Abstract:
An electronic assembly (100) with integral thermal transient suppression includes an integrated circuit (IC) chip (106) disposed within a cavity (103) of an IC device package (102). A transient thermal suppression material (TTSM) (110) is disposed in the cavity (103) in thermal contact with the IC chip (106). A heat sink (112) may also be provided in thermal contact with the chip (106). When present, the heat sink (112) serves as a cover of the packaged IC chip (106) and may include fins (112A,112B) extending from an upper surface (in contact with air) and a lower surface (in thermal contact with the TTSM (110)).The TTSM (110) may be thought of as a phase change material that absorbs energy dissipated by the IC chip (106) in a phase change event.
Abstract:
A microwave communication package (10) is constructed on an electrically conducting base plate (12) having a first side (14) defining a base plate cavity (16), with an antenna apparatus (40) mounted on an opposite, second side (18). A dielectric substrate (20) on the first side of the base plate covers the base plate cavity; and sealing apparatus (72) contacting the dielectric substrate and the base plate completely around the base plate cavity hermetically seals the cavity. Circuitry (30, 32) mounted on a surface of the substrate within the base plate cavity includes one or more microstrip lines (54) communicating components (30) to one or more waveguides comprising openings (50) extending through the base plate; and the waveguides are coupled at their opposite ends to the antenna apparatus.
Abstract:
A surface mount connector (11) and assembly including the surface mount connector (10) is shown and described. The assembly comprises a substrate (13) and a connector (11) including a carrier (14), and at least one electrical connecting element (16) having first (22) and second ends (24), wherein at least a portion of the first end (22) extends through the carrier (14) to electrically adjoin and physically secure the connector (11) to the substrate (13). A reinforcement medium (36) is disposed about at least a portion of surface mount connector (11) and said substrate (13).
Abstract:
A technique for manufacturing an electronic assembly (100) uses a mold (40) that has a first mold portion (44) and a second mold portion (42). The first mold portion (44) includes a plurality of spaced mold pins (46) extending from an inner surface. A cavity of the first and second mold portions (44,42) provides a mold cavity (11), when joined. A backplate (110) is also provided that includes a plurality of support pedestals (112) and an integrated heatsink (114) extending from a first side of the backplate (110). A substrate (102) includes a first side of an integrated circuit (IC) die (106A) mounted to a first side of the substrate (102). The backplate (110) and the substrate (102) are placed within the cavity of the second mold portion and the support pedestals (112) are in contact with the first side of the substrate (102). The first and second mold portions (44,42) are joined and the mold pins (46) contact a second surface of the substrate (102) during an overmolding process.
Abstract:
A heat sinkable package that includes a power device package (200, 300, 400, 500) including an active side (A) and a non-active side (N) is disclosed. The non-active side (N) includes a heat sinkable surface positioned adjacent to a product case (C). Another embodiment of the invention is directed to a method for manufacturing a heat sinkable package. The method comprises the steps of placing at least one flip chip (204, 304) over a flexible circuit (208) within a mold tool; compensating for height variances of the flip chips (204, 204); and positioning an input/output on an active side (A) of the power device package (200, 300, 400, 500) opposite a non-active side (N) of the power device package.
Abstract:
A no-flow underfill material (20) and process suitable for underfilling a bumped circuit component (10). The underfill material (20) initially comprises a dielectric polymer material (22) in which is dispersed a precursor capable of reacting to form an inorganic filler (24). The underfill process generally entails dispensing the underfill material (20) over terminals (18) on a substrate (16), and then placing the component (10) on the substrate (16) so that the underfill material (20) is penetrated by the bumps (12) on the component (10) and the bumps (12) contact the terminals (18) on the substrate (16). The bumps (12) are then reflowed to form solid electrical interconnects (26) that are encapsulated by the resulting underfill layer (28). The precursor may be reacted to form the inorganic filler (24) either during or after reflow.
Abstract:
A conductive adhesive material (12) characterized by metallurgical bonds (24) between electrically-conductive particles (20) dispersed in a polymer matrix (22) of the material (12). The polymer matrix (22) has a fluxing capability when heated to reduce metal oxides on the surfaces of the particles (20). At least the outer surfaces of the particles (20) are formed of a fusible material, so that sufficiently heating the conductive adhesive material (12) will reduce metal oxides on the particles (20), and at least partially melt the fusible metal, enabling the particles (20) to metallurgically bond to each other and to metal surfaces (14,16,44,46,54,56) contacted by the adhesive material (12).