Abstract:
The present invention provides a FinFET device that has a first fin and a second fin. Each fin has a channel region and source and drain regions that extend from the channel region. The fins have different heights. The invention has a gate conductor positioned adjacent the fins. The gate conductor runs perpendicular to the fins and crosses the channel region of each of the first fin and second fin. The fins are parallel to one another. The ratio of the height of the first fin to the height of the second fin comprises a ratio of one to 2/3. The ratio is used to tune the performance of the transistor and determines the total channel width of the transistor.
Abstract:
PROBLEM TO BE SOLVED: To effectively design a semiconductor integrated circuit or an electronic package without considerably increasing complexity of data or reducing wire resistance, by dividing a wide metallic area into metallic stripes. SOLUTION: A physical designing step includes the step of dividing a wide metallic area 4 into metallic stripes 2. The wide metallic area 4 is preferably separated into the stripes 2 which belong to a single wire segment, and vias 6 are inserted only into overlapping parts between metallic layers. An upper metallic layer is provided with an electronic structural element, preferably a C4 pad area 8 for mounting a chip. A blockage is set so as to prevent metallic segments from overlapping the C4 pad area 8. A long power line is divided from an edge to another edge, is formed into stripes on a part on which the C4 pad area 8 is not disposed, and is divided on a part on which the C4 pad area 8 is disposed.
Abstract:
PROBLEM TO BE SOLVED: To provide a reliable method and a device which enable design-keeping transition from an existing non-fin design structure to a functionally identical structure based on a technology of a double-gate fin-base field-effect transistor FinFET in a metal-oxide semiconductor MOS, a device of a complementary metal-oxide semiconductor CMOS, and designing chips of the semiconductors. SOLUTION: The corresponding cell structure "C" 512 contains an arrangement of a cell structure "A" and a cell structure "B" that include no previously generated fins. Consideration is made on arrangement combinations of a cell structure "A" and a cell structure "B" generated in this design hierarchy to other cell structures. A fin generation tool decides not to arrange the fins in the cell structure "A" and cell structure "B" in this hierarchy. The fin generation is delegated to the hierarchy, thus revealing a combined fin shape 560 without steps as indicated by a circle. COPYRIGHT: (C)2005,JPO&NCIPI
Abstract:
A phase splitter with latch comprises a true complement generator in the form of a current switch (T1, T2, T3, R3) which supplies two complementary output signals in response to an input signal (VIN). The outputs of this true complement generator are in each case connected to an associated emitter follower (T4, T5). The two emitter followers (T4, T5) have identical emitter resistors (R6, R7) which simultaneously serve as collector load resistors of two cross-coupled transistors (T6, T7) also comprise identical but higher emitter resistors (R13, R14) than the emitter followers (T6, T7). The emitters of the cross-coupled transistors (T6, T7) are each connected to one of the two inputs of an output stage (T8, T9, T11) consisting of a current switch. This current switch is connected to operating voltage (VEE) through a clock-controlled transitor (T11). Upon actuation of the output stage, i.e., when transistor (T11) is on, the active emitter resistance of one of the cross-coupled transistors (T6, T7) is pulled below the value of the emitter resistors (R6, R7) of the emitter followers (T4, T5), thus causing the latch circuit to be latched as a function of the input signal.
Abstract:
The present invention provides a FinFET device that has a first fin and a second fin. Each fin has a channel region and source and drain regions that extend from the channel region. The fins have different heights. The invention has a gate conductor positioned adjacent the fins. The gate conductor runs perpendicular to the fins and crosses the channel region of each of the first fin and second fin. The fins are parallel to one another. The ratio of the height of the first fin to the height of the second fin comprises a ratio of one to 2/3. The ratio is used to tune the performance of the transistor and determines the total channel width of the transistor.
Abstract:
The present invention provides a FinFET device that has a first fin and a second fin. Each fin has a channel region and source and drain regions that extend from the channel region. The fins have different heights. The invention has a gate conductor positioned adjacent the fins. The gate conductor runs perpendicular to the fins and crosses the channel region of each of the first fin and second fin. The fins are parallel to one another. The ratio of the height of the first fin to the height of the second fin comprises a ratio of one to 2/3. The ratio is used to tune the performance of the transistor and determines the total channel width of the transistor.
Abstract:
A phase splitter with latch comprises a true complement generator in the form of a current switch (T1, T2, T3, R3) which supplies two complementary output signals in response to an input signal (VIN). The outputs of this true complement generator are in each case connected to an associated emitter follower (T4, T5). The two emitter followers (T4, T5) have identical emitter resistors (R6, R7) which simultaneously serve as collector load resistors of two cross-coupled transistors (T6, T7) also comprise identical but higher emitter resistors (R13, R14) than the emitter followers (T6, T7). The emitters of the cross-coupled transistors (T6, T7) are each connected to one of the two inputs of an output stage (T8, T9, T11) consisting of a current switch. This current switch is connected to operating voltage (VEE) through a clock-controlled transitor (T11). Upon actuation of the output stage, i.e., when transistor (T11) is on, the active emitter resistance of one of the cross-coupled transistors (T6, T7) is pulled below the value of the emitter resistors (R6, R7) of the emitter followers (T4, T5), thus causing the latch circuit to be latched as a function of the input signal.
Abstract:
The present invention provides a FinFET device that has a first fin and a second fin. Each fin has a channel region and source and drain regions that extend from the channel region. The fins have different heights. The invention has a gate conductor positioned adjacent the fins. The gate conductor runs perpendicular to the fins and crosses the channel region of each of the first fin and second fin. The fins are parallel to one another. The ratio of the height of the first fin to the height of the second fin comprises a ratio of one to 2/3. The ratio is used to tune the performance of the transistor and determines the total channel width of the transistor.