公开(公告)号：US20190094071A1

公开(公告)日：2019-03-28

申请号：US16011022

申请日：2018-06-18

Applicant: Steve W. Fleck

Inventor： Steve W. Fleck

IPC: G01J1/42 ,  G01P3/36 ,  G01J1/04 ,  G01J1/02

CPC classification number: G01J1/4257 ,  G01J1/0252 ,  G01J1/0403 ,  G01J1/0411 ,  G01J1/0414 ,  G01J1/0422 ,  G01J1/044 ,  G01P3/36

Abstract: A method and a device for measuring absorbed energy-momentum symmetry in which radiant energy W·sr−1·m−2·nm−1 is compared directly against its absorbed impinging momentum kg·m·s−1 in a manner that will provide an experimental basis for asymmetrical anomalies that may or may not exist within a measurable range of the electromagnetic spectrum.

公开(公告)号：US20180336389A1

公开(公告)日：2018-11-22

申请号：US15818779

申请日：2017-11-21

Applicant: Chih-Yen Wu ,  Chen-Ta Ho ,  Chien-Hung Wu

Inventor： Chih-Yen Wu ,  Chen-Ta Ho ,  Chien-Hung Wu

IPC: G06K9/00 ,  G02B3/00 ,  B32B37/14 ,  G01J1/44 ,  G01J1/02 ,  G01J1/04

CPC classification number: G06K9/0004 ,  B32B37/02 ,  B32B37/14 ,  B32B2038/045 ,  B32B2307/40 ,  G01J1/0204 ,  G01J1/0411 ,  G01J1/44 ,  G02B3/0012 ,  G02B3/0031 ,  G02B3/0056 ,  G02B13/0085

Abstract: An optical element fabrication method including following steps are provided. First, a micro-lens layer including a micro-lens and a first substrate is provided. Besides, a micro optical channel layer including a micro optical channel and a second substrate is provided. A first bonding process is performed to bond the micro-lens layer to the micro optical channel layer, wherein the micro-lens is corresponded to the micro optical channel in a direction that is perpendicular to the surface of the second substrate, and the first substrate of the micro-lens layer is removed later.

公开(公告)号：US20180292264A1

公开(公告)日：2018-10-11

申请号：US16004942

申请日：2018-06-11

Applicant: Cymer, LLC

Inventor： Zhongquan Zhao ,  Brian Edward King ,  Thomas Patrick Duffey

IPC: G01J3/50 ,  H01S4/00 ,  G03F7/20 ,  G01J3/02 ,  G01J3/26 ,  G01J11/00

CPC classification number: G01J3/505 ,  G01J1/0407 ,  G01J1/0411 ,  G01J1/0474 ,  G01J1/0488 ,  G01J1/4257 ,  G01J3/0205 ,  G01J3/0208 ,  G01J3/027 ,  G01J3/26 ,  G01J3/502 ,  G01J11/00 ,  G03F7/70041 ,  G03F7/70075 ,  G03F7/70575 ,  G03F7/7085 ,  H01S3/005 ,  H01S3/0057 ,  H01S3/0071 ,  H01S3/0085 ,  H01S3/08009 ,  H01S3/225 ,  H01S3/2308 ,  H01S4/00

Abstract: A metrology system is used for measuring a spectral feature of a pulsed light beam. The metrology system includes: a beam homogenizer in the path of the pulsed light beam, the beam homogenizer having an array of wavefront modification cells, with each cell having a surface area that matches a size of at least one of the spatial modes of the light beam; an optical frequency separation apparatus in the path of the pulsed light beam exiting the beam homogenizer, wherein the optical frequency separation apparatus is configured to interact with the pulsed light beam and to output a plurality of spatial components that correspond to the spectral components of the pulsed light beam; and at least one sensor that receives and senses the output spatial components.

公开(公告)号：US10062254B1

公开(公告)日：2018-08-28

申请号：US15478142

申请日：2017-04-03

Applicant: Alexander Paul

Inventor： Alexander Paul

IPC: G08B13/18 ,  G08B13/184 ,  G01V8/14 ,  G01J1/44 ,  G01J1/02

CPC classification number: G08B13/184 ,  G01J1/0228 ,  G01J1/0411 ,  G01J1/0414 ,  G01J1/0422 ,  G01J1/0488 ,  G01J2001/4238 ,  G01J2001/4242 ,  G01V8/14 ,  H04B1/38

Abstract: Systems and methods for intrusion detection, including an intrusion detection device configured to send a light source to a retroreflector and receive reflected light from the retroreflector. An alarm is activated if the light source is not detected by the intrusion detection device. The intrusion detection device includes a computing device coupled to a preamplifier, a superregenerative receiver, and a digitizer.

