TEM-lamella, process for its manufacture, and apparatus for executing the process
    361.
    发明公开
    TEM-lamella, process for its manufacture, and apparatus for executing the process 有权
    TEM-Lamelle und Verfahren zu deren Herstellung

    公开(公告)号:EP2413126A2

    公开(公告)日:2012-02-01

    申请号:EP11006234.6

    申请日:2011-07-28

    Abstract: A process for manufacturing a TEM-lamella includes mounting (51) a plate shaped substrate having a thickness in a support, manufacturing (53) a first strip-shaped recess on a first side of the substrate under a first angle to the support by means of a particle beam, and manufacturing (55) a second strip-shaped recess on a second side of the substrate under a second angle to the support by means of a particle beam, such that the first and the second strip-shaped recess mutually form an acute or right angle, and between them form an overlap region of lesser thickness. The lamella has a thicker rim region and a thinner central region, with a first strip-shaped recess on a first side of the lamella and a second strip-shaped recess on a second side of the lamella, wherein the first and the second strip-shaped recess mutually form an acute or right angle, and between them form an overlap region having a thickness of below 100 nm. An apparatus for executing the process or manufacturing the lamella includes a lamella support pivotable about a transverse axis and a longitudinal axis inclined to the vertical direction, a device for rotating about the longitudinal axis, and stop means for limiting a tilt of the lamella support about the transverse axis.

    Abstract translation: 制造TEM薄片的方法包括将具有厚度的板状基板安装(51)在支撑体中,在基板的第一侧上以支承件的方式制造(53)第一条形凹槽 并且通过颗粒束在基板的第二侧上以第二角度制造(55)第二条形凹槽,使得第一和第二条形凹槽相互形成 尖锐或直角,并且在它们之间形成较小厚度的重叠区域。 薄片具有较厚的边缘区域和较薄的中心区域,在薄片的第一侧上具有第一条形凹部,在薄片的第二侧上具有第二条形凹部,其中,第一和第二条带状凹部, 相互形成锐角或直角,并且在它们之间形成厚度低于100nm的重叠区域。 用于执行该方法或制造薄片的装置包括可围绕横向轴线枢转的薄片支撑件和与垂直方向倾斜的纵向轴线,围绕纵向轴线旋转的装置,以及用于限制薄片支撑件的倾斜约束的止动装置 横轴。

    TRANSMISSION ELECTRON MICROSCOPE APPARATUS COMPRISING ELECTRON SPECTROSCOPE, SAMPLE HOLDER, SAMPLE STAGE, AND METHOD FOR ACQUIRING SPECTRAL IMAGE
    362.
    发明公开
    TRANSMISSION ELECTRON MICROSCOPE APPARATUS COMPRISING ELECTRON SPECTROSCOPE, SAMPLE HOLDER, SAMPLE STAGE, AND METHOD FOR ACQUIRING SPECTRAL IMAGE 有权
    WITH A电子分光镜,样本架,试样台和方法,用于接收光谱图像透射电子显微镜

    公开(公告)号:EP2293319A1

    公开(公告)日:2011-03-09

    申请号:EP09770068.6

    申请日:2009-06-11

    Abstract: A transmission electron microscope apparatus, a sample holder and a sample stage and a method for acquiring spectral images as well are provided which can acquire spectral images at a time from a plurality of samples and measure highly accurate chemical shifts from electron energy loss spectra extracted from the spectral images.
    A transmission electron microscope apparatus comprises an electron gun for emitting an electron beam, a condenser lens for converging the emitted electron beam, a plurality of sample stages radiated with a converged electron beam and adapted to mount samples, a sample movement control unit for moving the sample stages, image-forming lenses for forming an image of an electron beam having transmitted through the plural samples, an electron spectrometer adapted to perform spectrometry of the electron beam in accordance with energy amounts the image-formed electron beam has and deliver spectral images obtained at convergence positions which are different in energy dispersion axis direction and in a direction orthogonal to the energy dispersion axis direction to thereby acquire spectral images from the plural samples at a time, and an image display unit for displaying acquired spectral images.

