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公开(公告)号：US5616920A
公开(公告)日：1997-04-01
申请号：US538865
申请日：1995-10-04
Applicant: Erich Plies
Inventor： Erich Plies
CPC classification number: H01J37/1477 , H01J35/02 , H01J37/05 , H01J49/288 , H01J49/48
Abstract: Purely electrical or magnetic deflection systems are usually utilized in the probe-shaping part of modern electron beam tomographs in order to remove the gas ions generated in the evacuated drift tube by electron impact from the beam. The known deflection systems, however, cause an offset of the electron beam, so that this enters extra-axially into the lens element following the deflection system. In the apparatus for removing ions from an electron beam disclosed herein, a deflection unit (Wien filter) generates an E.times.B field oriented perpendicular to the beam axis that exerts strong shearing forces only on the positively charged gas ions, but does not influence the electrons. The deflection unit is essentially composed of two tube electrodes lying at a constant potential, of an electrostatic octopole deflector, and two saddle coil pairs annularly surrounding the octopole deflector. The apparatus is useful for fast electron beam tomographs, including x-ray scanners.
Abstract translation: 通常在现代电子束断层摄影机的探针成形部分中采用纯电气或磁偏转系统，以便通过电子束从电子束中去除真空漂移管中产生的气体离子。 然而，已知的偏转系统引起电子束的偏移，使得其在偏转系统之后进入到轴向进入透镜元件。 在用于从本文公开的电子束去除离子的装置中，偏转单元（维恩滤波器）产生垂直于光束轴线定向的ExB场，其仅在带正电荷的气体离子上施加强剪切力，但不影响电子。 偏转单元基本上由位于恒定电位的静电八极偏转器的两个管电极和环形围绕八极偏转器的两个鞍形线圈组成。 该装置适用于快速电子束断层扫描仪，包括x射线扫描仪。
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公开(公告)号：US5097178A
公开(公告)日：1992-03-17
申请号：US655882
申请日：1991-02-14
Applicant: Susumu Nishihara
Inventor： Susumu Nishihara
Abstract: A RF electron gun, such as for use in a linear electron accelerator, having a cathode activating device which, in one embodiment, includes means for altering the phase of the accelerating electric field to accelerate emitted electrons in the reverse direction to cause them to strike the cathode, thereby activating the cathode. In another embodiment, laser light is directed onto the cathode for activation thereof and, in a further embodiment, the electric field is positioned and directed at the cathode to cause the activation thereof.
Abstract translation: 用于线性电子加速器的RF电子枪具有阴极激活装置，在一个实施例中，阴极激活装置包括用于改变加速电场的相位以加速发射的电子在相反方向上的装置，以使它们发射 阴极，从而激活阴极。 在另一个实施例中，激光被引导到阴极上用于激活它，并且在另一实施例中，电场被定位并且指向阴极以引起其激活。
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13.发明授权Beam guidance for electron beam tests, and electron impact spectrometer having such beam guidance 失效电子束测试的光束指导和具有这种光束引导的电子轰击光谱仪
公开(公告)号：US4300045A
公开(公告)日：1981-11-10
申请号：US107592
申请日：1979-12-27
Applicant: Harald Ibach , Hermann Froitzheim , Heinz-Dieter Bruchmann , Sieghard Lehwald
Inventor： Harald Ibach , Hermann Froitzheim , Heinz-Dieter Bruchmann , Sieghard Lehwald
IPC: H01J49/08 , G01N23/203 , G01Q30/02 , G01Q30/18 , G01Q70/18 , H01J49/06 , H01J49/14 , H01J49/44 , H01J49/48 , H01J40/00 , H01J47/00
Abstract: A beam guidance for electron beam tests, especially of solid bodies. The ctrons cathodically emitted and electron-optically bundled are subjected at least to an energy selection in a cylinder condenser deflection unit and are subsequently detected or indicated in a detector. The emission and bundling systems are arranged in such a way that the electrons, in the plane at right angles to the cylinder condenser axis, are focused upon the inlet shield or baffle of the condenser, yet are focused at right angles thereto upon the detector. Also disclosed is an electron impact spectrometer having such a beam guidance, and an emission system encompassing a cathode and a lens system for focusing an electron current or flow upon an inlet baffle of a monochromator, with such flow entering into the cylinder condenser monochromator for energy selection of the electrons, which emanate bundled from the monochromator and strike or fall upon the probe or test sample and after reflection thereon come by way of a lens system into the cylinder condenser analyzer and after energy selection and passage through the outlet baffle of the analyzer strike or impinge upon a detector.
