Abstract:
The invention relates to a support (4) with solder globule elements (1), for assembly of substrates (2) with globule contacts. The invention further relates to a unit for assembly of substrates (2) with globule contacts and a method for assembly of substrates (2) with globular contacts. The support (4) comprises an adhesive layer (5) applied to one side thereof, whereby said adhesive layer (5) largely loses the adhesive force thereof on irradiation. The support (4) further comprises solder globule elements (1), tightly packed in rows (6) and columns (7) on the adhesive layer (5) at given separations (w) for a semiconductor chip or a semiconductor component.
Abstract:
A support with solder ball elements for loading substrates with ball contacts is disclosed. One embodiment provides a system for loading substrates with ball contacts and a method for loading substrates with ball contacts. The support has a layer of adhesive applied on one side, the layer of adhesive losing its adhesive force to the greatest extent when irradiated. The support has solder ball elements, which are arranged closely packed in rows and columns on the layer of adhesive in a prescribed pitch for a semiconductor chip or a semiconductor component.
Abstract:
The method involves applying a supporting and a transporting foil on an adhesive layer (1) applied on rear side of semiconductor chips (2). A protective foil is removed from an active top side (8) of the chips. The coated semiconductor chips with the adhesive layer are taken off from a non-hardened adhesive (10) of the foil under forcing a bond bridge (4) of a semiconductor wafer material along separation slots.
Abstract:
A semiconductor element comprises a semiconductor chip (2) with an integrated circuit having bond pads in a chip carrier (6) housing (5) with external connections and at least one ground connection (13). These are sheathed in an electrically isolating passivation (8) and by a grounded electrically and thermally conductive plastic housing.
Abstract:
The invention relates to a panel and a semiconductor device including a composite plate with semiconductor chips and a plastic packaging compound, and to processes for producing them. For this purpose, the panel having a composite plate has semiconductor chips arranged in rows and columns on a top side of a wiring substrate. The wiring substrate is covered by a plastic packaging compound in a plurality of semiconductor device positions, the rear sides of the semiconductor chips being fixed on the wiring substrate. A plastic packaging compound in the region of the boundary surfaces with the semiconductor chips has a coefficient of thermal expansion which is matched to that of silicon, while the remaining plastic packaging compound has a coefficient of thermal expansion which is matched to that of the wiring substrate and is therefore correspondingly higher.
Abstract:
A semiconductor stack and a semiconductor base device with a wiring substrate and an intermediate wiring board for a semiconductor device stack is disclosed. In one embodiment, a semiconductor chip is arranged between the intermediate wiring board and the wiring substrate, which is electrically connected by way of the wiring substrate on the one hand to external contacts on the underside of the wiring substrate and on the other hand to contact terminal areas in the edge regions of the wiring substrate. The intermediate wiring board has angled-away external flat conductors, which are electrically connected in the contact terminal areas of the wiring board. Furthermore, on the upper side of the intermediate wiring board, arranged on the free ends of the internal flat conductors are external contact terminal areas, which correspond in size and arrangement to external contacts of a semiconductor device to be stacked.
Abstract:
A support with solder ball elements for loading substrates with ball contacts is disclosed. One embodiment provides a system for loading substrates with ball contacts and a method for loading substrates with ball contacts. The support has a layer of adhesive applied on one side, the layer of adhesive losing its adhesive force to the greatest extent when irradiated. The support has solder ball elements, which are arranged closely packed in rows and columns on the layer of adhesive in a prescribed pitch for a semiconductor chip or a semiconductor component.
Abstract:
The method involves applying a stencil with openings to the semiconductor wafer so that the openings are aligned with contact surfaces (3) of integrated circuits. A first remelt of a first solder paste in the apertures of the stencil is performed to form columnar lands (7) on the contact surfaces. A second solder paste of lower melting point is applied to the platforms, and a second remelt is performed to form extensions (9) to the lands. The stencil is then removed.