Abstract:
PROBLEM TO BE SOLVED: To provide a method for reducing the risk of contamination of immersion liquid and components of the apparatus. SOLUTION: A method of inspecting a substrate with first and second layers thereon is disclosed. This method includes directing a beam of electromagnetic radiation at an acute angle towards an edge of the layers, detecting scattered and/or reflected electromagnetic radiation, and establishing, from the results of the detecting, whether an edge of the second layer overlaps an edge of the first layer. COPYRIGHT: (C)2009,JPO&INPIT