Mass spectrometry for gas analysis with a one-stage charged particle deflector lens between a charged particle source and a charged particle analyzer both offset from a central axis of the deflector lens
    31.
    发明授权
    Mass spectrometry for gas analysis with a one-stage charged particle deflector lens between a charged particle source and a charged particle analyzer both offset from a central axis of the deflector lens 有权
    在带电粒子源和带电粒子分析仪之间的一级带电粒子偏转透镜的气体分析的质谱仪偏离偏转透镜的中心轴线

    公开(公告)号:US08796620B2

    公开(公告)日:2014-08-05

    申请号:US13155890

    申请日:2011-06-08

    CPC classification number: H01J49/061 H01J49/062 H01J49/067

    Abstract: Apparatus, methods and systems are provided to inhibit a sightline from a charged particle source to an analyzer and for changing a baseline offset of an output spectrum of an analyzer. A supply of charged particles is directed through a hollow body of a deflector lens that is positioned relative to a charged particle source and an analyzer. A flow path along a preferred flow path through a deflector lens permits passage of the ions from the source to the detector while inhibiting a sightline from the detector to the source in a direction parallel to the central longitudinal axis of the deflector lens.

    Abstract translation: 提供了装置,方法和系统以阻止从带电粒子源到分析器的视线以及用于改变分析仪的输出光谱的基线偏移。 带电粒子的供应被引导通过相对于带电粒子源和分析器定位的偏转器透镜的空心体。 沿通过偏转器透镜的优选流动路径的流动路径允许离子从源到检测器的通过,同时在与偏转器透镜的中心纵向轴线平行的方向上禁止从检测器到源的视线。

    ION MASS SELECTOR, ION IRRADIATION DEVICE, SURFACE ANALYSIS DEVICE, AND ION MASS SELECTING METHOD
    32.
    发明申请
    ION MASS SELECTOR, ION IRRADIATION DEVICE, SURFACE ANALYSIS DEVICE, AND ION MASS SELECTING METHOD 审中-公开
    离子质量选择器,离子辐照装置,表面分析装置和离子选择方法

    公开(公告)号:US20140138533A1

    公开(公告)日:2014-05-22

    申请号:US14076496

    申请日:2013-11-11

    Inventor: Kota Iwasaki

    Abstract: A time-of-flight mass selector includes a first ion lens for converging ions, a flight tube into which ions which enter from the first ion lens are introduced, the flight tube having equipotential space therein, a second ion lens for converging ions having passed through the flight tube, and a chopper for a gate for pulsing the ions converged by the second ion lens.

    Abstract translation: 飞行时间质量选择器包括用于会聚离子的第一离子透镜,引入从第一离子透镜入射的离子的飞行管,其中具有等电位空间的飞行管,用于会聚已经通过的离子的第二离子透镜 通过飞行管和用于脉冲由第二离子透镜会聚的离子的栅极的斩波器。

    METHOD AND DEVICE FOR INCREASING THE THROUGHPUT IN TIME-OF-FLIGHT MASS SPECTROMETERS
    33.
    发明申请
    METHOD AND DEVICE FOR INCREASING THE THROUGHPUT IN TIME-OF-FLIGHT MASS SPECTROMETERS 审中-公开
    用于在飞行时间质谱仪中增加通量的方法和装置

    公开(公告)号:US20130327935A1

    公开(公告)日:2013-12-12

    申请号:US14001520

    申请日:2012-02-24

    CPC classification number: H01J49/40 H01J49/0031 H01J49/061 H01J49/403

    Abstract: The invention relates to a method for increasing the throughput in time-of-flight mass spectrometers as well as a device for conducting the method.The invention relates to a method for increasing the throughput in time-of-flight mass spectrometers, whereby the individual ion packets 5, which the extractor 2 admits into the drift zone 4, are deflected inside the drift zone by means of deflecting devices 6 disposed in the drift zone for the generation of time-variable electric fields, whereby the measurement of the deflection is such that the site where the deflected ion packet 5 strikes the detector 3 can be assigned by means of the detector 3, and the deflection is detected as additional information together with the flight time by means of the detector 3, whereby for each ion packet 5, the intensity of the electric field is selected such that the intensity of the electric field does not coincide with the one which was selected for the ion packet that was previously admitted from the extractor 2 into the drift zone 4.

