OBJECT ALIGNMENT MEASUREMENT METHOD AND APPARATUS.

    公开(公告)号:NL2005092A

    公开(公告)日:2011-01-18

    申请号:NL2005092

    申请日:2010-07-15

    Abstract: A lithographic apparatus includes apparatus for measuring the alignment of an object. The measuring apparatus includes a plurality of alignment sensors, each including an alignment detector for measuring the position of an alignment mark over an alignment detection area. The measuring apparatus further includes a leveling sensor for measuring the height and/or tilt of an object in a leveling sensor detection area, and a feed-forward connection between said leveling sensor and said alignment sensors.

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