公开(公告)号：JP2007329491A

公开(公告)日：2007-12-20

申请号：JP2007189655

申请日：2007-07-20

Applicant: Formfactor Inc ,  フォームファクター, インコーポレイテッド

Inventor： KHANDROS IGOR Y ,  MATHIEU GAETAN L ,  ELDRIDGE BENJAMIN N ,  GRUBE GARY W

IPC: G01R1/073 ,  H01L21/60 ,  B23K1/00 ,  B23K20/00 ,  B23K31/02 ,  C23C18/16 ,  C25D5/08 ,  C25D5/16 ,  C25D5/22 ,  C25D7/12 ,  C25D21/02 ,  G01R1/04 ,  G01R1/06 ,  G01R1/067 ,  G01R31/26 ,  G01R31/28 ,  H01L21/00 ,  H01L21/48 ,  H01L21/56 ,  H01L21/58 ,  H01L21/603 ,  H01L21/607 ,  H01L21/66 ,  H01L21/68 ,  H01L23/02 ,  H01L23/12 ,  H01L23/32 ,  H01L23/48 ,  H01L23/485 ,  H01L23/49 ,  H01L23/498 ,  H01L23/538 ,  H01L25/065 ,  H01L25/07 ,  H01L25/16 ,  H01L25/18 ,  H01R9/00 ,  H01R12/71 ,  H01R13/05 ,  H01R13/24 ,  H01R29/00 ,  H01R33/74 ,  H01R33/76 ,  H01R107/00 ,  H05H1/18 ,  H05K1/14 ,  H05K1/18 ,  H05K3/20 ,  H05K3/24 ,  H05K3/30 ,  H05K3/32 ,  H05K3/34 ,  H05K3/36 ,  H05K3/40 ,  H05K7/10

CPC classification number: H05K7/1069 ,  B23K1/0016 ,  B23K20/004 ,  B23K2201/40 ,  C25D5/08 ,  C25D5/22 ,  C25D7/12 ,  C25D21/02 ,  G01R1/0466 ,  G01R1/0483 ,  G01R1/06711 ,  G01R1/07314 ,  G01R1/07342 ,  G01R1/07357 ,  G01R1/07371 ,  G01R1/07378 ,  G01R31/2884 ,  G01R31/2886 ,  G01R31/2889 ,  H01L21/4853 ,  H01L21/4889 ,  H01L21/563 ,  H01L21/67138 ,  H01L22/20 ,  H01L23/32 ,  H01L23/49811 ,  H01L24/11 ,  H01L24/12 ,  H01L24/16 ,  H01L24/29 ,  H01L24/45 ,  H01L24/48 ,  H01L24/49 ,  H01L24/72 ,  H01L24/81 ,  H01L25/0652 ,  H01L25/16 ,  H01L2224/0401 ,  H01L2224/05124 ,  H01L2224/05166 ,  H01L2224/05599 ,  H01L2224/05647 ,  H01L2224/1134 ,  H01L2224/13099 ,  H01L2224/131 ,  H01L2224/13124 ,  H01L2224/13144 ,  H01L2224/13147 ,  H01L2224/13639 ,  H01L2224/13644 ,  H01L2224/13647 ,  H01L2224/13655 ,  H01L2224/13657 ,  H01L2224/16145 ,  H01L2224/29111 ,  H01L2224/45014 ,  H01L2224/45015 ,  H01L2224/45111 ,  H01L2224/45124 ,  H01L2224/45139 ,  H01L2224/45144 ,  H01L2224/45147 ,  H01L2224/4554 ,  H01L2224/456 ,  H01L2224/48091 ,  H01L2224/48227 ,  H01L2224/48463 ,  H01L2224/48599 ,  H01L2224/48699 ,  H01L2224/48799 ,  H01L2224/49109 ,  H01L2224/73203 ,  H01L2224/73204 ,  H01L2224/73265 ,  H01L2224/78301 ,  H01L2224/81801 ,  H01L2224/85201 ,  H01L2225/0651 ,  H01L2225/06527 ,  H01L2225/06555 ,  H01L2225/06572 ,  H01L2924/00013 ,  H01L2924/00014 ,  H01L2924/01005 ,  H01L2924/01006 ,  H01L2924/01011 ,  H01L2924/01012 ,  H01L2924/01014 ,  H01L2924/01015 ,  H01L2924/01018 ,  H01L2924/01019 ,  H01L2924/01022 ,  H01L2924/01023 ,  H01L2924/01027 ,  H01L2924/01028 ,  H01L2924/01029 ,  H01L2924/0103 ,  H01L2924/01032 ,  H01L2924/01033 ,  H01L2924/01037 ,  H01L2924/01039 ,  H01L2924/01042 ,  H01L2924/01044 ,  H01L2924/01045 ,  H01L2924/01046 ,  H01L2924/01047 ,  H01L2924/01049 ,  H01L2924/0105 ,  H01L2924/01051 ,  H01L2924/01057 ,  H01L2924/0106 ,  H01L2924/01074 ,  H01L2924/01075 ,  H01L2924/01076 ,  H01L2924/01077 ,  H01L2924/01078 ,  H01L2924/01079 ,  H01L2924/01082 ,  H01L2924/01088 ,  H01L2924/0132 ,  H01L2924/01322 ,  H01L2924/0133 ,  H01L2924/014 ,  H01L2924/07802 ,  H01L2924/10253 ,  H01L2924/10329 ,  H01L2924/12041 ,  H01L2924/12042 ,  H01L2924/12044 ,  H01L2924/14 ,  H01L2924/15153 ,  H01L2924/15165 ,  H01L2924/1517 ,  H01L2924/15312 ,  H01L2924/1532 ,  H01L2924/15787 ,  H01L2924/16195 ,  H01L2924/181 ,  H01L2924/19041 ,  H01L2924/19043 ,  H01L2924/30105 ,  H01L2924/30107 ,  H01L2924/3011 ,  H01L2924/3025 ,  H01R12/52 ,  H01R13/2407 ,  H01R13/2464 ,  H05K1/141 ,  H05K3/20 ,  H05K3/326 ,  H05K3/3421 ,  H05K3/368 ,  H05K3/4015 ,  H05K3/4092 ,  H05K2201/0397 ,  H05K2201/068 ,  H05K2201/1031 ,  H05K2201/10318 ,  H05K2201/10378 ,  H05K2201/10719 ,  H05K2201/10734 ,  H05K2201/10757 ,  H05K2201/10878 ,  Y02P70/611 ,  H01L2924/00 ,  H01L2924/01013 ,  H01L2924/01026 ,  H01L2924/3512 ,  H01L2224/29099 ,  H01L2224/48 ,  H01L2924/20752 ,  H01L2924/20753 ,  H01L2924/20754 ,  H01L2924/20755 ,  H01L2924/00012 ,  H01L2924/20751 ,  H01L2924/20756 ,  H01L2924/20757 ,  H01L2924/00015 ,  H01L2924/2075

