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251.
公开(公告)号:US20180128682A1
公开(公告)日:2018-05-10
申请号:US15793800
申请日:2017-10-25
Applicant: TruTag Technologies, Inc.
Inventor: Ron R. Nissim , Timothy Learmonth , Mark Hsu , Hod Finkelstein
CPC classification number: G01J3/45 , G01J3/0297 , G01J3/26 , G01J3/28
Abstract: A system for determining a calibrated spectral measurement includes a tunable Fabry-Perot etalon, a detector, and a processor. The tunable Fabry-Perot etalon has a settable gap. The detector measures light intensity. The processor is configured to determine the calibrated spectral measurement. The calibrated spectral measurement is based at least in part on a measurement set of detected light intensities for a plurality of settable gaps and a reconstruction matrix. The reconstruction matrix is based at least in part on calibration measurements. For a calibration measurement, a settable gap is selected and a set of input monochromatic source wavelengths is used to measure responses at a detector after transmission through the Fabry-Perot etalon. Each input monochromatic source wavelength is also measured using a radiometer to scale detector measurements.
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公开(公告)号:US20180106676A1
公开(公告)日:2018-04-19
申请号:US15842770
申请日:2017-12-14
Applicant: SEOUL VIOSYS CO., LTD.
Inventor: Seong Tae Jang , Stella Park , Sung Il Park , Ji Ye Song , Woong Ki Jeong
CPC classification number: G01J3/42 , A61B5/0075 , A61B5/441 , A61B5/6898 , G01J3/0256 , G01J3/027 , G01J3/0291 , G01J3/0297 , G01J3/10 , G01J3/2803 , G01J3/2823 , G01J2003/104 , G01J2003/106 , G01J2003/2859 , G01J2003/2866 , G01J2003/425 , G01N21/278 , G01N21/31 , G01N21/6456 , G01N21/6486 , G01N2021/3181 , G01N2201/0221 , G01N2201/0627 , G02B6/12 , G02B7/02 , G02B2006/12083
Abstract: In one aspect, a hyperspectral image measurement device is provided to include: a main body; an illumination module disposed in the main body and including LEDs having different peak wavelengths to irradiate light to a subject; a camera disposed on the main body and receiving light reflected from the subject to acquire an image of the subject; a barrel having a contact surface contacting the subject, the contact surface located to be spaced apart from the illumination module and the camera module by a predetermined distance; and a reference cover located on the contact surface and including a standard reflection layer for reflecting light irradiated from the illumination module toward the camera module.
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公开(公告)号:US20180067017A1
公开(公告)日:2018-03-08
申请号:US15685832
申请日:2017-08-24
Applicant: CENTRE NATIONAL D'ETUDES SPATIALES
Inventor: Jean-Marc DELVIT , Christophe LATRY , Carole THIEBAUT , Gwendoline BLANCHET
IPC: G01M11/02
CPC classification number: G01M11/0264 , G01J3/0297 , G01J3/28 , G01J3/2823 , G01J2003/2826 , G01M11/0207 , G01M11/0292
Abstract: The invention relates to a method and device for characterising at least one optical aberration of an optical system of an image acquisition device, the optical system having an associated optical transfer function that is dependent on the aberrations, the image acquisition device being capable of acquiring at least two images in a field of image capture in a manner so as to introduce a differential aberration between the two images, each image being defined by a digital image signal. The method includes the obtaining (50) of a first image and a second image of a same given zone of the field of image capture, the second image being acquired with a differential aberration (Δaberr) relative to the first image, each image acquisition having an associated optical transfer function. An optical aberration is characterised (58, 60) by the calculation of at least one parameter by minimisation of a functional expressed as a function of the first and second images acquired, from a modelling of the optical transfer functions associated with the two image acquisitions dependent on the aberrations of the image acquisition device as well as on the differential aberration (Δaberr).
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254.
公开(公告)号:US09897486B2
公开(公告)日:2018-02-20
申请号:US15402751
申请日:2017-01-10
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Tae-Yong Jo , Young-Joo Lee , Chang-Hoon Choi , Jong-Jeong Kim
CPC classification number: G01J3/0297 , G01J3/28
Abstract: A method of calibrating a measuring apparatus includes determining apparatus parameters that have an influence on a measurement spectrum generated by the measuring apparatus, generating the measurement spectrum by exposing a measurement target on a sample to light generated by the measuring apparatus, calculating an error of the apparatus parameters by comparing the measurement spectrum to an ideal spectrum corresponding to the apparatus parameters, and calibrating the measuring apparatus based on the calculated error of the apparatus parameters.
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公开(公告)号:US20180031420A1
公开(公告)日:2018-02-01
申请号:US15551915
申请日:2016-02-24
Applicant: Leica Microsystems CMS GmbH
Inventor: Marcus Dyba
IPC: G01J1/44 , G01J3/02 , G01J3/28 , G02B21/00 , H01L31/107
CPC classification number: G01J1/44 , G01J1/42 , G01J3/0297 , G01J3/2803 , G01J2001/4406 , G01J2001/442 , G01J2001/444 , G01J2001/4466 , G02B21/008 , H01L31/107
Abstract: A method for improving dynamic range of a device for detecting light includes providing at least two detection regions. The detection regions are each formed by an array of a plurality of single-photon avalanche diodes (SPADs) and the detection regions each comprise at least one signal output. A characteristic curve is determined for each of the detection regions. The characteristic curves are combined with one another and/or offset against one another in order to obtain a correction curve and/or a correction factor.
