Wafer level package resistance monitor scheme
    1.
    发明授权
    Wafer level package resistance monitor scheme 有权
    晶圆级封装电阻监测方案

    公开(公告)号:US08957694B2

    公开(公告)日:2015-02-17

    申请号:US13477313

    申请日:2012-05-22

    Abstract: An integrated circuit includes a monitoring circuit and a monitored circuit connected with the monitoring circuit. The monitoring circuit is operable to determine during fabrication if a resistance of a connection between an in-fab redistribution layer connector and a post-fab redistribution layer connector exceeds a threshold.

    Abstract translation: 集成电路包括监控电路和与监控电路相连的监控电路。 监控电路可操作以在制造期间确定晶片间再分配层连接器和后再生分布层连接器之间的连接的电阻是否超过阈值。

    WAFER LEVEL PACKAGE RESISTANCE MONITOR SCHEME
    2.
    发明申请
    WAFER LEVEL PACKAGE RESISTANCE MONITOR SCHEME 有权
    WAFER LEVEL封装电阻监测方案

    公开(公告)号:US20130314120A1

    公开(公告)日:2013-11-28

    申请号:US13477313

    申请日:2012-05-22

    Abstract: An integrated circuit includes a monitoring circuit and a monitored circuit connected with the monitoring circuit. The monitoring circuit is operable to determine during fabrication if a resistance of a connection between an in-fab redistribution layer connector and a post-fab redistribution layer connector exceeds a threshold.

    Abstract translation: 集成电路包括监控电路和与监控电路相连的监控电路。 监控电路可操作以在制造期间确定晶片间再分配层连接器和后再生分布层连接器之间的连接的电阻是否超过阈值。

    Thermal Enhanced High Density Flip Chip Package
    8.
    发明申请
    Thermal Enhanced High Density Flip Chip Package 有权
    热增强型高密度倒装芯片封装

    公开(公告)号:US20120319255A1

    公开(公告)日:2012-12-20

    申请号:US13162064

    申请日:2011-06-16

    Abstract: Systems and methods according to embodiments of the invention enable flip chip packaging using high density routing while minimizing the thickness and layer count of the flip chip package. By using a photoresist layer to create very fine traces on a metallic base layer, embodiments of the present invention combine advantages of leadframe substrates and laminate substrates by supporting high-density routing while minimizing layer count and manufacturing cost. Additionally, the use of raised metallic pads in a routing layer enables embodiments of the present invention to include highly compact traces that pass over IC die bond pad connection sites without directly coupling to these bond IC die bond pad connection sites. Further, embodiments of the present invention can support multiple thin routing layers without the need for organic (e.g., laminate) material separating these routing layers.

    Abstract translation: 根据本发明的实施例的系统和方法使得能够使倒装芯片封装的厚度和层数最小化的高密度布线的倒装芯片封装。 通过使用光致抗蚀剂层在金属基底层上产生非常精细的迹线,本发明的实施例通过支持高密度布线同时最小化层数和制造成本来结合引线框架基板和层叠基板的优点。 此外,在布线层中使用凸起的金属焊盘使得本发明的实施例能够包括通过IC管芯接合焊盘连接位置的非常紧凑的迹线,而不直接耦合到这些接合IC管芯接合焊盘连接位置。 此外,本发明的实施例可以支持多个薄路由层,而不需要分离这些路由层的有机(例如,层叠)材料。

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