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公开(公告)号:JP2001273761A
公开(公告)日:2001-10-05
申请号:JP2001037522
申请日:2001-02-14
Applicant: INFINEON TECHNOLOGIES AG
Inventor: BACHHOFER HARALD , HANEDER THOMAS PETER , ULLMANN MARC , BRAUN GEORG , HONLEIN WOLFGANG
IPC: G11C11/22 , H01L21/8246 , H01L21/8247 , H01L27/105 , H01L29/788 , H01L29/792
Abstract: PROBLEM TO BE SOLVED: To prevent a present state from being changed to a polarization state in which other ferroelectrioc transistor in other memory cell in a memory matrix cannot be discriminated, when a state is read out from a ferroelectric transistor or a state is stored in the ferroelectric transistor. SOLUTION: Threshold voltage of an other ferroelectric transistor in a memory matrix is increased by applying drain-substrate voltage to a ferroelectric transistor, when a state is read out from a ferroelectric transistor or a state is stored in the ferroelectric transistor.
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公开(公告)号:JP2001351374A
公开(公告)日:2001-12-21
申请号:JP2001121421
申请日:2001-04-19
Applicant: INFINEON TECHNOLOGIES AG
Inventor: BRAUN GEORG , HOENIGSCHMID HEINZ
IPC: G11C11/22
Abstract: PROBLEM TO BE SOLVED: To constitute a circuit so that the ratio of bit line capacitance to the capacitance of a ferroelectric capacitor can be selected over further wider range, in a circuit for reading out a memory cell provided with a ferroelectric capacitor. SOLUTION: This circuit is provided with a bit line BL connected to a memory cell FSPZ and a differential amplifier D. An input side DE1 of a first differential amplifier is connected to the bit line BL, and a reference signal VBSOLL is supplied to a second differential amplifier DE2. The device is also provided with a first driver circuit TR1 provided with a driver input side TRE1 and a first driver output side TRA1. A differential amplifier output side DA is connected to the first driver input side TRE1, and the first driver output side TRA1 is connected to the bit line BL, and a potential of the bit line BL is controlled according to a potential of the reference signal VBSOLL.
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公开(公告)号:JP2001291386A
公开(公告)日:2001-10-19
申请号:JP2001047191
申请日:2001-02-22
Applicant: INFINEON TECHNOLOGIES AG
Inventor: BRAUN GEORG , HONIGSCHMID HEINZ
IPC: G11C11/22 , H01L21/8246 , H01L27/10 , H01L27/105
Abstract: PROBLEM TO BE SOLVED: To suppress occurrence of an error more than a publicly-known memory by providing an integrated memory. SOLUTION: This memory is provided with a driver unit, and a column selection line is connected to a plate type line segment through this driver unit, The driver unit forms a potential of a prescribed value for respective operation state of memories depending on a potential of a belonging column selection line and a word address of a connected plate type line segment.
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公开(公告)号:JP2000353398A
公开(公告)日:2000-12-19
申请号:JP2000126387
申请日:2000-04-26
Applicant: INFINEON TECHNOLOGIES AG
Inventor: HOENIGSCHMID HEINZ , BRAUN GEORG
IPC: G01R31/28 , G11C11/22 , G11C11/401 , G11C11/406 , G11C14/00 , G11C29/34 , G11C29/00
Abstract: PROBLEM TO BE SOLVED: To provide an integrated memory in which simultaneous write-in of the same logic information is easily performed in plural memory cells. SOLUTION: An integrated memory has bit lines BLi, word lines WLk, and memory cells MC arranged at intersections of plate electrode lines PLi. In a first operation mode, a plate electrode line PLi is left at a plate electrode potential VPL of a fixed period of write-in access. In a second operation mode, the bit line is left at a plate electrode potential, on the other hand, a plate electrode line PLi takes the prescribed potential VF other than the plate electrode potential VPL.
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公开(公告)号:JP2002170378A
公开(公告)日:2002-06-14
申请号:JP2001249665
申请日:2001-08-20
Applicant: INFINEON TECHNOLOGIES AG
Inventor: BENEDIX ALEXANDER , BRAUN GEORG , FISCHER HELMUT , KLEHN BERND , KUHNE SEBASTIAN
IPC: G11C11/14 , G11C11/15 , G11C11/16 , H01F17/00 , H01F17/02 , H01F27/245 , H01L21/822 , H01L21/8246 , H01L27/04 , H01L27/105 , H01L43/08
Abstract: PROBLEM TO BE SOLVED: To provide an inductance which can be integrated monolithically and can be utilized profitably especially in an MRAM mechanism. SOLUTION: This inductance can be integrated monolithically and comprises continuous layers in which conduction layers (P1-P4) and insulation layers (I1-I3) are laminated upward and downward alternately. This constitution of the conduction layers (P1-P4) has a coil-like structure in which a center region (M) being able to provide GMR materials (WM, TB, HM) is centered.