Abstract: PROBLEM TO BE SOLVED: To provide a restorable contact structure suited for temporary connection with an electronic component such as a semiconductor die, subjected to aging and functional tests. SOLUTION: The contact structure having restorable and tractable properties for various electronic components is formed by bonding a free end of a wire 502 to a substrate 508, disposing the wire to form a wire stem having an elastic form, cutting the wire stem and providing a protective film by at least one layer of a certain material on the wire stem 530. In an illustrative embodiment: the free end of the wire stem is bonded to a contact region on the substrate; the wire stem is constructed to have an elastic form; the wire stem is cut by discharge to be free-standing; and applying, by deposition, the protective film to the free-standing wire stem. Various materials are disclosed as materials to be used for the wire stem (functioning as a foothold) and the protective film (functioning as an upper structure over the foothold). COPYRIGHT: (C)2008,JPO&INPIT

Abstract translation: 要解决的问题：提供适于与诸如半导体管芯的电子部件临时连接的可恢复的接触结构，进行老化和功能测试。 解决方案：通过将导线502的自由端接合到基板508上来形成具有用于各种电子部件的可恢复和易于处理的特性的接触结构，布置线以形成具有弹性形式的线杆，切割线杆 并且通过线杆530上的某种材料的至少一层提供保护膜。在说明性实施例中：线杆的自由端结合到衬底上的接触区域; 线杆构造成具有弹性形式; 线杆由排放口切割成独立的; 并通过沉积将保护膜施加到独立的线杆上。 公开了各种材料作为用于线杆（用作支脚）的材料和保护膜（用作支脚上的上部结构）。 版权所有（C）2008，JPO＆INPIT

公开(公告)号：JP2007173846A

公开(公告)日：2007-07-05

申请号：JP2006355406

申请日：2006-12-28

Applicant: Formfactor Inc ,  フォームファクター, インコーポレイテッド

Inventor： KHANDROS IGOR Y ,  GETAN L MATTHEW

IPC: H01L23/12 ,  H01L25/18 ,  C23C18/16 ,  C25D7/12 ,  G01R1/04 ,  G01R1/067 ,  G01R1/073 ,  G01R3/00 ,  G01R31/26 ,  G01R31/28 ,  H01L21/00 ,  H01L21/48 ,  H01L21/56 ,  H01L21/60 ,  H01L21/66 ,  H01L23/32 ,  H01L23/48 ,  H01L23/485 ,  H01L23/49 ,  H01L23/498 ,  H01L25/065 ,  H01L25/07 ,  H01L25/16 ,  H01R4/02 ,  H01R9/00 ,  H01R12/52 ,  H01R33/76 ,  H05K1/14 ,  H05K3/30 ,  H05K3/32 ,  H05K3/34 ,  H05K3/36 ,  H05K3/40 ,  H05K7/10

CPC classification number: H05K7/1069 ,  B23K2201/40 ,  G01R1/0466 ,  G01R1/0483 ,  G01R1/06711 ,  G01R1/06716 ,  G01R1/06761 ,  G01R1/07314 ,  G01R1/07342 ,  G01R1/07357 ,  G01R3/00 ,  G01R31/2884 ,  G01R31/2886 ,  H01L21/4853 ,  H01L21/563 ,  H01L21/67138 ,  H01L21/6715 ,  H01L22/20 ,  H01L23/49811 ,  H01L23/49827 ,  H01L24/11 ,  H01L24/13 ,  H01L24/16 ,  H01L24/45 ,  H01L24/49 ,  H01L24/72 ,  H01L24/81 ,  H01L25/0652 ,  H01L25/16 ,  H01L2224/0401 ,  H01L2224/06153 ,  H01L2224/1134 ,  H01L2224/13083 ,  H01L2224/13099 ,  H01L2224/13124 ,  H01L2224/13144 ,  H01L2224/13147 ,  H01L2224/136 ,  H01L2224/13639 ,  H01L2224/13644 ,  H01L2224/13647 ,  H01L2224/13655 ,  H01L2224/13657 ,  H01L2224/45124 ,  H01L2224/45144 ,  H01L2224/45147 ,  H01L2224/4554 ,  H01L2224/49109 ,  H01L2224/73203 ,  H01L2224/78301 ,  H01L2224/81801 ,  H01L2224/85045 ,  H01L2224/85205 ,  H01L2924/00013 ,  H01L2924/00014 ,  H01L2924/01005 ,  H01L2924/01006 ,  H01L2924/01011 ,  H01L2924/01012 ,  H01L2924/01014 ,  H01L2924/01015 ,  H01L2924/01022 ,  H01L2924/01027 ,  H01L2924/01028 ,  H01L2924/01029 ,  H01L2924/01033 ,  H01L2924/01039 ,  H01L2924/01042 ,  H01L2924/01044 ,  H01L2924/01045 ,  H01L2924/01046 ,  H01L2924/01047 ,  H01L2924/01049 ,  H01L2924/0105 ,  H01L2924/01051 ,  H01L2924/01055 ,  H01L2924/01074 ,  H01L2924/01078 ,  H01L2924/01079 ,  H01L2924/01082 ,  H01L2924/01322 ,  H01L2924/01327 ,  H01L2924/014 ,  H01L2924/10253 ,  H01L2924/14 ,  H01L2924/15153 ,  H01L2924/1517 ,  H01L2924/15312 ,  H01L2924/15787 ,  H01L2924/16152 ,  H01L2924/16195 ,  H01L2924/181 ,  H01L2924/19041 ,  H01L2924/19043 ,  H01L2924/19107 ,  H01L2924/30107 ,  H01L2924/3011 ,  H01L2924/3025 ,  H01R12/52 ,  H05K1/141 ,  H05K3/308 ,  H05K3/326 ,  H05K3/3421 ,  H05K3/3426 ,  H05K3/368 ,  H05K3/4015 ,  H05K3/4092 ,  H05K2201/0397 ,  H05K2201/068 ,  H05K2201/1031 ,  H05K2201/10318 ,  H05K2201/10378 ,  H05K2201/10719 ,  H05K2201/10734 ,  H05K2201/10757 ,  H05K2201/10878 ,  H05K2201/10909 ,  H05K2201/10946 ,  Y02P70/611 ,  Y02P70/613 ,  Y10T29/49124 ,  Y10T29/49144 ,  Y10T29/49147 ,  Y10T29/49149 ,  Y10T29/49162 ,  Y10T29/49169 ,  Y10T29/49217 ,  Y10T29/49224 ,  H01L2924/00 ,  H01L2224/48 ,  H01L2224/81205

