公开(公告)号：US08817345B2

公开(公告)日：2014-08-26

申请号：US13893946

申请日：2013-05-14

Applicant: Quad/Tech, Inc.

Inventor： Patrick James Noffke

IPC: H04N1/46

CPC classification number: H04N1/48 ,  B41F33/0036 ,  G01J3/2823 ,  G01J3/50 ,  G01J3/502 ,  G01J3/513 ,  G01J3/524 ,  H04N1/00023

Abstract: Apparatus and methods for image processing using multiple imaging devices are provided. A first imaging device is configured to acquire a first image of a portion of a printed substrate and the second imaging device is configured to acquire a second image of a portion of the printed substrate. At least a portion of the first image and the second image are acquired from the same portion of the printed substrate at the same time. The first imaging device is configured to process color data from the first image using a first processing circuit of the first imaging device and the second imaging device is configured to process spatial information from the second image using a separate second processing circuit of the second imaging device.

Abstract translation: 提供了使用多个成像装置进行图像处理的装置和方法。 第一成像装置被配置为获取印刷基板的一部分的第一图像，并且第二成像装置被配置为获取印刷基板的一部分的第二图像。 同时从印刷基板的相同部分获取第一图像和第二图像的至少一部分。 第一成像设备被配置为使用第一成像设备的第一处理电路来处理来自第一图像的颜色数据，并且第二成像设备被配置为使用第二成像设备的单独的第二处理电路来处理来自第二图像的空间信息 。

公开(公告)号：US08409907B2

公开(公告)日：2013-04-02

申请号：US12489636

申请日：2009-06-23

Applicant: Atsushi Toda ,  Hirofumi Sumi

Inventor： Atsushi Toda ,  Hirofumi Sumi

IPC: H01L31/18

CPC classification number: G01J3/2823 ,  G01J3/04 ,  G01J3/1804 ,  G01J3/2803 ,  G01J3/502 ,  G01J3/51 ,  G01J3/513 ,  H01L27/14623 ,  H01L27/14625 ,  H01L27/14645 ,  H01L27/14687 ,  H01L27/14689 ,  H01L27/14831 ,  H04N5/2254 ,  H04N9/045 ,  H04N9/07

Abstract: A method for manufacturing a semiconductor device for detecting a physical amount distribution, the semiconductor device comprising unit components arrayed in a predetermined order, the unit components each including a unit signal generation portion for detecting an electromagnetic wave and outputting the corresponding unit signal. A diffraction grating is provided on the incident light side of a spectral image sensor, the diffraction grating including scatterers, slits, and scatterers disposed in that order. An electromagnetic wave is scattered by the scatterers to produce diffracted waves, and by using the fact that interference patterns between the diffracted waves change with wavelengths, signals are detected for respective wavelengths by photoelectric conversion elements in each photodiode group.

Abstract translation: 一种用于制造用于检测物理量分布的半导体器件的方法，所述半导体器件包括以预定顺序排列的单元组件，所述单元组件各自包括用于检测电磁波的单元信号生成部分并输出相应的单位信号。 衍射光栅设置在光谱图像传感器的入射光侧，衍射光栅包括依次布置的散射体，狭缝和散射体。 电磁波被散射体散射以产生衍射波，并且通过使用衍射波之间的干涉图案随波长变化的事实，通过每个光电二极管组中的光电转换元件检测各波长的信号。

公开(公告)号：US20130063723A1

公开(公告)日：2013-03-14

申请号：US13559982

申请日：2012-07-27

Applicant: Kohei SHIMBO ,  Naohiro KAMIJO ,  Yoichi KUBOTA ,  Manabu SEO

Inventor： Kohei SHIMBO ,  Naohiro KAMIJO ,  Yoichi KUBOTA ,  Manabu SEO

IPC: G01J3/18

CPC classification number: G01J3/524 ,  B41F33/00 ,  B41F33/0045 ,  G01J3/04 ,  G01J3/28 ,  G01J3/502 ,  G01N21/86 ,  H04N1/6033 ,  H04N1/6044

Abstract: A spectral characteristic acquiring apparatus is provided which includes: an area dividing part; a spectrum separating part; a light receiving part; and a calculating part, wherein the calculating part includes a transformation matrix storing part that stores a transformation matrix used for calculating the spectral characteristic corresponding to electrical signals of a first diffraction pattern group including two or more adjacent diffraction patterns, and a spectral characteristic calculating part that calculates, based on the electrical signals of the first diffraction pattern group and the corresponding transformation matrix, the spectral characteristic at the locations of the image carrying medium corresponding to the apertures of the first diffraction pattern group.

