公开(公告)号：US20140339424A1

公开(公告)日：2014-11-20

申请号：US14277933

申请日：2014-05-15

Applicant: Carl Zeiss Microscopy GmbH

Inventor： Albrecht Glasmachers ,  Michel Aliman

IPC: H01J37/05 ,  H01J37/252 ,  H01J37/244

CPC classification number: H01J37/05 ,  H01J37/244 ,  H01J37/252 ,  H01J49/022 ,  H01J49/027 ,  H01J49/424 ,  H01J2237/028 ,  H01J2237/057

Abstract: A device for mass selective determination of at least one ion or of a plurality of ions is used, for example, in a measuring apparatus having an ion trap. The ion trap has a ring electrode having a first opening. A first electrode is arranged at the first opening. Furthermore, an amplifier for providing a radio-frequency storage signal for the ion trap and a first transformer are provided, said first transformer being connected to the amplifier and the first electrode in such a way that the radio-frequency storage signal is coupled into the first electrode via the first transformer.

Abstract translation: 例如，在具有离子阱的测量装置中使用用于质量选择性测定至少一种离子或多种离子的装置。 离子阱具有具有第一开口的环形电极。 第一电极布置在第一开口处。 此外，提供了一种用于提供用于离子阱的射频存储信号和第一变压器的放大器，所述第一变压器以这样的方式连接到放大器和第一电极，使得射频存储信号耦合到 第一电极经由第一变压器。

公开(公告)号：US20140332684A1

公开(公告)日：2014-11-13

申请号：US13810934

申请日：2012-02-03

Applicant: Ken Harada ,  Hiroto Kasai

Inventor： Ken Harada ,  Hiroto Kasai

IPC: H01J37/252 ,  H01J37/26 ,  H01J37/147 ,  G01N23/04

CPC classification number: H01J37/252 ,  G01N23/04 ,  H01J37/147 ,  H01J37/26 ,  H01J37/295 ,  H01J2237/221 ,  H01J2237/226 ,  H01J2237/2505

Abstract: There is a limit in range and distance in which an electron beam can interfere and electron interference is implemented within a range of a coherence length. Therefore, interference images are consecutively recorded for each interference region width from an interference image of a reference wave and an observation region adjacent to the reference wave by considering that a phase distribution regenerated and observed by an interference microscopy is a differential between phase distributions of two waves used for interference and a differential image between phase distributions of a predetermined observation region and a predetermined reference wave is acquired by acquiring integrating phase distributions acquired by individually regenerating the interference images. This work enables a wide range of interference image which is more than a coherence length by arranging phase distribution images performed and acquired in the respective phase distributions in a predetermined order.

Abstract translation: 电子束可能干扰的范围和距离有限制，并且在相干长度的范围内实现电子干扰。 因此，通过考虑到由干涉显微镜再生和观测到的相位分布是两相的相位分布之间的差分，从参考波的干涉图像和与参考波相邻的观察区域的每个干涉区域宽度连续记录干涉图像 通过获取通过单独再生干涉图像获得的积分相位分布来获取用于干扰的波和预定观察区域和预定参考波的相位分布之间的差分图像。 通过以预定的顺序排列在各个相位分布中执行和获取的相位分布图像，能够实现大于相干长度的宽范围的干涉图像。

公开(公告)号：US08516610B1

公开(公告)日：2013-08-20

申请号：US13423317

申请日：2012-03-19

Applicant: Hadi Tavakoli Nia ,  Iman Soltani Bozchalooi ,  Kamal Youcef-Toumi ,  Christine Ortiz ,  Alan J. Grodzinsky ,  Eliot Frank

Inventor： Hadi Tavakoli Nia ,  Iman Soltani Bozchalooi ,  Kamal Youcef-Toumi ,  Christine Ortiz ,  Alan J. Grodzinsky ,  Eliot Frank

IPC: H01J37/252

CPC classification number: G01Q60/366 ,  G01Q60/32

Abstract: Rheology system. The system includes a first piezoelectric actuator assembly for providing microscale displacement of a sample and a second piezoelectric actuator assembly for oscillating the sample at a nano/micro scale displacement in a selected frequency range extended significantly as compared to the frequency range available on the commercial AFMs. A preferred sample is cartilage and the disclosed system can distinguish between normal cartilage and GAG-depleted cartilage.