Abstract: PROBLEM TO BE SOLVED: To make it possible to use a contact structure directly attached to active silicon equipment, and especially, an elastic contact structure. SOLUTION: In a semiconductor package assembly 611, a board 612 which comprises conductive contact pads on a first surface and a second surface and which is composed of an insulating material is contained. In addition, a plurality of semiconductor devices 621 which comprise contact pads faced with the contact pads on the first surface and the second surface of the board 612 are contained. In addition, elastic contact structures 626 by which the contact pads of the semiconductor devices 621 and contact pads held by the board 612 are electrically connected to each other, and which are used to support the semiconductor devices in positions at intervals from the surface of the board 612 in such a way that the semiconductor devices 621 exist on a first parallel plane and a second parallel plane on both sides of the board 612 are contained. In addition, contact means 616 which are held by the board 612 and which form electrical contacts with the semiconductor devices 621 via the contact structures 626 are contained. COPYRIGHT: (C)2007,JPO&INPIT

Abstract translation: 要解决的问题：使得可以使用直接连接到有源硅设备的接触结构，特别是弹性接触结构。 解决方案：在半导体封装组件611中，包含在第一表面和第二表面上包括由绝缘材料构成的导电接触焊盘的板612。 此外，包含面对面板612的第一表面和第二表面上的接触焊盘的接触焊盘的多个半导体器件621。 另外，由半导体器件621的接触焊盘和由板612保持的接触焊盘的弹性接触结构626彼此电连接，并且用于将半导体器件从位于 板612，使得半导体器件621存在于第一平行平面上，并且包含在板612两侧的第二平行平面。 此外，包含由板612保持并且经由接触结构626与半导体器件621形成电接触的接触装置616。 版权所有（C）2007，JPO＆INPIT

公开(公告)号：JP2004336062A

公开(公告)日：2004-11-25

申请号：JP2004147222

申请日：2004-05-18

Applicant: Formfactor Inc ,  フォームファクター,インコーポレイテッド

Inventor： KHANDROS IGOR Y ,  ELDRIDGE BENJAMIN N ,  MATHIEU GAETAN L ,  DOSIRE THOMAS H ,  SMITH WILLIAM D

IPC: B23K20/00 ,  C23C18/16 ,  C25D5/08 ,  C25D5/22 ,  C25D7/12 ,  C25D21/02 ,  G01R1/067 ,  G01R1/073 ,  G01R3/00 ,  G01R31/28 ,  H01L21/00 ,  H01L21/48 ,  H01L21/56 ,  H01L21/60 ,  H01L21/603 ,  H01L21/66 ,  H01L21/68 ,  H01L23/48 ,  H01L23/485 ,  H01L23/49 ,  H01L23/498 ,  H01L25/065 ,  H01L25/16 ,  H01R33/76 ,  H05K1/14 ,  H05K3/20 ,  H05K3/32 ,  H05K3/40

CPC classification number: B23K20/004 ,  B23K2201/40 ,  C25D5/08 ,  C25D5/22 ,  C25D21/02 ,  G01R1/06711 ,  G01R1/06716 ,  G01R1/06744 ,  G01R1/07342 ,  G01R3/00 ,  G01R31/2884 ,  G01R31/2886 ,  H01L21/4853 ,  H01L21/4889 ,  H01L21/563 ,  H01L22/20 ,  H01L23/49811 ,  H01L24/11 ,  H01L24/13 ,  H01L24/72 ,  H01L24/81 ,  H01L25/0652 ,  H01L25/16 ,  H01L2224/13099 ,  H01L2224/131 ,  H01L2224/16145 ,  H01L2224/45144 ,  H01L2224/73203 ,  H01L2224/81801 ,  H01L2224/85201 ,  H01L2225/0651 ,  H01L2225/06527 ,  H01L2225/06555 ,  H01L2225/06572 ,  H01L2924/0001 ,  H01L2924/01004 ,  H01L2924/01005 ,  H01L2924/01006 ,  H01L2924/01012 ,  H01L2924/01013 ,  H01L2924/01015 ,  H01L2924/01019 ,  H01L2924/01022 ,  H01L2924/01027 ,  H01L2924/01029 ,  H01L2924/01033 ,  H01L2924/01039 ,  H01L2924/01042 ,  H01L2924/01045 ,  H01L2924/01046 ,  H01L2924/01047 ,  H01L2924/01049 ,  H01L2924/0105 ,  H01L2924/01051 ,  H01L2924/01057 ,  H01L2924/01074 ,  H01L2924/01075 ,  H01L2924/01078 ,  H01L2924/01079 ,  H01L2924/01082 ,  H01L2924/01322 ,  H01L2924/014 ,  H01L2924/09701 ,  H01L2924/10253 ,  H01L2924/10329 ,  H01L2924/12042 ,  H01L2924/14 ,  H01L2924/1532 ,  H01L2924/15787 ,  H01L2924/19041 ,  H01L2924/19043 ,  H01L2924/30107 ,  H01L2924/3011 ,  H01L2924/3025 ,  H05K1/141 ,  H05K3/20 ,  H05K3/326 ,  H05K3/4015 ,  H01L2924/00

