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    REDUNDANT REGISTER PROGRAMMING METHOD AND COLUMN REDUNDANT INTEGRATED CIRCUIT
    3.
    发明专利
    REDUNDANT REGISTER PROGRAMMING METHOD AND COLUMN REDUNDANT INTEGRATED CIRCUIT 失效

    公开(公告)号：JPH0822698A

    公开(公告)日：1996-01-23

    申请号：JP2664295

    申请日：1995-02-15

    Applicant: ST MICROELECTRONICS SRL

    Inventor： PASCUCCI LUIGI ,  OLIVO MARCO

    IPC: G11C11/413 ,  G11C11/401 ,  G11C29/00 ,  G11C29/04

    Abstract: PURPOSE: To eliminate the need of generating an ON-CHIP exclusive signal to reduce the chip size by using the existing signal line in a memory to program a redundant register. CONSTITUTION: A two-dimensional array memory matrix provided with a 16-bit data bus is divided into a plurality of portions each of which is composed of a plurality of bit groups. Redundant registers RR1-4 composed of programmable non-volatile memory is capable of programming an address of the defective bit line received from a column address signal CABUS in its first block 1. Moreover, in the second block 2, an identification code MCS7-10 of the bit group to which a defective bit line belongs obtained from the first part R1-4 of the row address signal set RABUS. A programming selection means 6 selects the redundant register RR1-4 with the second part R5-8 of the row address signal set RABUS to store the address information of the defective bit line.

    LAYOUT OF REDUNDANCY CIRCUIT FOR SEMICONDUCTOR MEMORY
    6.
    发明专利
    LAYOUT OF REDUNDANCY CIRCUIT FOR SEMICONDUCTOR MEMORY 失效

    公开(公告)号：JPH08102527A

    公开(公告)日：1996-04-16

    申请号：JP6925895

    申请日：1995-03-28

    Applicant: ST MICROELECTRONICS SRL

    Inventor： PASCUCCI LUIGI ,  CARRERA MARCELLO ,  DEFENDI MARCO

    IPC: G11C17/00 ,  G11C5/02 ,  G11C16/06 ,  G11C29/00 ,  G11C29/04 ,  H01L21/82 ,  H01L21/822 ,  H01L27/04 ,  H01L27/10

    Abstract: PURPOSE: To provide the layout of a redundancy circuit, wherein the chip area required for realization of redundancy becomes a minimum area. CONSTITUTION: An array MAR of a programmable nonvolatile memory, which stores a redundancy bit line, a redundancy word line, a defective bit line, which should be functionally replaced respectively, and the address of a word line is provided. The layout of the redundancy circuit is divided into a plurality of the same layout strips LS1-LS4, which intersect the array at right angles and have first and second strip parts at both sides of the array. The first strip part intersects a column-address signal bus CABUS, extending in parallel with the array. The second strip part intersects a row-address signal bus (RABUS), extending in parallel with the array.

    READ TIMING METHOD OF NONVOLATILE MEMORY AND CIRCUIT
    7.
    发明专利
    READ TIMING METHOD OF NONVOLATILE MEMORY AND CIRCUIT 失效

    公开(公告)号：JPH0855485A

    公开(公告)日：1996-02-27

    申请号：JP4796295

    申请日：1995-02-14

    Applicant: ST MICROELECTRONICS SRL

    Inventor： PASCUCCI LUIGI ,  PADOAN SILVIA ,  GOLLA CARLA MARIA ,  MACCARRONE MARCO ,  OLIVO MARCO

    IPC: G11C17/00 ,  G11C7/02 ,  G11C7/10 ,  G11C7/22 ,  G11C16/02 ,  G11C16/32 ,  G11C16/06

    Abstract: PURPOSE: To derive optimum performance from a memory by enabling the circuit with a switching edge, making the circuit programmable, and protecting the circuit against noise. CONSTITUTION: A delay unit 23 inputs a low-level signal, which goes up to a high level a delay time corresponding to the contents of memory elements 20 and 22 after a leading edge of a signal ATD is received, to a NOR gate 27. The gate 27 inputs a signal PC as a signal DET to an asymmetrical delay unit 24 through a NOR gate 28, and a low-level data simulation signal SP is outputted which goes up to the high level a delay time based upon the elements 20 and 21 after a leading edge of the signal DET is received. The signal SP is transferred to an output similar circuit 33 and at its completion time, a high level is outputted. Consequently, signals N and L are switched to the low level and the output STP of a continuance expanding circuit 51 goes down to a low level. Consequently, the data loading is completed. This loading lasts accurately in an output circuit 108 during data propagation.

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