公开(公告)号：US20090073433A1

公开(公告)日：2009-03-19

申请号：US12094469

申请日：2006-11-27

Applicant: Michael L. Myrick ,  Robert P. Freese ,  John C. Blackburn ,  Ryan J. Priore

Inventor： Michael L. Myrick ,  Robert P. Freese ,  John C. Blackburn ,  Ryan J. Priore

IPC: G01J3/36

CPC classification number: G01J3/08 ,  A61K8/046 ,  A61K8/25 ,  A61K8/26 ,  A61K8/44 ,  A61Q11/00 ,  G01J3/02 ,  G01J3/0205 ,  G01J3/021 ,  G01J3/0232 ,  G01J3/0291 ,  G01J3/28 ,  G01N21/274 ,  G01N21/31

Abstract: A method of arranging and utilizing a multivariate optical computing and analysis system includes transmitting a o first light from a light source; generating a second light by reflecting the first light from the sample; directing a portion of the second light with a beamsplitter; and arranging an optical filter mechanism in a normal incidence orientation to receive the portion of the second light, the optical filter mechanism being configured to optically filter data carried by the portion of the second light.

Abstract translation: 一种布置和利用多变量光学计算和分析系统的方法包括从光源发射第一光; 通过反射来自样品的第一光产生第二光; 用分束器引导第二光的一部分; 以及将法兰入射方向的滤光器机构布置成接收第二光的一部分，所述光学滤光器机构被配置为光学地过滤由所述第二光的一部分携带的数据。

公开(公告)号：US20090066956A1

公开(公告)日：2009-03-12

申请号：US11002603

申请日：2004-12-02

Applicant: Sze Tan

Inventor： Sze Tan

IPC: G01N21/61

CPC classification number: G01N21/39 ,  G01J3/28 ,  G01J3/42 ,  G01N2021/399

Abstract: A method and apparatus for enhancing the accuracy of spectroscopic measurements using a cavity ringdown spectrometer (CRDS) is provided. A first aspect of the invention consists of a novel algorithm for the processing of ring-down data that significantly reduces the amplitude of an exponential fitting artifact, and thereby gives a better estimate of the actual loss. The primary cause of the artifact is the presence of an unwanted backwards-traveling wave that counter-propagates within the ringdown cavity. Scattering due to small imperfections at the cavity mirrors produces this wave and its intensity may be minimized by adjustment of the mirror positions during cavity construction. A second aspect of the invention consists of an apparatus for measuring the backscattered wave within a cavity to allow such cavity mirror adjustments to be made.

Abstract translation: 提供了一种用于增强使用空腔衰减谱仪（CRDS）的光谱测量精度的方法和装置。 本发明的第一方面包括一种用于处理降噪数据的新算法，其显着地减少指数拟合人造物的振幅，从而给出对实际损失的更好的估计。 赝像的主要原因是存在反冲传播的不需要的向后行波。 由于腔镜的小缺陷引起的散射产生这种波，并且通过在空腔构造期间通过调整反射镜位置可以最小化其强度。 本发明的第二方面包括用于测量空腔内的后向散射波以允许进行这种空腔镜子调节的装置。

公开(公告)号：US20090059210A1

公开(公告)日：2009-03-05

申请号：US12228495

申请日：2008-08-13

Applicant: Yuqin Zong ,  Steven W. Brown ,  Keith R. Lykke ,  Yoshihiro Ohno

Inventor： Yuqin Zong ,  Steven W. Brown ,  Keith R. Lykke ,  Yoshihiro Ohno

IPC: G02B3/08 ,  G06K9/36 ,  G06F7/32 ,  G01R35/00

CPC classification number: G02B27/0018 ,  G01J1/08 ,  G01J1/4228 ,  G01J3/28 ,  H04N5/217 ,  H04N5/23229 ,  H04N17/002