    Abstract translation: 透射电子显微镜装置,一个样品保持器和样品台和用于获取以及被提供了能够在一个时间从样本的多元性取得分光图像,并测量从提取电子能量损失光谱高度精确的化学位移谱图像的方法 的分光图像。 透射电子显微镜装置的电子枪的包括用于发射在电子束,用于会聚发射的电子束的聚光透镜,样品级的多元性辐射与会聚电子束和angepasst装入样品,用于移动所述样本移动控制部 样品阶段,成象透镜用于形成具有反式的电子束的图像通过在电子能谱仪angepasst复数样本mitted执行与能量雅舞蹈的电子束的光谱量的图像形成的电子束具有和提供获得光谱图像 在收敛的位置其在能量分散轴方向和正交于能量色散轴方向,由此在同一时间获取来自多个样品的分光图像,以及用于显示所获取的分光图像的图像显示单元的方向上不同。

    PROTEIN LAYERS AND THEIR USE IN ELECTRON MICROSCOPY
    364.
    发明公开
    PROTEIN LAYERS AND THEIR USE IN ELECTRON MICROSCOPY 有权
    蛋白层和它们在电子

    公开(公告)号:EP2167529A1

    公开(公告)日:2010-03-31

    申请号:EP08737092.0

    申请日:2008-04-23

    Abstract: Protein layers (1) repeating regularly in two dimensions comprise protein protomers (2) which each comprise at least two monomers (5), (6) genetically fused together. The monomers (5), (6) are monomers of respective oligomer assemblies (3), (4) into which the monomers are assembled to assembly of the protein layer. The first oligomer assembly (3) belongs to a dihedral point group of order O, where O equals (3), (4) or (6) and has a set of O rotational symmetry axes of order (2). The second oligomer assembly (4) has a rotational symmetry axis of order (2). Due to the symmetry of the oligomer assemblies (3), (4), the rotational symmetry axes of each second oligomer assembly (4) is aligned with one of said set of O rotational symmetry axes of a first oligomer assembly (3) with (2) protomers being arranged symmetrically therearound. Thus, an 2-fold fusion between the oligomer assemblies (3), (4) is produced and the arrangements of the rotational symmetry axes of the oligomer assemblies (3), (4) cause the protein layer to repeat regularly. The protein layer has many uses, for example to support molecular entities for biosensing, x-ray crystallography or electron microscopy.

    Sample holder, method for observation and inspection, and apparatus for observation and inspection
    365.
    发明公开
    Sample holder, method for observation and inspection, and apparatus for observation and inspection 审中-公开
    样品架,用于观察和测试设备,用于观察和检查方法

    公开(公告)号:EP2075821A2

    公开(公告)日:2009-07-01

    申请号:EP08254133.5

    申请日:2008-12-23

    Applicant: JEOL Ltd.

    Abstract: A sample holder (102,150,151,153-157,160-163) used in SEM (scanning electron microscopy) or TEM (transmission electron microscopy) permitting observation and inspection at higher resolution. The common feature to SEM and TEM sample holders is that a sample containing liquid and placed under atmospheric pressure can be observed or inspected after a small amount of the sample is passed through a filter or a medicine is mixed with the sample. The holder has a framelike member (102a,150a) provided with an opening (102b,150b) that is covered with a film (101,150c,231,411,495,496). The film has a first surface on which a sample (315,414) is held. The thickness D of the film and the length L of the portion of the film providing a cover over the opening in the framelike member satisfy a relationship given by L/D

    Abstract translation: 在SEM(扫描电子显微镜)或TEM(透射电子显微镜)中使用的样本保持器(102,150,151,153-157,160-163)允许观察和检查以更高的分辨率。 以SEM和TEM样品支架的共同特征是一个样品做了含液体并且在大气压下放置在样品的一个小的量通过过滤器或药物与样品混合之​​后可以进行观察或检查。 该保持器具有板状部件(102A,150A),其设有在开口(102B,150B)并覆盖有薄膜(101,150c,231411495496)的帧。 该薄膜具有在其上保持的样品(315.414)的第一表面。 该膜的厚度D和所述薄膜在以上状部件的框架中的开口提供覆盖的部分的长度L满足L / D <200000给定的关系。 的装置和用于观察或检查样品的方法是如此游离缺失盘。

