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公开(公告)号：US20230258578A1
公开(公告)日：2023-08-17
申请号：US18139864
申请日：2023-04-26
Applicant: Araz Yacoubian
Inventor： Araz Yacoubian
CPC classification number: G01N21/9515 , G01N21/4788 , B33Y30/00 , B33Y50/00 , B22F10/20 , B22F12/00 , B33Y50/02 , G01N21/21 , G01N2021/4792 , G01N2021/4735 , G01N2201/06113 , G01N2201/0638 , G01N2201/0634 , G01N2021/479 , B22F10/30
Abstract: Additive manufacturing, such as laser sintering or melting of additive layers, can produce parts rapidly at small volume and in a factory setting. To ensure the additive manufactured parts are of high quality, a real-time non-destructive evaluation (NDE) technique is required to detect defects while they are being manufactured. The present invention describes an in-situ (real-time) inspection unit that can be added to an existing additive manufacturing (AM) tool, such as an FDM (fused deposition modeling) machine, or a direct metal laser sintering (DMLS) machine, providing real-time information about the part quality, and detecting flaws as they occur. The information provided by this unit is used to a) qualify the part as it is being made, and b) to provide feedback to the AM tool for correction, or to stop the process if the part will not meet the quality, thus saving time, energy and reduce material loss.
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公开(公告)号：US20230221245A1
公开(公告)日：2023-07-13
申请号：US17999890
申请日：2021-05-27
Inventor： Cyrielle MONPEURT , Salim BOUTAMI
CPC classification number: G01N21/35 , G02B6/0036 , G01N2201/0635 , G01N2201/0638
Abstract: A light distributing device configured for, in use, distributing, over a scene to illuminate light rays that come from an auxiliary light source, and which comprises: a planar waveguide, with a core layer disposed between the two cladding layers; and an extraction set, located in the planar waveguide, and constituted by a plurality of diffraction gratings distributed in the two dimensions of a plane parallel to the plane of the planar waveguide.
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公开(公告)号：US20190033287A1
公开(公告)日：2019-01-31
申请号：US16134245
申请日：2018-09-18
Applicant: Nova Biomedical Corporation
Inventor： Michael S. Cafferty , Scott P. Cionek
CPC classification number: G01N21/0303 , G01J3/0202 , G01J3/0205 , G01J3/0208 , G01J3/0218 , G01J3/0286 , G01J3/0291 , G01J3/0297 , G01J3/10 , G01J3/14 , G01J3/28 , G01J3/42 , G01J2003/2866 , G01N21/255 , G01N21/274 , G01N21/31 , G01N33/49 , G01N33/492 , G01N2021/0321 , G01N2021/0389 , G01N2201/062 , G01N2201/0633 , G01N2201/0634 , G01N2201/0638
Abstract: A replaceable cuvette assembly for use in an optical absorbance measurement system for measuring whole-blood hemoglobin parameters or whole-blood bilirubin parameters. The replaceable cuvette assembly includes a cuvette substrate and a cuvette module fixedly connected to the cuvette substrate wherein the cuvette substrate is a support for securing the cuvette assembly within the optical absorbance measurement system. The cuvette module has a sample inlet port, a sample outlet port, an electronic chip assembly, a sample receiving chamber that fluidly communicates with the sample inlet port and the sample outlet port, a first cuvette window, and a second cuvette window forming a portion of the sample receiving chamber. The first cuvette window and the second cuvette window are aligned with each other defining a cuvette optical path length between the first cuvette window and the second cuvette window and disposed within an optical path of the optical absorbance measurement system.
