Abstract:
The production of an electronic component consists of: (a) covering the surface (S) of a substrate (100) with a portion (P) delimiting with the substrate a volume (V) filled at least partially with a temporary material; (b) evacuating the temporary material from the volume by a shaft (C) extending between the volume and an access surface; (c) introducing an electrical conducting filling material (7) into the volume from some precursors fed via the shaft. Independent claims are also included for: (1) a field effect transistor with a gate produced by this method; (2) an electronic device incorporating such a transistor.
Abstract:
The production of an electronic component consists of: (a) covering the surface (S) of a substrate (100) with a portion (P) delimiting with the substrate a volume (V) filled at least partially with a temporary material; (b) evacuating the temporary material from the volume by a shaft (C) extending between the volume and an access surface; (c) introducing an electrical conducting filling material (7) into the volume from some precursors fed via the shaft. Independent claims are also included for: (1) a field effect transistor with a gate produced by this method; (2) an electronic device incorporating such a transistor.
Abstract:
The device comprises a semiconductor substrate (SB), a base insulator layer (BOX) formed on the substrate, a semiconductor channel region extending in longitudinal direction and enveloping the channel region. The regions of source (S), channel (CN) and drain (D) are formed in a continuous semiconductor layer (200) which is substantially flat and parallel to the upper surface of the substrate (SB), and the region of source, drain and gate (80) are encapsulated so to ensure an electrical insulation between the gate region and the regions of source and drain, and also between the substrate and the regions of source, drain, gate and channel. The thickness of the continuous semiconductor layer (200) is of the order of tens of nanometers. The gate region (80) is continuous, or formed of upper layer and lower parts separated by a dielectric layer. Independent claims are also included for: (1) an integrated circuit comprising the semiconductor device; and (2) a method for manufacturing the device comprising the formation of the base insulator layer, the formation of a silicon layer encapsulated between two layers, anisotropic etching, selective isotropic etching, filling tunnels with dielectric material, anisotropic etching, total selective etching of the remainders of encapsulation layers, oxidation of remainder of silicon layer, and filling spaces resulting from etching with the gate material.
Abstract:
The production of an electronic component consists of: (a) covering the surface (S) of a substrate (100) with a portion (P) delimiting with the substrate a volume (V) filled at least partially with a temporary material; (b) evacuating the temporary material from the volume by a shaft (C) extending between the volume and an access surface; (c) introducing an electrical conducting filling material (7) into the volume from some precursors fed via the shaft. Independent claims are also included for: (1) a field effect transistor with a gate produced by this method; (2) an electronic device incorporating such a transistor.
Abstract:
The device comprises a semiconductor substrate (SB), a base insulator layer (BOX) formed on the substrate, a semiconductor channel region extending in longitudinal direction and enveloping the channel region. The regions of source (S), channel (CN) and drain (D) are formed in a continuous semiconductor layer (200) which is substantially flat and parallel to the upper surface of the substrate (SB), and the region of source, drain and gate (80) are encapsulated so to ensure an electrical insulation between the gate region and the regions of source and drain, and also between the substrate and the regions of source, drain, gate and channel. The thickness of the continuous semiconductor layer (200) is of the order of tens of nanometers. The gate region (80) is continuous, or formed of upper layer and lower parts separated by a dielectric layer. Independent claims are also included for: (1) an integrated circuit comprising the semiconductor device; and (2) a method for manufacturing the device comprising the formation of the base insulator layer, the formation of a silicon layer encapsulated between two layers, anisotropic etching, selective isotropic etching, filling tunnels with dielectric material, anisotropic etching, total selective etching of the remainders of encapsulation layers, oxidation of remainder of silicon layer, and filling spaces resulting from etching with the gate material.
Abstract:
PROBLEM TO BE SOLVED: To provide an easy method for forming a compact pad whose manufacturing cost can be reduced. SOLUTION: A region 51 is an area 510 that extends at least up to part of the front surface of the region, and can be locally changed for the purpose of forming the area using a material that can be selectively removed from the region. This region is covered with an insulating material 7, and an orifice 90 that appears on the front surface of the area 510 is formed in the insulating material. The material that can be selectively removed is removed from this area through the orifice so that a cavity 520 may be formed in place of this area. The cavity and the orifice are filled up with at least one conductive material 91. COPYRIGHT: (C)2006,JPO&NCIPI
Abstract:
L'invention concerne un dispositif (200) de refroidissement d'une puce (IC) de circuit intégré, comportant un réseau de micro-canalisations (209, 211, 213, 215) dans lequel des portions de canalisations sont reliées par des vannes (218) comportant chacune au moins une lamelle (221) bicouche.
Abstract:
Un substrat hybride comporte des première (1) et seconde (3) zones actives en matériaux semi-conducteur décalées latéralement et séparées par une zone d'isolation (5). Les surfaces principales de la zone d'isolation (5) et de la première zone active (1) forment un plan. Le substrat hybride est obtenu à partir d'un substrat souche comportant successivement des couches en premier (2) et second (4) matériaux semi-conducteurs séparées par une couche d'isolation (6). Un unique masque de gravure est utilisé pour structurer la zone d'isolation (5), la première zone active (1) et la seconde zone active (3). La surface principale de la première zone active (1) est libérée formant ainsi des zones vides dans le substrat souche. Le masque de gravure est éliminé au dessus de la première zone active (1). Un premier matériau d'isolation est déposé, aplani et gravé jusqu'à libérer la surface principale de la première zone active (1).