Abstract translation: 流变系统 该系统包括用于提供样品的微量位移的第一压电致动器组件和用于以与在商业AFM上可用的频率范围相比显着延长的所选频率范围内的纳米/微尺度位移振荡样品的第二压电致动器组件 。 优选的样品是软骨，并且所公开的系统可以区分正常软骨和消耗GAG的软骨。

公开(公告)号：US07870616B2

公开(公告)日：2011-01-11

申请号：US12117801

申请日：2008-05-09

Applicant: André Meister ,  Jérôme Polesel-Maris ,  Michael Gabi ,  Tomaso Zambelli ,  Janos Vörös

Inventor： André Meister ,  Jérôme Polesel-Maris ,  Michael Gabi ,  Tomaso Zambelli ,  Janos Vörös

IPC: H01J37/252

CPC classification number: G01Q30/14 ,  G01N33/48707 ,  G01N33/48728 ,  G01Q60/02 ,  G01Q60/38 ,  G01Q60/44 ,  G01Q70/06

Abstract: A probe arrangement with a probe for local electrophysiological analysis of cells (4) such as patch-clamp techniques for use with atomic force microscopy, has a probe with a cantilever arm (2) connected to a probe holder (3). The probe has a probe tip (4) at a probing end (5) of the cantilever arm (2) and a fluid channel (6) in the cantilever arm (2) connecting a probe tip aperture (7) with a fluid reservoir (8) via a duct (9). The fluid channel (6), the duct (9) and the fluid reservoir (8) are adapted to be filled with a fluid solution (10) enabling ion transport for electrophysiological analysis. A first electrode (15) for electrophysiological analysis is placed in the fluid reservoir (8) and/or in the duct (9) and/or in the fluid channel (6).

Abstract translation: 具有用于细胞局部电生理分析的探针的探针装置（4），例如用原子力显微镜使用的膜片钳技术，具有连接到探针架（3）的悬臂（2）的探针。 探针在悬臂（2）的探测端（5）处具有探针尖端（4）以及悬臂（2）中的流体通道（6），其将探针尖端孔（7）与流体储存器 8）通过管道（9）。 流体通道（6），管道（9）和流体储存器（8）适于填充有能够进行电生理分析的离子输送的流体溶液（10）。 用于电生理分析的第一电极（15）放置在流体储存器（8）和/或管道（9）和/或流体通道（6）中。

公开(公告)号：US06891167B2

公开(公告)日：2005-05-10

申请号：US09882818

申请日：2001-06-15

Applicant: John A. Notte, IV

Inventor： John A. Notte, IV

IPC: H01J1/08 ,  H01J37/141 ,  H01J37/252 ,  H01J37/28 ,  H01J37/34

CPC classification number: B82Y15/00 ,  H01J37/141 ,  H01J37/34 ,  H01J2237/2485 ,  H01J2237/2817 ,  H01J2237/30405 ,  H01J2237/3175

Abstract: An apparatus configured to control a magnetic field strength of a magnetic lens is provided. The apparatus may include a magnetic sensor configured to generate an output signal responsive to a first magnetic field strength of the magnetic lens. The apparatus may also include a control circuit coupled to the magnetic sensor and the magnetic sensor. The control circuit may be configured to receive the output signal from the magnetic lens and to receive an input signal responsive to a predetermined magnetic field strength. The control circuit may be further configured to generate a control signal responsive to the output signal and the input signal. Additionally, the control circuit may be configured to apply a current to the magnetic lens such that a second magnetic field strength may be generated within the magnetic lens closer to the predetermined magnetic field strength than the first magnetic strength.