Abstract translation: 提供了一种光谱特征获取装置，包括：区域分割部分; 光谱分离部分; 光接收部; 以及计算部分，其中所述计算部分包括变换矩阵存储部分，所述变换矩阵存储部分存储用于计算与包括两个或更多个相邻衍射图案的第一衍射图形组的电信号相对应的光谱特性的变换矩阵，以及光谱特性计算部分 其基于第一衍射图案组的电信号和相应的变换矩阵计算与第一衍射图案组的孔对应的图像承载介质的位置处的光谱特性。

公开(公告)号：US08063352B2

公开(公告)日：2011-11-22

申请号：US12490415

申请日：2009-06-24

Applicant: Vladislav Blayvas

Inventor： Vladislav Blayvas

IPC: H01L27/00

CPC classification number: G01J3/51 ,  G01J3/02 ,  G01J3/0205 ,  G01J3/0208 ,  G01J3/0256 ,  G01J3/502

Abstract: A color separation filter (100), for a solid state image sensor includes a micro lens array (108) adapted to collect a full color spectrum light source (104), a mask layer (120) is attached to the micro lens array (108), the mask layer (120) includes plurality of openings (124), each opening is positioned in front of a single micro lens from the micro lens array. Additionally it includes a first array of prisms (204), each prism is positioned in front of each of the openings, a second array of prisms (212) is attached to the first array of prisms with an optical glue layer (208). Each prism from the first array of prisms is positioned in front of a prism from the second array of prisms to create a symmetrical optical path for the color spectrum light source (304).

Abstract translation: 用于固态图像传感器的分色滤光器（100）包括适于收集全色光源（104）的微透镜阵列（108），掩模层（120）附接到微透镜阵列（108） ），所述掩模层（120）包括多个开口（124），每个开口位于来自所述微透镜阵列的单个微透镜的前面。 另外，它包括第一棱镜阵列（204），每个棱镜位于每个开口的前面，第二棱镜阵列（212）用光学胶层（208）附接到第一棱镜阵列。 来自第一棱镜阵列的每个棱镜从第二棱镜阵列位于棱镜的前面，以产生用于色谱光源（304）的对称光路。

公开(公告)号：US20110019192A1

公开(公告)日：2011-01-27

申请号：US12934247

申请日：2009-03-16

Applicant: Kenji Imura

Inventor： Kenji Imura

IPC: G01J3/46

CPC classification number: G01J3/50 ,  G01J3/10 ,  G01J3/2803 ,  G01J3/501 ,  G01J3/502 ,  G01J3/524

Abstract: An object of the present invention is to provide a spectral characteristic measuring system, a spectral characteristic measuring instrument, a data processing apparatus, and a program, which make it possible to appropriately correct an influence of an illumination light variation caused by a temperature rise in a semiconductor light-emitting element due to light emission, in a scanning type color measurement system or the like which sequentially measures many color samples 1n and in which a semiconductor light-emitting element such as an LED is used as a light source and a reference system is not provided.Spectral distributions of illumination lights which are measured before and after the color sample is measured are interpolated, to thereby estimate a spectral distribution of an illumination light at the time when a spectral distribution of the color sample is obtained. Spectral characteristics of the color sample are identified based on the spectral distribution of the reflected light or the transmitted light reflected by or transmitted through the color sample and the estimated spectral distribution.

