Photoreaction Evaluation Apparatus
    14.
    发明公开

    公开(公告)号:US20240230524A1

    公开(公告)日:2024-07-11

    申请号:US18558169

    申请日:2022-03-07

    Inventor: Takahiro TAMAKI

    CPC classification number: G01N21/31 G01J3/42 G01N21/255 G01N2021/3125

    Abstract: A measurement light source is arranged on a rear surface side of a surface at a sample position irradiated with light by an irradiation light source and a detector is arranged on a front surface side of the surface at the sample position irradiated with light by the irradiation light source. A radiation intensity calculator calculates a radiation intensity at each wavelength of irradiation light from the irradiation light source based on a first detected intensity distribution, a second detected intensity distribution, and radiation characteristics of a standard light source. An irradiated photon number calculator calculates the number of irradiated photons at each wavelength of irradiation light from the irradiation light source based on the radiation intensity at each wavelength.

    Optical cell cleaner
    16.
    发明授权

    公开(公告)号:US11988598B2

    公开(公告)日:2024-05-21

    申请号:US17137313

    申请日:2020-12-29

    Applicant: SeekOps Inc.

    CPC classification number: G01N21/15 G01J3/0291 G01J3/42 G01N21/031 G01N21/31

    Abstract: Systems, devices, and methods for an optical head enclosure of a sensor; one or more imbedded nozzles disposed on a surface of the optical head enclosure; an inlet of the one or more imbedded nozzles, where the inlet comprises a nozzle channel for receiving a cleaning solution; a flow channel internal to the optical head enclosure, where the nozzle channel is connected to the flow channel, and where the flow channel comprises an outlet for dispersing the cleaning solution received from the nozzle channel; wherein the inlet comprises a break to stop a nozzle of a cleaning device from reaching a mirror of the sensor; where the outlet directs the cleaning solution from the inlet onto the mirror.

    Absorbance spectroscopic device
    17.
    发明授权

    公开(公告)号:US11977023B2

    公开(公告)日:2024-05-07

    申请号:US17765138

    申请日:2020-09-24

    Inventor: Kyung Nam Kim

    Abstract: Provided is a spectrophotometric device including a base plate including a first surface to accommodate a sample thereon, a rotatable plate including a second surface corresponding to and spaced a certain distance apart from the first surface, a test beam radiator connected to the first surface through a first beam guide to radiate a test beam to the sample accommodated on a beam path between the first and second surfaces, a spectrophotometer connected to the second surface through a second beam guide to analyze spectroscopic properties of the sample by analyzing a characteristic beam having passed through the sample accommodated on the beam path, and a state determiner provided near the beam path to determine whether the sample accommodated between the first and second surfaces is in a state in which analysis of optical properties is enabled.

    Systems and methods for characterizing spectral reflectance of real world objects

    公开(公告)号:US11976976B2

    公开(公告)日:2024-05-07

    申请号:US18078677

    申请日:2022-12-09

    Abstract: Systems, methods, and computer-readable media are disclosed for a systems and methods for intra-shot dynamic LIDAR detector gain. One example method my include receiving first image data associated with a first image of an object illuminated at a first wavelength and captured by a camera at the first wavelength, the first image data including first pixel data for a first pixel of the first image and second pixel data for a second pixel of the first image. The example method may also include calculating a first reflectance value for the first pixel using the first pixel data. The example method may also include calculating a second reflectance value for the second pixel using the second pixel data. The example method may also include generating, using first reflectance value and the second reflectance value, a first reflectance distribution of the object.

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