Abstract: PROBLEM TO BE SOLVED: To provide a contact mechanism to a wafer in which a semiconductor is suitably aged at a stage of a wafer. SOLUTION: A plurality of free-standing mutual contact elements 710 such as contact bumps or free-standing spring contacts including both monolithic and composite interconnection elements are mounted to relatively small tile substrates 702 which are then mounted and connected to a relatively large electronic component substrate 706, thereby stationing a plurality of contact elements to an electronic component. In this manner, pressure connections can be made to an entire semiconductor wafer, at once, to provide for wafer-stage aging and the like. Further, solder balls, a z-axis conductive adhesive, or compliant connections are suitably employed for making electrical connections between the tile substrates 702 and the electronic component. COPYRIGHT: (C)2005,JPO&NCIPI

公开(公告)号：JP2003177144A

公开(公告)日：2003-06-27

申请号：JP2002285165

申请日：2002-09-30

Applicant: FORMFACTOR INC

Inventor： KHANDROS IGOR Y ,  MATHIEU GAETAN L ,  ELDRIDGE BENJAMIN N ,  GRUBE GARY W

IPC: G01R1/073 ,  B23K1/00 ,  B23K20/00 ,  B23K31/02 ,  C23C18/16 ,  C25D5/08 ,  C25D5/16 ,  C25D5/22 ,  C25D7/12 ,  C25D21/02 ,  G01R1/04 ,  G01R1/06 ,  G01R1/067 ,  G01R31/26 ,  G01R31/28 ,  H01L21/00 ,  H01L21/48 ,  H01L21/56 ,  H01L21/58 ,  H01L21/60 ,  H01L21/603 ,  H01L21/607 ,  H01L21/66 ,  H01L21/68 ,  H01L23/02 ,  H01L23/12 ,  H01L23/32 ,  H01L23/48 ,  H01L23/485 ,  H01L23/49 ,  H01L23/498 ,  H01L23/538 ,  H01L25/065 ,  H01L25/07 ,  H01L25/16 ,  H01L25/18 ,  H01R9/00 ,  H01R12/16 ,  H01R12/71 ,  H01R13/05 ,  H01R13/24 ,  H01R29/00 ,  H01R33/74 ,  H01R33/76 ,  H01R107/00 ,  H05H1/18 ,  H05K1/14 ,  H05K1/18 ,  H05K3/20 ,  H05K3/24 ,  H05K3/30 ,  H05K3/32 ,  H05K3/34 ,  H05K3/36 ,  H05K3/40 ,  H05K7/10

Abstract: PROBLEM TO BE SOLVED: To provide a technique for probing semiconductor devices. SOLUTION: This probe card assembly 500 is constituted from a probe card 502 and a space converter 506. The space converter 506 has a restorable contact structure (probe element) 524 mounted directly on the surface and elongating from the surface. An interposer 504 is disposed between the space converter 506 and the probe card 502. The space transformer 506 and the interposer 504 are piled so that orientation of the space transformer 506, namely, orientation of the tip of the probe element 524, can be adjusted without changing orientation of the probe card 502. Proper mechanisms 532, 534, 538, 546 for adjusting the orientation of the space transformer 506 and determining the degree of adjustment are provided. COPYRIGHT: (C)2003,JPO

公开(公告)号：JP2003031289A

公开(公告)日：2003-01-31

申请号：JP2002152167

申请日：2002-05-27

Applicant: Formfactor Inc ,  フォームファクター,インコーポレイテッド

Inventor： PEDERSEN DAVID V ,  KHANDROS IGOR Y

IPC: H01L23/12 ,  H01L21/20 ,  H01L21/3205 ,  H01L21/48 ,  H01L21/60 ,  H01L23/48 ,  H01L23/498 ,  H01L23/52 ,  H01L23/522 ,  H01R4/48 ,  H01R12/16 ,  H01R13/24 ,  H05K3/40

CPC classification number: H01L21/4853 ,  H01L23/49811 ,  H01L23/522 ,  H01L24/02 ,  H01L24/03 ,  H01L24/05 ,  H01L24/11 ,  H01L24/13 ,  H01L24/14 ,  H01L24/16 ,  H01L24/72 ,  H01L24/81 ,  H01L24/94 ,  H01L2224/02311 ,  H01L2224/02313 ,  H01L2224/0239 ,  H01L2224/036 ,  H01L2224/03912 ,  H01L2224/0401 ,  H01L2224/05166 ,  H01L2224/05644 ,  H01L2224/05666 ,  H01L2224/11003 ,  H01L2224/11005 ,  H01L2224/11334 ,  H01L2224/11426 ,  H01L2224/1143 ,  H01L2224/1145 ,  H01L2224/11452 ,  H01L2224/11462 ,  H01L2224/11464 ,  H01L2224/11472 ,  H01L2224/11474 ,  H01L2224/11823 ,  H01L2224/119 ,  H01L2224/13012 ,  H01L2224/13015 ,  H01L2224/13016 ,  H01L2224/13017 ,  H01L2224/13018 ,  H01L2224/13019 ,  H01L2224/13024 ,  H01L2224/1308 ,  H01L2224/13082 ,  H01L2224/13083 ,  H01L2224/13084 ,  H01L2224/131 ,  H01L2224/13109 ,  H01L2224/13111 ,  H01L2224/13113 ,  H01L2224/13116 ,  H01L2224/13139 ,  H01L2224/13144 ,  H01L2224/13147 ,  H01L2224/13155 ,  H01L2224/13157 ,  H01L2224/1316 ,  H01L2224/13163 ,  H01L2224/13164 ,  H01L2224/13166 ,  H01L2224/13169 ,  H01L2224/13173 ,  H01L2224/13176 ,  H01L2224/13178 ,  H01L2224/1318 ,  H01L2224/13184 ,  H01L2224/13562 ,  H01L2224/13644 ,  H01L2224/145 ,  H01L2224/16145 ,  H01L2224/16227 ,  H01L2224/81801 ,  H01L2224/94 ,  H01L2924/381 ,  H05K3/4092 ,  H01L2924/00012 ,  H01L2224/11 ,  H01L2924/014 ,  H01L2924/00014 ,  H01L2924/01074 ,  H01L2924/01027 ,  H01L2924/01028 ,  H01L2924/01082 ,  H01L2924/01108 ,  H01L2924/01104 ,  H01L2924/01022 ,  H01L2924/01079 ,  H01L2224/034 ,  H01L2224/1147 ,  H01L2224/0231 ,  H01L2224/114