    Abstract translation: 本发明涉及一种用于提高飞行时间质谱仪中的吞吐量的方法以及用于进行该方法的装置。 本发明涉及一种用于增加飞行时间质谱仪中的通过量的方法,由此提取器2允许进入漂移区4的各个离子分组5通过设置的偏转装置6在漂移区内偏转 在用于产生时变电场的漂移区中,由此偏转的测量使得偏转的离子束5撞击检测器3的位置可以借助于检测器3来分配,并且检测到偏转 作为附加信息以及通过检测器3的飞行时间,由此对于每个离子包5,选择电场的强度,使得电场的强度与为离子选择的电场强度不一致 先前从提取器2进入漂移区4的包。

    Combination Ion Gate And Modifier
    34.
    发明申请
    Combination Ion Gate And Modifier 有权
    组合离子门和改性剂

    公开(公告)号:US20130299712A1

    公开(公告)日:2013-11-14

    申请号:US13980002

    申请日:2012-01-20

    CPC classification number: H01J49/06 G01N27/622 H01J49/061

    Abstract: A detection device including an ionization region, an ion gate comprising two electrodes, an ion modifier comprising two electrodes, a drift chamber and a collector. The ion gate and ion modifier are combined so the ion gate is one of the ion modifier electrodes.

    Abstract translation: 包括电离区域的检测装置,包括两个电极的离子门,包括两个电极的离子修饰剂,漂移室和收集器。 离子浇口和离子改性剂组合使离子浇口是离子修饰电极之一。

    METHOD AND SYSTEM FOR INCREASING THE DYNAMIC RANGE OF ION DETECTORS
    36.
    发明申请
    METHOD AND SYSTEM FOR INCREASING THE DYNAMIC RANGE OF ION DETECTORS 审中-公开
    用于增加离子检测器动态范围的方法和系统

    公开(公告)号:US20130181125A1

    公开(公告)日:2013-07-18

    申请号:US13817189

    申请日:2011-08-18

    CPC classification number: H01J49/0031 H01J49/025 H01J49/06 H01J49/061

    Abstract: A mass spectrometer system can include a mass analyzer operable to mass transmit streams of ions to a detector in a mass dependent fashion for measurement of ion flux intensity. An ion attenuator can be located in the extraction region between the mass analyzer and detector, downstream of the mass analyzer, and can be operable to provide selective attenuation of the ion beam by attenuating ion flux intensity also in mass dependent fashion. Higher concentration ions can be selected and attenuated, while other lower concentration ions can be left unattenuated. Different ions can be attenuated to different degrees. Locating the ion attenuator downstream of the mass analyzer so that the ion beam is already mass differentiated when attenuated can avoid mass discriminatory effects associated with ion beam attenuators. Selective attenuation of only certain ions but not others can extend the dynamic range of the detector without necessarily sacrificing detector sensitivity.

    Abstract translation: 质谱仪系统可以包括质量分析器,其可以质量传递离子流到检测器以质量依赖的方式来测量离子通量强度。 离子衰减器可以位于质量分析器和检测器之间的质量分析器下游的提取区域中,并且可以通过以质量依赖的方式衰减离子通量强度来操作来提供离子束的选择性衰减。 可以选择和减弱更高浓度的离子,而其他低浓度离子可以保持不衰减。 不同的离子可以衰减到不同的程度。 将离子衰减器定位在质量分析仪的下游,以便当衰减时离子束已经被质量分化,可以避免与离子束衰减器相关的质量差异影响。 只有某些离子而不是其他离子的选择性衰减可以扩展检测器的动态范围,而不必牺牲检测器灵敏度。

    Mass spectrometry for gas analysis in which both a charged particle source and a charged particle analyzer are offset from an axis of a deflector lens, resulting in reduced baseline signal offsets
    37.
    发明授权
    Mass spectrometry for gas analysis in which both a charged particle source and a charged particle analyzer are offset from an axis of a deflector lens, resulting in reduced baseline signal offsets 有权
    用于气体分析的质谱法,其中带电粒子源和带电粒子分析仪都偏离偏转器透镜的轴线,导致基线信号偏移减小

    公开(公告)号:US08450681B2

    公开(公告)日:2013-05-28

    申请号:US13155896

    申请日:2011-06-08

    CPC classification number: H01J49/067 H01J49/061

    Abstract: Apparatus, methods and systems are provided to inhibit a sightline from a charged particle source to an analyzer and for changing a baseline offset of an output spectrum of an analyzer. A supply of charged particles is directed through a hollow body of a deflector lens that is positioned relative to a charged particle source and an analyzer. A flow path along a preferred flow path through a deflector lens permits passage of the ions from the source to the detector while inhibiting a sightline from the detector to the source in a direction parallel to the central longitudinal axis of the deflector lens.