    Ion implantation apparatus
    367.
    发明公开
    Ion implantation apparatus 有权
    Vorrichtung zur离子植入

    公开(公告)号:EP1768163A1

    公开(公告)日:2007-03-28

    申请号:EP05256025.7

    申请日:2005-09-27

    CPC classification number: H01J37/3171 H01J37/18 H01J2237/1825 H01J2237/201

    Abstract: An ion implantation apparatus structure is provided that does not allow gas to accumulate in the vicinity of a wafer when implantation ions to the wafer. The ion implantation apparatus includes a rotating body (100) that rotates in a fixed direction, a vacuum chamber (302) that houses the rotating body, and an ion beam injecting portion (306) that injects an ion beam to a wafer placed on the rotating body. The rotating body comprises one or more wafer placement boards having a wafer placement face on one face, a driving portion that drives the wafer placement board, and a gas evacuation member provided protruding from one face of the wafer placement board having a gas evacuation wall face on the front in the direction of rotation, and functions such that due to rotation of the wafer placement board, the gas evacuation wall face collides with gas present on one face of the wafer placement board and the gas is evacuated upward or to the rear face of the wafer placement face.

    Abstract translation: 提供一种离子注入装置结构,其在将离子注入晶片时不允许气体积聚在晶片附近。 离子注入装置包括沿固定方向旋转的旋转体(100),容纳旋转体的真空室(302),以及离子束注入部(306),其将离子束注入到位于 旋转体。 旋转体包括一个或多个晶片放置板,其具有在一个面上的晶片放置面,驱动晶片放置板的驱动部分和从晶片放置板的一个表面突出设置的排气构件,该排气构件具有排气壁面 在旋转方向上的前方,并且起作用,由于晶片配置板的旋转,排气壁面与存在于晶片放置板的一个面上的气体碰撞,并且气体向上或向后排出 的晶片放置面。

    ワークピース搬送および配置装置
    369.
    发明专利
    ワークピース搬送および配置装置 审中-公开
    工件传送和定位装置

    公开(公告)号:JP2017500722A

    公开(公告)日:2017-01-05

    申请号:JP2016553269

    申请日:2014-11-11

    Abstract: 自動化ワークピース処理装置は、処理位置でワークピースを処理するように構成される処理モジュールを含む処理セクションと、多段シャトルを含む搬送モジュールであって、多段シャトルは複数の動作自由度を有する第1のシャトルステージと、第1のステージから独立した複数の動作自由度を有する第2のシャトルステージとを有する搬送モジュールと、第1および第2のシャトルステージの少なくとも一方に接続されるエンドエフェクタとを含み、エンドエフェクタは、ワークピースを保持し、処理モジュール内および処理モジュール外へワークピースを搬送するように構成され、またエンドエフェクタは、処理位置でワークピースを配置するために、処理モジュール外部のワークピース保持ステーションから処理モジュール内部の処理位置まで延びる、第1および第2のステージの複数の動作自由度の組み合わせにより定められる動作範囲を有するので、処理モジュールの処理ステージを定める搬送モジュールと、自動化装着および搬送セクションであって、ワークピースが自動化装着および搬送セクション内に装着されるロードポートモジュールを含み、搬送モジュールに連通可能に接続されている自動化装着および搬送セクションとを含む。

    Abstract translation: 自动工件装卸装置具备:处理部,其包括,一传输模块,包括一个多级梭,多级梭具有第一多个操作灵活性配置成处理在所述处理位置的工件的处理模块 梭阶段,传输模块和具有多个操作自由度独立于所述第一阶段的每一个的第二梭阶段,和连接到所述第一和第二往复阶段中的至少一个的端部执行 其中,所述端部执行器保持所述处理模块外部的工件放入和处理模块被构造成传送工件,也端部执行器放置在处理位置工件,处理模块外部 从工件保留站的处理模块内的处理位置 延伸,因为它具有由多个第一和第二级的操作灵活性的组合所定义的操作范围时,转移模块限定所述处理模块中的一个处理级,一个自动安装和输送部,对工件 它包括一个负载端口模块附连到一个自动装载和传送部,和一个自动装载和输送部可通信地连接到所述传送模块。

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