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公开(公告)号:JP2001229667A
公开(公告)日:2001-08-24
申请号:JP2001013090
申请日:2001-01-22
Applicant: INFINEON TECHNOLOGIES AG
Inventor: BOEHM THOMAS , BRAUN GEORG , HOENIGSCHMID HEINZ , ROEHR THOMAS
IPC: G11C14/00 , G11C11/22 , G11C11/406
Abstract: PROBLEM TO BE SOLVED: To constitute a refresh cycle as advantageously as possible regarding a required energy demand in a semiconductor memory. SOLUTION: In this semiconductor memory, a refresh logic circuit (8) is started in the case of detecting a prescribed minimum deviation at the time of comparing the feature amount of at least one reference memory cell (10) with a reference value (VREF).
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公开(公告)号:JP2000156091A
公开(公告)日:2000-06-06
申请号:JP32163899
申请日:1999-11-11
Applicant: INFINEON TECHNOLOGIES AG
Inventor: ROEHR THOMAS , HOENIGSCHMID HEINZ , BRAUN GEORG
Abstract: PROBLEM TO BE SOLVED: To reduce remarkably a time for reading out by connecting respectively one short circuit element to one side bit line of two pairs of bit line, applying a reference signal to a sense amplifier through a first pair of bit line, simultaneously, applying a read-out signal to the sense amplifier through a second pair of bit line. SOLUTION: In a short circuit element SG, being not adjacent bit lines, but every other bit lines are connected mutually. This way is indicated by a bit line BL , BL or bBL , bBL , further, in this case, two control lines INIT , INIT are not used for pre-charge, but used for short-circuiting two bit lines BL , BL or bBL , bBL . Active memory cells L and a reference cell R are arranged comparatively densely in the same block as a memory cell field by arranging utilized pairs of bit line in parallel.
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公开(公告)号:WO0127974A3
公开(公告)日:2001-10-18
申请号:PCT/EP0009739
申请日:2000-10-05
Applicant: INFINEON TECHNOLOGIES AG , HOENIGSCHMID HEINZ , BRAUN GEORG
Inventor: HOENIGSCHMID HEINZ , BRAUN GEORG
IPC: G11C5/10 , H01L21/8242 , H01L27/108
CPC classification number: H01L27/10885 , G11C5/10 , H01L27/10811 , H01L27/10814
Abstract: The invention relates to a memory device comprising numerous memory cells, each cell comprising at least one selection transistor and one stacked capacitor and being driven via word (3) and bit lines (14, 16). Said memory device is characterised in that the bit lines (14, 16) are led through two metallised sheets and in that the stacked capacitors (7, 8, 9) of the memory cells are located between these metallised sheets.
Abstract translation: 根据本发明,提供了一种具有多个存储器单元的存储器装置的每一个包括至少一个选择晶体管和一个叠置电容器和经由字(3) - 和位线(14,16)是可控的。 根据本发明的存储系统的特征在于:(14,16)在两个金属化被引导所述位线和所述层叠电容器(7,8,9)的金属化平面之间的存储器单元的布置。
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公开(公告)号:DE10146491B4
公开(公告)日:2006-04-13
申请号:DE10146491
申请日:2001-09-21
Applicant: INFINEON TECHNOLOGIES AG
Inventor: KANDOLF HELMUT , BRAUN GEORG
IPC: H04L25/06 , H03K19/00 , H03K19/0175 , H04B3/04 , H04L12/40
Abstract: An electronic circuit has a driver circuit to drive a signal onto a signal line. The driver circuit contains a first switching device with a first forward resistance between a first supply voltage terminal and the signal line, and a second switching device with a second forward resistance between a second supply voltage terminal and the signal line. A control circuit is provided to generate a first and a second control signal to control the first and second switching devices in a first operating mode such that, depending on the signal which is to be driven, either the first switching device or the second switching device is through-connected. In a second operating mode, the first switching device and the second switching device are essentially through-connected with the aid of the first and second control signals so that the first and second forward resistances together form a terminating resistance.
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公开(公告)号:DE10121241B4
公开(公告)日:2005-07-07
申请号:DE10121241
申请日:2001-04-30
Applicant: INFINEON TECHNOLOGIES AG
Inventor: MUFF SIMON , GALL MARTIN , SCHAEFER ANDRE , BRAUN GEORG
IPC: H01L23/34 , H01L23/495 , H01L23/50 , H01L23/66
Abstract: An integrated circuit which is integrated in a housing having connecting pins fitted to the housing for connecting the housing to signal lines of an external circuit, each connecting pin connected by an associated wiring line to a contact pad of the circuit integrated in the housing, to exchange signals between the external circuit and the integrated circuit, where to minimize the line lengths of the associated wiring lines, the connecting pins to be connected to signal lines for high-frequency signals are fitted centrally to the housing.
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