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公开(公告)号:US20180283935A1
公开(公告)日:2018-10-04
申请号:US15870842
申请日:2018-01-12
Applicant: Oki Electric Industry Co., Ltd.
Inventor: Yoshihiro KANDA
Abstract: A vibration sensing optical fiber sensor is structured to include a probe light supplying section, an optical fiber, a polarimeter for reflected light, and a computing unit. The probe light supplying section generates, as probe light, light pulses that are switched alternately and periodically to orthogonal polarization directions. The probe light is inputted to the optical fiber. The polarimeter for reflected light measures a state of polarization of reflected light that is the probe light that has been reflected by the optical fiber. The computing unit carries out specifying of a position of vibrations by using the state of polarization measured by the polarimeter for reflected light.
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公开(公告)号:US10066989B1
公开(公告)日:2018-09-04
申请号:US15330353
申请日:2016-09-09
Applicant: J.A. WOOLLAM CO., INC
Inventor: Martin M. Liphardt , Ping He
Abstract: A system for providing variable wavelength intensity attenuation to said focused beams by application of an aperture-like element that comprises at least two regions of “filter” material, or comprises different materials graded into one another, which different materials that have different responses to different wavelengths, wherein said system is applied to reduce differences in wavelength intensity levels when applied in collimated portions of a beam as a Spectral Angle Adjustor (SAA) or to preserve information in a beam while changing said beam effective diameter as a Spectral Aperture Stop (SAS); or to affect a Spectral Field Stop (SFS) that controls source image size when applied at a convergent/divergent beam focal point as a Spectrally Varying Aperture, (SVA) the end result depending on where in a beam it is applied.
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公开(公告)号:US10048132B2
公开(公告)日:2018-08-14
申请号:US15222503
申请日:2016-07-28
Applicant: KLA-Tencor Corporation
Inventor: Andrew V. Hill , Amnon Manassen , Yuri Paskover , Yuval Lubashevsky
Abstract: Metrology methods and systems are provided, in which the detected image is split at a field plane of the collection path of the metrology system's optical system into at least two pupil plane images. Optical elements such as prisms may be used to split the field plane images, and multiple targets or target cells may be measured simultaneously by spatially splitting the field plane and/or the illumination sources and/or by using two polarization types. The simultaneous capturing of multiple targets or target cells increases the throughput of the disclosed metrology systems.
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公开(公告)号:US10031069B2
公开(公告)日:2018-07-24
申请号:US15619837
申请日:2017-06-12
Applicant: DEKA Products Limited Partnership
Inventor: Jacob W. Scarpaci , Jason M. Sachs , Simon C. Helmore
Abstract: Methods and apparatus for concentration determination using polarized light. The apparatus includes a first polarized light source having a first light source polarization axis and a second polarized light source having a second light source polarization axis generally perpendicular to the first light source polarization axis. Also, a first polarized light receiver having a first polarized light receiver polarization axis and configured to measure an intensity of light transmitted from the first light receiver polarizer and a second polarized light receiver having a second polarized light receiver polarization axis substantially perpendicular to the first light receiver polarization axis and configured to measure an intensity of light transmitted from the second light receiver polarizer, wherein the first and second light receiver polarization axes are generally +/−45 degrees relative to the first and second light source polarization axes.
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公开(公告)号:US09945718B2
公开(公告)日:2018-04-17
申请号:US14591763
申请日:2015-01-07
Applicant: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Inventor: Ulrich Boettiger
IPC: H01L27/00 , G01J1/04 , G01J1/02 , G01J3/28 , G01J4/04 , G01J3/02 , G01J1/42 , H04N5/369 , H04N9/04 , G01J1/44
CPC classification number: G01J1/0488 , G01J1/0209 , G01J1/0411 , G01J1/4228 , G01J3/0208 , G01J3/0259 , G01J3/2803 , G01J4/04 , G01J2001/448 , H04N5/3696 , H04N9/045
Abstract: An imaging system may include several different types of pixels that are each configured to detect different characteristics of light received at the imaging system. An imaging system may include image sensing pixels that detect the wavelength and intensity of the light, direction sensing pixels that detect the directionality of the light, polarization sensing pixels that detect a polarization state of the light, and diffractive wavelength separation pixels that detect multiple different wavelength components of the light. One or more pixels of the different types may be arranged in a pixel cluster. A pixel cluster that includes different pixel types may detect spatially correlated information for multiple characteristics of the light. Multiple pixel clusters may be arranged in a pixel array that generates an image based on spatially correlated information for the different characteristics of the light.