Abstract translation: 提供一种被配置为控制磁性透镜的磁场强度的装置。 该装置可以包括被配置为响应于磁性透镜的第一磁场强度而产生输出信号的磁传感器。 该装置还可以包括耦合到磁传感器和磁传感器的控制电路。 控制电路可以被配置为从磁性透镜接收输出信号并响应于预定的磁场强度接收输入信号。 控制电路还可以被配置为响应于输出信号和输入信号产生控制信号。 此外，控制电路可以被配置为向磁性透镜施加电流，使得在磁性透镜内可以产生比第一磁场强度更接近预定磁场强度的第二磁场强度。

公开(公告)号：US20050082477A1

公开(公告)日：2005-04-21

申请号：US10845092

申请日：2004-05-14

Applicant: Takeshi Soeda

Inventor： Takeshi Soeda

IPC: G01L1/00 ,  G01N23/04 ,  G01N23/207 ,  H01J37/28 ,  H01J37/252 ,  G01N23/20

CPC classification number: H01J37/252 ,  G01N23/046 ,  G01N2223/419 ,  H01J2237/24585 ,  H01J2237/2802

Abstract: A lattice strain measuring method comprising the steps of: using a scanning transmission electron microscope 12 to apply convergent electron beams 34 to a sample 32 and obtain a convergent-beam electron diffraction image 36 of the sample 32; computing a lattice strain magnitude of the sample 32, based on the obtained convergent-beam electron diffraction image; and displaying the computed lattice strain magnitude, associated with an electron microscope image of the sample 32. A scanning transmission electron microscope 12 is used, whereby electron beams 34 are caused to scan to thereby suitably set an incidence position. Accordingly, the incidence position of the electron beams can be displaced at a nanometer-order pitch accurately in a short period of time. The use of a scanning transmission electron microscope 12 requires no image forming lens below the sample 32, and the convergent-beam electron diffraction image is free from the distortion due to the influence of an image forming lens. Thus, a distribution of lattice strains in an electronic device having, e.g., a micronized structure can be displayed in an image with high resolving power and with high accuracy and furthermore in a short period of time.

Abstract translation: 一种晶格应变测量方法，包括以下步骤：使用扫描透射电子显微镜12将收敛电子束34施加到样品32，并获得样品32的会聚束电子衍射图像36; 基于获得的会聚束电子衍射图像计算样品32的晶格应变幅度; 并显示与样品32的电子显微镜图像相关联的计算的晶格应变幅度。 使用扫描透射电子显微镜12，由此使电子束34进行扫描，从而适当地设定入射位置。 因此，电子束的入射位置可以在短时间内精确地以纳米级间距移位。 扫描透射电子显微镜12的使用不需要在样品32下面的成像透镜，并且会聚束电子衍射图像由于成像透镜的影响而没有变形。 因此，具有例如微粉化结构的电子器件中的晶格应变的分布可以以高分辨率和高精度以及更短的时间内显示在图像中。

公开(公告)号：US20050067566A1

公开(公告)日：2005-03-31

申请号：US10937337

申请日：2004-09-10

Applicant: Takanori Koshikawa ,  Takashi Ikuta ,  Tsuneo Yasue ,  Masami Taguchi ,  Ibuki Tanaka

Inventor： Takanori Koshikawa ,  Takashi Ikuta ,  Tsuneo Yasue ,  Masami Taguchi ,  Ibuki Tanaka

