Three dimensional integrated circuit electrostatic discharge protection and prevention test interface
    31.
    发明授权
    Three dimensional integrated circuit electrostatic discharge protection and prevention test interface 有权
    三维集成电路静电放电防护测试接口

    公开(公告)号:US09252593B2

    公开(公告)日:2016-02-02

    申请号:US13716272

    申请日:2012-12-17

    Abstract: The present disclosure provides a system and method for providing electrostatic discharge protection. A probe card assembly is provided which is electrically connected to a plurality of input/output channels. The probe card assembly can be contacted with a secondary assembly having an interposer electrically connected to one or more wafers each wafer having a device under test. Voltage can be forced on ones of the plural input/output channels of the probe card assembly to slowly dissipate charges resident on the wafer to thereby provide electrostatic discharge protection. A socket assembly adaptable to accept a 3DIC package is also provided, the assembly having a loadboard assembly electrically connected to a plurality of input/output channels. Once the 3DIC package is placed within the socket assembly, voltage is forced on ones of the input/output channels to slowly dissipate charges resident on the 3DIC package to thereby provide electrostatic discharge protection.

    Abstract translation: 本公开提供了一种用于提供静电放电保护的系统和方法。 提供一种电连接到多个输入/输出通道的探针卡组件。 探针卡组件可以与具有电连接到一个或多个晶片的插入器的次级组件接触,每个晶片具有被测器件。 可以将电压强制在探针卡组件的多个输入/输出通道中的一个上,以缓慢地耗散驻留在晶片上的电荷,从而提供静电放电保护。 还提供了适于接受3DIC封装的插座组件,该组件具有电连接到多个输入/输出通道的装载板组件。 一旦将3DIC封装放置在插座组件中,则强制在输入/输出通道之间施加电压以缓慢耗散驻留在3DIC封装上的电荷,从而提供静电放电保护。

    THREE DIMENSIONAL INTEGRATED CIRCUIT ELECTROSTATIC DISCHARGE PROTECTION AND PREVENTION TEST INTERFACE
    32.
    发明申请
    THREE DIMENSIONAL INTEGRATED CIRCUIT ELECTROSTATIC DISCHARGE PROTECTION AND PREVENTION TEST INTERFACE 有权
    三维集成电路静电放电保护和预防测试界面

    公开(公告)号:US20140167799A1

    公开(公告)日:2014-06-19

    申请号:US13716272

    申请日:2012-12-17

    Abstract: The present disclosure provides a system and method for providing electrostatic discharge protection. A probe card assembly is provided which is electrically connected to a plurality of input/output channels. The probe card assembly can be contacted with a secondary assembly having an interposer electrically connected to one or more wafers each wafer having a device under test. Voltage can be forced on ones of the plural input/output channels of the probe card assembly to slowly dissipate charges resident on the wafer to thereby provide electrostatic discharge protection. A socket assembly adaptable to accept a 3DIC package is also provided, the assembly having a loadboard assembly electrically connected to a plurality of input/output channels. Once the 3DIC package is placed within the socket assembly, voltage is forced on ones of the input/output channels to slowly dissipate charges resident on the 3DIC package to thereby provide electrostatic discharge protection.

    Abstract translation: 本公开提供了一种用于提供静电放电保护的系统和方法。 提供一种电连接到多个输入/输出通道的探针卡组件。 探针卡组件可以与具有电连接到一个或多个晶片的插入器的次级组件接触,每个晶片具有被测器件。 可以将电压强制在探针卡组件的多个输入/输出通道中的一个上,以缓慢地耗散驻留在晶片上的电荷,从而提供静电放电保护。 还提供了适于接受3DIC封装的插座组件,该组件具有电连接到多个输入/输出通道的装载板组件。 一旦将3DIC封装放置在插座组件中,则强制在输入/输出通道之间施加电压以缓慢耗散驻留在3DIC封装上的电荷,从而提供静电放电保护。

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