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1.
公开(公告)号:EP1665334A4
公开(公告)日:2011-02-23
申请号:EP04756338
申请日:2004-06-29
Applicant: IBM
Inventor: PARK HEEMYOUNG , AGNELLO PAUL D , GILBERT PERCY V , LEE BYOUNG H , O'NEIL PATRICIA A , SHAHIDI GHAVAM G , WELSER JEFFREY J
IPC: H01L21/8234 , H01L21/336 , H01L21/425 , H01L21/4763 , H01L21/84 , H01L27/12 , H01L29/423 , H01L29/45 , H01L29/49 , H01L29/786
CPC classification number: H01L29/66772 , H01L21/84 , H01L29/458 , H01L29/6653 , H01L29/6656 , H01L29/66628 , H01L29/78621
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2.
公开(公告)号:WO2005024899A3
公开(公告)日:2008-11-20
申请号:PCT/US2004020850
申请日:2004-06-29
Applicant: IBM , PARK HEEMYOUNG , AGNELLO PAUL D , GILBERT PERCY V , LEE BYOUNG H , O'NEIL PATRICIA A , SHAHIDI GHAVAM G , WELSER JEFFREY J
Inventor: PARK HEEMYOUNG , AGNELLO PAUL D , GILBERT PERCY V , LEE BYOUNG H , O'NEIL PATRICIA A , SHAHIDI GHAVAM G , WELSER JEFFREY J
IPC: H01L21/8234 , H01L21/336 , H01L21/425 , H01L21/4763 , H01L21/84 , H01L27/12 , H01L29/423 , H01L29/45 , H01L29/49 , H01L29/786
CPC classification number: H01L29/66772 , H01L21/84 , H01L29/458 , H01L29/6653 , H01L29/6656 , H01L29/66628 , H01L29/78621
Abstract: Disclosed is a method and system of forming an integrated circuit transistor having a reduced gate height. The method forms a laminated structure having a substrate, a gate conductor (13) above the substrate, and at least one sacrificial layer (14-16) above the gate conductor (13). The process patterns the laminated structure into at least one gate stack extending from the substrate, forms spacers (60) adjacent to the gate stack, dopes regions of the substrate not protected by the spacers to form source and drain regions (71) adjacent the gate stack, and removes the spacers (60) and the sacrificial layer (14-16).
Abstract translation: 公开了一种形成栅极高度降低的集成电路晶体管的方法和系统。 该方法形成具有衬底,在衬底上方的栅极导体(13)和栅极导体(13)上方的至少一个牺牲层(14-16)的叠层结构。 该过程将层叠结构图案化为从衬底延伸的至少一个栅极堆叠,与栅极叠层相邻形成间隔物(60),不会由间隔物掺杂衬底的区域,以形成邻近栅极的源区和漏区(71) 并且移除间隔物(60)和牺牲层(14-16)。
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公开(公告)号:SG60174A1
公开(公告)日:1999-02-22
申请号:SG1997004574
申请日:1997-12-19
Applicant: IBM
Inventor: BURNS STUART MCALLISTER JR , HANAEL HUSSEIN IBRAHIM , KOCON WALDEMAR WALTER , WELSER JEFFREY J
IPC: H01L21/8242 , H01L21/8247 , H01L27/108 , H01L27/115 , H01L29/423 , H01L29/78 , H01L29/788 , H01L29/792 , H01L27/105
Abstract: A densely packed array of vertical semiconductor devices and methods of making thereof are disclosed. The array has columns of bitlines and rows of wordlines. The gates of the transistors act as the wordlines, while the source or drain regions acts as the bitlines. The array also has vertical pillars, acting as a channel, formed between source and drain regions. The source regions are self-aligned and located below the pillars. The source regions of adjacent bitlines are isolated from each other without increasing the cell size and allowing a minimum area of approximately 4F2 to be maintained. The isolated sources allow individual cells to be addressed and written via direct tunneling, in both volatile and non-volatile memory cell configurations. The source may be initially implanted. Alternatively, the source may be diffused below the pillars after forming thereof. In this case, the source diffusion may be controlled either to form floating pillars isolated from the underlying substrate, or to maintain contact between the pillars and the substrate.
