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    SYSTEM AND METHOD FOR UNIFORMITY ADJUSTMENT
    42.
    发明专利
    SYSTEM AND METHOD FOR UNIFORMITY ADJUSTMENT 未知

    公开(公告)号：AU2003297965A1

    公开(公告)日：2004-06-18

    申请号：AU2003297965

    申请日：2003-11-19

    Applicant: CANDESCENT TECH CORP

    Inventor： GAGANAM MADHUKAR ,  RAO KRISHNA A ,  DANIELSON DON L

    IPC: G09G3/22

    Abstract: A present invention field emission display brightness compensation system and method is capable of providing uniform display correction. In one present compensation system and method a masking process is utilized that adjusts the emissions for a particular area. In one exemplary implementation, the relative value of a pixel driver voltage is adjusted to correspond to a base brightness area. For example, an emitter uniformity area adjustment table is utilized to adjust the voltage value of the emitters. An emitter uniformity area adjustment table provides a correlation between a pixel location and a brightness level adjustment. The emitter uniformity area adjustment tables are utilized to create a software filtering mask that provides compensation for uniformity differences between different spots or areas in the display.

    Methods and systems for measuring display attributes of a fed
    45.
    发明专利
    Methods and systems for measuring display attributes of a fed 未知

    公开(公告)号：AU2002320162A1

    公开(公告)日：2003-03-03

    申请号：AU2002320162

    申请日：2002-06-24

    Applicant: CANDESCENT TECH CORP

    Inventor： HANSEN RONALD L ,  CRESSI LEE ,  SPINDT CHRISTOPHER J ,  DUNPHY JAMES C ,  LIU JUN ,  CUMMINGS WILLIAM ,  STANNERS COLIN

    IPC: G01R31/24 ,  G09G3/20 ,  G09G3/22 ,  G09G3/10

    Abstract: In a field emission display (FED) device comprising: rows and columns of emitters; and an anode electrode, a method of measuring display attributes of said FED device comprising the steps of: a) in a scan fashion, individually driving each row and measuring the current drawn by each row, wherein a settling time is allowed after each row is driven; b) measuring a background current level during a vertical blanking interval; c) correcting current measurements taken during said step a) by said background current level to yield corrected current measurements; d) averaging multiple corrected current measurements taken over multiple display frames to produce averaged corrected current values for all rows of said FED device; and e) generating a memory resident correction table based on said averaged corrected current values.

    Gripping multi-level matrix method and apparatus
    48.
    发明专利
    Gripping multi-level matrix method and apparatus 未知

    公开(公告)号：AU6128901A

    公开(公告)日：2001-12-11

    申请号：AU6128901

    申请日：2001-05-08

    Applicant: CANDESCENT TECH CORP

    Inventor： PORTER JOHN D ,  MACKEY BOB L ,  NEIMEYER ROBERT G ,  SPINDT CHRISTOPHER J ,  CHANG DAVID C ,  SAHLSTROM KRIS E

    IPC: H01J9/227 ,  H01J29/02 ,  H01J29/32 ,  H01J29/86 ,  H01J29/87 ,  H01J31/12 ,  H01J29/00

    Abstract: A multi-level matrix structure for retaining a support structure within a flat panel display device. In one embodiment, the multi-level matrix structure is comprised of a first parallel ridges. The multi-level matrix structure further includes a second parallel ridges. The second parallel ridges are oriented substantially orthogonally with respect to the first parallel ridges. In this embodiment, the second parallel ridges have a height which is greater than the height of the first parallel ridges. Furthermore, in this embodiment, the second plurality of parallel spaced apart ridges include contact portions for retaining a support structure at a desired location within a flat panel display device. Hence, when a support structure is inserted between at least two of the contact portions of the multi-level support structure, the support structure is retained in place, at a desired location within the flat panel display device, by the contact portions.

    50.
    发明专利
    未知

    公开(公告)号：DE885452T1

    公开(公告)日：1999-07-22

    申请号：DE97916717

    申请日：1997-03-05

    Applicant: CANDESCENT TECH CORP

    Inventor： SPINDT CHRISTOPHER ,  CHAKAROVA GABRIELA ,  NIKOLOVA MARIA ,  SEARSON PETER ,  HAVEN DUANE ,  KNALL NILS ,  MACAULAY JOHN ,  BARTON ROGER

    IPC: B81C1/00 ,  C25F3/14 ,  H01J9/02

    Abstract: An electrochemical technique is employed for removing certain material from a partially finished structure without significantly chemically attacking certain other material of the same chemical type as the removed material. The partially finished structure contains a first electrically non-insulating layer (52C) consisting at least partially of first material, typically excess emitter material that accumulates during the deposition of the emitter material to form electron-emissive elements (52A) in an electron emitter, that overlies an electrically insulating layer (44). An electrically non-insulating member, such as an electron-emissive element, consisting at least partially of the first material is situated at least partly in an opening (50) extending through the insulating layer. With the partially finished structure so arranged, at least part of the first material of the first non-insulating layer is electrochemically removed such that the non-insulating member is exposed without significantly attacking the first material of the non-insulating member.

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