Abstract translation: 本发明的目的是提供一种光谱特性测量系统，光谱特征测量仪器，数据处理设备和程序，其可以适当地校正由温度升高引起的照明光变化的影响 在扫描型色彩测量系统等中，由于发光而导致的半导体发光元件，其顺序地测量许多颜色样本1n，并且其中诸如LED的半导体发光元件用作光源和参考 系统不提供。 内插测量颜色样本之前和之后测量的照明光的光谱分布，从而估计获得彩色样本的光谱分布时的照明光的光谱分布。 基于反射光的光谱分布或由颜色样本反射或透射的透射光的光谱分布和估计的光谱分布来识别颜色样本的光谱特性。

公开(公告)号：US07860278B2

公开(公告)日：2010-12-28

申请号：US12621293

申请日：2009-11-18

Applicant: Patrick James Noffke ,  Patrick Younk ,  Bradly S. Moersfelder

Inventor： Patrick James Noffke ,  Patrick Younk ,  Bradly S. Moersfelder

IPC: G06K9/00

CPC classification number: B41F33/0036 ,  G01J3/2823 ,  G01J3/50 ,  G01J3/502 ,  G01J3/513 ,  G01J3/524

Abstract: An image processing apparatus for use with a printed image on a moving substrate is provided. The image processing apparatus includes a first imaging device configured to process spatial data which indicates a position of color patches printed along an edge portion of the printed image on the moving substrate. The image processing apparatus further includes a second imaging device configured to process at least one of densitometric data and colorimetric data of the color patches of the printed image. The first imaging device and second imaging device acquire image data from substantially the same position on the substrate at substantially the same time. The image processing apparatus further includes a processor configured to monitor a color of the printed image on the moving substrate based on the spatial data and the at least one of densitometric data and colorimetric data.

Abstract translation: 提供了一种与移动基板上的印刷图像一起使用的图像处理装置。 图像处理装置包括：第一成像装置，被配置为处理空间数据，其指示沿着移动基板上的打印图像的边缘部分印刷的色块的位置。 图像处理装置还包括被配置为处理打印图像的色块的光密度数据和色度数据中的至少一个的第二成像装置。 第一成像装置和第二成像装置在基本上同时从基板上的相同位置获取图像数据。 所述图像处理装置还包括处理器，其被配置为基于所述空间数据和所述至少一个光密度数据和比色数据来监视所述移动的基板上的所述打印图像的颜色。

公开(公告)号：US07755773B2

公开(公告)日：2010-07-13

申请号：US11961507

申请日：2007-12-20

Applicant: Peter Ehbets ,  Adrian Kohlbrenner

Inventor： Peter Ehbets ,  Adrian Kohlbrenner

IPC: G01B11/14

CPC classification number: H04N1/04 ,  G01J3/02 ,  G01J3/027 ,  G01J3/0278 ,  G01J3/50 ,  G01J3/502 ,  H04N1/00002 ,  H04N2201/0436 ,  H04N2201/0456

Abstract: A scanner device for measuring the color properties of a measured object pixel by pixel has a support surface for the measured object, a color measuring head, a drive unit for moving the color measuring head above the support surface in at least one dimension thereof and for adjusting the height of the color measuring head in the direction perpendicular to the support surface, as well as a measurement and drive control unit which activates the drive unit and co-operates with the color measuring head. It is also equipped with an electronic distance control system which adjusts the distance of the color measuring head above the measurement point in the direction perpendicular to the support surface to a desired measuring distance for every measurement point by means of the drive unit. The electronic distance control system works with measurement values generated by the color measuring head and distance values computed from them. The scanner device is suitable for running high-precision measurements on even the smallest measurement fields without contact and no separate measurement sensor is needed for the distance control system.

Abstract translation: 用于逐像素地测量被测物体的颜色属性的扫描仪装置具有用于测量对象的支撑表面，颜色测量头，用于在至少一个维度上将颜色测量头移动到支撑表面上方的驱动单元，并用于 在垂直于支撑表面的方向上调节彩色测量头的高度，以及测量和驱动控制单元，其激活驱动单元并与测色头配合。 还配备有电子距离控制系统，其通过驱动单元将测量点在与支撑表面垂直的方向上的距离调整到每个测量点的所需测量距离。 电子距离控制系统使用由测量头产生的测量值和从它们计算的距离值。 扫描仪装置适用于即使在最小测量领域也不接触地进行高精度测量，距离控制系统也不需要单独的测量传感器。

公开(公告)号：US07321423B2

公开(公告)日：2008-01-22

申请号：US10915204

申请日：2004-08-09

Applicant: Jeffrey L. Guttman

Inventor： Jeffrey L. Guttman

IPC: G01J3/42

CPC classification number: G01J3/2803 ,  G01J3/0208 ,  G01J3/0216 ,  G01J3/50 ,  G01J3/502 ,  G01J3/504 ,  G01J2001/4247 ,  G01N21/4788 ,  G01N21/57 ,  G01N2021/575

