公开(公告)号：US09383321B2

公开(公告)日：2016-07-05

申请号：US14465435

申请日：2014-08-21

Applicant: DAINIPPON SCREEN MFG. CO., LTD. ,  OSAKA UNIVERSITY

Inventor： Hidetoshi Nakanishi ,  Akira Ito ,  Iwao Kawayama ,  Masayoshi Tonouchi

IPC: G01N21/64

CPC classification number: G01N21/6489 ,  G01N21/6456 ,  G01N2021/6417 ,  G01N2201/10

Abstract: An inspection apparatus is an apparatus for inspecting a solar cell panel. The inspection apparatus includes: an excitation light irradiation part for irradiating the solar cell panel with pulsed light for causing the solar cell panel to radiate an electromagnetic wave pulse; a detection part for detecting the electromagnetic wave pulse radiated from the solar cell panel in response to irradiation with the pulsed light; and a temperature changing part for changing a temperature of the solar cell panel at a part irradiated with the pulsed light.

Abstract translation: 检查装置是用于检查太阳能电池面板的装置。 所述检查装置包括：激发光照射部，其对所述太阳能电池面板照射脉冲光，使所述太阳能电池面板照射电磁波脉冲; 检测部，其响应于所述脉冲光的照射，检测从所述太阳能电池面板辐射的电磁波脉冲; 以及温度变化部，用于改变在被脉冲光照射的部分处的太阳能电池面板的温度。

公开(公告)号：US09354182B2

公开(公告)日：2016-05-31

申请号：US13777053

申请日：2013-02-26

Applicant: STERIS Inc. ,  INSTITUT NATIONAL D'OPTIQUE / NATIONAL OPTICS INSTITUTE

Inventor： Daniel Rochette ,  Pascal Gallant ,  Ozge Mermut ,  Francois Baribeau ,  Isabelle Noiseux ,  Isabelle Gosselin

IPC: G01N21/76 ,  G01N21/94 ,  G01N21/64 ,  A61L2/28

CPC classification number: G01N21/6428 ,  A61L2/28 ,  A61L2202/24 ,  G01N21/6486 ,  G01N21/94 ,  G01N2021/6417 ,  G01N2021/6439 ,  G01N2201/06113 ,  G01N2201/068 ,  G01N2201/0697 ,  G01N2201/10 ,  G01N2201/105

Abstract: A method and apparatus for optical detection of residual soil on articles (such as medical instruments and equipment), after completion of a washing or a rinsing operation by a washer. A soil detection system provides an indication of soil on the articles by detecting luminescent radiation emanating from the soil in the presence of ambient light.

Abstract translation: 在清洗完成洗涤或冲洗操作之后，用于光学检测物品（例如医疗仪器和设备）上残留土壤的方法和装置。 土壤检测系统通过在环境光的存在下检测从土壤发出的发光辐射来提供物品上的土壤的指示。

公开(公告)号：US09335276B2

公开(公告)日：2016-05-10

申请号：US14195656

申请日：2014-03-03

Applicant: Coherent LaserSystems GmbH & Co. KG

Inventor： Paul Van Der Wilt

IPC: H01L21/268 ,  G01N21/95 ,  H01L21/66 ,  G01N21/84 ,  G01N21/88 ,  G02B21/00 ,  G01N21/47 ,  H01L21/02

CPC classification number: H01L21/67253 ,  C30B1/02 ,  C30B29/06 ,  G01N21/21 ,  G01N21/4788 ,  G01N21/8422 ,  G01N21/8851 ,  G01N21/9501 ,  G01N2021/8461 ,  G01N2021/8477 ,  G01N2201/06113 ,  G01N2201/068 ,  G01N2201/0683 ,  G01N2201/0697 ,  G01N2201/10 ,  G01N2201/105 ,  G02B21/002 ,  G02B21/0092 ,  H01L21/02532 ,  H01L21/02686 ,  H01L21/268 ,  H01L22/12

Abstract: A method is disclosed evaluating a silicon layer crystallized by irradiation with pulses form an excimer-laser. The crystallization produces periodic features on the crystallized layer dependent on the number of and energy density ED in the pulses to which the layer has been exposed. An area of the layer is illuminated with light. A microscope image of the illuminated area is made from light diffracted from the illuminated are by the periodic features. The microscope image includes corresponding periodic features. The ED is determined from a measure of the contrast of the periodic features in the microscope image.

