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    Mass spectrometer
    91.
    发明授权
    Mass spectrometer 有权

    公开(公告)号：US10593535B2

    公开(公告)日：2020-03-17

    申请号：US16320627

    申请日：2016-09-21

    Applicant: SHIMADZU CORPORATION

    Inventor： Yusuke Tateishi

    IPC: H01J49/42 ,  H01J49/14 ,  G01N27/62 ,  H01J49/06 ,  H01J49/10

    Abstract: A mass spectrometer including: an ionization chamber (11) that generates ions from a sample, a collision cell (222) located downstream from the ionization chamber (11), a mass separation unit (2412) located downstream from the collision cell (222), an energy barrier unit (223) located between the collision cell (222) and the mass separation unit (2412), a voltage application unit (30) that applies a voltage to each of the ionization chamber (11), the collision cell (222), and the energy barrier unit (223), and a control unit (42) that controls the voltage application unit (30) such that a potential of the ionization chamber (11) is set to a first potential, a potential of the collision cell (222) is set to a second potential that is lower than the first potential, and a potential of the energy barrier unit (223) is set to a third potential between the first potential and the second potential.

    Liquid sample analysis system
    95.
    发明授权
    Liquid sample analysis system 有权

    公开(公告)号：US10564136B2

    公开(公告)日：2020-02-18

    申请号：US15780829

    申请日：2015-12-04

    Applicant: SHIMADZU CORPORATION

    Inventor： Kazuma Maeda

    IPC: G01N30/00 ,  G01N30/72 ,  H01J49/10 ,  H01J49/04 ,  G01N30/02 ,  G01N30/62

    Abstract: A liquid sample analyzing system including an ion analyzer having a first ion source receiving a target sample and a second ion source receiving a reference sample; a liquid sample introduction mechanism 3 including a passage-switching section introducing reference samples into the second ion source; and a controller for repeatedly performing a series of steps in the ion analyzer, the steps including: a pre-measurement step for initiating a measurement; a measurement step for introducing a target sample into the first ion source and performing a measurement on an ion originating from the target sample along with an ion originating from a reference sample introduced into the second ion source by the liquid sample introduction mechanism; and a post-measurement step where the liquid sample introduction mechanism operates concurrently with the predetermined post-measurement step to switch the passage-switching section to a passage having a reference sample for the next analysis.

    ADJUSTABLE SAMPLE FLOOR FOR ULTRAFAST SIGNAL WASHOUT
    96.
    发明申请
    ADJUSTABLE SAMPLE FLOOR FOR ULTRAFAST SIGNAL WASHOUT 审中-公开

    公开(公告)号：US20200051802A1

    公开(公告)日：2020-02-13

    申请号：US16605392

    申请日：2018-04-20

    Applicant: Elemental Scientific Lasers, Inc.

    Inventor： Leif C. Summerfield ,  Brock Meyer

    IPC: H01J49/10 ,  H05H1/26 ,  H01J49/04

    Abstract: Systems and methods for an adjustable sample floor for ultrafast signal washout are disclosed. In an embodiment. A target support configured to adjustably support a target within a sample chamber may include: a support frame that may configured to be inserted into the sample chamber, a support platform that may be disposed within the support frame, and a platform adjustment system that may be coupled to the support frame and the support platform. The platform adjustment system may be configured to adjust at least one of: a position and an orientation of the support platform relative to the support frame when the support frame is inserted into the sample chamber.

    IONIZER AND MASS SPECTROMETER
    99.
    发明申请
    IONIZER AND MASS SPECTROMETER 审中-公开

    公开(公告)号：US20200041471A1

    公开(公告)日：2020-02-06

    申请号：US16339089

    申请日：2016-11-29

    Applicant: SHIMADZU CORPORATION

    Inventor： Manabu UEDA

    IPC: G01N30/72 ,  H01J49/10 ,  G01N27/62 ,  H01J49/04

    Abstract: An ionizer includes an ionization probe (21) provided with a capillary (211), a metallic slender tube (212), and a nebulizing gas pipe (213). The ionization probe (21) is equipped to perform ESI-based ionization of components in a liquid sample. An electroconductive capillary (22) is disposed at a position forward in a flow direction of a nebulized flow of the liquid sample from the ionization probe (21). A high voltage from a high voltage power supply (23) is applied to the electroconductive capillary (22) to induce corona discharge so that the components in the liquid sample are ionized by the APCI as well. At the time of tuning the ionizer, a standard sample solution is provided through the electroconductive capillary (22), and a high voltage from the high voltage power supply (23) is applied to the electroconductive capillary (22) so that components in the standard sample solution are ionized by the ESI or due to an ion molecular reaction with solvent molecular ions produced in the ionization probe (21). Thus, components in a standard sample can be ionized and subjected to mass spectrometry without pipe rearranging operations or without switch to and from different flow paths using a valve.

    Ion source and ion implantation apparatus
    100.
    发明授权
    Ion source and ion implantation apparatus 有权

    公开(公告)号：US10529532B2

    公开(公告)日：2020-01-07

    申请号：US16381512

    申请日：2019-04-11

    Applicant: ULVAC, INC.

    Inventor： Takumi Yuze ,  Toshihiro Terasawa ,  Naruyasu Sasaki

    IPC: H01J37/08 ,  H01J27/08 ,  H01J49/10 ,  H01J37/30 ,  H01J37/317 ,  H01J27/02 ,  H01L21/265

    Abstract: An ion source having an ion generation container configured to generate ions by reacting ionized gas introduced into the container via a tubular gas introduction pipe with an ion source material emitted in the container. The gas introduction pipe is configured to introduce the ionized gas into an inner space of the gas introduction pipe via a gas supply pipe. In the inner space of the gas introduction pipe, a detachable cooling trap member is disposed and includes a cooling trap portion configured to cool and trap a byproduct produced in the ion generation container. The cooling trap portion is disposed near a supply-side leading end of the gas supply pipe in the inner space of the gas introduction pipe and is not contact with an interior wall face of the gas introduction pipe.

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