公开(公告)号：JP2002156409A

公开(公告)日：2002-05-31

申请号：JP2001267229

申请日：2001-09-04

Applicant: INFINEON TECHNOLOGIES AG

Inventor： KLEHN BERND ,  LINDOLF JUERGEN

IPC: G01R31/26 ,  G01Q70/12 ,  G01R1/06 ,  G01R1/067 ,  G01R1/073 ,  H01L21/66 ,  G01N13/20

Abstract: PROBLEM TO BE SOLVED: To provide a measuring system by a measuring sonde whereby electrical signals in integrated circuits can be measured with an extremely highly accurate resolution without being effected almost by anything for analyzing functions of the integrated circuits on semiconductor chips. SOLUTION: A lever arm and a sonde leading end part set on the lever arm of the measuring sonde are formed of a highly conductive material which is coated by an extremely thin insulating layer. A window is formed on the insulating layer at a top point of the sonde leading end part, and the lever arm is connected passing through the insulating layer.

公开(公告)号：JP2002170378A

公开(公告)日：2002-06-14

申请号：JP2001249665

申请日：2001-08-20

Applicant: INFINEON TECHNOLOGIES AG

Inventor： BENEDIX ALEXANDER ,  BRAUN GEORG ,  FISCHER HELMUT ,  KLEHN BERND ,  KUHNE SEBASTIAN

IPC: G11C11/14 ,  G11C11/15 ,  G11C11/16 ,  H01F17/00 ,  H01F17/02 ,  H01F27/245 ,  H01L21/822 ,  H01L21/8246 ,  H01L27/04 ,  H01L27/105 ,  H01L43/08

Abstract: PROBLEM TO BE SOLVED: To provide an inductance which can be integrated monolithically and can be utilized profitably especially in an MRAM mechanism. SOLUTION: This inductance can be integrated monolithically and comprises continuous layers in which conduction layers (P1-P4) and insulation layers (I1-I3) are laminated upward and downward alternately. This constitution of the conduction layers (P1-P4) has a coil-like structure in which a center region (M) being able to provide GMR materials (WM, TB, HM) is centered.

公开(公告)号：DE10137373B4

公开(公告)日：2004-01-29

申请号：DE10137373

申请日：2001-07-31

Applicant: INFINEON TECHNOLOGIES AG

Inventor： SCHNABEL JOACHIM ,  KLEHN BERND ,  ZUCKERSTAETTER ANDREA ,  KLEIN RALF

IPC: G11C7/10 ,  H03K3/027 ,  G01R31/3177

公开(公告)号：DE10149104A1

公开(公告)日：2003-04-24

申请号：DE10149104

申请日：2001-10-05

Applicant: INFINEON TECHNOLOGIES AG

Inventor： KLEIN RALF ,  LE THOAI-THAI ,  BRAS ECKHARD ,  KLEHN BERND

IPC: G11C7/10 ,  G11C7/22

Abstract: A phase detector (4) ascertains the phase difference between a reference clock signal and the delayed operating clock signal. A digital counter (5) increments or reduces the count value by '1', when the operating clock signal leads or lags the reference signal, respectively. An evaluation circuit (7) assesses the operating state of the memory chip based on the counter reading. An Independent claim is also included for semiconductor memory chip operating detection method.

公开(公告)号：DE10148338A1

公开(公告)日：2003-04-24

申请号：DE10148338

申请日：2001-09-29

Applicant: INFINEON TECHNOLOGIES AG

Inventor： KLEIN RALF ,  KLEHN BERND ,  SCHNABEL JOACHIM

IPC: H03K19/003 ,  H03K19/0185 ,  H03K5/12

Abstract: In a scalable driver device having a plurality of driver stages whose outputs are connected to a common terminal contact for providing a common output signal, drive parameters of the driver stages, individually or in groups, are so dimensioned that the difference of the edge rise times and/or fall times of the output signal from one active driver stage to the next driver stage to be activated is substantially equal to the difference of the edge rise times and/or fall times from a next activated driver stage to the one activated after that.