Abstract: PROBLEM TO BE SOLVED: To provide improved technology to manufacture a spring contact element. SOLUTION: A microelectronic contact structural body is lithographically demarcated by applying a substrate 202 such as an electronic component, preparing an opening 222 on its mask layer 220, depositing the conductive trace of a seed layer 250 on the mask layer and in the opening, and building a mass of a conductive material on the conductive trace. The sidewall of the opening may be inclined. The conductive trace can be patterned by depositing a material through the stencil or a shadow mask 240. A protruding fixture 230 can be disposed on the mask layer so that the tip part of the contact structural body obtains topology. Plural elastic contact structural bodies precisely positioned can be formed by entirely composing these components as a group.

Abstract translation: 要解决的问题：提供改进的技术来制造弹簧接触元件。 解决方案：通过施加诸如电子部件的基底202，在其掩模层220上制备开口222，将种子层250的导电迹线沉积在掩模层和开口中，将光电子接触结构体光刻地划分，以及 在导电迹线上构建一块导电材料。 开口的侧壁可以是倾斜的。 导电迹线可以通过将材料沉积通过模板或荫罩240而被图案化。突出的夹具230可以设置在掩模层上，使得接触结构体的顶端获得拓扑结构。 可以通过完全组合这些组件作为一组来形成精确定位的多个弹性接触结构体。

公开(公告)号：JP2001156223A

公开(公告)日：2001-06-08

申请号：JP2000296240

申请日：2000-09-28

Applicant: FORMFACTOR INC

Inventor： KHANDROS IGOR Y ,  ELDRIDGE BENJAMIN N ,  MATHIEU GAETAN L ,  PEDERSEN DAVID V

IPC: G01R31/26 ,  G01R1/067 ,  G01R1/073 ,  G01R3/00 ,  G01R31/28 ,  G01R31/30 ,  H01H1/00 ,  H01L21/60 ,  H01L21/66 ,  H01L23/32 ,  H01L23/48 ,  H01L23/485 ,  H01L23/498 ,  H05K3/20 ,  H05K3/34 ,  H05K3/40

Abstract: PROBLEM TO BE SOLVED: To directly assemble a spring contact on an active electronic component such as a semiconductor device. SOLUTION: The spring contact component is assembled by depositing at least one layer of metal materials in side an opening formed on the surface of a substrate, which can be made into electronic component such as an active semiconductor device, with a deposited mask layer. Each of spring contact components has a bottom end, a contact end and a main body. The contact ends have steps on a z-axis (at different heights) and a step in one x-axis or y-axis direction from the bottom ends. Thus, a plurality of spring contact components are assembled keeping a specified spatial relation with the other components on the substrate. The spring contact component is formed with a temporary or eternal connection with the terminal of the other electronic component so as to provide electric connection between them. The spring contact component is located on a semiconductor device existent on a semiconductor wafer for burn-in and/or test the semiconductor device by performing temporary connection with the semiconductor device.

公开(公告)号：JPH11126800A

公开(公告)日：1999-05-11

申请号：JP23742498

申请日：1998-08-24

Applicant: FORMFACTOR INC

Inventor： KHANDROS IGOR Y ,  MATHIEU GAETAN L ,  ELDRIDGE BENJAMIN N ,  GRUBE GARY W ,  DOZIER THOMAS H

IPC: G01R1/073 ,  B23K1/00 ,  B23K20/00 ,  B23K31/02 ,  C23C18/16 ,  C25D5/08 ,  C25D5/16 ,  C25D5/22 ,  C25D7/12 ,  C25D21/02 ,  G01R1/04 ,  G01R1/06 ,  G01R1/067 ,  G01R31/26 ,  G01R31/28 ,  H01L21/00 ,  H01L21/48 ,  H01L21/56 ,  H01L21/58 ,  H01L21/60 ,  H01L21/603 ,  H01L21/607 ,  H01L21/66 ,  H01L21/68 ,  H01L23/02 ,  H01L23/12 ,  H01L23/32 ,  H01L23/48 ,  H01L23/485 ,  H01L23/49 ,  H01L23/498 ,  H01L23/538 ,  H01L25/065 ,  H01L25/07 ,  H01L25/16 ,  H01L25/18 ,  H01R9/00 ,  H01R12/16 ,  H01R12/71 ,  H01R13/05 ,  H01R13/24 ,  H01R29/00 ,  H01R33/74 ,  H01R33/76 ,  H01R107/00 ,  H05H1/18 ,  H05K1/14 ,  H05K1/18 ,  H05K3/20 ,  H05K3/24 ,  H05K3/30 ,  H05K3/32 ,  H05K3/34 ,  H05K3/36 ,  H05K3/40 ,  H05K7/10 ,  H01R23/68

Abstract: PROBLEM TO BE SOLVED: To form a solder ball and/or an uplifted solder bump on an electronic component, especially on a chip carrier or a semiconductor package, by forming mutually connected elements, especially spring elements, and mounting the mutually connected elements on the electronic component. SOLUTION: In a performing pattern 200 of a mutually connected element 210 which is mounted on an electronic component 212 wherein a terminal 214 is provided, one end of a soft wire core of gold or the like is bonded to the terminal 214. The core is extended from the terminal and formed so as to have the spring shape and cut so as to have the free end. The bonding, molding and cutting of the wire are performed by using a wire bonding device. The adhesive agent at an end part 216a of the core covers only the relatively small part of the exposed surface of the terminal 214. A shell is arranged along the wire core 16 and has an inner layer 218 and an outer layer 220 when multilayered pattern is formed. The both layers can be formed adequately by the plating process.