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公开(公告)号：US20190017992A1
公开(公告)日：2019-01-17
申请号：US16132689
申请日：2018-09-17
Applicant: Nova Biomedical Corporation
Inventor： Michael S. Cafferty , Scott P. Cionek
CPC classification number: G01N21/0303 , G01J3/0202 , G01J3/0205 , G01J3/0208 , G01J3/0218 , G01J3/0286 , G01J3/0291 , G01J3/0297 , G01J3/10 , G01J3/14 , G01J3/28 , G01J3/42 , G01J2003/2866 , G01N21/255 , G01N21/274 , G01N21/31 , G01N33/49 , G01N33/492 , G01N2021/0321 , G01N2021/0389 , G01N2201/062 , G01N2201/0633 , G01N2201/0634 , G01N2201/0638
Abstract: A calibrating-light module for use in a system for measuring whole-blood hemoglobin parameters or whole-blood bilirubin parameters. The calibrating-light module includes a calibrating module housing, a light beam receiving portion connected to a first end of the calibrating module housing, a calibrating light portion connected to a side of the calibrating module housing wherein the side is transverse to the first end, and an optic fiber portion connected to a second end of the calibrating module housing wherein the calibrating module housing, the light beam receiving portion and the optic fiber portion are aligned with an optical path and the calibrating light portion is spaced from and transverse to the optical path.
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公开(公告)号：US20180080871A1
公开(公告)日：2018-03-22
申请号：US15695377
申请日：2017-09-05
Applicant: Kabushiki Kaisha Toshiba
Inventor： Kaita Imai , Shouhei Kousai , Yosuke Akimoto , Michihiko Nishigaki , Yutaka Onozuka , Miyu Nagai
IPC: G01N21/64 , G01F23/292 , G01F22/00
CPC classification number: G01N21/645 , G01F22/00 , G01F23/292 , G01N2021/0382 , G01N2021/6482 , G01N2201/0638
Abstract: According to one embodiment, a measuring device for a sample liquid includes a container which stores the sample liquid, the container including a transparent or translucent optical component with an inclined surface to be brought into contact with the sample liquid, an optical sensor provided on a bottom of the container, which detects light from the sample liquid, and a measurement module which measures a concentration of a specific substance contained in the sample liquid, or a liquid height or liquid volume of the sample liquid based on a detected signal of the optical sensor.
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Patent Agency Ranking
146.发明申请公开(公告)号：US20180017486A1
公开(公告)日：2018-01-18
申请号：US15430916
申请日：2017-02-13
Applicant: Jang-Il SER
Inventor： Jang-Il SER
IPC: G01N21/47
CPC classification number: G01N21/4738 , G01N21/474 , G01N21/55 , G01N2021/4716 , G01N2021/4733 , G01N2021/556 , G01N2201/0626 , G01N2201/0634 , G01N2201/0638 , G01N2201/0655
Abstract: An illumination system for recognizing material includes a measurement stage, a light-providing part, a light-receiving part, and a processing part. The measurement stage is upwardly open and the measurement target is located on the measurement stage. The light-providing part includes a plurality of illumination sections providing incident lights to the measurement target, and provides multi-directional incident lights to the measurement target from multiple upper directions at which the measurement stage is open. The light-receiving part receives single-directional reflection lights reflected by the measurement target according to the multi-directional incident lights provided by the light-providing part. The processing part acquires a multi-directional intensity distribution of multi-directional reflection lights reflected by the measurement target according to a single-directional incident light from the single-directional reflection lights reflected by the measurement target according to the multi-directional incident lights, and determines material of the measurement target from the multi-directional intensity distribution of reflection lights. Thus, material of an object may be easily and accurately known at a low cost.
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公开(公告)号：US20170370837A1
公开(公告)日：2017-12-28
申请号：US15694576
申请日：2017-09-01
Inventor： REYAZ KANGO
IPC: G01N21/552 , B01L3/00 , G01N21/05
CPC classification number: G01N21/554 , B01L3/502715 , B01L2300/0654 , B01L2300/0816 , B01L2300/0861 , B01L2300/0864 , B01L2300/0877 , B01L2300/0883 , B01L2300/168 , B01L2400/0487 , G01N21/05 , G01N21/553 , G01N2201/0638
Abstract: A micro-fluidic chip comprises a chip base, a lens, and a securing portion. The chip base has a flow cell and a micro-fluidic channel defined therein. The micro-fluidic channel is fluidly connected to the flow cell to deliver fluid to and from the flow cell, respectively via a fluid input port and a fluid output port. The lens has an apex and a base. The apex is positioned within the flow cell. The securing portion is affixed to the chip base such that the lens is sandwiched between the chip base and the securing portion. The securing portion has a circular cavity defined therein in a surface adjacent the chip base, for receiving the base of the lens. The securing portion further has separate light input and output channels to allow light in and out, respectively, of the circular cavity and the lens.