IPC: G01N23/227 ,  G01N21/17 ,  G01N21/19 ,  G01N21/21 ,  G21K7/00 ,  H01J37/252 ,  H01J37/26 ,  H01J37/285

CPC classification number: H01J37/285 ,  H01J2237/2482

Abstract: A photoemission electron microscopy having a light source system for carrying out a high-resolution measurement such as work function distribution measurement or magnetic domain distribution with reliability, and a high-sensitivity measurement method using the photoemission electron microscopy. A photoemission electron microscopy having an excitation light source system in which a specimen is irradiated with irradiation light from a light source uses a vacuum chamber in which the specimen is placed and an objective lens which collects the irradiation light on a specimen surface. The objective lens is accommodated in the vacuum chamber. The light source may be placed outside the vacuum chamber. A condenser lens which makes the irradiation light from the light source generally parallel may be placed between the light source and the vacuum chamber. A transmission window which transmits the irradiation light while the vacuum chamber is sealed may be placed between the condenser lens and the objective lens. If a diffraction grating for selecting the wavelength of the irradiation light or a polarizing filter for selecting the direction of circularly polarized light in the irradiation light is used between the condenser lens and the transmission window, a high-resolution measurement of a work function distribution or a magnetic domain distribution on the specimen surface can be carried out.

Abstract translation: 具有用于进行诸如功函数分布测量或功能磁场分布的高分辨率测量的光源系统的光电子显微镜以及使用该光电子显微镜的高灵敏度测量方法。 具有激发光源系统的照射电子显微镜，其中用来自光源的照射光照射样本的激发光源系统使用其中放置有样本的真空室和将样品表面上的照射光聚集的物镜。 物镜容纳在真空室中。 光源可以放置在真空室外。 使来自光源的照射光大致平行的聚光透镜可以设置在光源和真空室之间。 在真空室被密封的同时透射照射光的透射窗可以放置在聚光透镜和物镜之间。 如果在聚光透镜和透射窗之间使用用于选择照射光的波长的衍射光栅或用于选择照射光中的圆偏振光的方向的偏振滤光器，则可以进行功函数分布的高分辨率测量或 可以在样品表面上进行磁畴分布。

公开(公告)号：US6002128A

公开(公告)日：1999-12-14

申请号：US973547

申请日：1998-05-04

Applicant: Rowland Hill ,  Paul William Miles

Inventor： Rowland Hill ,  Paul William Miles

IPC: H01J37/256 ,  H01J49/14 ,  H01J49/40 ,  H01J37/252

CPC classification number: H01J49/40 ,  H01J37/256 ,  H01J49/06 ,  H01J49/142

Abstract: A time-of-flight secondary ion mass spectrometer instrument comprises a pulsed source of a beam of ions, directed through a focusing device onto a sample to be analyzed. Ions emitted from the sample are collected, and mass spectrometry performed thereon to analyze the sample. Both the source and emitted beams may be focused by the same focusing device. This allows the instrument to be mounted to a single port in a vacuum chamber.

Abstract translation: PCT No.PCT / GB96 / 01592 Sec。 371日期：1998年5月4日 102（e）日期1998年5月4日PCT提交1996年7月2日PCT公布。 公开号WO97 / 02590 日期1997年1月23日飞行时间二次离子质谱仪仪器包括通过聚焦装置引导到待分析样品上的离子束的脉冲源。 收集样品发出的离子，并对其进行质谱分析。 源和发射光束都可以由相同的聚焦装置聚焦。 这样就可以将仪器安装在真空室中的单个端口上。

公开(公告)号：US5811804A

公开(公告)日：1998-09-22

申请号：US682601

申请日：1996-08-12

Applicant: Clemens Antoni Van Blitterswijk ,  Hendrick Klaas Koerten ,  Jan Greve

Inventor： Clemens Antoni Van Blitterswijk ,  Hendrick Klaas Koerten ,  Jan Greve

IPC: G01N21/65 ,  H01J37/252 ,  H01J37/256 ,  H01J37/244

CPC classification number: H01J37/228 ,  G01N21/65 ,  H01J37/226 ,  H01J37/252 ,  H01J37/256 ,  G01N2021/656 ,  H01J2237/2445

