Abstract:
A microelectronic assembly including elements such as a semiconductor chip (28) and substrate (60) has electrical connections between the elements incorporating fusible conductive metal masses (42). The fusible masses are surrounded and contained by a compliant material (54) such as an elastomer or gel. The fusible material may melt during operation or processing of the device to relieve thermal cycling stress in the electrical connections.
Abstract:
A method of encapsulating a semiconductor device. The encapsulation method includes a semiconductor chip package assembly (10) having a spacer (20) layer between a top surface of a sheet-like substrate (16) and a contact bearing surface of a semiconductor chip (12), wherein the substrate (16) has conductive leads (22) thereon, the leads (22) being electrically connected to terminals (26) on a first end and bonded to respective chip contacts (24) on a second end. Typically, the spacer layer (20) is comprised of a compliant or elastomeric material (40). A protective layer (30) is attached on a bottom surface of the substrate (16) so as to cover the terminals (26) on the substrate. A flowable, curable encapsulant material (40) is deposited around a periphery of the semiconductor chip (12) after the attachment of the protective layer (30) so as to encapsulate the leads (22). The encapsulant material (40) is then cured. Typically, this encapsulation method is performed on a plurality of chip assemblies simultaneously.
Abstract:
A plurality of separate semiconductor chips (58), each having a contact-bearing surface (59) and contacts (64) on such surface, are disposed in an array so that the contact-bearing surfaces face and define a first surface of the array. A flexible, dielectric sheet (30) with terminals (34) thereon overlies the first or contact bearing surface of the semiconductor chips. Elongated leads (40) are disposed between the dielectric element and the semiconductor chips. Each lead has a first end (42) connected to a terminal on the dielectric element, and a second end (44) connected to a contact on a semiconductor chip in the array. All of the leads are formed simultaneously by moving the dielectric element and the array relative to one another to simultaneously displace all of the first ends of the leads relative to all of the second ends. The dielectric element is subdivided after the forming step so as to leave one region of the dielectric element connected to each chip and thereby form individual units each including one chip, or a small number of chips.
Abstract:
A multi-layer circuit panel assembly is formed by laminating circuit panels (10) with interposers (12) incorporating flowable conductive material (48) at interconnect locations and a flowable dielectric material (30, 38) at other locations. Excess materials are captured in reservoirs (20) in the circuit panels. The flowable materials and reservoirs allow the interposers to compress and take up tolerances in the components. The stacked panels may have contacts (538) on their top surfaces, through conductors (527) extending between top and bottom and terminals (530) connected to the bottom end of each through conductor. The terminals and contacts are nonselectively connected to one another at each interface so that wherever a terminal and contact an adjacent panels are aligned with one another, these are connected to one another. This forms composite vertical conductors extending through a plurality of the panels. The selective treatment of the panel top and bottom surfaces provides selective interruptions in the vertical conductors.
Abstract:
A microelectronic connection component (62) has flexible leads (36) formed by polymeric strips (46, 50) with metallic conductors thereon. The metallic conductors (46, 50) may be very thin, desirably less than 5 microns thick, and provide good fatigue resistance. Each strip (46 or 50) may have two conductors thereon, one serving as a principal or signal conductor for connection to a contact on a chip (62) or other microelectronic element and the other serving as potential reference or ground conductor. The potential reference conductor on the lead provides enhanced resistance to crosstalk.
Abstract:
A thermal connector for conducting heat from microelectronic components such as semiconductor chips to a heat sink. The connector includes a large number of flexible thermal conductors (94, 96). The connector may be fabricated by a process which includes fabrication of the conductors as flat strips, bonding of the conductors to a pair of opposed planar sheets and vertically moving the sheets away from one another to expand the conductors vertically to their final three-dimensional configuration.
Abstract:
A method of connecting a semiconductor chip assembly (12) having at least first and second contacts (18) to a connection component (20) including at least first and second connection leads (30) by means of a tool (60) consisting of the steps of juxtaposing moving and connecting the leads to the corresponding contacts. The connection component (20) is juxtaposed with the semiconductor chip assembly (12) so that the first and second connection leads (30) are aligned with the first and second contacts (18) in such a manner that the first connection lead is offset from the first contact in the first direction and the second connection lead is offset from the second contact in the same first direction. The first connection lead is moved by means of the tool (60) substantially downwardly and towards the first contact in a second direction which is opposite to the first direction, so that an open space (A1) is formed between the first connection lead and the second contact and lead to facilitate movement of the second connection lead by the tool (60) substantially downwardly and towards the second contact in the second direction.
Abstract:
An interposer for interconnection between microelectronic circuit panels (260) has contacts (250) at its surfaces. Each contact has a central axis normal to the surface and a peripheral portion adapted to expand radially outwardly from the central axis responsive to a force applied by a pad (262) on the engaged circuit panel. Thus, when the circuit panels (260) are compressed with the interposers, the contacts expand radially and wipe across the pads (262). The wiping action facilitates bonding of the contacts to the pads, as by conductive bonding material (246) carried on the contacts themselves.
Abstract:
A connector for microelectronic elements includes a sheet-like body (30) having a plurality of holes (36), desirably arranged in a regular grid pattern. Each hole is provided with a resilient laminar contact (38) having a plurality of projections (42) extending inwardly over the hole in the body. Microelectronic elements (68) having bump leads (70) such as solder balls thereon may be engaged with the connector by advancing the bump leads into the holes of the connector to engage the bump leads with the contacts. The assembly can be tested, and if found acceptable, the bump leads can be permanently bonded to the contacts.