Abstract translation: 用于电子束测试的光束引导，特别是固体的测试。 阴极发射的电子和电子束的电子至少在气缸冷凝器偏转单元中进行能量选择，随后在检测器中检测或指示。 发射和捆扎系统被布置成使得在与圆柱形冷凝器轴线成直角的平面中的电子被聚焦在冷凝器的入口屏蔽或挡板上，但是在检测器上与其成直角聚焦。 还公开了具有这种光束引导的电子轰击光谱仪，以及包括阴极和透镜系统的发射系统，用于将电子流或流动聚焦在单色仪的入口挡板上，这样的流进入气缸电容器单色器以获得能量 从单色仪发射并发射或落在探针或测试样品上并在其上反射之后的电子的选择通过透镜系统进入气瓶冷凝器分析器，并且在能量选择和通过分析器的出口挡板之后 撞击或撞击检测器。
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公开(公告)号：US20210375608A1
公开(公告)日：2021-12-02
申请号：US17233610
申请日：2021-04-19
Applicant: PERKINELMER HEALTH SCIENCES, INC.
Inventor： Adam Patkin
Abstract: Certain configurations of an ionization source comprising a multipolar rod assembly are described. In some examples, the multipolar rod assembly can be configured to provide a magnetic field and a radio frequency field into an ion volume formed by a substantially parallel arrangement of rods of the multipolar rod assembly. The ionization source may also comprise an electron source configured to provide electrons into the ion volume of the multipolar rod assembly to ionize analyte introduced into the ion volume. Systems and methods using the ionization source are also described.
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公开(公告)号：US11164732B2
公开(公告)日：2021-11-02
申请号：US16294186
申请日：2019-03-06
Applicant: SHIMADZU CORPORATION
Inventor： Hideharu Shichi
Abstract: The mass spectrometer includes an ionizer, a mass separator, a detection device, a storage, and a controller. The detection device includes a detector and an electron introducer. The electrons from the electron introducer are introduced into the detector. In addition to an analysis operation, the mass spectrometer performs an operation to determine a voltage applied to the detector. At this point, electrons are introduced from the electron introducer to the detector. In the case that a detection value from the detector is less than a threshold, the controller can determine that a defect such as aging is generated in the detector.
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Patent Agency Ranking
公开(公告)号：US10930488B2
公开(公告)日：2021-02-23
申请号：US16814036
申请日：2020-03-10
Applicant: SHIMADZU CORPORATION
Inventor： Osamu Furuhashi , Tomomi Tamura , Kiyoshi Ogawa
Abstract: A mass spectrometer, includes: a sampling probe that irradiates a specimen disposed in the atmosphere with an electron and obtains a sample separated from the specimen; and a measurement unit that performs mass spectrometry of the sample obtained by the sampling probe, wherein the sampling probe comprises: a casing having an opening which is opened to the atmosphere and an outlet through which the sample is discharged to the measurement unit; and a surface emission type electron emission element housed in the casing such that an electron emission surface thereof opposes to the opening.
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公开(公告)号：US10566179B2
公开(公告)日：2020-02-18
申请号：US15770018
申请日：2015-10-23
Applicant: SHIMADZU CORPORATION
Inventor： Tomoyuki Oshiro
Abstract: An orthogonal acceleration time-of-flight (TOF) mass spectrometer in which an ion injected into an orthogonal acceleration area is periodically accelerated in a direction orthogonal to a direction of the injection and thereby ejected into a flight space. The mass spectrometer includes: an orthogonal acceleration electrode; a voltage supplier for applying a fixed level of voltage to the orthogonal acceleration electrode with a predetermined period; a TOF determiner for detecting an ion after a completion of a flight of the ion within the flight space, and determining the TOF of the ion; a storage section in which mass determination information defining a relationship between the TOF and mass-to-charge ratio of the ion depending on the period of the applied voltage is stored; and a mass-to-charge-ratio determiner for determining the mass-to-charge ratio of an ion from the TOF of the ion determined by the TOF determiner, based on the mass determination information.