公开(公告)号：DE10114777A1

公开(公告)日：2002-10-10

申请号：DE10114777

申请日：2001-03-26

Applicant: INFINEON TECHNOLOGIES AG

Inventor： BENEDIX ALEXANDER ,  BRAUN GEORG ,  KLEHN BERND

IPC: G06F9/445 ,  G06F15/177

Abstract: The method involves selecting a first configuration parameter set, configuring system components accordingly, processing a first program code, determining a first assessment of processing efficiency, selecting a second parameter set, processing a second program code, determining a second efficiency assessment, comparing the assessments, selecting the more efficient parameter set and configuring system components accordingly. The method involves providing a computer system (5) with functionally configurable components (10), selecting a first configuration parameter set (15), configuring the system components accordingly, processing a first program code (20), determining a first assessment of processing efficiency, selecting a second parameter set (30), processing a second program code (35), determining a second efficiency assessment, comparing the assessments, selecting the more efficient parameter set and configuring accordingly. Independent claims are also included for the following: a computer system and a computer program product.

公开(公告)号：DE10059745A1

公开(公告)日：2002-08-29

申请号：DE10059745

申请日：2000-12-01

Applicant: INFINEON TECHNOLOGIES AG

Inventor： KNUEPFER BERNHARD ,  KLEHN BERND

IPC: G01R1/24 ,  G01R31/28 ,  G01R31/26

Abstract: A measuring device has a needle-board circuit board carrying a large number of contact-making needles for contacting connecting areas on an IC circuit. The measuring device has lines for feeding test signals at a high clock frequency to the contact-making needles, and for carrying measured signals away from the contact-making needles. The needles have a shank part with a length L2 and a tip part 14 adjacent thereto with a length L1. For optimally transmitting signals in terms of impedance, the lines are formed as dual-transmission conductor tracks, the shank parts of the contact-making needles each contact a section of the conductor tracks, and the overall length of the contact-making needles satisfies: L1+L2

公开(公告)号：DE10043731A1

公开(公告)日：2002-03-21

申请号：DE10043731

申请日：2000-09-05

Applicant: INFINEON TECHNOLOGIES AG

Inventor： KLEHN BERND ,  LINDOLF JUERGEN

IPC: G01R31/26 ,  G01Q70/12 ,  G01R1/06 ,  G01R1/067 ,  G01R1/073 ,  H01L21/66 ,  G01R31/302

Abstract: The measuring probe has a lever arm provided with a probe point at its free end and made of a high conductivity material (14), e.g. doped crystalline silicon, covered by an extremely thin insulation layer (15), e.g. of silicon oxide, with a window (16) in the insulation layer at the apex of the probe point. The lever arm is contacted via a metal layer (17) applied over an opening in the insulation layer. Also included are Independent claims for the following: (a) a manufacturing method for a measuring probe; (b) a measuring system using a measuring probe

公开(公告)号：DE10043731C2

公开(公告)日：2003-06-26

申请号：DE10043731

申请日：2000-09-05

Applicant: INFINEON TECHNOLOGIES AG

Inventor： KLEHN BERND ,  LINDOLF JUERGEN

IPC: G01R31/26 ,  G01Q70/12 ,  G01R1/06 ,  G01R1/067 ,  G01R1/073 ,  H01L21/66 ,  G01R31/302

Abstract: The measuring probe has a lever arm provided with a probe point at its free end and made of a high conductivity material (14), e.g. doped crystalline silicon, covered by an extremely thin insulation layer (15), e.g. of silicon oxide, with a window (16) in the insulation layer at the apex of the probe point. The lever arm is contacted via a metal layer (17) applied over an opening in the insulation layer. Also included are Independent claims for the following: (a) a manufacturing method for a measuring probe; (b) a measuring system using a measuring probe

公开(公告)号：DE10135964A1

公开(公告)日：2003-02-27

申请号：DE10135964

申请日：2001-07-24

Applicant: INFINEON TECHNOLOGIES AG

Inventor： FREIMUTH FRANZ ,  MENCZIGAR ULRICH ,  KLEHN BERND

IPC: G05F1/46 ,  H03L7/06