公开(公告)号：JP2008275646A

公开(公告)日：2008-11-13

申请号：JP2008204891

申请日：2008-08-07

Applicant: Formfactor Inc ,  フォームファクター, インコーポレイテッド

Inventor： KHANDROS IGOR Y ,  ELDRIDGE BENJAMIN N ,  MATHIEU GAETAN L ,  GARY W GRUBE

IPC: G01R1/073 ,  G01R1/067 ,  G01R3/00 ,  G01R31/28 ,  G01R31/316 ,  H01H1/00 ,  H01L21/66 ,  H01L23/48 ,  H01L23/485 ,  H01L23/498 ,  H01R13/24 ,  H05K3/20 ,  H05K3/34

CPC classification number: G01R1/07342 ,  G01R1/06727 ,  G01R1/06744 ,  G01R3/00 ,  H01H1/0036 ,  H01L23/49811 ,  H01L24/06 ,  H01L24/10 ,  H01L24/45 ,  H01L24/72 ,  H01L2224/04042 ,  H01L2224/05639 ,  H01L2224/05644 ,  H01L2224/05647 ,  H01L2224/05657 ,  H01L2224/0566 ,  H01L2224/06136 ,  H01L2224/45144 ,  H01L2224/48639 ,  H01L2224/48644 ,  H01L2224/48647 ,  H01L2924/00013 ,  H01L2924/00014 ,  H01L2924/01005 ,  H01L2924/01006 ,  H01L2924/01013 ,  H01L2924/01014 ,  H01L2924/01015 ,  H01L2924/01019 ,  H01L2924/01022 ,  H01L2924/01024 ,  H01L2924/01027 ,  H01L2924/01028 ,  H01L2924/01029 ,  H01L2924/01033 ,  H01L2924/01039 ,  H01L2924/01042 ,  H01L2924/01045 ,  H01L2924/01046 ,  H01L2924/01047 ,  H01L2924/01049 ,  H01L2924/0105 ,  H01L2924/01057 ,  H01L2924/01074 ,  H01L2924/01078 ,  H01L2924/01079 ,  H01L2924/01082 ,  H01L2924/014 ,  H01L2924/10253 ,  H01L2924/12042 ,  H01L2924/14 ,  H01L2924/1433 ,  H01L2924/3011 ,  H01L2924/3025 ,  H05K3/20 ,  H05K3/3421 ,  H01L2224/13099 ,  H01L2924/00 ,  H01L2224/48657 ,  H01L2224/4866 ,  H01L2224/85399

Abstract: PROBLEM TO BE SOLVED: To provide a microelectronic contact structure and its manufacturing method. SOLUTION: The method for mounting two or more spring contact elements to the terminals of an electronic component includes fabricating the two or more spring contact elements on a sacrificial substrate, then mounting the parts of the spring contact elements to the terminals of the electronic component while the spring contact elements are on the sacrificial substrate, and removing the sacrificial substrate after the parts of the spring contact elements are mounted to the terminals of the electronic component. COPYRIGHT: (C)2009,JPO&INPIT

Abstract translation: 要解决的问题：提供微电子接触结构及其制造方法。 解决方案：将两个或更多个弹簧接触元件安装到电子部件的端子的方法包括在牺牲基板上制造两个或更多个弹簧接触元件，然后将弹簧接触元件的部件安装到 电子部件，同时弹簧接触元件在牺牲基板上，并且在部分弹簧接触元件安装到电子部件的端子之后移除牺牲基板。 版权所有（C）2009，JPO＆INPIT

公开(公告)号：JP2006084475A

公开(公告)日：2006-03-30

申请号：JP2005278874

申请日：2005-09-26

Applicant: Formfactor Inc ,  フォームファクター,インコーポレイテッド

Inventor： KHANDROS IGOR Y ,  MATHIEU GAETAN L ,  ELDRIDGE BENJAMIN N ,  GRUBE GARY W

IPC: G01R1/073 ,  B23K1/00 ,  B23K20/00 ,  B23K31/02 ,  C23C18/16 ,  C25D5/08 ,  C25D5/16 ,  C25D5/22 ,  C25D7/12 ,  C25D21/02 ,  G01R1/04 ,  G01R1/06 ,  G01R1/067 ,  G01R31/26 ,  G01R31/28 ,  H01L21/00 ,  H01L21/48 ,  H01L21/56 ,  H01L21/58 ,  H01L21/60 ,  H01L21/603 ,  H01L21/607 ,  H01L21/66 ,  H01L21/68 ,  H01L23/02 ,  H01L23/12 ,  H01L23/32 ,  H01L23/48 ,  H01L23/485 ,  H01L23/49 ,  H01L23/498 ,  H01L23/538 ,  H01L25/065 ,  H01L25/07 ,  H01L25/16 ,  H01L25/18 ,  H01R9/00 ,  H01R12/71 ,  H01R13/05 ,  H01R13/24 ,  H01R29/00 ,  H01R31/06 ,  H01R33/74 ,  H01R33/76 ,  H01R107/00 ,  H05H1/18 ,  H05K1/14 ,  H05K1/18 ,  H05K3/20 ,  H05K3/24 ,  H05K3/30 ,  H05K3/32 ,  H05K3/34 ,  H05K3/36 ,  H05K3/40 ,  H05K7/10