Abstract: A simple matrix method and computer program product for stray-light correction in imaging instruments is provided. The stray-light correction method includes receiving raw signals from an imaging instrument and characterizing the imaging instrument for a set of point spread functions. For high resolution imaging instruments, the raw signals may be compressed to reduce the size of the correction matrix. Based on stray-light distribution functions derived from the point spread functions, a correction matrix is derived. This fast correction is performed by a matrix multiplication to the measured raw signals, and may reduce stray-light errors by more than one order of magnitude. Using the stray-light corrected instrument, significant reductions may be made in overall measurement uncertainties in radiometry, colorimetry, photometry and other applications. Because the PSFs may include other types of undesired responses, the stray-light correction also eliminates other types of errors, e.g., interreflection between a CCD and the detector window.

Abstract translation: 提供了一种用于成像仪器中的杂散光校正的简单矩阵方法和计算机程序产品。 杂散光校正方法包括从成像仪器接收原始信号并表征一组点扩散函数的成像仪器。 对于高分辨率成像仪器，可以压缩原始信号以减小校正矩阵的大小。 基于从点扩散函数导出的散射光分布函数，导出校正矩阵。 这种快速校正通过与所测量的原始信号的矩阵乘法来执行，并且可以将杂散光误差减少超过一个数量级。 使用杂散光校正仪器，可以在辐射测量，比色法，光度测定和其他应用中的总体测量不确定度方面显着降低。 因为PSF可能包括其他类型的不期望的响应，所以杂散光校正也消除了其它类型的错误，例如CCD和检测器窗口之间的相互反射。

公开(公告)号：US20090051910A1

公开(公告)日：2009-02-26

申请号：US12229171

申请日：2008-08-20

Applicant: Kenji Imura

Inventor： Kenji Imura

IPC: G01J3/02

CPC classification number: G01J3/10 ,  G01J3/0254 ,  G01J3/28 ,  G01J2003/104 ,  G01J2003/2866

Abstract: In a calibration reference light source and a sensitivity calibration system using the same, a plurality of single-wavelength light sources for emitting reference lights having mutually different single-wavelengths are used instead of a black body radiation source for radiating a white light, and not only the intensities of the single-wavelength reference lights, but also the wavelengths thereof are measured to obtain sensitivity correction coefficients of intensity-to-radiance conversion data. Thus, obtained reference radiance are highly reliable and sensitivity correction of spectrophotometers and spectral illuminometers can be performed with high accuracy and reliability at a user side, whereby the calibration reference light source and the calibration system using the same can be obtained at low cost.

Abstract translation: 在校准基准光源和使用其的灵敏度校准系统中，使用用于发射具有相互不同的单一波长的参考光的多个单波长光源代替用于发射白光的黑体辐射源，而不是 仅测量单波长参考光的强度，还测量其波长，以获得强度到辐射转换数据的灵敏度校正系数。 因此，获得的基准亮度高度可靠，并且可以在用户侧以高精度和可靠性执行分光光度计和光谱照度计的灵敏度校正，由此可以以低成本获得校准参考光源和使用其的校准系统。

公开(公告)号：US07492454B2

公开(公告)日：2009-02-17

申请号：US10530608

申请日：2003-10-07

Applicant: Jean-Charles Hubinois ,  Vincent Lavoine ,  Hervé Chollet

Inventor： Jean-Charles Hubinois ,  Vincent Lavoine ,  Hervé Chollet

IPC: G02B17/06 ,  G01J3/28

CPC classification number: G01J3/28 ,  G01J3/0208 ,  G01J3/024

Abstract: This system collects light emitted by at least one light source (52) and focuses it onto at least one light detection device (54). Preferably, it comprises a first mirror (58) that collects light emitted by the source and focuses it on a second mirror (60) that focuses it in turn onto the device. The system is provided with a chamber that is opaque to all light, particularly ultraviolet radiation, and in which the light source, the light detection device and the mirrors are placed, and means of creating a vacuum in this chamber and filling it with a gas that is transparent to ultraviolet radiation.

