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公开(公告)号:DE10026243A1
公开(公告)日:2001-12-06
申请号:DE10026243
申请日:2000-05-26
Applicant: INFINEON TECHNOLOGIES AG
Inventor: KAISER ROBERT , LINDOLF JUERGEN , SCHNEIDER HELMUT
IPC: G11C17/00 , G11C17/18 , H01L21/82 , H01L21/8242 , H01L27/108 , H01L21/66 , H01L23/525 , G11C29/00
Abstract: The fuse state read-out method uses application of a voltage (Vblh) to the fuse which has a reduced voltage level relative to an internal voltage (Vint) of the semiconductor memory device, e.g. a voltage level which is reduced by between 20 and 30 % relative to an internal voltage of about 2 V, for defining the high potential of the bit lines (BL) of the memory cell field (6).
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公开(公告)号:DE10021776A1
公开(公告)日:2001-11-22
申请号:DE10021776
申请日:2000-05-04
Applicant: INFINEON TECHNOLOGIES AG
Inventor: FISCHER HELMUT , SCHNEIDER HELMUT , SCHOENINGER SABINE , MARKERT MICHAEL
IPC: G11C7/06 , G11C11/4091
Abstract: At least one of the drive transistors (N1, P1) is arranged with its doping areas between the associated NMOS or PMOS transistors of the read/write amplifiers (N2, N3, P2, P3), and the gate of these drive transistors (N1, P1) is constructed as a two-strip gate (N111, P111).
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公开(公告)号:DE19946201C1
公开(公告)日:2000-12-14
申请号:DE19946201
申请日:1999-09-27
Applicant: INFINEON TECHNOLOGIES AG
Inventor: SCHNEIDER HELMUT , ZIBERT MARTIN
IPC: G11C8/08 , G11C11/4074 , H01L21/761 , H01L27/02 , H01L27/108 , H01L23/58
Abstract: The arrangement includes a p-conductive semiconductor substrate (7), an n-conductive tub structure (5, 6) provided in the semiconductor substrate, a p-conductive semiconductor area (4) included by the tub structure, and an NMOS transistor (1) provided in the p-conductive semiconductor area. The n-conductive tub structure is supplied with a higher voltage than the p-conductive semiconductor area and the p-conductive semiconductor substrate. The semiconductor substrate is put at a low supply voltage (VSS) and the tub structure at a high supply voltage, so that a voltage to be buffered is applied at the tub structure. The voltage to be buffered may be a negative word conductor blocking voltage or an amplified word conductor voltage.
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74.
公开(公告)号:DE19950543C1
公开(公告)日:2000-11-23
申请号:DE19950543
申请日:1999-10-20
Applicant: INFINEON TECHNOLOGIES AG
Inventor: SCHNEIDER HELMUT , KAISER ROBERT
Abstract: An integrated circuit includes a first control unit (C1) for controlling the operating/working voltage of first conductivity type transistors (T1,T2), the latter having substrate terminals for supply of substrate potentials (Vnw;Vpw). The control unit has an input for a desired value (VTnsoll) and an input for an actual value (VTnist) of the working voltage of the transistors of the first conductivity type (T1,T2) as well as an output connected to the substrate terminals of the first conductivity type transistors. A second control unit (C2) controls the working voltage of the second conductivity type transistors (T3,T4) and has inputs for a desired value and an actual value (VTpist) of the working voltage of these transistors (T3,T4), and an output connected to the substrate terminals of these transistors (T3,T4). A desired value for the working voltage of the transistors (T3,T4) is supplied to the desired value input of the second control unit (C2), and is proportional to the amount of the actual value (VTnist) of the working voltage of the first conductivity type transistors (T1,T2).
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公开(公告)号:DE102006029169A1
公开(公告)日:2007-12-27
申请号:DE102006029169
申请日:2006-06-24
Applicant: INFINEON TECHNOLOGIES AG
Inventor: SCHNEIDER HELMUT , SAVIGNAC DOMINIQUE
IPC: G11C11/4096
Abstract: The memory module has a pulse generator (60), which contains an impulse timer (70,80) for presetting a fixed time (T f ) for the length of the split screening impulse (CS). Another impulse timer presets a frequency dependent proportional time (T v) for clock signal cycle for the length of the split screening impulse. The pulse generator lets the former pulse timer become effective, if the clock frequency is lower than a selected threshold value and otherwise lets the later pulse timer become effective. An independent claim is also included for the method for testing a memory module.
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公开(公告)号:DE102004059723A1
公开(公告)日:2006-06-14
申请号:DE102004059723
申请日:2004-12-11
Applicant: INFINEON TECHNOLOGIES AG
Inventor: SCHNABEL FLORIAN , SCHNEIDER HELMUT
IPC: G11C7/18 , G11C11/407 , G11C11/4097 , H01L27/108
Abstract: A memory component comprises bitlines (11-29) with which memory cells (71-78,81-88) are arranged and a row of read amplifiers (41-44) each connected to two bitlines. A bitline connected to a first read amplifier is next to a bitline connected to a second read amplifier in the row.
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公开(公告)号:DE10117614B4
公开(公告)日:2005-06-23
申请号:DE10117614
申请日:2001-04-07
Applicant: INFINEON TECHNOLOGIES AG
Inventor: KAISER ROBERT , SCHAMBERGER FLORIAN , SCHNEIDER HELMUT
IPC: G11C11/401 , G11C7/10 , G11C7/22 , G11C11/407
Abstract: A data read access and a data write access is shared between two memory banks. A first memory bank of which is operated with a clock that is shifted by half a clock pulse with respect to the operating clock of the other, second memory bank. Partial data streams are combined at the output of the two memory banks to form a data stream with double the frequency.
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公开(公告)号:DE10102000B4
公开(公告)日:2004-04-08
申请号:DE10102000
申请日:2001-01-18
Applicant: INFINEON TECHNOLOGIES AG
Inventor: BROX MARTIN , SCHNEIDER HELMUT
IPC: H01L23/50 , H01L23/544 , H01L23/58
Abstract: A description is given of an integrated circuit having components and a method for checking a connection configuration of bonding pads. The integrated circuit has an identification circuit that identifies a connection of the bonding pads to external circuits. After the identification of the connected bonding pads, the data width of the input/output circuit is preferably programmed accordingly. In this way, self-detection and automatic programming are possible without data inputting from the outside.
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公开(公告)号:DE10107182A1
公开(公告)日:2002-09-05
申请号:DE10107182
申请日:2001-02-15
Applicant: INFINEON TECHNOLOGIES AG
Inventor: KEYSERLINGK ALBERT GRAF VON , SCHAFFROTH THILO , SCHNEIDER HELMUT
IPC: G11C11/408 , G11C8/08
Abstract: A semiconductor memory comprises a transistor pair in a row with control connections (G1,G2) and a rising or tied-off voltage. An evaluation circuit is coupled to the transistors to determine a voltage signal and to control the memory on the basis of the output signal from one of the voltages.
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公开(公告)号:DE10102871A1
公开(公告)日:2002-08-14
申请号:DE10102871
申请日:2001-01-23
Applicant: INFINEON TECHNOLOGIES AG
Inventor: KAISER ROBERT , SCHAMBERGER FLORIAN , SCHNEIDER HELMUT
IPC: G11C29/48 , G01R31/3187 , G11C29/00 , H04L7/00
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