Abstract: In accordance with embodiments of the present invention, a goniospectrophotometer is provided for quickly obtaining a goniospectrum using a goniospectrophotometer. In some embodiments, a parabolic reflector is used to optically transform the angular space of a source at the parabola focus into a linear space and facilitate the use of a single diffracting element and area camera to simultaneously measure the angular spectrum of the source. Spectra corresponding to zenith angles of light reflection by the parabolic reflector can be acquired by a detector and analyzed in a computer.

Abstract translation: 根据本发明的实施方案，提供了一种使用分光光度计快速获得oniospectrum的分光光度计。 在一些实施例中，抛物面反射器用于将抛物面焦点处的源的角空间光学变换成线性空间，并且有助于使用单个衍射元件和区域相机来同时测量源的角谱。 通过抛物面反射器对应于光反射的天顶角的光谱可以由检测器获取并在计算机中进行分析。

公开(公告)号：US20070046936A1

公开(公告)日：2007-03-01

申请号：US11217070

申请日：2005-08-31

Applicant: Charles Mauzy ,  Michael Stokes ,  Gary Starkweather ,  Jonathan Schwartz

Inventor： Charles Mauzy ,  Michael Stokes ,  Gary Starkweather ,  Jonathan Schwartz

IPC: G01J3/28 ,  G02B5/18

CPC classification number: G01J3/18 ,  G01J3/02 ,  G01J3/0256 ,  G01J3/0272 ,  G01J3/06 ,  G01J3/502 ,  G01J2003/064 ,  G02B5/1828

Abstract: Color measurement using compact devices is described herein. A color measurement device can include a diffraction grating that receives light reflected from a surface whose color is being measured. The diffraction grating is responsive to a control signal to split selected components from the reflected light and to admit the components in sequence to a sensor. The components can correspond to a selected wavelength or frequency of the reflected light. The sensor measures the energy or power level of each of the admitted components. The device can support determining a spectral representation of the color of the surface by generating output signals representing the various energy or power levels of each component of the light reflected from the surface.

Abstract translation: 这里描述使用紧凑型装置的颜色测量。 颜色测量装置可以包括接收从被测量颜色的表面反射的光的衍射光栅。 衍射光栅响应于控制信号以从反射光中分离所选择的分量，并将分量依次接纳到传感器。 这些分量可以对应于所选择的反射光的波长或频率。 传感器测量每个被允许组件的能量或功率水平。 该装置可以支持通过产生表示从表面反射的光的每个分量的各种能量或功率水平的输出信号来确定表面的颜色的光谱表示。

公开(公告)号：US20060091300A1

公开(公告)日：2006-05-04

申请号：US10977687

申请日：2004-10-29

Applicant: Ken Nishimura

Inventor： Ken Nishimura

IPC: H01J5/16

CPC classification number: G01J3/02 ,  G01J3/0229 ,  G01J3/0256 ,  G01J3/50 ,  G01J3/502

Abstract: Optical color sensor using diffractive elements. Semiconductor fabrication processes are used to form diffraction gratings as part of a photosensor. In a first embodiment, photosensors such as photodiodes are formed on a substrate, and diffraction gratings of fixed spacing are formed using the metallization layers common to semiconductor fabrication techniques. In a second embodiment, a linear photodiode array is formed on a substrate, and a diffraction grating with changing spacing is formed in the metal layers, providing a continuous color sensor. Other metal layers commonly used in semiconductor processing techniques may be used to provide apertures as needed.

Abstract translation: 使用衍射元件的光学颜色传感器。 半导体制造工艺用于形成作为光电传感器一部分的衍射光栅。 在第一实施例中，在基板上形成诸如光电二极管的光电传感器，并且使用半导体制造技术共有的金属化层形成固定间隔的衍射光栅。 在第二实施例中，在衬底上形成线性光电二极管阵列，并且在金属层中形成具有间隔变化的衍射光栅，从而提供连续的颜色传感器。 通常用于半导体处理技术的其它金属层可用于根据需要提供孔。