公开(公告)号：US20180233521A1

公开(公告)日：2018-08-16

申请号：US15952053

申请日：2018-04-12

Applicant: Artilux Corporation

Inventor： Yun-Chung Na ,  Szu-Lin Cheng ,  Shu-Lu Chen ,  Han-Din Liu ,  Hui-Wen Chen ,  Che-Fu Liang ,  Yuan-Fu Lyu ,  Chien-Lung Chen ,  Chung-Chih Lin ,  Kuan-Chen Chu

IPC: H01L27/146 ,  G02B1/11 ,  H04N5/359 ,  H04N5/378 ,  G01J1/44 ,  G01J1/04 ,  G01S17/36

CPC classification number: H01L27/1461 ,  G01J1/0411 ,  G01J1/44 ,  G01J3/0208 ,  G01J3/0259 ,  G01J2001/446 ,  G01J2003/2806 ,  G01S7/4914 ,  G01S7/4915 ,  G01S17/023 ,  G01S17/36 ,  G01S17/89 ,  G02B1/11 ,  G02B3/0006 ,  H01L27/1462 ,  H01L27/14621 ,  H01L27/14627 ,  H01L27/14634 ,  H01L27/14636 ,  H01L27/14645 ,  H01L27/14649 ,  H01L27/1469 ,  H01L31/02162 ,  H01L31/02325 ,  H01L31/028 ,  H01L31/0312 ,  H01L31/0336 ,  H01L31/1055 ,  H01L31/113 ,  H04N5/359 ,  H04N5/378 ,  H04N9/04553

Abstract: An optical apparatus that includes: a semiconductor substrate formed from a first material, the semiconductor substrate including a first n-doped region; and a photodiode supported by the semiconductor substrate, the photodiode including an absorption region configured to absorb photons and to generate photo-carriers from the absorbed photons, the absorption region being formed from a second material different than the first material and including: a first p-doped region; and a second n-doped region coupled to the first n-doped region, wherein a second doping concentration of the second n-doped region is less than or substantially equal to a first doping concentration of the first n-doped region.

公开(公告)号：US10012544B2

公开(公告)日：2018-07-03

申请号：US15364006

申请日：2016-11-29

Applicant: Cymer, LLC

Inventor： Zhongquan Zhao ,  Brian Edward King ,  Thomas Patrick Duffey

IPC: G01J1/42 ,  G01J3/50 ,  G01J11/00 ,  G01J3/02 ,  G01J3/26 ,  H01S4/00 ,  G03F7/20

CPC classification number: G01J3/505 ,  G01J1/0407 ,  G01J1/0411 ,  G01J1/0474 ,  G01J1/0488 ,  G01J1/4257 ,  G01J3/0205 ,  G01J3/0208 ,  G01J3/027 ,  G01J3/26 ,  G01J3/502 ,  G01J11/00 ,  G03F7/70041 ,  G03F7/70075 ,  G03F7/70575 ,  G03F7/7085 ,  H01S3/005 ,  H01S3/0057 ,  H01S3/0071 ,  H01S3/0085 ,  H01S3/08009 ,  H01S3/225 ,  H01S3/2308 ,  H01S4/00

Abstract: A metrology system is used for measuring a spectral feature of a pulsed light beam. The metrology system includes: a beam homogenizer in the path of the pulsed light beam, the beam homogenizer having an array of wavefront modification cells, with each cell having a surface area that matches a size of at least one of the spatial modes of the light beam; an optical frequency separation apparatus in the path of the pulsed light beam exiting the beam homogenizer, wherein the optical frequency separation apparatus is configured to interact with the pulsed light beam and to output a plurality of spatial components that correspond to the spectral components of the pulsed light beam; and at least one sensor that receives and senses the output spatial components.

公开(公告)号：US10004985B2

公开(公告)日：2018-06-26

申请号：US14880231

申请日：2015-10-11

Applicant: Neonode Inc.

Inventor： Stefan Holmgren ,  Sairam Iyer ,  Richard Berglind ,  Karl Erik Patrik Nordström ,  Lars Sparf ,  Per Rosengren ,  Erik Rosengren ,  John Karlsson ,  Thomas Eriksson ,  Alexander Jubner ,  Remo Behdasht ,  Simon Fellin ,  Robin Kjell Åman ,  Joseph Shain

IPC: A63F9/24 ,  A63F13/31 ,  G01S17/48 ,  G01J1/04 ,  G01J1/42 ,  G06F3/042 ,  G06F3/03 ,  G06F3/0488 ,  G06F3/02 ,  G06F3/0354 ,  A63F13/21 ,  A63F13/213 ,  G06F3/01 ,  G01S17/02 ,  G01S17/88 ,  G01S7/481 ,  A63F13/26 ,  A63F13/355 ,  A63F13/92 ,  A63F13/211 ,  A63F13/33 ,  A63F13/428 ,  G06F1/16

