METHOD AND APPARATUS FOR CHARACTERIZATION OF TERAHERTZ RADIATION

    公开(公告)号:US20170336262A1

    公开(公告)日:2017-11-23

    申请号:US15524488

    申请日:2015-11-04

    CPC classification number: G01J3/42 G01J3/0218 G01J3/0224

    Abstract: A method for characterizing terahertz radiation using spectral domain interferometry, comprising overlapping a pump beam and a terahertz beam in a detecting crystal; obtaining two probe pulses by propagating the probe beam into a polarization maintaining single-mode optical fiber after the detecting crystal; and measuring a change in the optical path difference between the two probe pulses. The system comprises a detection crystal, where a terahertz pulse and a probe beam are made to overlap; a polarization-maintaining optical fiber propagating the probe beam after the detection crystal and outputting two probe pulses; and a spectrometer where the two probe pulses interfere.

    SYSTEM FOR ANALYZING OPTICAL PROPERTIES OF AN OBJECT

    公开(公告)号:US20170241766A1

    公开(公告)日:2017-08-24

    申请号:US15502147

    申请日:2015-08-07

    Abstract: In a system for analyzing optical properties of an object (350) a point source of light (100) composed of multiple spectral bands each having a respective amplitude, phase and polarization is converted by first optics (120, 150) into a line light source to illuminate an object line on the object. A beam splitter (200) splits the light exiting the first optics and directs a first portion of light on to the object (350) as an illuminated line and a second portion of the light on to a reference mirror (450). Second optics (500) collects respective first and second lines of light reflected by the object and mirror of and collinearly images the reflected lines of light as an image line on to an imaging spectrometer (550) wherein mutual interference allows determination of the optical properties of the object at each point along the object line.

    Spectrometer of high diffraction efficiency for analyzing the spectrum of a light beam

    公开(公告)号:US09709441B2

    公开(公告)日:2017-07-18

    申请号:US14649065

    申请日:2013-11-29

    Abstract: A spectrometer (100) for analyzing the spectrum of an upstream light beam (1) includes an entrance slit (101) and angular dispersing elements (130). The angular dispersing elements include at least one polarization-dependent diffraction grating that is suitable for, at the plurality of wavelengths (1, 2, 3), diffracting a corrected light beam (20) into diffracted light beams (31, 32, 33) in a given particular diffraction order of the polarization-dependent diffraction grating, which is either the +1 diffraction order or the −1 diffraction order, when the corrected light beam has a preset corrected polarization state that is circular; and the spectrometer includes elements for modifying polarization (1100) placed between the entrance slit and the angular dispersion elements, which are suitable for modifying the polarization state of the upstream light beam in order to generate the corrected light beam with a preset corrected polarization state.

    Multifunction imager
    159.
    发明授权

    公开(公告)号:US09631973B2

    公开(公告)日:2017-04-25

    申请号:US14340072

    申请日:2014-07-24

    Inventor: Terry Dorschner

    Abstract: A programmable multifunction spectral and/or polarization imager. In one example, such an imager includes an imaging optical subsystem configured to receive electromagnetic radiation from a distant scene, a focal plane array configured to produce an image of the scene, and a programmable polarimetry subsystem electrically switchable between an ON state in which the polarimetry subsystem receives the electromagnetic radiation and provides polarized electromagnetic radiation to the focal plane array, and an OFF state in which the polarimetry system is configured as a first substantially clear aperture that passes the electromagnetic radiation to the focal plane array. In certain examples, the imager includes a programmable spectral imaging sub-system configurable between an ON state and an OFF state.

    High Dynamic Range Infrared Imaging Spectroscopy

    公开(公告)号:US20170082490A1

    公开(公告)日:2017-03-23

    申请号:US14863225

    申请日:2015-09-23

    Abstract: An imaging scanner and a method for using the same are disclosed. The scanner includes a variable attenuator adapted to receive a light beam generated by a MIR laser and that generates an attenuated light beam therefrom characterized by an attenuation level. The scanner includes an optical assembly that focuses the attenuated light beam to a point on a specimen. A light detector measures an intensity of light leaving the point on the specimen, the light detector being characterized by a detector dynamic range. A controller forms a plurality of MIR images from the intensity as a function of position on the specimen, each of the plurality of MIR images being formed with a different level of attenuation of the light beam. The controller combines the plurality of MIR images to generate a combined MIR image having a dynamic range greater than the detector dynamic range.

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