Temperature measurement and control for photohermal processes
    172.
    发明授权
    Temperature measurement and control for photohermal processes 失效
    光热过程的温度测量和控制

    公开(公告)号:US4959244A

    公开(公告)日:1990-09-25

    申请号:US329054

    申请日:1989-03-27

    CPC classification number: G01J5/601 C23C16/52 G01J2001/442 G01J2003/2813

    Abstract: The temperature of a surface undergoing a radiation assisted thermally driven process is sensed by observation of the thermal emission from that surface and used to control the process. In a preferred embodiment, the blue edge of the thermal emission spectral distribution is detected to determine the surface temperature of a workpiece during a process such as laser-assisted chemical vapor deposition, and used to control this temperature. The temperature measuring system has means for focusing workpiece thermal emission and defining the field of view, a spectrometer to separate shorter wavelength light from other spectral components of the thermal emission, and a photon-counting system to detect the shorter wavelength light and generate a surface temperature signal. Systems to determine surface temperature at a spot and along a line have an optical prism to disperse the thermal emission into component wavelengths, and a multichannel photon-counting detector comprised of an intensified photodetector array.

    Abstract translation: 通过观察来自该表面的热发射并用于控制该过程来感测经历辐射辅助热驱动过程的表面的温度。 在优选实施例中,检测热发射光谱分布的蓝色边缘以在诸如激光辅助化学气相沉积的过程中确定工件的表面温度,并用于控制该温度。 温度测量系统具有用于聚焦工件热发射和限定视野的装置,用于将较短波长的光与热发射的其他光谱分量分离的光谱仪,以及用于检测较短波长的光并产生表面的光子计数系统 温度信号。 确定点和沿着线的表面温度的系统具有光学棱镜以将热辐射分散成分量波长,以及包括强化光电检测器阵列的多通道光子计数检测器。

    Apparatus for the optical measurement of spectra distribution
    173.
    发明授权
    Apparatus for the optical measurement of spectra distribution 失效
    用于光谱分布光学测量的装置

    公开(公告)号:US4929080A

    公开(公告)日:1990-05-29

    申请号:US194391

    申请日:1988-05-16

    Inventor: Herschel Burstyn

    Abstract: An optical double-balanced quadrature mixer for analysis of optical spectra, particularly asymmetric optical spectra. Beam splitting means are used in conjunction with a quarter wavelength retardation plate to enable highly stable, accurate and precise spectral analysis. The invention is illustrated in the context of a generic light scattering test setup.

    Abstract translation: 一种光学双平衡正交混频器,用于分析光谱,特别是不对称光谱。 光束分束装置与四分之一波长延迟板一起使用,以实现高度稳定,精确和精确的光谱分析。 在通用光散射测试装置的上下文中说明本发明。

    Photoionization optical filter and detector
    174.
    发明授权
    Photoionization optical filter and detector 失效
    光电离滤光片和检测器

    公开(公告)号:US4879468A

    公开(公告)日:1989-11-07

    申请号:US791663

    申请日:1985-10-28

    Applicant: John C. Brock

    Inventor: John C. Brock

    Abstract: An optical filter and detector, and a related method for its operation, in which signal photons are admitted into a detector cell and selectively excite atoms or molecules of a vapor to a selected metastable state. An illuminating laser then photoionizes a large proportion of the excited atoms or molecules, and the resulting free electrons are collected as a measure of the number of incident signal photons. The initial excitation step to a metastable state is highly sensitive to the wavelength of the signal photons and therefore acts as a narrowband filter.

    Abstract translation: 光学滤波器和检测器及其操作的相关方法,其中信号光子被允许进入检测器单元并选择性地将蒸气的原子或分子激发到选定的亚稳态。 然后照射激光使大部分激发的原子或分子光电离,并且将所得的自由电子作为入射信号光子的数量的度量进行收集。 到亚稳态的初始激发步骤对信号光子的波长高度敏感,因此用作窄带滤波器。

