Abstract:
A new architecture for implementing a time-resolved Raman spectrometer is 2-3 orders of magnitude faster than current systems. The system additionally is compact, environmentally rugged, low cost and can detect multiple components of a sample simultaneously. In one embodiment, the invention employs a rotating optical switch to time multiplex an input signal through multiple bandpass filters and into a single optical detector which is electrically activated only when the filtered input light pulse is about to impact it.The combination of time-multiplexing the input signal through multiple optical filters and time-sequencing the optical detector enables the device to detect and analyze 2-3 orders of magnitude faster than current designs, processing spectra within milliseconds instead of seconds. The system can process multiple material samples (25+) simultaneously, instead of sequentially, and its mechanical ruggedness and simplicity enables using the system in harsh physical environments when traditional spectrometers can not be used reliably.
Abstract:
A new architecture for implementing a time-resolved Raman spectrometer is 2-3 orders of magnitude faster than current systems. The system additionally is compact, environmentally rugged, low cost and can detect multiple components of a sample simultaneously. In one embodiment, the invention employs a rotating optical switch to time multiplex an input signal through multiple bandpass filters and into a single optical detector which is electrically activated only when the filtered input light pulse is about to impact it.The combination of time-multiplexing the input signal through multiple optical filters and time-sequencing the optical detector enables the device to detect and analyze 2-3 orders of magnitude faster than current designs, processing spectra within milliseconds instead of seconds. The system can process multiple material samples (25+) simultaneously, instead of sequentially, and its mechanical ruggedness and simplicity enables using the system in harsh physical environments when traditional spectrometers can not be used reliably.
Abstract:
The invention provides a spectrometer (10) which includes a filter arrangement (16,18), in addition to any option filters (20) for limiting an operational wavelength range of the spectrometer, the filter arrangement (16,18) comprising a plurality of broadband optical filters or broadband optical filter areas each of known transmission and being located or selectively locatable in a path of collected incident spectral radiation (44). The spectrometer further includes at least one detector (24) arranged to measure the spectral radiation passing through at least one of the broadband filters located in the path of collected incident spectral radiation, and signal-processing means (34) for recovering the spectrum of the collected spectral radiation from measurements by the detector (24).
Abstract:
A diffraction grating and a prism with the appropriate characteristics are employed to provide a combined dispersive characteristic that is substantially linear over the visible spectrum. Radiation from the grating and prism is collimated by a lens towards a detector array. The grating or a telecentric stop between the grating and prism is placed at a focal point of the lens in a telecentric arrangement so that equal magnification is achieved at the detector array. If the detector array is replaced by a plurality of optical channels, a multiplexer/demultiplexer is obtained.
Abstract:
A hemispherical detector comprising a plurality of photodetectors arranged in a substantially contiguous array, the array being substantially in the shape of a half-sphere, the half-sphere defining a closed end and an open end, the open end defining a substantially circular face. Also provided is a method for constructing a hemispherical detector comprising the steps of making a press mold of the desired shape of the hemispherical detector, pouring a material into the press mold to form a cast, finishing the cast to remove any defects, coating the cast with a coating material, and attaching a plurality of photodetectors to the cast.
Abstract:
Spectroscopic system and spectrometers including an optical bandpass filter unit consisting of a plurality of bandpass regions and a spatial encoding unit for encoding discrete frequencies of light passing through the optical filter. The incorporation of the encoding unit allows the spectrometer system to use a detector consisting of one or a small number of elements, rather than using a more expensive detector array as is commonly used with filter-based spectrometers. The system can also include an integrating chamber that collects the light that is not transmitted through the bandpass filter unit and is substantially reflected, and redirects this light to strike the filter unit again, resulting in a significant increase in the optical power passing through the filter. The integrating chamber maximizes the return of the reflected light to the filter assembly and minimizes optical losses. The integrating chamber may be an orthogonal design to preserve the optical geometric characteristics of the light entering the chamber, even after multiple reflections from the optical filter.
Abstract:
A sample placed under a microscope is illuminated by light from a laser beam. Raman scattered light is passed back via a dichroic filter to various optical components which analyse the Raman spectrum, and thence to a CCD detector. The optical components for analysing the Raman spectrum include tunable dielectric filters in a filter wheel; a Fabry-Perot etalon; and a diffraction grating. These various components may be swapped into the optical path as desired, for example using movable mirrors, enabling the apparatus to be used very flexibly for a variety of different analysis procedures. Various novel analysis methods are also described.
Abstract:
Each of three or more telescopic filters in pairs of filters and detectors therefor has very narrow passband lines centered about laser wavelengths and nearby guardbands. As defined, a passband is any wavelength region of the spectrum permitted by a system to pass through to a detector, and a guardband is a spectral region near but not including the laser lines of interest. Each laser wavelength is simultaneously detected in exactly two detectors. Associated with each wavelength is a guardband near that wavelength, which is used to detect and reject broader band radiation. False alarms are made rare by proper parameter selection.
Abstract:
Instrument comprising a burner (22) provided with a window (221), on the axis of which is disposed a flame spectrophotometric device consisting of a focusing lens (222, 231), a chopper (223) introducing a number of optical filters (224) at the rate of one per characteristic line in the spectrum of the element under analysis, an optoelectronic cell (232) disposed within the focusing zone of said lens, a demodulation assembly for demodulating the electric signal emitted by said cell, and devices for amplifying and displaying the electric signal emitted by said assembly. Special provisions render the instrument portable and autonomous without detracting from its high precision.
Abstract:
A microscope is modified to allow for precise imaging of samples using different filters at different focal planes under computer control. A filter accessory includes a filter disc having bandpass filters. The filter disc may be rotated to move a selected filter into the optical path between a light source and the microscope sample. Adjustment of the image plane of the microscope is controlled by the computer using feedback from a lens position sensor.