Abstract:
PROBLEM TO BE SOLVED: To provide a lithographic apparatus and method that correct deformation of an optical element. SOLUTION: The lithographic apparatus includes an illumination system configured to condition a radiation beam and a support constructed to support a patterning device. A substrate table is constructed to hold a substrate, and a projection system is configured to project the patterned radiation beam onto a target portion of the substrate. The lithographic apparatus includes a heater arrangement HA that includes an electron beam generator 50 configured to generate an electron beam, and an electron beam guide arrangement 52 configured to guide the electron beam onto the optical element of the lithographic apparatus. The optical element 56 forms a part of the illumination system or the projection system of the lithographic apparatus which, in use, is traversed by the radiation beam. The heater arrangement HA is controllable to provide a distribution of heat on the optical element 56 by deflection of the electron beam 54. COPYRIGHT: (C)2011,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To provide an optical apparatus capable of reducing unwanted wavelengths of radiation, and a lithographic apparatus.SOLUTION: In an EUV (extreme ultraviolet) lithographic apparatus, an illumination system includes a multifaceted field mirror and a multifaceted pupil mirror. Field facet mirrors in mirrors focus EUV radiation onto a particular associated pupil facet mirror, from which the EUV radiation is directed to a target area. Each of the field facet mirrors is changed so as to scatter unwanted DUV (deep ultraviolet) radiation into a large range of directions. The majority of DUV falls onto neighboring pupil facet mirrors in the pupil mirrors, so that the amount of EUV radiation reaching target E is suppressed in comparison to the wanted EUV radiation. Because the distance between mirrors is much greater than the width of an individual pupil facet mirror, the excellent DUV suppression can be achieved with only a narrow scattering angle.
Abstract:
A beam-splitting apparatus (40) arranged to receive an input radiation beam (B) and split the input radiation beam (B) into a plurality of output radiation beams (Ba - Bj). The beam-splitting apparatus (40) comprising a plurality of reflective diffraction gratings (41-45) arranged to receive a radiation beam and configured to form a diffraction pattern comprising a plurality of diffraction orders, at least some of the reflective diffraction gratings (42-45) being arranged to receive a 0th diffraction order formed at another of the reflective diffraction gratings (41-44). The reflective diffraction gratings are arranged such that the optical path of each output radiation beam (Ba - Bj) includes no more than one instance of a diffraction order which is not a 0th diffraction order.
Abstract:
An adjustable diffraction grating comprises: an optical element and a distortion mechanism. The optical element has an optical surface for receiving an input radiation beam. The optical element is provided with a plurality of closed channels below the optical surface, above each closed channel the optical surface being formed from a membrane of material. The distortion mechanism comprises one or more actuators that are operable to distort the membranes over the closed channels so as to control the shape of the optical surface and to form a periodic structure on the optical surface which acts as a diffraction grating such that the input radiation beam is diffracted from the optical element to form a plurality of angularly separated sub-beams.
Abstract:
An apparatus for receiving an input radiation beam at a beam receiving location and outputting from the beam receiving location one or more output radiation beams. The apparatus comprises: an optical element; and a movement mechanism. The optical element comprises a plurality of portions for receiving the input radiation beam. The movement mechanism is operable to move the plurality of portions so as selectively position each of the plurality of portions at the beam receiving location. When one of the plurality of portions is disposed in the beam receiving location it is configured to receive the input radiation beam and to scatter the input radiation beam so as to form the one or more output radiation beams. A direction of each of the one or more output radiation beams formed by each of the plurality of portions is substantially the same as a direction of a corresponding output radiation beam formed by each of the other portions. One or more properties of each of the plurality of portions differs from that of the other portions such that a power of at least one of the one or more output radiation beams formed by each of the plurality of portions is different to that of the corresponding output radiation beam formed by at least one of the other portions.
Abstract:
A radiation system comprising a beam splitting apparatus configured to receive a main radiation beam and split the main radiation beam into a plurality of branch radiation beams and a radiation alteration device arranged to receive an input radiation beam and output a modified radiation beam, wherein the radiation alteration device is configured to provide an output modified radiation beam which has an increased etendue, when compared to the received input radiation beam, wherein the radiation alteration device is arranged such that the input radiation beam which is received by the radiation alteration device is a main radiation beam and the radiation alteration device is configured to provide a modified main radiation beam to the beam splitting apparatus, or wherein the radiation alteration device is arranged such that the input radiation beam which is received by the radiation alteration device is a branch radiation beam output from the beam splitting apparatus.
Abstract:
A lithographic apparatus comprises: an illumination system; a support structure; a substrate table; a projection system and a heating system. The illumination system is configured to condition a radiation beam. The support structure is constructed to support a reticle and pellicle assembly for receipt of the radiation beam conditioned by the illumination system. The substrate table is constructed to support a substrate. The projection system is configured to receive the radiation beam from the reticle - pellicle assembly and to project it onto the substrate. The heating system is operable to heat a pellicle of the reticle - pellicle assembly supported by the support structure. A method for using a reticle - pellicle assembly comprises: illuminating the reticle - pellicle assembly with a radiation beam so as to form a patterned image on a substrate; and heating the pellicle of the reticle - pellicle assembly using a separate heat source.