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公开(公告)号:ITMI920344D0
公开(公告)日:1992-02-18
申请号:ITMI920344
申请日:1992-02-18
Applicant: ST MICROELECTRONICS SRL , SGS THOMSON MICROELECTRONICS
Inventor: CONTIERO CLAUDIO , GALBIATI MARIA PAOLA , ZULLINO LUCIA
IPC: H01L21/765 , H01L29/06 , H01L29/40 , H01L29/78 , H01L
Abstract: The breakdown voltage of a VDMOS transistor is markedly increased without depressing other electrical characteristics of the device by tying the potential of a field-isolation diffusion, formed under the edge portion of a strip of field oxide separating a matrix of source cells from a drain diffusion, to the source potential of the transistor. This may be achieved by extending a body region of a peripheral source cell every given number of peripheral cells facing the strip of field-isolation structure until it intersects said field-isolation diffusion. By so connecting one peripheral source cell every given number of cells, the actual decrement of the overall channel width of the integrated transistor is negligible, thus leaving unaltered the electrical characteristics of the power transistor.
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公开(公告)号:JPH0613622A
公开(公告)日:1994-01-21
申请号:JP5523593
申请日:1993-02-18
Applicant: ST MICROELECTRONICS SRL
Inventor: CONTIERO CLAUDIO , GALBIATI MARIA PAOLA , ZULLINO LUCIA
IPC: H01L21/765 , H01L29/06 , H01L29/40 , H01L29/78 , H01L29/784
Abstract: PURPOSE: To provide a VDMOS transistor(TR), capable of sharply increasing the effect of a by planar field effect plate, without lowering an electric performance characteristic. CONSTITUTION: A field separating diffusion part 5 is formed under a strip 1 of a field separating layer and electrically connected to the source region 6 of a TR. Consequently, breakdown voltage can be increased without increasing internal resistor.
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公开(公告)号:JP2744592B2
公开(公告)日:1998-04-28
申请号:JP31187094
申请日:1994-12-15
Applicant: ST MICROELECTRONICS SRL
Inventor: CONTIERO CLAUDIO , MANZINI STEFANO , CAVIONI TIZIANA
IPC: H01L21/8247 , H01L27/06 , H01L27/092 , H01L27/105 , H01L27/115 , H01L29/788 , H01L29/792
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公开(公告)号:JPH07254687A
公开(公告)日:1995-10-03
申请号:JP31187094
申请日:1994-12-15
Applicant: ST MICROELECTRONICS SRL
Inventor: CONTIERO CLAUDIO , MANZINI STEFANO , CAVIONI TIZIANA
IPC: H01L21/8247 , H01L27/06 , H01L27/092 , H01L27/105 , H01L27/115 , H01L29/788 , H01L29/792
Abstract: PURPOSE: To provide an integrated circuit structure, capable of forming a hybrid type integrated circuit having at least one EPROM without adding a special working step for the hybrid type integrated circuit regarding the integrated circuit. CONSTITUTION: An EPROM cell has an active region 18, and the region is formed by the same operation as the formation of a P-type region 17, in which an N -channel MOS transistor is housed. Likewise, each region of sources and drains is formed by the same operation as the formation of the source regions and drain regions 31 of the transistors, control electrodes 15 consisting of N - type regions are shaped by the same operation as the formation of deep regions 14 communicating each N -type embedded region, and floating gate electrodes 24 formed of one conductive material layer are formed by the same operation as the formation of the gate electrodes 23 of the transistors in an integrated circuit.
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公开(公告)号:JPS61102782A
公开(公告)日:1986-05-21
申请号:JP23854285
申请日:1985-10-23
Applicant: Sgs Thomson Microelectronics
Inventor: CONTIERO CLAUDIO
IPC: H01L29/78 , H01L21/225 , H01L21/336
CPC classification number: H01L29/66712 , H01L21/2257
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公开(公告)号:DE69410251T2
公开(公告)日:1998-10-01
申请号:DE69410251
申请日:1994-06-20
Applicant: SGS THOMSON MICROELECTRONICS
Inventor: DIAZZI CLAUDIO , MURARI BRUNO , MASTROMATTEO UBALDO , CONTIERO CLAUDIO
IPC: H01L21/76 , H01L21/822 , H01L23/31 , H01L23/58 , H01L27/04
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公开(公告)号:IT8424139D0
公开(公告)日:1984-12-20
申请号:IT2413984
申请日:1984-12-20
Applicant: SGS THOMSON MICROELECTRONICS
Inventor: CONTIERO CLAUDIO , IANNUZZI GIULIO , SANTI GIORGIO DE , ANDREANI FABRIZIO
IPC: H01L23/52 , H01L21/28 , H01L21/3205 , H01L23/532 , H01L
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公开(公告)号:IT1235843B
公开(公告)日:1992-11-03
申请号:IT8362689
申请日:1989-06-14
Applicant: SGS THOMSON MICROELECTRONICS
Inventor: CONTIERO CLAUDIO , GALBIATI PAOLA , ZULLINO LUCIA
IPC: H01L29/73 , H01L21/331 , H01L21/8234 , H01L21/8249 , H01L27/06 , H01L27/092 , H01L29/732 , H01L29/78 , H01L
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公开(公告)号:IT1213261B
公开(公告)日:1989-12-14
申请号:IT2413984
申请日:1984-12-20
Applicant: SGS THOMSON MICROELECTRONICS
Inventor: CONTIERO CLAUDIO , IANNUZZI GIULIO , SANTI GIORGIO DE , ANDREANI FABRIZIO
IPC: H01L23/52 , H01L21/28 , H01L21/3205 , H01L23/532 , H01L
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公开(公告)号:IT8424126D0
公开(公告)日:1984-12-18
申请号:IT2412684
申请日:1984-12-18
Applicant: SGS THOMSON MICROELECTRONICS
Inventor: CONTIERO CLAUDIO , GALBIATI PAOLA
IPC: H01L27/092 , H01L21/8238 , H01L27/04 , H01L27/088 , H01L29/78 , C07C
Abstract: The disclosed bridge circuit is fabricated using power MOS technology. Common terminals of the bridge circuit are integrated into common regions in the implementation. Electrodes, typically coupled together in the bridge circuit, are implemented by a shared conducting region in the integrated circuit of the semiconductor chip. By integrating the elements of the circuit, less area of the semiconductor chip is required as compared to an implementation involving 4 (four) discrete elements. Diodes are fabricated across the transistors to protect the elements against reverse biasing.
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