Method and system for gas concentration measurement of gas dissolved in liquids

    公开(公告)号:US10101266B2

    公开(公告)日:2018-10-16

    申请号:US15023721

    申请日:2014-09-17

    Applicant: Vaisala Oyj

    Abstract: The present invention concerns a method and system for gas concentration measurement of gas or gas mixtures dissolved in liquids. A gas or gas mixture dissolved in a liquid sample is extracted from the liquid sample using an extraction system and conducted into a measurement chamber. Then a measurement signal is generated by means of a radiant source and the measurement signal is directed to a measurement object in a measurement chamber containing the gas or gas mixture to be measured. The measurement signal is filtered using at least two wavelengths, whereupon the filtering is preferably implemented by means of an electrically tunable, short-resonator Fabry-Perot interferometer. Then the filtered measurement signals are detected my means of a detector.

    SELF-CALIBRATING SPECTRAL MODELS
    193.
    发明申请

    公开(公告)号:US20180283943A1

    公开(公告)日:2018-10-04

    申请号:US15476601

    申请日:2017-03-31

    Inventor: Robert J. Klein

    CPC classification number: G01J3/28 G01N21/274 G01N2021/0118

    Abstract: A method of implementing a self-calibrating database of spectral data includes receiving remotely-sensed spectral data for a geographic location. The method also includes accessing spectral data for a composition of materials at the geographic location from a database of spectral data for compositions of materials at respective geographic locations. The method includes calibrating the spectral data to match the remotely-sensed spectral data and thereby produce calibrated spectral data for the composition. The method includes validating the calibrated spectral data for the composition. And in an instance in which the calibrated spectral data for the composition is validated, the method includes replacing the spectral data with the calibrated spectral data to produce an enhanced database of spectral data for use in identifying materials or compositions of materials therefrom; and in at least one instance, outputting identifiers of the materials in the composition of materials.

    Delay Line Device And Terahertz Time-Domain Spectrometer System

    公开(公告)号:US20180274978A1

    公开(公告)日:2018-09-27

    申请号:US15768714

    申请日:2017-08-10

    Abstract: A delay line device and a terahertz time-domain spectrometer system include: a baseplate, a slide rail component, in which the slide rail component includes a slide, a reflector, a grating ruler component, and an electric-magnetic induction component. When the electric-magnetic component, after being applied a current, cuts the magnetic induction coil to generate power to push the slide moving, the grating ruler component placed on the slide rail component collects the movement information of the slide. The slide's movement drives the reflector placed on the slide to move together to change the optical distance of a pump light, so as to generate the delay between the pump light and a probe light.The changes to the abstract are shown below:A delay line device and a terahertz time-domain spectrometer system include: a baseplate, a slide rail component, in which the slide rail component includes a slide, a reflector, a grating ruler component, and an electric-magnetic induction component. When the electric-magnetic component, after being applied a current, cuts the magnetic induction coil to generate power to push the slide moving, the grating ruler component placed on the slide rail component collects the movement information of the slide. The slide's movement drives the reflector placed on the slide to move together to change the optical distance of a pump light, so as to generate the delay between the pump light and a probe light.

    TERAHERTZ SPECTROSCOPY SYSTEM AND METHOD
    195.
    发明申请

    公开(公告)号:US20180252581A1

    公开(公告)日:2018-09-06

    申请号:US15967964

    申请日:2018-05-01

    Abstract: A terahertz spectrometer includes: a terahertz-wave emitter and a terahertz receiver elements. The terahertz wave generated by means of generating beat frequency corresponding to the difference between two rapidly tunable continuous wave lasers. Having a difference in time between the interrogating signal and the reference signal at the receiver end side, which corresponds to intermediate frequency (IF), not centered around the baseband, i.e. zero Hertz. The offset step size of the intermediate frequency from zero Hertz is linearly correlated to the position of the interrogated object position.

    Methods And Systems For Measurement Of Thick Films And High Aspect Ratio Structures

    公开(公告)号:US20180238814A1

    公开(公告)日:2018-08-23

    申请号:US15896978

    申请日:2018-02-14

    Abstract: Methods and systems for performing spectroscopic measurements of semiconductor structures including ultraviolet, visible, and infrared wavelengths greater than two micrometers are presented herein. A spectroscopic measurement system includes a combined illumination source including a first illumination source that generates ultraviolet, visible, and near infrared wavelengths (wavelengths less than two micrometers) and a second illumination source that generates mid infrared and long infrared wavelengths (wavelengths of two micrometers and greater). Furthermore, the spectroscopic measurement system includes one or more measurement channels spanning the range of illumination wavelengths employed to perform measurements of semiconductor structures. In some embodiments, the one or more measurement channels simultaneously measure the sample throughout the wavelength range. In some other embodiments, the one or more measurement channels sequentially measure the sample throughout the wavelength range.

    Method for Calibrating Absolute Responsivity of Terahertz Quantum Well Detector and Device thereof

    公开(公告)号:US20180216994A1

    公开(公告)日:2018-08-02

    申请号:US15121520

    申请日:2014-04-30

    CPC classification number: G01J1/4257 G01J1/08 G01J1/4228 G01J3/42 G01J2001/083

    Abstract: A calibration method for an absolute responsivity of a terahertz quantum well detector and a calibration device thereof, in which the device at least comprises: a driving power supply, a single frequency laser source, an optic, a terahertz array detector, a terahertz dynamometer, a current amplifier and an oscilloscope. The calibration method adopts a power detectable single frequency laser source as a calibration photosource, to obtain the absolute responsivity parameters of the detector at the laser frequency; a normalized photocurrent spectrum of the detector is used to further calculate the absolute responsivity parameters of the detector at any detectable frequency. the single frequency laser source with periodically output is adopted as a calibration photosource, the terahertz array detector and the dynamometer are adopted to directly measure and obtain the incident power of the calibrated detector.

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