CPC classification number: H05K7/1069 ,  B23K1/0016 ,  B23K20/004 ,  B23K2201/40 ,  C25D5/08 ,  C25D5/22 ,  C25D7/12 ,  C25D21/02 ,  G01R1/0466 ,  G01R1/0483 ,  G01R1/06711 ,  G01R1/07314 ,  G01R1/07342 ,  G01R1/07357 ,  G01R1/07371 ,  G01R1/07378 ,  G01R31/2884 ,  G01R31/2886 ,  G01R31/2889 ,  H01L21/4853 ,  H01L21/4889 ,  H01L21/563 ,  H01L21/67138 ,  H01L22/20 ,  H01L23/32 ,  H01L23/49811 ,  H01L24/11 ,  H01L24/12 ,  H01L24/16 ,  H01L24/29 ,  H01L24/45 ,  H01L24/48 ,  H01L24/49 ,  H01L24/72 ,  H01L24/81 ,  H01L25/0652 ,  H01L25/16 ,  H01L2224/0401 ,  H01L2224/05124 ,  H01L2224/05166 ,  H01L2224/05599 ,  H01L2224/05647 ,  H01L2224/1134 ,  H01L2224/13099 ,  H01L2224/131 ,  H01L2224/13124 ,  H01L2224/13144 ,  H01L2224/13147 ,  H01L2224/13639 ,  H01L2224/13644 ,  H01L2224/13647 ,  H01L2224/13655 ,  H01L2224/13657 ,  H01L2224/16145 ,  H01L2224/29111 ,  H01L2224/45014 ,  H01L2224/45015 ,  H01L2224/45111 ,  H01L2224/45124 ,  H01L2224/45139 ,  H01L2224/45144 ,  H01L2224/45147 ,  H01L2224/4554 ,  H01L2224/456 ,  H01L2224/48091 ,  H01L2224/48227 ,  H01L2224/48463 ,  H01L2224/48599 ,  H01L2224/48699 ,  H01L2224/48799 ,  H01L2224/49109 ,  H01L2224/73203 ,  H01L2224/73204 ,  H01L2224/73265 ,  H01L2224/78301 ,  H01L2224/81801 ,  H01L2224/85201 ,  H01L2225/0651 ,  H01L2225/06527 ,  H01L2225/06555 ,  H01L2225/06572 ,  H01L2924/00013 ,  H01L2924/00014 ,  H01L2924/01005 ,  H01L2924/01006 ,  H01L2924/01011 ,  H01L2924/01012 ,  H01L2924/01014 ,  H01L2924/01015 ,  H01L2924/01018 ,  H01L2924/01019 ,  H01L2924/01022 ,  H01L2924/01023 ,  H01L2924/01027 ,  H01L2924/01028 ,  H01L2924/01029 ,  H01L2924/0103 ,  H01L2924/01032 ,  H01L2924/01033 ,  H01L2924/01037 ,  H01L2924/01039 ,  H01L2924/01042 ,  H01L2924/01044 ,  H01L2924/01045 ,  H01L2924/01046 ,  H01L2924/01047 ,  H01L2924/01049 ,  H01L2924/0105 ,  H01L2924/01051 ,  H01L2924/01057 ,  H01L2924/0106 ,  H01L2924/01074 ,  H01L2924/01075 ,  H01L2924/01076 ,  H01L2924/01077 ,  H01L2924/01078 ,  H01L2924/01079 ,  H01L2924/01082 ,  H01L2924/01088 ,  H01L2924/0132 ,  H01L2924/01322 ,  H01L2924/0133 ,  H01L2924/014 ,  H01L2924/07802 ,  H01L2924/10253 ,  H01L2924/10329 ,  H01L2924/12041 ,  H01L2924/12042 ,  H01L2924/12044 ,  H01L2924/14 ,  H01L2924/15153 ,  H01L2924/15165 ,  H01L2924/1517 ,  H01L2924/15312 ,  H01L2924/1532 ,  H01L2924/15787 ,  H01L2924/16195 ,  H01L2924/181 ,  H01L2924/19041 ,  H01L2924/19043 ,  H01L2924/30105 ,  H01L2924/30107 ,  H01L2924/3011 ,  H01L2924/3025 ,  H01R12/52 ,  H01R13/2407 ,  H01R13/2464 ,  H05K1/141 ,  H05K3/20 ,  H05K3/326 ,  H05K3/3421 ,  H05K3/368 ,  H05K3/4015 ,  H05K3/4092 ,  H05K2201/0397 ,  H05K2201/068 ,  H05K2201/1031 ,  H05K2201/10318 ,  H05K2201/10378 ,  H05K2201/10719 ,  H05K2201/10734 ,  H05K2201/10757 ,  H05K2201/10878 ,  Y02P70/611 ,  H01L2924/00 ,  H01L2924/01013 ,  H01L2924/01026 ,  H01L2924/3512 ,  H01L2224/29099 ,  H01L2224/48 ,  H01L2924/20752 ,  H01L2924/20753 ,  H01L2924/20754 ,  H01L2924/20755 ,  H01L2924/00012 ,  H01L2924/20751 ,  H01L2924/20756 ,  H01L2924/20757 ,  H01L2924/00015 ,  H01L2924/2075

Abstract: PROBLEM TO BE SOLVED: To provide a technique for applying a probe onto a semiconductor element, wherein the tip of a probe element can be oriented without changing the position of a probe card. SOLUTION: The probe card assembly includes: the probe card (electronic component) having an upper surface, a lower surface, and a plurality of terminals in the upper surface; an intervening body (electronic component) having an upper surface, a lower surface, a first plurality of restorable contact structures extending from terminals in the lower surface, and a second plurality of restorable contact structures extending from terminals in the upper surface; and an interval changer having an upper surface, a lower surface, a plurality of contact pads (terminals) provided on the lower surface, and a third restorable contact structure (probe element) extending from a terminal in the upper surface. COPYRIGHT: (C)2006,JPO&NCIPI

Abstract translation: 要解决的问题：提供一种将探针施加到半导体元件上的技术，其中探针元件的尖端可以定向而不改变探针卡的位置。 解决方案：探针卡组件包括：在上表面具有上表面，下表面和多个端子的探针卡（电子部件）; 具有上表面，下表面，从下表面中的端子延伸的第一多个可恢复接触结构的中间体（电子部件）和从上表面中的端子延伸的第二多个可恢复接触结构; 以及具有上表面，下表面，设置在下表面上的多个接触垫（端子）和从上表面中的端子延伸的第三可恢复接触结构（探针元件）的间隔变换器。 版权所有（C）2006，JPO＆NCIPI