Abstract translation: 公开了评估通过用脉冲照射形成准分子激光而结晶的硅层的方法。 结晶层上产生周期性特征，取决于层暴露于的脉冲中的数量和能量密度ED。 该层的一个区域用光照亮。 照明区域的显微镜图像由从被照明的周期特征衍射的光制成。 显微镜图像包括相应的周期特征。 ED是从显微镜图像中的周期特征的对比度的量度确定的。

公开(公告)号：US09292630B1

公开(公告)日：2016-03-22

申请号：US14496840

申请日：2014-09-25

Applicant: STATE FARM MUTUAL AUTOMOBILE INSURANCE COMPANY

Inventor： James M. Freeman ,  Roger D. Schmidgall ,  Patrick Harold Boyer ,  Nicholas U. Christopulos ,  Jonathan D. Maurer ,  Nathan L. Tofte ,  Jackie O. Jordan, II

IPC: G06F17/50

CPC classification number: G06T17/20 ,  G01N21/64 ,  G01N21/8851 ,  G01N22/02 ,  G01N2201/06113 ,  G01N2201/10 ,  G01S7/4817 ,  G01S13/89 ,  G01S15/89 ,  G01S17/023 ,  G01S17/89 ,  G06F17/5004 ,  G06Q30/0278 ,  G06Q30/0283 ,  G06Q40/08 ,  G06Q50/16 ,  G06Q50/163 ,  G06T1/0007 ,  G06T7/0002 ,  G06T2200/08 ,  G06T2207/10028 ,  G06T2207/10032 ,  H04N7/185 ,  H04N13/106 ,  H04N13/254 ,  H04N13/271 ,  H04N13/275 ,  H04R23/008

Abstract: In a computer-implemented method and system for capturing the condition of a structure, the structure is scanned with a three-dimensional (3D) scanner. The 3D scanner generates 3D data. A point cloud or 3D model is constructed from the 3D data. The point cloud or 3D model is then analyzed to determine the condition of the structure.

Abstract translation: 在用于捕获结构状况的计算机实现的方法和系统中，用三维（3D）扫描仪扫描结构。 3D扫描仪生成3D数据。 从3D数据构建点云或3D模型。 然后分析点云或3D模型以确定结构的状况。

公开(公告)号：US09255892B2

公开(公告)日：2016-02-09

申请号：US14825765

申请日：2015-08-13

Applicant: ASML Netherlands B.V.

Inventor： Marcus Adrianus Van De Kerkhof ,  Maurits Van Der Schaar ,  Hendrik Jan Hidde Smilde

IPC: G01B11/00 ,  G01B11/14 ,  G03B27/32 ,  H01L23/544 ,  G01N21/95 ,  G03F7/20 ,  G01N21/47 ,  G02B5/18 ,  G03F9/00

CPC classification number: G01N21/9501 ,  G01N21/4738 ,  G01N2201/06113 ,  G01N2201/10 ,  G02B5/1823 ,  G02B5/1861 ,  G03F7/70058 ,  G03F7/70633 ,  G03F7/70683 ,  G03F9/70 ,  G03F9/7046 ,  G03F9/7076 ,  H01L23/544 ,  H01L2924/0002 ,  Y10T428/24612 ,  H01L2924/00

Abstract: A second set of superimposed gratings are superposed over a first set of superimposed gratings. The second set of gratings have a different periodicity from the first set of gratings or a different orientation. Consequently the first order diffraction pattern from the second set of superimposed gratings can be distinguished from the first order diffraction pattern from the first set of superimposed gratings.

