中科微点-全球专利检索

  1. Login
  2. Sign Up

Search Results

542 records (took 0.017 seconds)

    Spectrometer provided with an optical shutter
    91.
    发明授权
    Spectrometer provided with an optical shutter 失效
    光谱仪配有光学快门

    公开(公告)号：US5570180A

    公开(公告)日：1996-10-29

    申请号：US518194

    申请日：1995-08-23

    Applicant: Yoshiroh Nagai

    Inventor： Yoshiroh Nagai

    IPC: G01J3/06 ,  G01J3/28 ,  G01J3/04

    CPC classification number: G01J3/02 ,  G01J3/0229 ,  G01J3/0232 ,  G01J3/0237 ,  G01J3/06 ,  G01J3/2846 ,  G01J2003/1273

    Abstract: A multi-slit type spectrometer includes a light diffracter which diffracts an incident light according to wavelengths; an optical shutter array member including a plurality of optical shutter elements arranged in correspondence with wavelength bands diffracted by the light diffracter, operable to transmit an incident ray according to an applied voltage, and made of PLZT. A zone of a given number of adjacent optical shutter elements is applied with a voltage corresponding to the wavelength bands of the rays incident upon the zone of adjacent optical shutter elements at a specified timing so that the rays respectively pass through or are reflected at the optical shutter elements. A signal processor receives the ray which has passed through or has been reflected at each optical shutter element and outputs an electrical signal according to the intensity of the received ray. A calculator calculates the intensity of the incident ray for each wavelength band in accordance with the electrical signal output from the signal processor and the specified applying timing.

    Abstract translation: 多狭缝型光谱仪包括根据波长衍射入射光的光致畸变器; 光学快门阵列部件，其包括与由光致变色器衍射的波长带对应地布置的多个光学快门元件，可操作以根据施加的电压传输入射光线，并由PLZT制成。 给定数量的相邻光学快门元件的区域以指定的时刻施加与入射在相邻光学快门元件的区域上的光线的波段相对应的电压，使得光线分别通过或者被反射在光学 快门元素 信号处理器接收已经通过或已经在每个光学快门元件反射的光线，并根据所接收的光线的强度输出电信号。 计算器根据从信号处理器输出的电信号和指定的施加定时计算每个波段的入射光线的强度。

    RAMAN MICROSCOPE
    96.
    发明公开
    RAMAN MICROSCOPE 审中-公开

    公开(公告)号：US20230194339A1

    公开(公告)日：2023-06-22

    申请号：US17994387

    申请日：2022-11-28

    Applicant: Shimadzu Corporation

    Inventor： Naoya FUJIWARA ,  Yuka MORITANI

    IPC: G01J3/02 ,  G01J3/10 ,  G01J3/44 ,  G01J3/28

    CPC classification number: G01J3/0237 ,  G01J3/108 ,  G01J3/4412 ,  G01J3/2823 ,  G01J2003/106

    Abstract: In a Raman microscope, a depth measurement processor performs depth measurement by changing a focal position of laser light along a depth direction of a sample which is an irradiation direction of the laser light with respect to the sample, and meanwhile, acquiring a Raman spectrum of the sample at a plurality of points in the depth direction. A display processor displays an input screen used to input a parameter at a time of performing the depth measurement on the sample in association with a surface image of the sample on a stage. The parameter includes a range in which the focal position of the laser light is changed along the depth direction and an interval between the plurality of points within the range.

    MULTI-SPECTRAL BORESIGHT ALIGNMENT METHODS AND SYSTEMS
    98.
    发明申请
    MULTI-SPECTRAL BORESIGHT ALIGNMENT METHODS AND SYSTEMS 审中-公开

    公开(公告)号：US20190113337A1

    公开(公告)日：2019-04-18

    申请号：US15786273

    申请日：2017-10-17

    Applicant: RAYTHEON COMPANY

    Inventor： Liam Skoyles ,  Justin Martin ,  Tyler Layne Hook ,  Benjamin P. Lane

    IPC: G01B11/27 ,  G01J3/28 ,  G01J1/02

    CPC classification number: G01B11/272 ,  G01J1/0266 ,  G01J3/0208 ,  G01J3/0229 ,  G01J3/0237 ,  G01J3/0289 ,  G01J3/2823 ,  G01J3/36

    Abstract: Aspects are generally directed to multi-sensor boresight alignment methods and systems for a multi-spectral reimaging optical system. In one example, a multi-sensor boresight alignment system includes a system interface to receive a first image frame from a first sensor and a second image frame from a second sensor, the first image frame having a contrast within a first spectral band and including a first image of a plate having a pattern of apertures, and the second image frame having a contrast within a second spectral band and including a second image of the plate. The system includes a field programmable gate array (FPGA) coupled to the system interface, the FPGA configured to spot track each image frame to identify a corresponding centroid of the pattern of apertures and correct an optical alignment between the first and second sensors based on a position of the corresponding centroids.

Patent Agency Ranking