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公开(公告)号:US20180066991A1
公开(公告)日:2018-03-08
申请号:US15556995
申请日:2016-03-10
Applicant: PRESIDENT AND FELLOWS OF HARVARD COLLEGE
Inventor: Jan Philipp Balthasar MUELLER , Kristjan LEOSSON , Federico CAPASSO
CPC classification number: G01J4/02 , G01J4/04 , G01J2004/002 , G01N21/47 , G01N2021/4792 , G01R29/0814 , G01R29/0892 , H01Q21/24
Abstract: A polarimeter includes an integrated device with an array of antennas including multiple column pairs. Each column pair has two columns, and each column in each column pair includes multiple antennas. A first column of each column pair in the array scatters a first polarization component of an incident radiation, and a second column of each column pair in the array scatters a second polarization component of the incident radiation. The scattered fields of the column pairs interfere constructively in a direction depending on the polarization of the incident radiation, resulting in maximal intensity at a certain point in space for a specific polarization state. Multiple column pairs in parallel and oriented at angles with respect to each other can be used to scatter different polarization components of the incident radiation directionally to different points in space. Detectors are positioned with respect to the integrated device to detect polarization components.
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公开(公告)号:US20180052059A1
公开(公告)日:2018-02-22
申请号:US15800329
申请日:2017-11-01
Applicant: Gigaphoton Inc.
Inventor: Masato MORIYA , Osamu WAKABAYASHI , Yoshinobu WATABE
CPC classification number: G01J11/00 , G01J1/0414 , G01J1/0429 , G01J1/0477 , G01J1/4257 , G01J4/04 , G01J2001/4261 , G02B5/3066 , G02B27/148 , H01S3/0014 , H01S3/134 , H01S3/2366
Abstract: A light beam measurement device includes: a polarization measurement unit including a first measurement beam splitter provided on an optical path of a laser beam and configured to measure a polarization state of the laser beam having been partially reflected by the first measurement beam splitter; a beam profile measurement unit including a second measurement beam splitter provided on the optical path of the laser beam and configured to measure a beam profile of the laser beam having been partially reflected by the second measurement beam splitter; and a laser beam-directional stability measurement unit configured to measure a stability in a traveling direction of the laser beam, while the first measurement beam splitter and the second measurement beam splitter are made of a material containing CaF2.
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公开(公告)号:US09829384B2
公开(公告)日:2017-11-28
申请号:US14854326
申请日:2015-09-15
Applicant: POLARIS SENSOR TECHNOLOGIES, INC.
Inventor: J Larry Pezzaniti , Justin Parker Vaden , Michael Ernest Roche
CPC classification number: G01J5/58 , G01J4/04 , G01J5/10 , G01J2004/001 , G01J2005/0077 , G01J2005/586 , G02B5/3058 , H04N5/33
Abstract: A long wave infrared imaging polarimeter (LWIP) is disclosed including a pixilated polarizing array (PPA) in close proximity to a microbolometer focal plane array (MFPA), along with an alignment engine for aligning and bonding the PPA and MFPA and method for assembly.
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公开(公告)号:US09791315B2
公开(公告)日:2017-10-17
申请号:US14761328
申请日:2014-01-16
Applicant: UNIVERSITEIT LEIDEN
Inventor: Christoph Ulrich Keller , Frans Snik
CPC classification number: G01J3/0224 , G01J1/0425 , G01J1/4228 , G01J3/0218 , G01J3/14 , G01J4/00 , G01J4/04 , G02F1/0136
Abstract: A polarimetry apparatus comprising a plurality of flexible light conduits each having first and second ends, and a respective polarization modulator associated with each light conduit, wherein each light conduit is configured to receive incident light from a different predetermined region in space via the first end, and deliver said light to a detector unit via the second end, and wherein the polarization modulator is configured to modulate the polarization of the light to enable a partial or complete polarization state of the incident light to be determined by the detector unit for each light conduit.
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公开(公告)号:US09759655B2
公开(公告)日:2017-09-12
申请号:US14870425
申请日:2015-09-30
Applicant: LI-COR, Inc.
Inventor: Serguei Koulikov
CPC classification number: G01N21/39 , G01N2021/1704 , G01N2021/399 , G01N2201/0642 , G02B5/205 , G02B5/3066 , H01S3/081 , H01S5/0014 , H01S5/0078
Abstract: Laser-based spectroscopy systems and methods including a laser source that emits a beam of radiation, an optical resonant cavity having at least two cavity mirrors, and at least one beam filtering element positioned along a path of the beam external to the cavity and having a front surface, wherein the front surface is oriented such that an intersection of the beam and the surface is at an angle, such as the Brewster's angle or a pseudo-Brewster's, that reduces or eliminates reflection of a predominant polarization component of the beam by the filtering element.
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