Abstract translation: 该系统收集由至少一个光源（52）发射的光并将其聚焦到至少一个光检测装置（54）上。 优选地，其包括第一反射镜（58），其收集由源发射的光并将其聚焦在第二反射镜（60）上，所述第二反射镜将其依次聚焦到所述装置上。 该系统设置有对所有光，特别是紫外线辐射是不透明的室，其中放置有光源，光检测装置和反射镜，以及在该室中产生真空并用气体填充的装置 对紫外线辐射是透明的。

公开(公告)号：US07492453B2

公开(公告)日：2009-02-17

申请号：US11861184

申请日：2007-09-25

Applicant: Paul E. Denney ,  Jay R. Eastman ,  Ta-Chieh Huang

Inventor： Paul E. Denney ,  Jay R. Eastman ,  Ta-Chieh Huang

IPC: G01J3/18 ,  G01J3/30 ,  G01N21/63

CPC classification number: B23K26/032 ,  B23K26/03 ,  B23K26/034 ,  B23K26/043 ,  B23K26/12 ,  B23K26/123 ,  B23K26/128 ,  B23K26/142 ,  B23K26/16 ,  G01J3/02 ,  G01J3/0218 ,  G01J3/0291 ,  G01J3/28

Abstract: A system and method processes a structure comprising embedded material. The system includes a laser adapted to generate light and to irradiate an interaction region of the structure. The system further includes an optical system adapted to receive light from the interaction region and to generate a detection signal indicative of the presence of embedded material in the interaction region. The system further includes a controller operatively coupled to the laser and the optical system. The controller is adapted to receive the detection signal and to be responsive to the detection signal by selectively adjusting the laser.

Abstract translation: 系统和方法处理包括嵌入材料的结构。 该系统包括适于产生光并照射结构的相互作用区域的激光器。 该系统还包括适于接收来自相互作用区域的光并且产生指示在相互作用区域中存在嵌入材料的检测信号的光学系统。 该系统还包括可操作地耦合到激光器和光学系统的控制器。 控制器适于接收检测信号，并通过选择性调节激光来响应检测信号。

公开(公告)号：US20090021732A1

公开(公告)日：2009-01-22

申请号：US12173092

申请日：2008-07-15

Applicant: Boris Kolodin ,  Emil Radkov ,  Mark J. Mayer

Inventor： Boris Kolodin ,  Emil Radkov ,  Mark J. Mayer

IPC: G01J3/28

CPC classification number: G01J3/02 ,  G01J1/0242 ,  G01J3/0202 ,  G01J3/0218 ,  G01J3/28 ,  G01J3/504 ,  G01J2001/4247

Abstract: Optical test apparatuses and methods, and related subject matter, are disclosed herein.

Abstract translation: 本文公开了光学测试装置和方法以及相关主题。

公开(公告)号：US20090021731A1

公开(公告)日：2009-01-22

申请号：US11861193

申请日：2007-09-25

Applicant: Paul E. Denney ,  Jay R. Eastman ,  Ta-Chieh Huang

Inventor： Paul E. Denney ,  Jay R. Eastman ,  Ta-Chieh Huang

IPC: G01J3/18 ,  G01J3/30 ,  G01N21/63

CPC classification number: B23K26/032 ,  B23K26/03 ,  B23K26/034 ,  B23K26/043 ,  B23K26/12 ,  B23K26/123 ,  B23K26/128 ,  B23K26/142 ,  B23K26/16 ,  G01J3/02 ,  G01J3/0218 ,  G01J3/0291 ,  G01J3/28

Abstract: A detection system is used during irradiation of an interaction region of a structure with laser light. The structure includes embedded material. The detection system includes means for receiving light emitted from the interaction region. The detection system further includes means for separating the received light into a spectrum of wavelengths. The detection system further includes means for analyzing at least a portion of the spectrum for indications of embedded material within the interaction region.

