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公开(公告)号:JPH0613622A
公开(公告)日:1994-01-21
申请号:JP5523593
申请日:1993-02-18
Applicant: ST MICROELECTRONICS SRL
Inventor: CONTIERO CLAUDIO , GALBIATI MARIA PAOLA , ZULLINO LUCIA
IPC: H01L21/765 , H01L29/06 , H01L29/40 , H01L29/78 , H01L29/784
Abstract: PURPOSE: To provide a VDMOS transistor(TR), capable of sharply increasing the effect of a by planar field effect plate, without lowering an electric performance characteristic. CONSTITUTION: A field separating diffusion part 5 is formed under a strip 1 of a field separating layer and electrically connected to the source region 6 of a TR. Consequently, breakdown voltage can be increased without increasing internal resistor.
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公开(公告)号:JP2744592B2
公开(公告)日:1998-04-28
申请号:JP31187094
申请日:1994-12-15
Applicant: ST MICROELECTRONICS SRL
Inventor: CONTIERO CLAUDIO , MANZINI STEFANO , CAVIONI TIZIANA
IPC: H01L21/8247 , H01L27/06 , H01L27/092 , H01L27/105 , H01L27/115 , H01L29/788 , H01L29/792
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公开(公告)号:JPH07254687A
公开(公告)日:1995-10-03
申请号:JP31187094
申请日:1994-12-15
Applicant: ST MICROELECTRONICS SRL
Inventor: CONTIERO CLAUDIO , MANZINI STEFANO , CAVIONI TIZIANA
IPC: H01L21/8247 , H01L27/06 , H01L27/092 , H01L27/105 , H01L27/115 , H01L29/788 , H01L29/792
Abstract: PURPOSE: To provide an integrated circuit structure, capable of forming a hybrid type integrated circuit having at least one EPROM without adding a special working step for the hybrid type integrated circuit regarding the integrated circuit. CONSTITUTION: An EPROM cell has an active region 18, and the region is formed by the same operation as the formation of a P-type region 17, in which an N -channel MOS transistor is housed. Likewise, each region of sources and drains is formed by the same operation as the formation of the source regions and drain regions 31 of the transistors, control electrodes 15 consisting of N - type regions are shaped by the same operation as the formation of deep regions 14 communicating each N -type embedded region, and floating gate electrodes 24 formed of one conductive material layer are formed by the same operation as the formation of the gate electrodes 23 of the transistors in an integrated circuit.
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公开(公告)号:ITMI920344D0
公开(公告)日:1992-02-18
申请号:ITMI920344
申请日:1992-02-18
Applicant: ST MICROELECTRONICS SRL , SGS THOMSON MICROELECTRONICS
Inventor: CONTIERO CLAUDIO , GALBIATI MARIA PAOLA , ZULLINO LUCIA
IPC: H01L21/765 , H01L29/06 , H01L29/40 , H01L29/78 , H01L
Abstract: The breakdown voltage of a VDMOS transistor is markedly increased without depressing other electrical characteristics of the device by tying the potential of a field-isolation diffusion, formed under the edge portion of a strip of field oxide separating a matrix of source cells from a drain diffusion, to the source potential of the transistor. This may be achieved by extending a body region of a peripheral source cell every given number of peripheral cells facing the strip of field-isolation structure until it intersects said field-isolation diffusion. By so connecting one peripheral source cell every given number of cells, the actual decrement of the overall channel width of the integrated transistor is negligible, thus leaving unaltered the electrical characteristics of the power transistor.
