Abstract:
A method for operating a mass spectrometer comprises: generating a stream of ions by an ion source; directing the stream of ions into a first one of a pair of ion storage locations and trapping a first portion of the ions therein; directing a packet of ions from the other one of the pair of ion storage locations into an ion cooling cell that damps the kinetic energy of the ions comprising the packet of ions; directing the packet of ions to a mass analyzer of the mass spectrometer for mass analysis thereby; directing the first portion of ions from the first one of the pair of ion storage locations into the ion cooling cell; and directing the first portion of ions to the mass analyzer for mass analysis thereby.
Abstract:
A method for characterising ions includes trapping a first-generation ions in an ion trap; cooling the plurality of first-generation ions; photo-fragmenting the plurality of cooled first generation ions to obtain a plurality of second-generation ions, the second-generation ions being different to the first-generation ions, the plurality of second-generation ions being at least of one first type; selecting the first type of second-generation ions in the ion trap by ejecting, out of the trap, any residual first-generation ion and any second-generation ion of a type different from the first type; cooling the second-generation ions of the first type selected and trapped in the trap; photo-fragmenting the cooled second-generation ions of the first type to obtain a plurality of third-generation ions, the plurality of third-generation ions being different from the plurality of second-generation ions, the plurality of third-generation ions being at least of one first type; detecting the plurality of last-generation ions.
Abstract:
An ion spectrometer is provided, comprising: an ion source, arranged to generate ions continuously with a first range of mass to charge ratios; and an ion trap, arranged to receive ions from the ion source along an axis, and to eject ions with a second range of mass to charge ratios orthogonally to that axis, the second range of mass to charge ratios being narrower than the first range of mass to charge ratios. In some embodiments, ions generated by the ion source continuously flow into the ion trap. Additionally or alternatively, ion optics receive ions ejected from the ion trap and cool the ions without substantial fragmentation. An ion analyser receives ions ejected from the ion trap or ion optics and separates the ions in accordance with at least one characteristic of the ions.
Abstract:
A method of ejecting ions to be analyzed from a quadrupole ion trap in which a trapping field is created by one or more RF voltages applied to one or more electrodes of the trap, the method comprising the steps of cooling the ions to be analyzed within the quadrupole ion trap until the ions are thermalized, reducing the amplitude of one or more RF voltages applied to the quadrupole ion trap and applying the reduced amplitude RF voltages for one half cycle after the one or more RF voltages have reached a zero crossing point, turning off the RF voltages applied to the quadrupole ion trap, and ejecting the ions to be analyzed from the quadrupole ion trap.
Abstract:
An ion spectrometer is provided, comprising: an ion source, arranged to generate ions continuously with a first range of mass to charge ratios; and an ion trap, arranged to receive ions from the ion source along an axis, and to eject ions with a second range of mass to charge ratios orthogonally to that axis, the second range of mass to charge ratios being narrower than the first range of mass to charge ratios. In some embodiments, ions generated by the ion source continuously flow into the ion trap. Additionally or alternatively, ion optics receive ions ejected from the ion trap and cool the ions without substantial fragmentation. An ion analyzer receives ions ejected from the ion trap or ion optics and separates the ions in accordance with at least one characteristic of the ions.
Abstract:
An ion spectrometer is provided, comprising: an ion source, arranged to generate ions continuously with a first range of mass to charge ratios; and an ion trap, arranged to receive ions from the ion source along an axis, and to eject ions with a second range of mass to charge ratios orthogonally to that axis, the second range of mass to charge ratios being narrower than the first range of mass to charge ratios. In some embodiments, ions generated by the ion source continuously flow into the ion trap. Additionally or alternatively, ion optics receive ions ejected from the ion trap and cool the ions without substantial fragmentation. An ion analyzer receives ions ejected from the ion trap or ion optics and separates the ions in accordance with at least one characteristic of the ions.
Abstract:
A device and associated methods of operations are disclosed for interfacing on ion trap to a mass analyzer, such as a TOF mass analyzer. The device includes a plurality of sequentially arranged confinement cells having fixed locations. A group of ions, e.g., ions within a relatively narrow window of mass-to-charge ratio, is received by the device from the ion trap, undergoes fragmentation, and is transported through the device from a first to final confinement cell by a series of transfers between adjacent cells. The ion group is confined in each cell for a prescribed cooling period. By providing a suitable aggregate ion confinement time and by enabling concurrent transport and cooling of successively ejected ion groups, the ions are cooled sufficiently to enable the acquisition of mass spectra at high resolution, without having to substantially delay the ejection of a subsequent group of ions from the ion trap until cooling of the previous group is completed.
Abstract:
A method and apparatus for transmitting ions in a mass spectrometer from an ion source to a mass analyzer extracts analyte ions from the ion source in such a manner that the number of extracted analyte ions is maximized. The ions are then transmitted through an ion guide to the mass analyzer. The ion guide is filled with an interaction gas and its operating parameters are adjusted so that, as the ions pass through the ion guide, the analyte ion energy distribution width is narrowed and the analyte ions are collimated within the ion guide to improve the resolution and sensitivity of the mass analyzer.
Abstract:
A method of pulsing gas in a quadrupole ion trap to reduce excess internal energy of ions formed externally to the trap at high-vacuum conditions by laser desoprtion is disclosed. With pulsed gas introduction, pressures greater than those under which traps are normally operated can be achieved over a few milliseconds. Under these elevated pressure transients, the process of translational cooling is accelerated and ions undergo thermalized collisions before dissociation occurs. Minimization of uncontrolled fragmentation (thermalization) and enhanced sensitivity are observed at pressures exceeding a threshold of about 1 mTorr.
Abstract:
In performing an isolation of specific ions or performing a dissociation operation by CID, ions are captured by applying a radio-frequency high voltage to a ring electrode 31 as before. In a cooling operation which is performed immediately before target ions are ejected toward a TOFMS unit 4 with the ions stored in an ion trap 3, a radio-frequency high voltage is not applied to the ring electrode 31 but to end cap electrodes 32 and 34 to capture the ions. In this operation, the frequency thereof is set to be higher than that of the voltage applied to the ring electrode 31 and the amplitude is also increased in order to assure a large pseudopotential and keep the low mass cutoff (LMC). This narrows the spatial distribution of the cooled ions, reducing the variation of the initial positions of the ions at the point in time when they are ejected, which increases the mass resolution. In addition, since an isolation of ions having a large m/z can be performed with a great qz value as is conventionally done, a high mass selectivity can be assured.