CPC classification number: A63F13/31 ,  A63F9/24 ,  A63F13/21 ,  A63F13/211 ,  A63F13/213 ,  A63F13/26 ,  A63F13/33 ,  A63F13/355 ,  A63F13/428 ,  A63F13/92 ,  A63F2009/245 ,  G01J1/0411 ,  G01J1/42 ,  G01S7/4811 ,  G01S7/4813 ,  G01S7/4815 ,  G01S17/026 ,  G01S17/48 ,  G01S17/88 ,  G06F1/1616 ,  G06F1/169 ,  G06F3/017 ,  G06F3/021 ,  G06F3/0219 ,  G06F3/0304 ,  G06F3/03547 ,  G06F3/0421 ,  G06F3/0428 ,  G06F3/0488 ,  G06F3/04883 ,  G06F2203/04809

Abstract: A system including two handheld electronic devices, each device including a housing, a communicator mounted in the housing continuously receiving images from an internet server, a display mounted in the housing, and a sensor mounted in the housing and connected to the communicator, configured to detect sizes of objects in an adjacent detection zone, and including an analyzer recognizing the other handheld electronic device when the sensor detects that an object in the adjacent detection zone is as long as an edge of the housing, wherein the server receives outputs from the analyzer and partitions each of the images into two half-images, and continuously transmits one of each half-image to the handheld electronic device and the other of each half-image to the other handheld device, such that each full image spans the two device displays.

公开(公告)号：US10001408B2

公开(公告)日：2018-06-19

申请号：US14865193

申请日：2015-09-25

Applicant: Steve W Fleck

Inventor： Steve W Fleck

IPC: G01J1/42 ,  G01P3/36

CPC classification number: G01J1/4257 ,  G01J1/0252 ,  G01J1/0403 ,  G01J1/0411 ,  G01J1/0414 ,  G01J1/0422 ,  G01J1/044 ,  G01P3/36

Abstract: A method and a device for measuring absorbed energy-momentum symmetry in which radiant energy W·sr−1·m−2·nm−1 is compared directly against its absorbed impinging momentum kg·m·s−1 in a manner that will provide an experimental basis for asymmetrical anomalies that may or may not exist within a measurable range of the electromagnetic spectrum.

公开(公告)号：US20180149523A1

公开(公告)日：2018-05-31

申请号：US15364006

申请日：2016-11-29

Applicant: Cymer, LLC

Inventor： Zhongquan Zhao ,  Brian Edward King ,  Thomas Patrick Duffey

IPC: G01J3/50 ,  G01J11/00 ,  G01J3/02 ,  G01J3/26 ,  H01S4/00 ,  G03F7/20

CPC classification number: G01J3/505 ,  G01J1/0407 ,  G01J1/0411 ,  G01J1/0474 ,  G01J1/0488 ,  G01J1/4257 ,  G01J3/0205 ,  G01J3/0208 ,  G01J3/027 ,  G01J3/26 ,  G01J3/502 ,  G01J11/00 ,  G03F7/70041 ,  G03F7/70075 ,  G03F7/70575 ,  G03F7/7085 ,  H01S3/005 ,  H01S3/0057 ,  H01S3/0071 ,  H01S3/0085 ,  H01S3/08009 ,  H01S3/225 ,  H01S3/2308 ,  H01S4/00

Abstract: A metrology system is used for measuring a spectral feature of a pulsed light beam. The metrology system includes: a beam homogenizer in the path of the pulsed light beam, the beam homogenizer having an array of wavefront modification cells, with each cell having a surface area that matches a size of at least one of the spatial modes of the light beam; an optical frequency separation apparatus in the path of the pulsed light beam exiting the beam homogenizer, wherein the optical frequency separation apparatus is configured to interact with the pulsed light beam and to output a plurality of spatial components that correspond to the spectral components of the pulsed light beam; and at least one sensor that receives and senses the output spatial components.

公开(公告)号：US09976911B1

公开(公告)日：2018-05-22

申请号：US15196679

申请日：2016-06-29

Applicant: Beam Engineering for Advanced Materials Co.

Inventor： Nelson V. Tabirian ,  Zhi J. Liao

IPC: G01J9/00

CPC classification number: G01J9/00 ,  G01J1/0411 ,  G01J1/4257 ,  G01J2009/002

Abstract: Sensors, devices, apparatus, systems and methods for replacing microlens arrays with one or more switchable diffractive waveplate microlens arrays for providing measurements of wavefronts and intensity distribution in light beams with high spatial resolution with a single optical radiation sensor. The device acts like a conventional Shack-Hartmann wavefront sensor when the microlens array elements are in focusing state, and the device performs light beam intensity profile characterization acting as a beam profiler when the optical power of lens array elements is switched off.