    Abstract translation: 提供了装置,方法和系统以阻止从带电粒子源到分析器的视线以及用于改变分析仪的输出光谱的基线偏移。 带电粒子的供应被引导通过相对于带电粒子源和分析器定位的偏转器透镜的空心体。 沿通过偏转器透镜的优选流动路径的流动路径允许离子从源到检测器的通过,同时在与偏转器透镜的中心纵向轴线平行的方向上禁止从检测器到源的视线。

    Method and Apparatus for Tandem Time-of-Flight Mass Spectrometry
    38.
    发明申请
    Method and Apparatus for Tandem Time-of-Flight Mass Spectrometry 有权
    串联飞行时间质谱法的方法和装置

    公开(公告)号:US20120068062A1

    公开(公告)日:2012-03-22

    申请号:US13221976

    申请日:2011-08-31

    Applicant: Takaya Satoh

    Inventor: Takaya Satoh

    Abstract: Tandem time-of-flight mass spectrometry method and apparatus permits an ion gate to be time set optimally at all times if the instrumental conditions are modified. Delayed extraction conditions for the mass-to-charge ratios of plural reference substances and optimum values of the time for which the ion gate is opened are measured and stored in a data table. Delayed extraction conditions and opening time of the ion gate which optimize the mass resolution at the mass-to-charge ratio of the desired precursor ions are found based on values stored in the table.

    Abstract translation: 串联飞行时间质谱法和设备允许离子浇口在工具条件被修改时始终保持最佳时间。 测量多个参考物质的质荷比的延迟提取条件和离子门打开的时间的最佳值并存储在数据表中。 基于存储在表中的值,找到离子门的延迟提取条件和打开时间,其优化在所需前体离子的质荷比下的质量分辨率。

    Mass spectrometer
    39.
    发明授权
    Mass spectrometer 有权
    质谱仪

    公开(公告)号:US08093555B2

    公开(公告)日:2012-01-10

    申请号:US12743932

    申请日:2007-11-21

    CPC classification number: H01J49/061 H01J49/408

    Abstract: A mass analysis is initially performed while applying appropriate voltages to the electrodes so that ions injected through an entrance gate electrode (5) into a loop orbit (3) are guided through approximately one half of the loop orbit (3) and diverted at an exit gate electrode (6) toward an ion detector (7). Based on the intensities of the peaks appearing on a mass spectrum obtained by this mass analysis, one or more objective ions are selected and a time parameter is specified so that the voltage applied to the exit gate electrode (6) changes when none of the ions flying along the loop orbit (3) are passing through the exit gate electrode (6). As a result, the orbit of the objective ions will assuredly changed so that they will be directed toward the ion detector (7) after flying through the loop orbit (3) multiple times. Thus, the mass information of the objective ions can be assuredly obtained.

    Abstract translation: 最初执行质量分析,同时向电极施加适当的电压,使得通过入口栅电极(5)注入环形轨道(3)的离子被引导通过环路轨道(3)的大约一半,并在出口 栅电极(6)朝向离子检测器(7)。 基于通过该质量分析获得的质谱出现的峰的强度,选择一个或多个目标离子,并且指定时间参数,使得当没有离子时,施加到出口栅极(6)的电压发生变化 沿环路轨道(3)飞行通过出口栅电极(6)。 结果,目标离子的轨道将确实改变,使得它们在通过环轨道(3)多次之后被引向离子检测器(7)。 因此,可以确实地获得目标离子的质量信息。

    Automatic gain control (AGC) method for an ion trap and a temporally non-uniform ion beam
    40.
    发明授权
    Automatic gain control (AGC) method for an ion trap and a temporally non-uniform ion beam 有权
    用于离子阱和时间不均匀离子束的自动增益控制(AGC)方法

    公开(公告)号:US07960690B2

    公开(公告)日:2011-06-14

    申请号:US12179548

    申请日:2008-07-24

    CPC classification number: H01J49/061 H01J49/4265

    Abstract: An automatic gain control (AGC) technique and apparatus is introduced herein for any temporally non-uniform ion beam, such as, for example, an ion beam produced by a MALDI ion source so as to minimize space charge effects. The disclosed configurations and techniques can be achieved by using an ion optical gating element and applying a desired signal waveform (e.g., a square wave) having a predetermined duty cycle. The applied voltage amplitude of such a signal can be configured to switch between a voltage which fully transmits the ions, and a voltage which does not transmit any ions. The frequency is chosen to result in a period which is significantly lower than the smallest non-uniformity period. Techniques of the present invention can also be extended to methods of AGC which can use a single ion injection event from the ion source to avoid variations in ion numbers from an unstable ion source.

    Abstract translation: 本文中引入了用于任何时间不均匀离子束(例如由MALDI离子源产生的离子束)的自动增益控制(AGC)技术和装置,以最小化空间电荷效应。 所公开的配置和技术可以通过使用离子光学门控元件并施加具有预定占空比的期望信号波形(例如,方波)来实现。 这种信号的施加电压幅度可以被配置为在完全透射离子的电压和不透射任何离子的电压之间切换。 选择频率导致明显低于最小不均匀周期的周期。 本发明的技术也可以扩展到AGC的方法,AGC方法可以使用来自离子源的单一离子注入事件来避免离不开离子源的离子数的变化。

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