Abstract translation: 第二组叠加的光栅叠加在第一组叠加的光栅上。 第二组光栅具有与第一组光栅不同的周期性或不同的取向。 因此，来自第二组叠加光栅的一阶衍射图可以与来自第一组叠加光栅的一阶衍射图案区分开。

公开(公告)号：US20160018318A1

公开(公告)日：2016-01-21

申请号：US14332426

申请日：2014-07-16

Applicant: International Business Machines Corporation

Inventor： Gabriel P. Borges ,  Claude Falbriard ,  Grant D. Miller ,  Nader M. Nassar

IPC: G01N21/23 ,  G01N21/27

CPC classification number: G01N21/25 ,  G01J3/46 ,  G01J2003/466 ,  G01N21/21 ,  G01N21/23 ,  G01N21/55 ,  G01N2201/10 ,  G01N2201/12

Abstract: Polarized light characteristics are detected and mapped to an application, such as product identification. A process of reflecting a directed light emission through a polarizing filter, and sensing the processed light emission having particular characteristics is provided. The characteristics of the sensed light emission is associated with a “color code” that is cross-referenced within a database of color codes.

Abstract translation: 检测到偏振光特性并映射到应用程序，如产品标识。 提供了通过偏振滤光器反射定向光发射并感测具有特定特征的经处理的光发射的过程。 感测光发射的特征与在颜色代码的数据库内被交叉引用的“颜色代码”相关联。

公开(公告)号：US20150369748A1

公开(公告)日：2015-12-24

申请号：US14548997

申请日：2014-11-20

Applicant: BOE TECHNOLOGY GROUP CO., LTD. ,  BEIJING BOE DISPLAY TECHNOLOGY CO., LTD.

Inventor： Shoukun WANG ,  Huibin GUO ,  Yuchun FENG ,  Liangliang LI ,  Xiaoxiang ZHANG ,  Zongjie GUO

IPC: G01N21/84

CPC classification number: G01N21/8422 ,  G01B11/00 ,  G01B11/14 ,  G01B11/24 ,  G01N21/8851 ,  G01N2201/10

Abstract: The present invention provides a film edge detecting method and a film edge detecting device. The film edge detecting method is used for detecting a film edge of a film layer formed on a substrate, the film layer comprises a patterned film layer, the method includes: forming at least one scale pattern in the patterned film layer, a film edge of the patterned film layer corresponding to an edge of the scale pattern; obtaining a patterned film edge indication value of the edge of the scale pattern; and obtaining a second distance, which is a distance between the film edge of the non-patterned film layer and a corresponding edge of the substrate, based on the non-patterned film edge indication value and a preset reference value of the corresponding edge of the substrate.

Abstract translation: 本发明提供一种胶片边缘检测方法和胶片边缘检测装置。 膜边缘检测方法用于检测在基板上形成的膜层的膜边缘，该膜层包括图案化膜层，该方法包括：在图案化膜层中形成至少一个标尺图案， 所述图案化膜层对应于所述标尺图案的边缘; 获得刻度图案的边缘的图案化胶片边缘指示值; 并且基于未图案化的膜边缘指示值和相对于所述基板的相应边缘的预设参考值，获得作为所述非图案化膜层的膜边缘与所述基板的相应边缘之间的距离的第二距离 基质。

公开(公告)号：US20150355094A1

公开(公告)日：2015-12-10

申请号：US14829983

申请日：2015-08-19

Applicant: OLYMPUS CORPORATION

Inventor： Hiroya FUKUYAMA

IPC: G01N21/64

CPC classification number: G01N21/6456 ,  G01N2201/10 ,  G01N2201/121 ,  G02B21/06 ,  G02B21/365

Abstract: A high-resolution fluorescence image in which an afterimage is suppressed is obtained, even when a fluorescence detection interval is shortened. Provided is a scanning observation apparatus including a scanning unit that spatially scans pulsed excitation light emitted from a light source at prescribed time intervals on a specimen; a fluorescence detecting unit that detects fluorescence generated by exciting a fluorescent substance inside the specimen with the excitation light scanned by the scanning unit, in synchronization with the emission of the excitation light; and a fluorescence correcting unit that subtracts, from a fluorescence intensity detected by the fluorescence detecting unit, an afterimage fluorescence component calculated on the basis of time-sequential fluorescence detected by the fluorescence detecting unit prior thereto, at each scanning position, to correct the fluorescence intensity at the scanning position.

