Abstract:
There is provided an ion implantation device capable of suppressing spread of an ion beam and accurately controlling a scan waveform, there by obtaining a large scan angle in the order of 10 degrees. In the ion implantation device, a first, a second, and a third chamber (12A, 14A, 16A) are arranged at predetermined positions on the beam line. The second chamber (14A) is arranged with a first and a second gap (20A, 22A) with respect to the first and the third chamber (12A, 16A). The second chamber (14A) is electrically insulated from the first and the third chamber (12A, 16A) via a first and a second electrode pair (26A, 28A) mounted on the first and the second gap (20A, 22A), respectively. At least one of the first and the second electrode pair (26A, 28A) obliquely intersects a reference axis J of the ion beam with a predetermined angle. The second chamber (14A) includes an ion beam scan mechanism (10A) connected to a scan power source (40A) for applying a potential of a desired scan waveform.
Abstract:
An electroscope system based on exciting a certain area of the surface of a sample to emit electrons with a characteristic distribution of kinetic energies, has the analyzed area of the sample excited by an electron beam produced by a field emission source and a monochromator energy filter of said electron beam disposed down-stream of the electron source.The field emission electron source is preferably a Schottky source and monochromator energy filter reduces energy dispertion of the electrons of said electron beam to less than 0.2 eV. Microareas of linear dimensions in the order of ten nm may be analyzed while observing them gathering information on the chemical state of detected elements present at the surface of the examined microarea of the sample.
Abstract:
Es wird ein bildgebender Energiefilter für elektrisch geladene Teilchen mit mindestens zwei toroidalen, hintereinander angeordneten Energieanalysatoren (30, 40) beschrieben. Zwischen der Austrittsebene (5) des ersten Energieanalysators (30) in der Eintrittsebene (6) des zweiten Energieanalysators (40) ist eine Transferlinseneinrichtung (20) angeordnet. Es wird damit eine energiegefilterte, fehlerfreie Abbildung der Oberfläche (1') der Probe (1) auf dem Detektor (10) ermöglicht.
Abstract:
A charged particle filter provides a curved through path and has both magnetic poles for applying a magnetic field normal to the plane of curvature of the path and electrodes for applying a radial electric field. The filter is used as an energy filter downstream of an acelerator in an ion implanter. The filter can be set toprovide a range of energy dispersions, to operate as an achromatic bend, or to reject lower charge state ions.
Abstract:
An elemental analyser capable of displaying an element distribution image of an object to be analyzed at a high contrast and determining an element distribution position with high accuracy, a scanning transmission electron microscope, and an elemental analyzing method. The elemental analyser comprises a scattering electron beam detector 21 for detecting an electron beam scattered by the object 5 to be analyzed, an electron spectroscope 11 for implementing the energy spectroscopy of the electron beam transmitted through the object, an electron beam detector 13 for detecting the spectrally analyzed electron beam, and a control device for analyzing the elements of the object based on an output signal of the electron beam detector and an output signal of the scattering electron beam detector.
Abstract:
A method of separating ion mass, comprising the steps of, by using an air-cored exciting current path (21) formed by spirally winding a conductor (20) in lateral direction on the outside of a bent ion deflection casing having an inlet and an outlet along a bent shape after passing through the inlet and outlet, forming a magnetic field of uniform intensity laterally in the ion deflection casing, leading an ion beam into the air-cored exciting current path through a clearance between the conductors (20c) at the inlet, bending the ion beam according to ion mass by the action of a magnetic field caused by the air-cored exciting current path, and taking out the ion beam of a desired mass through a clearance between the conductors (20d) at the outlet, whereby the ion mass can be separated uniformly from the large diameter ion beam.
Abstract:
A charged particle filter provides a curved through path and has both magnetic poles for applying a magnetic field normal to the plane of curvature of the path and electrodes for applying a radial electric field. The filter is used as an energy filter downstream of an acelerator in an ion implanter. The filter can be set toprovide a range of energy dispersions, to operate as an achromatic bend, or to reject lower charge state ions.
Abstract:
An inspection apparatus and a method for fabricating a semiconductor device using that inspection apparatus. The inspection apparatus is used for inspecting the defect of a sample, e.g. a wafer, and measuring the line width and surface potential thereof. In the inspection apparatus, a plurality of charged particles from a primary optical system impinge on a sample and secondary charged particles emitted from the sample are separated from the primary optical system and introduced through a secondary optical system to a detector. The sample is irradiated with charged particles while being moved. Irradiating points of charged particles are arranged in N rows in the moving direction of the sample and in M columns in the direction perpendicular thereto. Each row of charged particle irradiating points is shifted sequentially, by a constant amount, in the direction perpendicular to the moving direction of the sample.
Abstract:
Incorporating the use of a permanent magnet (252) within a GCIB apparatus to separate undesirable monomer ions from a gas cluster ion beam (148) to facilitate improved processing of workpieces (152). In an alternate embodiment, the effect of the permanent magnet may be controlled by the use of an electrical coil. The above system eliminates problems related to power consumption and heat generation.
Abstract:
An electronic energy filter is equipped with a first pair of magnetic poles (21) which generates a first deflecting magnetic field and a second pair of magnetic poles (22) which generates a second deflecting magnetic field in the same direction as that of the first magnetic field. Incident electrons are deflected by about 90 DEG with a path radius of AM1 in the first magnetic field, passed through a free space having a length of DL2 which is about the half of the radius AM1, directed into the second magnetic field, deflected in the second field by about 180 DEG with a radius of AM2 which is nearly the half of the radius AM1, passed through the free space, again directed into the first magnetic field, deflected in the first field by about 90 DEG with the radius AM1, and emitted in the same direction where the electrons enter the first magnetic field. Thus, the electrons travel on a path like a Greek letter gamma . Therefore, the filter is compact and the aberrations of the filter are small.