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公开(公告)号:ITUB20161081A1
公开(公告)日:2017-08-25
申请号:ITUB20161081
申请日:2016-02-25
Applicant: ST MICROELECTRONICS SRL
IPC: H01L21/74 , H01L23/535
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公开(公告)号:DE69528961D1
公开(公告)日:2003-01-09
申请号:DE69528961
申请日:1995-03-09
Applicant: ST MICROELECTRONICS SRL
Inventor: CONTIERO CLAUDIO , GALBIATI PAOLA , PALMIERI MICHELE
IPC: H01L21/265 , H01L21/336 , H01L21/8222 , H01L21/8234 , H01L21/8247 , H01L21/8248 , H01L21/8249 , H01L27/06 , H01L27/088 , H01L27/115 , H01L29/08 , H01L29/78 , H01L29/788 , H01L29/792
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公开(公告)号:DE69415987T2
公开(公告)日:1999-06-24
申请号:DE69415987
申请日:1994-11-08
Applicant: ST MICROELECTRONICS SRL
Inventor: CONTIERO CLAUDIO , DEPETRO RICCARDO
IPC: H01L21/8234 , H01L27/088 , H01L29/06 , H01L29/417 , H01L29/423 , H01L29/78 , H01L29/41
Abstract: An integrated device presenting a structure for protection against electric fields. The protection structure is formed by a first region of conducting material (34) connected electrically to the gate/source region (6) of the device and at a first potential, and by a second region of conducting material (35) connected electrically to the drain region (15) of the device and at a second potential differing from the first. The first region of conducting material (34) is comb-shaped, and presents a first number of fingers (32) separated by a number of gaps; and the second region of conducting material (35) presents portions (33) extending at the aforementioned number of gaps and also forming a comb structure, so that the body of semiconductor material (1) of the device sees a protection region formed by a pair of interlocking comb structures and at an intermediate potential between the first and second potentials.
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公开(公告)号:DE69505348T2
公开(公告)日:1999-03-11
申请号:DE69505348
申请日:1995-02-21
Applicant: ST MICROELECTRONICS SRL
Inventor: DE PETRO RICCARDO , PALMIERI MICHELE , GALBIATI PAOLA , CONTIERO CLAUDIO
IPC: H01L21/336 , H01L29/06 , H01L29/08 , H01L29/40 , H01L29/417 , H01L29/423 , H01L29/78
Abstract: A high voltage lateral MOSFET transistor structure constituted by various interdigitated modular elements formed on a layer of monocrystaline silicon is described together with a process for its fabrication. To save area of silicon and to reduce the specific resistivity RDS on enriched drain regions (16) are formed by implanting doping material (N) in the silicon through apertures in the field oxide (11) obtained with a selective anisotropic etching by utilising as a mask the strips of polycrystaline silicon (14) which serve as gate electrodes and field electrodes.
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公开(公告)号:DE69528961T2
公开(公告)日:2003-09-04
申请号:DE69528961
申请日:1995-03-09
Applicant: ST MICROELECTRONICS SRL
Inventor: CONTIERO CLAUDIO , GALBIATI PAOLA , PALMIERI MICHELE
IPC: H01L21/265 , H01L21/336 , H01L21/8222 , H01L21/8234 , H01L21/8247 , H01L21/8248 , H01L21/8249 , H01L27/06 , H01L27/088 , H01L27/115 , H01L29/08 , H01L29/78 , H01L29/788 , H01L29/792
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公开(公告)号:DE69330564T2
公开(公告)日:2002-06-27
申请号:DE69330564
申请日:1993-12-15
Applicant: ST MICROELECTRONICS SRL
Inventor: CONTIERO CLAUDIO , MANZINI STEFANO , CAVIONI TIZIANA
IPC: H01L21/8247 , H01L27/06 , H01L27/092 , H01L27/105 , H01L27/115 , H01L29/788 , H01L29/792 , H01L27/088
Abstract: An integrated circuit structure is disclosed wherein an EPROM cell has an active area (18) formed by the same operations as are necessary to form a P region (17) intended to contain an N-channel MOS transistor, source and drain regions formed by the same operations as are necessary to form the source and drain regions (31) of said transistor, a control electrode (15) consisting of an N+ region formed by the same operations as are carried out to form deep regions (14) intended to contact buried N+ regions, and a floating gate electrode (24) consisting of a layer of conductive material formed by the same operations as are carried out to form the gate electrodes (23) of the MOS transistors in the integrated circuit. The EPROM cell can, therefore, be formed in a mixed integrated circuit with no need for purposely added processing steps.
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