Abstract: Electron microscope provided, in the direction of the longitudinal axis, with at least one electron beam generation system, a condenser and objective lens system, a specimen chamber with a specimen mount, a projection lens system with imaging screen for the purpose of transmission electron microscopy (TEM) and/or an electron detector for the purpose of scanning electron microscopy (SEM) . The microscope is used in combination with an externally positioned Raman spectrometer and an associated light source for injecting and extracting, via a window in the microscope wall, a light beam to be directed at the specimen, and specimen-related Raman radiation, respectively. In the specimen chamber, a light beam and Raman radiation guide system is provided with an optical guide to guide the light beam to--and the Raman radiation from--the specimen. The guide system and the specimen mount are displaceable with respect to one another for mutual alignment of the specimen and the optical axis of the Raman spectrometer.

Abstract translation: PCT No.PCT / NL95 / 00033 Sec。 371日期：1996年8月12日 102（e）日期1996年8月12日PCT提交1995年1月24日PCT公布。 公开号WO95 / 20242 日期1995年7月27日电子显微镜在纵向方向上提供至少一个电子束产生系统，冷凝器和物镜系统，具有样本座的样本室，具有成像屏幕的投影透镜系统 用于扫描电子显微镜（SEM）的透射电子显微镜（TEM）和/或电子检测器的目的。 显微镜与外部定位的拉曼光谱仪和相关联的光源结合使用，用于通过显微镜壁中的窗口分别注射和提取指向样品的光束和与样品相关的拉曼辐射。 在样本室中，光束和拉曼辐射导向系统设置有光引导件，以将光束引导到来自样本的拉曼辐射。 引导系统和样本支架可相对于彼此移位，以使样本与拉曼光谱仪的光轴相互对准。

公开(公告)号：US5714757A

公开(公告)日：1998-02-03

申请号：US542562

申请日：1995-10-13

Applicant: Naoshi Itabashi ,  Kozo Mochiji ,  Hiroyasu Shichi ,  Seiji Yamamoto ,  Satoshi Osabe ,  Keiichi Kanehori

Inventor： Naoshi Itabashi ,  Kozo Mochiji ,  Hiroyasu Shichi ,  Seiji Yamamoto ,  Satoshi Osabe ,  Keiichi Kanehori

IPC: G01N23/225 ,  G01Q90/00 ,  H01J37/252 ,  H01J37/08

CPC classification number: G01N23/2255 ,  H01J37/252 ,  H01J2237/04756

Abstract: A surface analyzing method comprising an ion generation step for generating multiply-charged ions of specific ion species and specific charge state; a deceleration step for decelerating the generated multiply-charged ions to a lower kinetic energy than an energy of threshold of sputtering of an objective material; an irradiation step for irradiating the decelerated multiply-charged ions on the surface of a sample; and an analysis step for analyzing particles or light emitted from the surface of said sample by the irradiation of said multiply-charged ions. Apparatus is provided for carrying out the method. Since the ions irradiated on the sample surface are multiply-charged ions having a lower kinetic energy than that of threshold of sputtering of materials constituting a sample, the irradiated ions interact merely with the top surface layer of the sample whereby analyzed information merely from the top surface layer of the sample can be obtained, and as a result, the kind of atoms of the top surface layer of the sample and the bonding state of said atoms can be analyzed with high sensitivity and high resolution.

Abstract translation: 一种表面分析方法，包括用于产生特定离子种类的多电荷离子和特定电荷状态的离子产生步骤; 减速步骤，用于将产生的多电荷离子减速到比目标材料的溅射阈值的能量更低的动能; 照射步骤，用于在样品的表面上照射减速的多电荷离子; 以及分析步骤，用于通过照射所述多电荷离子来分析从所述样品的表面发射的颗粒或光。 提供了用于执行该方法的装置。 由于照射在样品表面上的离子是具有比构成样品的材料的溅射阈值低的动能的多电荷离子，因此照射的离子仅与样品的顶表面层相互作用，从而仅从顶部分析信息 可以获得样品的表面层，结果，可以以高灵敏度和高分辨率分析样品的顶表面层的原子的种类和所述原子的键合状态。