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公开(公告)号：US20190341243A1
公开(公告)日：2019-11-07
申请号：US16424206
申请日：2019-05-28
Applicant: FEI Company
Inventor： Bert Henning Freitag , Sorin Lazar , Stephan Kujawa , Maarten Kuijper , Gerard Nicolaas Anne van Veen , Peter Christiaan Tiemeijer , Jamie McCormack
Abstract: A method of performing Electron Energy-Loss Spectroscopy (EELS) in an electron microscope, comprising: Producing a beam of electrons from a source; Using an illuminator to direct said beam so as to irradiate the specimen; Using an imaging system to receive a flux of electrons transmitted through the specimen and direct it onto a spectroscopic apparatus comprising: A dispersion device, for dispersing said flux in a dispersion direction so as to form an EELS spectrum; and A detector, comprising a detection surface that is sub-divided into a plurality of detection zones, specifically comprising: Using at least a first detection zone, a second detection zone and a third detection zone to register a plurality of EELS spectral entities; and Reading out said first and said second detection zones whilst said third detection zone is registering one of said plurality of EELS spectral entities.
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公开(公告)号：US20190004071A1
公开(公告)日：2019-01-03
申请号：US16020141
申请日：2018-06-27
Applicant: SHIMADZU CORPORATION
Inventor： Hidenori TAKAHASHI , Sadanori SEKIYA
Abstract: Lipid-derived ions captured within an ion trap are irradiated with hydrogen radicals to induce the reaction of hydrogen extraction (S1, S2). A precursor-ion isolation process is subsequently performed (S3), and the precursor ion is dissociated by low-energy collision-induced dissociation (S4). The thereby generated product ions are subjected to mass spectrometry to create a product-ion spectrum (S5, S6). Since the dissociation achieved by such a procedure does not cause hydrogen rearrangement, a peak pair having a mass difference of +12 Da characteristic of the unsaturated bond site certainly appears on the product-ion spectrum. By searching for this peak pair, the unsaturated bond site can be located (S7, S8). By such a method, a lipid-structure analysis including the determination of the position of the unsaturated bond site in a lipid can be performed in a stable and accurate manner without requiring derivatization or other cumbersome pretreatments.
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公开(公告)号：US20180358219A1
公开(公告)日：2018-12-13
申请号：US15778341
申请日：2016-11-21
Applicant: Micromass UK Limited , LECO CORPORATION
Inventor： John Brian Hoyes , Anatoly Verenchikov , Mikhail Yavor , Keith Richardson
CPC classification number: H01J49/406 , H01J49/063 , H01J49/067 , H01J49/068 , H01J49/08
Abstract: An ion mirror is disclosed comprising an ion entrance electrode section (62) at the ion entrance to the ion mirror, an energy focussing electrode section (66) for reflecting ions back along a longitudinal axis towards said ion entrance, and a spatial focussing electrode section (64) arranged between the ion entrance electrode section (62) and the energy focussing electrode section (66) for spatially focussing the ions. One or more DC voltage supply is provided to apply a DC potential to the ion entrance electrode section (62) that is intermediate the DC potential applied to the spatial focussing electrode section (64) and the DC potential applied to the energy focussing electrode section (66). The ion mirror further comprises: (i) at least one first transition electrode (68) arranged between said ion entrance electrode section (62) and said spatial focussing electrode section (64), wherein said one or more DC voltage supply is configured to apply a DC potential to said at least one first transition electrode that is intermediate the DC potential applied to the ion entrance electrode section (62) and the DC potential applied to the spatial focussing electrode section (64); and (ii) at least one second transition electrode (69) arranged between said energy focussing electrode section (66) and said spatial focussing electrode section (64), wherein said one or more DC voltage supply is configured to apply a DC potential to said at least one second transition electrode (69) that is intermediate the DC potential applied to the spatial focussing electrode section (64) and the DC potential applied to the ion entrance electrode section (62).
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