are successively scanned by the column decoders 12 not larger than n/4 (n is the total number of the columns) at one time dependently upon the input signals from the column input selection lines. All low decoding switches 15 have common address lines. Consequently, the I/O terminals necessary for addressing LEDs of respective pixels are decreased and the electric power consumption is reduced.
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公开(公告)号:JP2000119096A
公开(公告)日:2000-04-25
申请号:JP23207999
申请日:1999-08-19
Applicant: MOTOROLA INC
Inventor: YU ZHIYI , WANG JUN , DROOPAD RAVINDRANATH , MARSHALL DANIEL S , HALLMARK JERALD A , ABROKWAH JONATHAN
IPC: H01L21/203 , C30B23/02 , C30B29/10
Abstract: PROBLEM TO BE SOLVED: To form a layer of a silicide of an alkaline earth metal on a silicon substrate by a molecular beam epitaxial technology executable at a low temperature. SOLUTION: This method of forming a silicide on a silicon substrate comprises heating the surface 13 of the substrate to 500-750 deg.C, and irradiating silicon atomic beam 18 and alkaline earth metal atomic beam 20 on the surface. The step is performed in a molecular beam epitaxial container 10 under a reduced pressure of
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公开(公告)号:AU2003247664A8
公开(公告)日:2004-02-09
申请号:AU2003247664
申请日:2003-06-30
Applicant: MOTOROLA INC
Inventor: HALLMARK JERALD A , XIE CHENGGANG
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公开(公告)号:AU2703002A
公开(公告)日:2002-06-18
申请号:AU2703002
申请日:2001-11-29
Applicant: MOTOROLA INC
Inventor: OOMS WILLIAM J , FINDER JEFFREY M , EISENBEISER KURT W , HALLMARK JERALD A
Abstract: High quality epitaxial layers of monocrystalline materials can be grown overlying large silicon wafers by first growing an accommodating buffer layer (104) on a silicon wafer (102). The accommodating buffer layer (104) is a layer of monocrystalline material spaced apart from the silicon wafer (102) by an amorphous interface layer (108) of silicon oxide. The amorphous interface layer dissipates strain and permits the growth of a high quality monocrystalline accommodating buffer layer. Any lattice mismatch between the accommodating buffer layer and the underlying silicon substrate is taken care of by the amorphous interface layer. Utilizing this technique permits the fabrication of thin film pyroelectric devices (150) on a monocrystalline silicon substrate.
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公开(公告)号:HK1043246A1
公开(公告)日:2002-09-06
申请号:HK02104063
申请日:2002-05-31
Applicant: MOTOROLA INC
Inventor: YU ZHIYI , DROOPAD RAVINDRANATH , OVERGAARD COREY D , RAMDANI JAMAL , CURLESS JAY A , HALLMARK JERALD A , COMS WILLIAM J , WANGJUN
IPC: C30B20060101 , C30B25/00 , H01L20060101 , H01L21/00 , H01L21/20 , H01L , C30B
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公开(公告)号:AU2871902A
公开(公告)日:2002-05-27
申请号:AU2871902
申请日:2001-10-24
Applicant: MOTOROLA INC
Inventor: YU ZHIYI , OVERGAARD COREY DANIEL , DROOPAD RAVINDRANATH , HALLMARK JERALD A , OOMS WILLIAM J
IPC: C30B23/02 , H01L20060101 , H01L21/316 , H01L31/18
Abstract: A method of forming single crystalline oxides on the surface of a semiconductor substrate includes placing the semiconductor substrate (10) in a vacuum chamber and depositing a thin layer of material (12) including a II metal on the surface (11). At a minimum the layer is thick enough to passivate the surface. An alternative oxidation agent is introduced into the chamber at a partial vapor pressure and at a temperature so as to form a layer (14) of single crystal oxide from the thin layer of material with the layer of single crystal oxide lattice matched to the semiconductor substrate. The surface is monitored by reflection high energy electron diffraction (RHEED) during the oxide growth. In a preferred embodiment single crystal BaO or (Ba,Sr)O is grown on and lattice matched to a silicon substrate.
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公开(公告)号:SG101423A1
公开(公告)日:2004-01-30
申请号:SG200003946
申请日:2000-07-14
Applicant: MOTOROLA INC
Inventor: YU ZHIYI , DROOPAD RAVINDRANATH , OVERGAARD COREY DANIEL , RAMDANI JAMAL , CURLESS JAY A , HALLMARK JERALD A , OOMS WILLIAM J , WANG JUN
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公开(公告)号:AU8289901A
公开(公告)日:2002-02-05
申请号:AU8289901
申请日:2001-07-17
Applicant: MOTOROLA INC
Inventor: FOLEY BARBARA M , HALLMARK JERALD A , OOMS WILLIAM JAY
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公开(公告)号:AU7355301A
公开(公告)日:2002-02-05
申请号:AU7355301
申请日:2001-07-18
Applicant: MOTOROLA INC
Inventor: FINDER JEFFREY M , EISENBEISER KURT , HALLMARK JERALD A
IPC: H01L21/02 , H01L21/316 , H01L21/336 , H01L29/24 , H01L29/78 , H01L21/8246 , H01L27/115
Abstract: High quality epitaxial layers (26) of compound semiconductor materials can be grown overlying large silicon wafers (22) by first growing an accommodating buffer layer (24) on a silicon wafer. The accommodating buffer layer is a layer of monocrystalline oxide spaced apart from the silicon wafer by an amorphous interface layer (28) of silicon oxide. The amorphous interface layer dissipates strain and permits the growth of a high quality monocrystalline oxide accommodating buffer layer. Any lattice mismatch between the accommodating buffer layer and the underlying silicon substrate is taken care of by the amorphous interface layer. Utilizing this technique permits (20) the fabrication of thin film non-volatile memory elements on a monocrystalline silicon substrate.
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公开(公告)号:DE69603407T2
公开(公告)日:2000-03-30
申请号:DE69603407
申请日:1996-04-29
Applicant: MOTOROLA INC
Inventor: ABROKWAH JONATHAN K , HUANG JENN-HWA , OOMS WILLIAM J , SHURBOFF CARL L , HALLMARK JERALD A
IPC: H01L29/43 , H01L21/28 , H01L21/285 , H01L21/3205 , H01L21/335 , H01L21/338 , H01L23/52 , H01L27/085 , H01L29/08 , H01L29/417 , H01L29/45 , H01L29/778 , H01L29/812
Abstract: A complementary III-V heterostructure field effect device includes the same refractory ohmic material for providing the contacts (117, 119), to both the N-type and P-type devices. Furthermore, the refractory ohmic contacts (117, 119) directly contact the InGaAs channel layer (16) to provide improved ohmic contact, despite the fact that the structure incorporates an advantageous high aluminum composition barrier layer (18) and an advantageous GaAs cap layer (20).
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