公开(公告)号：JP2005252313A

公开(公告)日：2005-09-15

申请号：JP2005162980

申请日：2005-06-02

Applicant: Formfactor Inc ,  フォームファクター,インコーポレイテッド

Inventor： KHANDROS IGOR Y ,  GETAN L MATTHEW

IPC: H01L23/12 ,  C23C18/16 ,  C25D7/12 ,  G01R1/04 ,  G01R1/067 ,  G01R1/073 ,  G01R3/00 ,  G01R31/26 ,  G01R31/28 ,  H01L21/00 ,  H01L21/48 ,  H01L21/56 ,  H01L21/60 ,  H01L21/66 ,  H01L23/32 ,  H01L23/48 ,  H01L23/485 ,  H01L23/49 ,  H01L23/498 ,  H01L25/065 ,  H01L25/07 ,  H01L25/16 ,  H01L25/18 ,  H01R4/02 ,  H01R9/00 ,  H01R12/52 ,  H01R33/76 ,  H05K1/14 ,  H05K3/30 ,  H05K3/32 ,  H05K3/34 ,  H05K3/36 ,  H05K3/40 ,  H05K7/10

CPC classification number: H05K7/1069 ,  B23K2201/40 ,  G01R1/0466 ,  G01R1/0483 ,  G01R1/06711 ,  G01R1/06716 ,  G01R1/06761 ,  G01R1/07314 ,  G01R1/07342 ,  G01R1/07357 ,  G01R3/00 ,  G01R31/2884 ,  G01R31/2886 ,  H01L21/4853 ,  H01L21/563 ,  H01L21/67138 ,  H01L21/6715 ,  H01L22/20 ,  H01L23/49811 ,  H01L23/49827 ,  H01L24/11 ,  H01L24/13 ,  H01L24/16 ,  H01L24/45 ,  H01L24/49 ,  H01L24/72 ,  H01L24/81 ,  H01L25/0652 ,  H01L25/16 ,  H01L2224/0401 ,  H01L2224/06153 ,  H01L2224/1134 ,  H01L2224/13083 ,  H01L2224/13099 ,  H01L2224/13124 ,  H01L2224/13144 ,  H01L2224/13147 ,  H01L2224/136 ,  H01L2224/13639 ,  H01L2224/13644 ,  H01L2224/13647 ,  H01L2224/13655 ,  H01L2224/13657 ,  H01L2224/45124 ,  H01L2224/45144 ,  H01L2224/45147 ,  H01L2224/4554 ,  H01L2224/49109 ,  H01L2224/73203 ,  H01L2224/78301 ,  H01L2224/81801 ,  H01L2224/85045 ,  H01L2224/85205 ,  H01L2924/00013 ,  H01L2924/00014 ,  H01L2924/01005 ,  H01L2924/01006 ,  H01L2924/01011 ,  H01L2924/01012 ,  H01L2924/01014 ,  H01L2924/01015 ,  H01L2924/01022 ,  H01L2924/01027 ,  H01L2924/01028 ,  H01L2924/01029 ,  H01L2924/01033 ,  H01L2924/01039 ,  H01L2924/01042 ,  H01L2924/01044 ,  H01L2924/01045 ,  H01L2924/01046 ,  H01L2924/01047 ,  H01L2924/01049 ,  H01L2924/0105 ,  H01L2924/01051 ,  H01L2924/01055 ,  H01L2924/01074 ,  H01L2924/01078 ,  H01L2924/01079 ,  H01L2924/01082 ,  H01L2924/01322 ,  H01L2924/01327 ,  H01L2924/014 ,  H01L2924/10253 ,  H01L2924/14 ,  H01L2924/15153 ,  H01L2924/1517 ,  H01L2924/15312 ,  H01L2924/15787 ,  H01L2924/16152 ,  H01L2924/16195 ,  H01L2924/181 ,  H01L2924/19041 ,  H01L2924/19043 ,  H01L2924/19107 ,  H01L2924/30107 ,  H01L2924/3011 ,  H01L2924/3025 ,  H01R12/52 ,  H05K1/141 ,  H05K3/308 ,  H05K3/326 ,  H05K3/3421 ,  H05K3/3426 ,  H05K3/368 ,  H05K3/4015 ,  H05K3/4092 ,  H05K2201/0397 ,  H05K2201/068 ,  H05K2201/1031 ,  H05K2201/10318 ,  H05K2201/10378 ,  H05K2201/10719 ,  H05K2201/10734 ,  H05K2201/10757 ,  H05K2201/10878 ,  H05K2201/10909 ,  H05K2201/10946 ,  Y02P70/611 ,  Y02P70/613 ,  Y10T29/49124 ,  Y10T29/49144 ,  Y10T29/49147 ,  Y10T29/49149 ,  Y10T29/49162 ,  Y10T29/49169 ,  Y10T29/49217 ,  Y10T29/49224 ,  H01L2924/00 ,  H01L2224/48 ,  H01L2224/81205

Abstract: PROBLEM TO BE SOLVED: To provide a semiconductor package assembly having an improved contact structure. SOLUTION: A semiconductor assembly 611 includes; a substrate 612 made of an insulating material which has conductive contact pads formed on its first surface and second surface; a plurality of semiconductor devices 612 having contact pads opposite to the contact pads on the first and second surfaces of the substrate 612; a spring contact structure 626 for electrically interconnecting the contact pads of the semiconductor devices 612 and the contact pads held by the substrate 612 and for supporting the semiconductor devices at positions spaced from the surface of the substrate 612 such that the semiconductor devices 612 are placed on the first and second planes in parallel each other which are both sides of the substrate 612; and a contact means 616 held by the substrate 612 for forming an electrical contact to the semiconductor devices 612 through the contact structure 626. COPYRIGHT: (C)2005,JPO&NCIPI

Abstract translation: 要解决的问题：提供具有改进的接触结构的半导体封装组件。 解决方案：半导体组件611包括： 由绝缘材料制成的基板612，其具有形成在其第一表面和第二表面上的导电接触焊盘; 具有与衬底612的第一和第二表面上的接触焊盘相对的接触焊盘的多个半导体器件612; 弹簧接触结构626，用于将半导体器件612的接触焊盘和由衬底612保持的接触焊盘电互连，并用于将半导体器件支撑在与衬底612的表面隔开的位置处，使得半导体器件612放置在 第一平面和第二平面彼此是基板612的两侧; 以及由衬底612保持的接触装置616，用于通过接触结构626形成与半导体器件612的电接触。版权所有：（C）2005，JPO＆NCIPI