    SUPERCONDUCTING SINGLE-PHOTON DETECTION SYSTEM
    175.
    发明公开

    公开(公告)号:US20240344882A1

    公开(公告)日:2024-10-17

    申请号:US18292490

    申请日:2022-07-28

    CPC classification number: G01J1/44 G01J1/0425 G01J2001/442

    Abstract: A superconducting single-photon detection system includes: a plurality of optical transmission paths through each of which a photon emitted from a light source is transmitted; a plurality of superconducting single-photon detectors (hereinafter referred to as “SSPDs”) that are independent of each other and in one-to-one correspondence with the optical transmission paths; and a superconducting logic circuit that multiplexes first pulse signals output from the SSPDs. A photon entry time at which the photon enters each of the SSPDs through a corresponding one of the optical transmission paths is different for each of the optical transmission paths, and a difference in the photon entry time between the optical transmission paths is greater than a pulse width of a corresponding one of second pulse signals output from the superconducting logic circuit.

    INTERCEPTION-PROOF SINGLE-PHOTON DETECTOR DEVICE FOR DETECTING AN OPTICAL SIGNAL

    公开(公告)号:US20240337529A1

    公开(公告)日:2024-10-10

    申请号:US18293999

    申请日:2022-07-28

    CPC classification number: G01J1/44 G01J2001/442 H04L9/0852

    Abstract: The invention relates to a single-photon detector device (10) for detecting an optical signal, comprising an optical waveguide (12) and at least two nanowires (16, 18). The optical waveguide (12) is designed to guide the optical signal along an optical axis (14), wherein the at least two nanowires (16, 18) are arranged along the optical axis (14) relative thereto such that at least a second nanowire (18) is arranged in front of a first nanowire (16) with respect to the optical axis (14), wherein the at least two nanowires (16, 18) are designed to be superconductive at a specified temperature and, in the superconductive state, to generate an output signal when an intensity threshold of the optical signal is exceeded, and the at least two nanowires (16, 18) are designed so as to have different intensity thresholds. The invention additionally relates to the use of the aforementioned single-photon detector device for detecting an attack during a signal transmission encrypted using a quantum key distribution.

    Single-photon detector, and array and fabricating method thereof

    公开(公告)号:US12078535B2

    公开(公告)日:2024-09-03

    申请号:US17966502

    申请日:2022-10-14

    CPC classification number: G01J1/44 G01J1/0425 G01J2001/442

    Abstract: The invention provides a single-photon detector that includes a superconducting wire made from a high quality and uniform superconducting film with a higher critical temperature. A reflector or a multilayered reflector with high reflectivity, preferably a nitride-based distributed Bragg reflector, is provided to reflect an incident light to the superconducting wire. A surface-plasmon wavelength-selective surface may be further provided above the superconducting wire to resonantly transmits the incident light within a selective passband, making the single-photon detector operable in the ultraviolet, visible, and infrared wavelength bands. In addition, a large area of superconducting film with high level of uniformity is grown to achieve the up scaling of the single-photon detector and a single-photon detector array.

    Superconducting photon detector
    178.
    发明授权

    公开(公告)号:US12061114B2

    公开(公告)日:2024-08-13

    申请号:US17967773

    申请日:2022-10-17

    Abstract: The various embodiments described herein include methods, devices, and systems for fabricating and operating superconducting photon detectors. In one aspect, a photon detector includes: (1) a first waveguide configured to guide photons from a photon source; (2) a second waveguide that is distinct and separate from the first waveguide and optically-coupled to the first waveguide; and (3) a superconducting component positioned adjacent to the second waveguide and configured to detect photons within the second waveguide.

    Cryogenic microfluidic cooling for photonic integrated circuits

    公开(公告)号:US12055755B1

    公开(公告)日:2024-08-06

    申请号:US17961043

    申请日:2022-10-06

    Inventor: Eric Dudley

    Abstract: A method includes fabricating a device including a first dielectric layer, an optical waveguide in the first dielectric layer, and a superconducting circuit in the first dielectric layer and on the optical waveguide. The method also includes forming a sacrificial structure on the first dielectric layer, the sacrificial structure aligned with the superconducting circuit, depositing a second dielectric layer on the sacrificial structure, and cutting an opening in the second dielectric layer to expose the sacrificial structure. The method further includes wet etching the sacrificial structure through the opening and sealing the opening in the second dielectric layer with a third dielectric layer to form a micro-channel between the first dielectric layer and the second dielectric layer.

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