Abstract:
The spectrometer 1 is provided with a package 2 in which a light guiding portion 7 is provided, a spectroscopic module 3 accommodated inside the package 2, and a support member 29 arranged on an inner wall plane of the package 2 to support the spectroscopic module 3. The spectroscopic module 3 is provided with a body portion 11 for transmitting light made incident from the light guiding portion 7 and a spectroscopic portion 13 for dispersing light passed through the body portion 11 on a predetermined plane of the body portion 11, and the spectroscopic portion 13 is supported by the support member 29 on the predetermined plane in a state of being spaced away from the inner wall plane.
Abstract:
In a spectroscopy module 1, a light passing hole 50 through which a light L1 advancing to a spectroscopic portion 4 passes is formed in a light detecting element 5. Therefore, it is possible to prevent the relative positional relationship between the light passing hole 50 and a light detecting portion 5a of the light detecting element 5 from deviating. Moreover, the light detecting element 5 is bonded to a front plane 2a of a substrate 2 with an optical resin adhesive 63. Thus, it is possible to reduce a stress generated onto the light detecting element 5 due to a thermal expansion difference between the light detecting element 5 and the substrate 2. Additionally, on the light detecting element 5, a first pool portion 101 is formed so as to be located at least between the light detecting portion 5a and the light passing hole 50 when viewed from a direction substantially perpendicular to the front plane 2a. Thus, when the light detecting element 5 is attached to the substrate 2 via the optical resin adhesive 63, the optical resin adhesive 63 is pooled to remain at the first pool portion 101. Thus, the optical resin adhesive 63 is prevented from penetrating into the light passing hole 50.
Abstract:
Automated systems and methods for characterizing light-emitting devices as a function of the electrical and temperature properties of the device are disclosed. The system includes a thermal stack assembly operatively connected to a temperature control system and that operably supports and controls the temperature of the light-emitting device. A power supply provides varying amounts of electrical power to the light-emitting device. A control computer controls the power supply and the temperature control system based on a user-defined electrical and temperature profiles. A light processor optically analyzes light from the light-emitting device as its electrical and temperature properties are varied. The control computer receives and processes electrical signals from the light processor and outputs one or more optical characterizations as a function of electrical and temperature properties of the light-emitting device.
Abstract:
A spectrometer includes: a lighting device (LSRC) configured to generate a light beam covering a wavelength band, a probe configured so that the light beam coming from the lighting device interacts with a fluid to be analyzed, and a spectrum analyzing device configured to receive the light beam after it has interacted with the fluid to be analyzed, and to provide light intensity measurements for various ranges of wavelengths. The lighting device includes several light-emitting components (1a-1c) emitting light in various ranges of wavelengths, and a mixing optical component (3) fixed onto the emitting surface of the light-emitting components (1a-1g), to combine the light flows emitted by the light-emitting components into a resulting light beam covering the wavelength band, and guide the resulting light flow to the probe.
Abstract:
An apparatus and method are provided. In particular, at least one first electro-magnetic radiation may be provided to a sample and at least one second electro-magnetic radiation can be provided to a non-reflective reference. A frequency of the first and/or second radiations varies over time. An interference is detected between at least one third radiation associated with the first radiation and at least one fourth radiation associated with the second radiation. Alternatively, the first electro-magnetic radiation and/or second electro-magnetic radiation have a spectrum which changes over time. The spectrum may contain multiple frequencies at a particular time. In addition, it is possible to detect the interference signal between the third radiation and the fourth radiation in a first polarization state. Further, it may be preferable to detect a further interference signal between the third and fourth radiations in a second polarization state which is different from the first polarization state. The first and/or second electro-magnetic radiations may have a spectrum whose mean frequency changes substantially continuously over time at a tuning speed that is greater than 100 Tera Hertz per millisecond.
Abstract:
Optical characteristic measuring systems and methods such as for determining the color or other optical characteristics of teeth are disclosed. Perimeter receiver fiber optics are spaced apart from a source fiber optic and receive light from the surface of the object/tooth being measured. Light from the perimeter fiber optics pass to a variety of filters. The system utilizes the perimeter receiver fiber optics to determine information regarding the height and angle of the probe with respect to the object/tooth being measured. Under processor control, the optical characteristics measurement may be made at a predetermined height and angle. Various color spectral photometer arrangements are disclosed. Translucency, fluorescence, gloss and/or surface texture data also may be obtained. Audio feedback may be provided to guide operator use of the system. The probe may have a removable or shielded tip for contamination prevention. A method of producing dental prostheses based on measured data also is disclosed. Measured data also may be stored and/or organized as part of a patient data base.
Abstract:
The present invention provides a highly reliable spectral module. The spectral module (1) of the present invention comprises a substrate (2) for transmitting therethrough light incident on one surface (2a); a lens unit (3), having an entrance surface (3a) opposing the other surface (2b) of the substrate (2), for transmitting therethrough the light entering from the entrance surface (3a) after passing through the substrate (2); a spectroscopic unit (4), formed with the lens unit (3), for spectrally resolving and reflecting the light having entered the lens unit (3); a photodetector (4) for detecting the light reflected by the spectroscopic unit (4); and a support unit (8), disposed between the other surface (2b) and the entrance surface (3a), for supporting the lens unit (3) against the substrate (2). Since the support unit (8) forms a gap between the other surface (2b) and the entrance surface (3a) in the spectral module (1), the other surface (2b) and the entrance surface (3a) are prevented from coming into contact with each other and causing damages, whereby the spectral module (1) can improve its reliability.
Abstract:
Method and apparatus for analyzing radiation using analyzers and encoders employing the spatial modulation of radiation dispersed by wavelength or imaged along a line.
Abstract:
The present invention relates to a bispectral detection device, particularly of an infrared radiation and a visible radiation, including a monolithic substrate; an array of bolometric micro-bridges sensitive to infrared radiation, the bolometric micro-bridges being suspended over a first face of the substrate by means of support and connection arms; and an array of photoelectric elements fowled in the substrate, and sensitive to visible radiation, the bolometric micro-bridges and the photoelectric elements being stacked. According to the invention, the substrate portion between the photoelectric element array and a second face of the substrate, opposite to the first face thereof, is thinned so that the photoelectric elements are capable of detecting a visible radiation incident on the second face.
Abstract:
A method for passive background correction during spatially or angularly resolved detection of emission that is based on the simultaneous acquisition of both the passive background spectrum and the spectrum of the target of interest.