Abstract:
Apparatus, methods and systems are provided to inhibit a sightline from a charged particle source to an analyzer and for changing a baseline offset of an output spectrum of an analyzer. A supply of charged particles is directed through a hollow body of a deflector lens that is positioned relative to a charged particle source and an analyzer. A flow path along a preferred flow path through a deflector lens permits passage of the ions from the source to the detector while inhibiting a sightline from the detector to the source in a direction parallel to the central longitudinal axis of the deflector lens.
Abstract:
A time-of-flight mass selector includes a first ion lens for converging ions, a flight tube into which ions which enter from the first ion lens are introduced, the flight tube having equipotential space therein, a second ion lens for converging ions having passed through the flight tube, and a chopper for a gate for pulsing the ions converged by the second ion lens.
Abstract:
The invention relates to a method for increasing the throughput in time-of-flight mass spectrometers as well as a device for conducting the method.The invention relates to a method for increasing the throughput in time-of-flight mass spectrometers, whereby the individual ion packets 5, which the extractor 2 admits into the drift zone 4, are deflected inside the drift zone by means of deflecting devices 6 disposed in the drift zone for the generation of time-variable electric fields, whereby the measurement of the deflection is such that the site where the deflected ion packet 5 strikes the detector 3 can be assigned by means of the detector 3, and the deflection is detected as additional information together with the flight time by means of the detector 3, whereby for each ion packet 5, the intensity of the electric field is selected such that the intensity of the electric field does not coincide with the one which was selected for the ion packet that was previously admitted from the extractor 2 into the drift zone 4.
Abstract:
A detection device including an ionization region, an ion gate comprising two electrodes, an ion modifier comprising two electrodes, a drift chamber and a collector. The ion gate and ion modifier are combined so the ion gate is one of the ion modifier electrodes.
Abstract:
A method of reflecting ions in a multireflection time of flight mass spectrometer is disclosed. The method includes guiding ions toward an ion mirror having multiple electrodes, and applying a voltage to the ion mirror electrodes to create an electric field that causes the mean trajectory of the ions to intersect a plane of symmetry of the ion mirror and to exit the ion mirror, wherein the ion are spatially focussed by the mirror to a first location and temporally focused to a second location different from the first location. Apparatus for carrying out the method is also disclosed.
Abstract:
A mass spectrometer system can include a mass analyzer operable to mass transmit streams of ions to a detector in a mass dependent fashion for measurement of ion flux intensity. An ion attenuator can be located in the extraction region between the mass analyzer and detector, downstream of the mass analyzer, and can be operable to provide selective attenuation of the ion beam by attenuating ion flux intensity also in mass dependent fashion. Higher concentration ions can be selected and attenuated, while other lower concentration ions can be left unattenuated. Different ions can be attenuated to different degrees. Locating the ion attenuator downstream of the mass analyzer so that the ion beam is already mass differentiated when attenuated can avoid mass discriminatory effects associated with ion beam attenuators. Selective attenuation of only certain ions but not others can extend the dynamic range of the detector without necessarily sacrificing detector sensitivity.
Abstract:
Apparatus, methods and systems are provided to inhibit a sightline from a charged particle source to an analyzer and for changing a baseline offset of an output spectrum of an analyzer. A supply of charged particles is directed through a hollow body of a deflector lens that is positioned relative to a charged particle source and an analyzer. A flow path along a preferred flow path through a deflector lens permits passage of the ions from the source to the detector while inhibiting a sightline from the detector to the source in a direction parallel to the central longitudinal axis of the deflector lens.
Abstract:
Tandem time-of-flight mass spectrometry method and apparatus permits an ion gate to be time set optimally at all times if the instrumental conditions are modified. Delayed extraction conditions for the mass-to-charge ratios of plural reference substances and optimum values of the time for which the ion gate is opened are measured and stored in a data table. Delayed extraction conditions and opening time of the ion gate which optimize the mass resolution at the mass-to-charge ratio of the desired precursor ions are found based on values stored in the table.
Abstract:
A mass analysis is initially performed while applying appropriate voltages to the electrodes so that ions injected through an entrance gate electrode (5) into a loop orbit (3) are guided through approximately one half of the loop orbit (3) and diverted at an exit gate electrode (6) toward an ion detector (7). Based on the intensities of the peaks appearing on a mass spectrum obtained by this mass analysis, one or more objective ions are selected and a time parameter is specified so that the voltage applied to the exit gate electrode (6) changes when none of the ions flying along the loop orbit (3) are passing through the exit gate electrode (6). As a result, the orbit of the objective ions will assuredly changed so that they will be directed toward the ion detector (7) after flying through the loop orbit (3) multiple times. Thus, the mass information of the objective ions can be assuredly obtained.
Abstract:
An automatic gain control (AGC) technique and apparatus is introduced herein for any temporally non-uniform ion beam, such as, for example, an ion beam produced by a MALDI ion source so as to minimize space charge effects. The disclosed configurations and techniques can be achieved by using an ion optical gating element and applying a desired signal waveform (e.g., a square wave) having a predetermined duty cycle. The applied voltage amplitude of such a signal can be configured to switch between a voltage which fully transmits the ions, and a voltage which does not transmit any ions. The frequency is chosen to result in a period which is significantly lower than the smallest non-uniformity period. Techniques of the present invention can also be extended to methods of AGC which can use a single ion injection event from the ion source to avoid variations in ion numbers from an unstable ion source.