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    ACTIVE HYPERSPECTRAL IMAGING SYSTEM
    34.
    发明申请
    ACTIVE HYPERSPECTRAL IMAGING SYSTEM 审中-公开

    公开(公告)号：US20170205344A1

    公开(公告)日：2017-07-20

    申请号：US14997300

    申请日：2016-01-15

    Applicant: The MITRE Corporation

    Inventor： Kevin GEMP ,  Ariel SCHLAMM ,  Christopher MILLER ,  Shannon JORDAN ,  Marin HALPER ,  Brent BARTLETT

    IPC: G01N21/55 ,  G01N21/27

    CPC classification number: G01N21/55 ,  G01N21/27 ,  G01N2201/0612 ,  G01N2201/0621

    Abstract: A system for generating reflectance values for a target that includes a plurality of electromagnetic radiation sources for irradiating the target, an imager for generating a plurality of digital representations of the target that includes an array of filter elements for filtering electromagnetic radiation reflected by the target through an array of filter elements, and a detector for detecting the filtered electromagnetic radiation at an array of detection elements. The system includes processors for determining a set of reflectance values for a portion of the target based on a first digital representation of the target generated in response to irradiation of the target with radiation of a first wavelength band and a second digital representation of the target generated in response to irradiation of the target with radiation of a second wavelength band.

    SPECTROSCOPIC ANALYSER
    35.
    发明申请
    SPECTROSCOPIC ANALYSER 审中-公开

    公开(公告)号：US20170184494A1

    公开(公告)日：2017-06-29

    申请号：US15377914

    申请日：2016-12-13

    Applicant: Klein Medical Limited

    Inventor： Donal Paul Krouse ,  Raymond Andrew Simpkin ,  Bryan James Smith

    IPC: G01N21/3577 ,  G01N21/359

    CPC classification number: G01N21/3577 ,  G01J3/10 ,  G01J3/28 ,  G01J3/42 ,  G01J2003/1286 ,  G01N21/359 ,  G01N21/84 ,  G01N2021/3595 ,  G01N2201/0612 ,  G01N2201/0691

    Abstract: An analyser 10 for identifying or verifying or otherwise characterising a liquid based drug sample 16 comprising: an electromagnetic radiation source 11 for emitting electromagnetic radiation 14a in at least one beam at a sample 16, the electromagnetic radiation comprising at least two different wavelengths, a sample detector 17 that detects affected electromagnetic radiation resulting from the emitted electromagnetic radiation affected by the sample, and a processor 18 for identifying or verifying the sample from the detected affected electromagnetic radiation, wherein each wavelength or at least two of the wavelengths is between substantially 1300 nm and 2000 nm, and each wavelength or at least two of the wavelengths is in the vicinity of the wavelength(s) of (or within a region spanning) a spectral characteristic in the liquid spectrum between substantially 1300 nm and 2000 nm.

    Heatable gas analysis device
    36.
    发明授权
    Heatable gas analysis device 有权

    公开(公告)号：US09689851B2

    公开(公告)日：2017-06-27

    申请号：US14391043

    申请日：2013-03-26

    Applicant: Siemens Aktiengesellschaft

    Inventor： Peter Krause

    IPC: G01K3/00 ,  G01N33/00 ,  G01N30/30 ,  G01N30/54 ,  G01K3/10

    CPC classification number: G01N33/0016 ,  G01K3/10 ,  G01N30/30 ,  G01N30/54 ,  G01N2030/3076 ,  G01N2201/0612

    Abstract: A heatable gas analysis device which is monitored in a simply way, wherein a gas analysis device contains a monitoring unit which, after the device is switched on and until a predefined operating temperature is reached, generates a two-dimensional temperature profile from temperature progressions measured at different measuring points within the device, in which temperature profile one dimension indicates time and another dimension indicates the different measuring points, where the monitoring unit compares the temperature profile to a reference temperature profile generated and stored under reference conditions and, in the event of any deviation exceeding a predefined amount, generates an error message.

    Apparatus and methods for concentration determination using polarized light
    38.
    发明授权
    Apparatus and methods for concentration determination using polarized light 有权

    公开(公告)号：US09677997B2

    公开(公告)日：2017-06-13

    申请号：US15095724

    申请日：2016-04-11

    Applicant: DEKA Products Limited Partnership

    Inventor： Jacob W. Scarpaci ,  Jason M. Sachs ,  Simon C. Helmore

    IPC: G01J4/04 ,  G01N21/21 ,  G01N21/90 ,  A61M1/14

    CPC classification number: G01N21/21 ,  A61M1/14 ,  G01J4/04 ,  G01N21/90 ,  G01N2201/0612 ,  G01N2201/0683

    Abstract: Methods and apparatus for concentration determination using polarized light. The apparatus includes a first polarized light source having a first light source polarization axis and a second polarized light source having a second light source polarization axis generally perpendicular to the first light source polarization axis. Also, a first polarized light receiver having a first polarized light receiver polarization axis and configured to measure an intensity of light transmitted from the first light receiver polarizer and a second polarized light receiver having a second polarized light receiver polarization axis substantially perpendicular to the first light receiver polarization axis and configured to measure an intensity of light transmitted from the second light receiver polarizer, wherein the first and second light receiver polarization axes are generally +/−45 degrees relative to the first and second light source polarization axes.

    MACHINE FOR DETECTING TINY PARTICLES
    39.
    发明申请
    MACHINE FOR DETECTING TINY PARTICLES 审中-公开

    公开(公告)号：US20170160207A1

    公开(公告)日：2017-06-08

    申请号：US14960349

    申请日：2015-12-05

    Applicant: Ming-Sheng Chen

    Inventor： Ming-Sheng Chen

    IPC: G01N21/94 ,  G01N21/958 ,  G01N21/95

    CPC classification number: G01N21/94 ,  G01N21/9501 ,  G01N21/958 ,  G01N2201/0612 ,  G01N2201/105 ,  G01N2201/12

    Abstract: A machine for inspecting a face of a transparent plate includes a frame, a carrier module, an optical module and at least two illumination modules. The frame includes an X-axis. The carrier module is adapted for carrying a transparent plate in need of inspection on the frame along the X-axis. The optical module is located on the frame and movable relative to the carrier module and includes at least one detector adapted for rectilinear scanning along a Y-axis perpendicularly intersecting the X-axis of the carrier module at a crossing point. The illumination modules are located on two opposite sides of the X-axis of the frame. Each of the illumination modules includes a laser emitter. The laser emitters are located at a same distance from the crossing point and adapted for emitting rays on the transparent plate at a same angle of 0.5° to 6°.

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