Conductor interconnect with dendrites through film
    81.
    发明授权
    Conductor interconnect with dendrites through film 失效
    导体通过薄膜与树突互连

    公开(公告)号:US06300575B1

    公开(公告)日:2001-10-09

    申请号:US08918084

    申请日:1997-08-25

    Abstract: A method is provided for connecting two conductive layers in an electronic circuit package comprising the steps of forming dendrites on selected regions of a first conductive layer, forming dendrites on selected regions of a second conductive layer, applying an epoxy adhesive material over the first conductive layer, and compressively attaching the second conductive layer to the first conductive layer such that the dendrites on the first conductive layer contact the dendrites on the second conductive layer. Also claimed is an electronic circuit package incorporating the dendrites used for electrical interconnection manufactured in accordance with the present invention. An alternative embodiment of the invention utilizes an intermediate surface metal with dendrites in place of a “through via.”

    Abstract translation: 提供了一种用于连接电子电路封装中的两个导电层的方法,包括以下步骤:在第一导电层的选定区域上形成枝晶,在第二导电层的选定区域上形成枝晶,在第一导电层上施加环氧粘合剂材料 并且将第二导电层压缩附接到第一导电层,使得第一导电层上的枝晶与第二导电层上的枝晶接触。 还要求保护的是包括用于根据本发明制造的电互连的树突的电子电路封装。 本发明的替代实施例利用具有树突的中间表面金属代替“通孔”。

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