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公开(公告)号：US20170362652A1
公开(公告)日：2017-12-21
申请号：US15629631
申请日：2017-06-21
Applicant: Pacific Biosciences of California, Inc.
Inventor： Cheng Frank Zhong , Paul Lundquist , Mathieu Foquet , Jonas Korlach , Hovig Bayandorian
IPC: C12Q1/68 , G01N21/64 , G01N21/77 , G01N33/543
CPC classification number: C12Q1/6874 , C12Q1/68 , C12Q1/6825 , G01N21/6428 , G01N21/648 , G01N21/7703 , G01N33/54373 , G01N2021/6463 , G01N2201/06113 , G01N2201/0638 , G01N2201/08
Abstract: This invention provides substrates for use in various applications, including single-molecule analytical reactions. Methods for propagating optical energy within a substrate are provided. Devices comprising waveguide substrates and dielectric omnidirectional reflectors are provided. Waveguide substrates with improved uniformity of optical energy intensity across one or more waveguides and enhanced waveguide illumination efficiency within an analytic detection region of the arrays are provided.
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公开(公告)号：US09829787B2
公开(公告)日：2017-11-28
申请号：US15181691
申请日：2016-06-14
Applicant: SHIN-ETSU CHEMICAL CO., LTD.
Inventor： Tsuneo Terasawa , Hiroshi Fukuda , Takahiro Kishita , Daisuke Iwai , Atsushi Yokohata
CPC classification number: G03F1/36 , G01B11/24 , G01N21/9501 , G01N2201/0638 , G03F1/84
Abstract: A method of inspecting a defect present at a surface portion of a photomask blank having at least one thin film formed on a substrate by use of the inspecting optical system. The method includes setting the distance between the defect and an objective lens of an inspecting optical system to a defocus distance, applying inspection light to the defect through the objective lens, collecting reflected light from the region irradiated with the inspection light, through the objective lens, as a magnified image, identifying a light intensity variation portion of the magnified image, and determining the rugged shape of the defect on the basis of a variation in light intensity of the light intensity variation portion of the magnified image.
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公开(公告)号：US20170254755A1
公开(公告)日：2017-09-07
申请号：US15061769
申请日：2016-03-04
Applicant: Applied Materials, Inc.
Inventor： Tae Seung CHO , Junghoon KIM , Soonwook JUNG , Soonam PARK , Dmitry LUBOMIRSKY
CPC classification number: G01N21/68 , G01J3/0208 , G01J3/0229 , G01J3/0237 , G01J3/0289 , G01J3/06 , G01J3/443 , G01N21/73 , G01N2201/0638 , G01N2201/068 , H01J37/10 , H01J37/32458 , H01J37/32935 , H01J37/32963 , H01J37/32972 , H01J2237/103 , H01J2237/3341
Abstract: Implementations of the present disclosure relate to a plasma chamber having an optical device for measuring emission intensity of plasma species. In one implementation, the plasma chamber includes a chamber body defining a substrate processing region therein, the chamber body having a sidewall, a viewing window disposed in the sidewall, and a plasma monitoring device coupled to the viewing window. The plasma monitoring device includes an objective lens and an aperture member having a pinhole, wherein the aperture member is movable relative to the objective lens by an actuator to adjust the focal point in the plasma using principles of optics, allowing only the light rays from the focal point in the plasma to reach the pinhole. The plasma monitoring device therefore enables an existing OES (coupled to the plasma monitoring device through an optical fiber) to monitor emission intensity of the species at any specific locations of the plasma.
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