Abstract:
The invention relates to an MRAM arrangement, comprising a selection transistor (T), connected to several MTJ memory cells (1) and with an increased channel width.
Abstract:
A decoder element is provided with an output, whereby an output signal with one of three different possible potentials is produced. The output signal may have a value of either a first potential, a second potential, and a third potential, where the second potential lies between the first potential and the third potential. The output signal is produced according to voltage values of input signals at terminal connections of the decoder element.
Abstract:
A bit line (BL) first driver (FD) (T1) has an FD current source (J3) and an FD n-channel field effect transistor (N6) with a channel width (wn). The FD current source and the FD field effect transistor connect in series between a BL source of voltage supply (V-SupplyBL) and the BL. A second driver (SD) (T2) for a word line (WL) has an SD current source (J0) that connects with an SD field effect transistor (N0) in series between a WL source of voltage supply (V-SupplyWL) and the WL.
Abstract:
The memory device has a matrix of magnetic tunnel junction memory cells (1), each connected between a bit line (B1-B4) and a plate line (PL), with selection transistors coupled to the plate line connected at their gate electrodes to perpendicular word lines (W1-W4). Each selection transistor is associated with several magnetic tunnel junction memory cells, with its channel width determined by the number of associated magnetic tunnel junction memory cells.
Abstract:
Both ends of a selected word line (WL2) are set at a high voltage (V2) to keep the voltage drop on the selected word line as low as possible. A cell (Z22) is read out at an intersecting point between the selected word line and a bit line. Other word lines are set at another voltage level. An Independent claim is also included for a method for reducing the voltage drop along a word/bit line in an MRAM memory.
Abstract:
The CFRAM arrangement has a number of memory cells each consisting of a ferroelectric storage capacitor and a selection transistor. Each block of selection transistors is associated with a block-select-transistor. The selection transistors and the block-select-transistor are arranged between a plate line and a bit line and the selection transistors are each connected to word lines. The selection transistors are depletion type FETs. The CFRAM arrangement has a number of memory cells (Z0-Z3) each consisting of a ferroelectric storage capacitor (Cferro0...) and a selection transistor (Tdep10..). Each block of selection transistors is associated with a block-select-transistor (TEnh). The selection transistors and the block-select-transistor are arranged between a plate line (PL) and a bit line (BL) and the selection transistors are each connected to word lines (WL0...). The selection transistors are depletion type field effect transistors.
Abstract:
A bit line (BL) first driver (FD) (T1) has an FD current source (J3) and an FD n-channel field effect transistor (N6) with a channel width (wn). The FD current source and the FD field effect transistor connect in series between a BL source of voltage supply (V-SupplyBL) and the BL. A second driver (SD) (T2) for a word line (WL) has an SD current source (J0) that connects with an SD field effect transistor (N0) in series between a WL source of voltage supply (V-SupplyWL) and the WL.
Abstract:
The circuit includes an information memory with an addressing device with a decoder and an input circuit. The number of address terminal contacts (11,12) is equal to a sum Z+S, where Z is the number of bits required by M elements, and S is the number of bits required by N elements. The numbers P and Q are selected so that for addressing P elements K less than or equal to (Z-2) bits are required and for addressing Q elements L less than or equal to (S-2) bits are required. The input circuit (11-36) has an additional control bit contact (13) and a switchover device (31-34) which receives a control bit to set a first operating mode or a second, third or fourth operating mode accordingly.
Abstract:
The memory arrangement has a memory cell field (7) with a number of memory cells driven via word lines and bit lines and a refresh logic circuit (8) for refreshing the memory contents of the memory cell field. A comparator circuit (9) compares a characteristic parameter of at least one memory cell (10) with a reference value (VREF) and activates the refresh logic as required.