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公开(公告)号:MY118306A
公开(公告)日:2004-09-30
申请号:MYPI9706162
申请日:1997-12-18
Applicant: IBM
Inventor: BURNS STUART MCALLISTER JR , HANAFI HUSSEIN IBRAHIM , KALTER HOWARD LEO , KOCON WALDEMAR WALTER , WELSER JEFFREY J
IPC: H01L21/336 , H01L21/8238 , H01L21/8242 , H01L21/8247 , H01L27/108 , H01L27/115 , H01L29/76 , H01L29/788 , H01L29/792
Abstract: A DENSELY PACKED ARRAY (200, 420, 500, 510, 540, 850) OF VERTICAL SEMICONDUCTOR DEVICES, HAVING PILLARS (230) WITH STACK CAPACITORS (520, 520'') THEREON, AND METHODS OF MAKING THEREOF ARE DISCLOSED. THE PILLARS ACT AS TRANSISTOR CHANNELS, AND ARE FORMED BETWEEN UPPER AND LOWER DOPED REGIONS (240, 405). THE LOWER DOPED REGIONS ARE SELF-ALIGNED AND ARE LOCATED BELOW THE PILLARS. THE ARRAY HAS COLUMNS OF BITLINES (220,700, 705) AND ROWS OF WORD LINES (225, 225''). THE LOWER DOPED REGIONS OF ADJACENT BITLINES MAY BE ISOLATED FROM EACH OTHER WITHOUT INCREASING THE CELL SIZE AND ALLOWING A MINIMUM AREA OF APPROXIMATELY 4F2 TO BE MAINTAINED. THE ARRAY IS SUITABLE FOR GBIT DRAM APPLICATIONS BECAUSE THE STACK CAPACITORS DO NOT INCREASE ARRAY AREA. THE ARRAY MAY HAVE AN OPEN BITLINE, A FOLDED, OR AN OPEN/FOLDED ARCHITECTURE WITH DUAL WORDLINES, WHERE TWO TRANSISTORS ARE FORMED ON TOP OF EACH OTHER IN EACH TRENCH. THE LOWER REGIONS MAY BE INITIALLY IMPLANTED. ALTERNATIVE1Y, THE LOWER REGIONS MAY BE DIFFUSED BELOW THE PILLARS AFTER FORMING THEREOF. IN THIS CASE, THE LOWER REGION DIFFUSION MAY BE CONTROLLED EITHER TO FORM FLOATING PILLARS ISOLATED FROM THE UNDERLYING SUBSTRATE, OR TO MAINTAIN CONTACT BETWEEN THE PILLARS AND THE SUBSTRATE. (FIG.8)
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公开(公告)号:SG66418A1
公开(公告)日:1999-07-20
申请号:SG1997004440
申请日:1997-12-15
Applicant: IBM
Inventor: BURNS STUART MCALLISTER JR , HANAEL HUSSEIN IBRAHIM , KALTER HOWAR LEO , KOCON WALDEMAR WALTER , WELSER JEFFREY J
IPC: H01L21/24 , H01L21/302 , H01L21/3065 , H01L21/8247 , H01L21/76 , H01L21/8242 , H01L27/108 , H01L27/115 , H01L29/788 , H01L29/792 , H01L21/70
Abstract: A densely packed array of vertical semiconductor devices, having pillars and deep trench capacitors, and methods of making thereof are disclosed. The pillars act as transistor channels, and are formed between upper and lower doped regions. The lower doped regions are self-aligned and are located below the pillars. The array has columns of bitlines and rows of wordlines. The lower doped regions of all the cells are isolated from each other without increasing the cell size and allowing a minimum area of approximately 4F2 to be maintained. The array is suitable for Gbit DRAM applications because the deep trench capacitors do not increase array area. The array may have an open bitline, a folded, or an open/folded architecture with dual wordlines, where two transistors are formed on top of each other in each trench. The lower regions may be initially implanted. Alternatively, the lower regions may be diffused below the pillars after forming thereof. In this case, the lower region diffusion may be controlled to form floating pillars isolated from the underlying substrate, or to maintain contact between the pillars and the substrate.
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