Abstract translation: 在具有激光的结构的相互作用区域的照射期间使用检测系统。 该结构包括嵌入材料。 检测系统包括用于接收从交互区域发射的光的装置。 检测系统还包括用于将接收的光分离成波长范围的装置。 检测系统还包括用于分析光谱的至少一部分以用于交互区域内的嵌入材料的指示的装置。

公开(公告)号：US20090015829A1

公开(公告)日：2009-01-15

申请号：US11418107

申请日：2006-05-05

Applicant: Jeromy P. Rezac ,  Thomas H. Chyba

Inventor： Jeromy P. Rezac ,  Thomas H. Chyba

IPC: G01J3/44 ,  G01N21/65

CPC classification number: G01N21/65 ,  G01J3/28 ,  G01J3/4412 ,  G01N21/274

Abstract: A method is provided for calibrating a spectrometer device used for Raman scattering analysis. A predetermined dispersion curve for a diffraction grating or spectrograph of the spectrometer device is modified based on spectrum data associated with detected dispersed light from a calibration light source to produce a modified dispersion curve. The wavelength of a Raman light source on a light detection device is determined. Calibration data for the spectrometer device is computed from the Raman line peak positions for the first chemical, the wavelength on the detection device of the Raman light source and the modified dispersion curve.

Abstract translation: 提供了一种用于校准用于拉曼散射分析的光谱仪装置的方法。 基于与来自校准光源的检测到的散射光相关联的光谱数据来修改用于衍射光栅或光谱仪装置的光谱仪的预定色散曲线，以产生修改的色散曲线。 确定光检测装置上的拉曼光源的波长。 用于第一化学品的拉曼线峰值位置，拉曼光源检测装置上的波长和改进的色散曲线计算光谱仪器件的校准数据。

公开(公告)号：US20090014635A1

公开(公告)日：2009-01-15

申请号：US12159887

申请日：2006-11-27

Applicant: Lutz Neitsch

Inventor： Lutz Neitsch

IPC: G01D18/00

CPC classification number: G01J3/28 ,  G01J3/443 ,  G01N21/73

Abstract: The present invention relates to a method for correcting spectral interference in a spectrum which is determined using an inductively coupled plasma spectrometer (ICP) for analysing element contents of a liquid or gaseous sample, comprising the following steps: recording the spectrum of a matrix solution containing all spectrally interfering components, which are also contained in the sample, in a first concentration; recording the spectrum of the matrix solution in at least one dilution of the first concentration; regressing the signal intensities obtained in steps a. and b. against the concentration for a number of wavelength positions; calibrating the spectrometer, background correction using the values determined from the regression in step c. and determining the calibration function c=f(I); recording the sample spectrum using at least one analyte which is contained therein; determining the concentration of the spectrally interfering components in the sample using the results obtained in step c. for wavelength positions at which no line of the analyte of the sample is present; and determining the sample signal which is characteristic of the analyte concentration by forming the difference between the spectrum from step e. and the calculated matrix spectrum in a dilution which was calculated in step f., wherein the calibration function c=f(I) is used.

Abstract translation: 本发明涉及一种校正光谱干涉的方法，该方法使用用于分析液体或气体样品的元素含量的电感耦合等离子体光谱仪（ICP）确定，包括以下步骤：记录含有 所有光谱干扰组分，其也包含在样品中，以第一浓度; 将所述基质溶液的光谱记录在所述第一浓度的至少一个稀释度中; 回归步骤a中获得的信号强度。 和b。 反对多个波长位置的浓度; 使用从步骤c中的回归确定的值校准光谱仪，进行背景校正。 并确定校准函数c = f（I）; 使用其中包含的至少一种分析物记录样品光谱; 使用步骤c中获得的结果确定样品中光谱干扰组分的浓度。 对于不存在样品分析物线的波长位置; 以及通过形成来自步骤e的光谱之间的差异来确定分析物浓度的特征的样品信号。 以及在步骤f。中计算的稀释中计算的矩阵光谱，其中使用校准函数c = f（I）。