Abstract translation: 即使在荧光检测间隔缩短的情况下也能够得到抑制残像的高分辨率的荧光图像。 本发明提供一种扫描观察装置，其具备：扫描单元，其以规定的时间间隔在样本上空间扫描从光源发出的脉冲激发光; 荧光检测单元，其与通过所述激发光的发射同步地检测利用所述扫描单元扫描的激发光来激发所述样本内的荧光物质而产生的荧光; 以及荧光校正单元，从荧光检测单元检测出的荧光强度，在每个扫描位置根据荧光检测单元检测到的时间序列荧光计算的余像荧光成分，从而校正荧光 在扫描位置的强度。

公开(公告)号：US09200885B2

公开(公告)日：2015-12-01

申请号：US14561425

申请日：2014-12-05

Applicant: AGILENT TECHNOLOGIES, INC.

Inventor： Gregg Ressler ,  Jeffrey H. Saller

IPC: G01B9/02 ,  G01N21/35 ,  G01J3/06 ,  G01J3/453 ,  G02B7/182 ,  G01J3/45

CPC classification number: G01B9/02 ,  G01B9/02015 ,  G01J3/06 ,  G01J3/45 ,  G01J3/4535 ,  G01J2003/061 ,  G01N21/35 ,  G01N2021/3595 ,  G01N2201/061 ,  G01N2201/10 ,  G02B7/182

Abstract: An interferometer includes a first assembly having a base, a beam splitter assembly to split light into first and second portions, and a fixed mirror for reflecting the first portion of light; and a second assembly movable with respect to the first assembly, and having first and second scan carriages, and a movable mirror connected to the second scan carriage for reflecting the second portion of light. The beam splitter assembly combines the reflected first and second portions of light into a recombined radiation beam. Inner bearing flexures enable movement of the first scan carriage relative to the base, and outer bearing flexures enable movement of the second scan carriage relative to the first scan carriage, such that a plane containing the movable mirror is maintained parallel to multiple planes containing the movable mirror at respective distances between the second and first assemblies during scan movement of the movable mirror.

Abstract translation: 干涉仪包括具有底座的第一组件，将光分成第一和第二部分的分束器组件以及用于反射第一部分光的固定镜; 以及第二组件，其可相对于所述第一组件移动，并且具有第一和第二扫描支架，以及连接到所述第二扫描托架的用于反射所述第二部分光的可移动反射镜。 分束器组件将反射的第一和第二部分光合并成复合辐射束。 内部轴承挠曲能够使第一扫描滑架相对于基座移动，而外轴承挠曲使第二扫描滑架相对于第一扫描滑架能够移动，使得包含可移动反射镜的平面保持平行于包含可移动的多个平面的多个平面 在可移动镜的扫描运动期间在第二组件和第一组件之间的相应距离处的镜子。

公开(公告)号：US20150308947A1

公开(公告)日：2015-10-29

申请号：US14647410

申请日：2013-11-27

Applicant: Xiaoji Xu ,  Gilbert C Walker

Inventor： Xiaoji Xu ,  Gilbert C Walker

IPC: G01N21/359 ,  G01Q10/00 ,  G01B9/02

CPC classification number: G01N21/359 ,  B82Y20/00 ,  G01B9/0203 ,  G01N2201/06113 ,  G01N2201/10 ,  G01Q10/00 ,  G01Q30/02 ,  G01Q60/06 ,  G01Q60/22

Abstract: The present disclosure provides a procedure and an apparatus to obtain the absorption profiles of molecular resonance with ANSOM. The method includes setting a reference field phase to φ=0.5π relative to the near-field field, and reference amplitude A≧5|αeff|. The requirement on phase precision is found to be

Abstract translation: 本公开提供了获得与ANSOM的分子共振的吸收曲线的方法和装置。 该方法包括将参考场相位设置为＆phgr。= 0.5＆pgr; 相对于近场场，参考振幅A≥5|αeff|。 相位精度的要求为<0.3＆pgr。 该装置包括除了ANSOM之外的相位稳定机制，以保持小于0.1rad的高相位精度零差相位条件。 该方法使ANSOM能够以纳米级空间分辨率执行振动光谱。