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公开(公告)号:US09816805B2
公开(公告)日:2017-11-14
申请号:US14302187
申请日:2014-06-11
Applicant: Nikon Corporation
Inventor: Daniel Gene Smith , Eric Peter Goodwin
CPC classification number: G01B11/14 , G01B11/02 , G01B11/0608 , G01J3/0237 , G01J3/0297 , G01N21/25 , G02B7/28 , G02B7/36
Abstract: Method of predicting a distribution of light in an illumination pupil of an illumination system includes identifying component(s) of the illumination system the adjustment of which affects this distribution and simulating the distribution based on a point spread function defined in part by the identified components. The point spread function has functional relationship with configurable setting of the illumination settings.
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公开(公告)号:US09746375B2
公开(公告)日:2017-08-29
申请号:US14247526
申请日:2014-04-08
Applicant: Yokogawa Electric Corporation
Inventor: Anatoliy A. Kosterev
CPC classification number: G01J3/0297 , G01J3/42 , G01J3/433 , G02F1/0131 , G02F1/0147 , G02F1/19 , G02F1/21
Abstract: Aspects of the disclosure include suppression of optical interference fringes in optical spectra via a modification to the refractive index of media that forms or is contained in one or more components of equipment utilized for optical spectroscopy. Such a modification can yield changes in the optical path of light propagating through at least one of the media, with the ensuing changes in the spectral structure of interference between light propagating through different optical paths. In certain embodiments, the refractive index of the media that forms or is contained in one or more components can be modified via application of a time-dependent stimulus to at least one of the one or more components. The applied stimulus can include pressure, mechanical strain or stress, temperature, a combination thereof, or the like.
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258.
公开(公告)号:US20170165873A1
公开(公告)日:2017-06-15
申请号:US15115828
申请日:2015-02-05
Applicant: O.E.D.A. LIAD HOLDINGS (2006) LTD.
Inventor: Vadim (Dan) REGELMAN , Eli MARGALIT , Daniel HOFMANN , Ofer JACOBOVICH , Aviad ADANI
CPC classification number: B29B7/72 , B29B7/40 , B29B7/603 , B29B7/88 , B29C45/76 , B29C48/92 , B29C2948/92095 , B29C2948/92457 , B29C2948/926 , B29C2948/92828 , G01J3/0208 , G01J3/0218 , G01J3/0224 , G01J3/0237 , G01J3/0291 , G01J3/0297 , G01J3/10 , G01J3/463 , G01J3/50 , G01J3/524 , G01J2003/106 , G01J2003/2873
Abstract: A method and system for optimizing a match between the color of an in-line part manufactured by a plastic product production machine and the color of a reference part by adjusting the concentration of masterbatch in the mixture of raw material fed to the plastic product production machine. The optimization of the color is based on spectra of the in-line part and reference part obtained within a short time interval using the same spectrometer, thereby eliminating the requirement for high accuracy spectrometer calibration and allowing the method, which determines the rates at which the base masterbatches are added to the raw material, to be carried out in real time on the manufacturing floor while the plastic product production machine is being operated to manufacture in-line parts.
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259.
公开(公告)号:US20170115211A1
公开(公告)日:2017-04-27
申请号:US15312320
申请日:2015-08-14
Applicant: Kubota Corporation
Inventor: Susumu Morimoto , Masao Soe
IPC: G01N21/3554 , G01N21/3563 , G01N33/10 , A01D41/127
CPC classification number: G01N21/3554 , A01D41/1277 , G01J3/0291 , G01J3/0297 , G01J3/04 , G01J2003/042 , G01N21/3563 , G01N21/359 , G01N21/85 , G01N33/10 , G01N2021/8592
Abstract: An optical grain evaluation device is provided with: a light-projecting part 58 through which light from a light source is projected to grain; a light-receiving part 59 on which light transmitted through the grain is incident; a grain evaluation unit 60 configured to evaluate the grain based on information relating to the received light; and a shielding part SH that separates an area between the light source 50 and the light-projecting part 59 from an area between the light-receiving part 59 and the grain evaluation unit 60, and prevents light from the light-projecting part 58 from directly entering the light-receiving part 59. The area between the light source 50 and the light-projecting part 58, and the area between the light-receiving part 59 and the grain evaluation unit 60 are configured, over the entirety of the areas, as air transmission areas in which light is transmitted through air.
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公开(公告)号:US09612154B2
公开(公告)日:2017-04-04
申请号:US14577573
申请日:2014-12-19
Applicant: Schlumberger Technology Corporation
Inventor: Kentaro Indo , Alexis Petit , Vivek Agarwal , Sepand Ossia , Julian J. Pop , Kai Hsu
CPC classification number: G01J3/0297 , E21B47/01 , E21B49/087 , E21B49/10 , G01V8/02
Abstract: A method for analyzing the condition of a spectrometer is provided. In one embodiment, the method includes acquiring optical data from a spectrometer of a downhole tool during flushing of a flowline and selecting a data set from the acquired optical data. The method can also include estimating light scattering and optical drift for the spectrometer based on the selected data set and determining impacts of the estimated light scattering and optical drift for the spectrometer on measurement accuracy of a characteristic of a downhole fluid determinable through analysis of the downhole fluid using the spectrometer. Additional methods, systems, and devices are also disclosed.
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