Abstract:
An illumination device (20) for a microscope (40) has a laser unit (24) that generates at least one broadband laser light pulse (30); light components (71, 72, 73, 74, 75, 76) of different wavelengths of said broadband laser light pulse (30) being offset in time from one another. A compensation unit (36) disposed in the path of the broadband laser light pulse (30) temporally offsets the light components (71, 72, 73, 74, 75, 76) of the broadband laser light pulse (30) in such a way that they exit the compensation unit (36) simultaneously or nearly simultaneously.
Abstract:
Described herein is a photonic spectrograph for accurately measuring and displaying spectra from radiation signals received from a telescope. One embodiment provides a photonic imaging device, in the form of a spectrograph, including a plurality of input ports for receiving an arbitrary incident electromagnetic radiation field containing one or more spatial propagation modes; a coupling device attached to the multi-mode optical fibre for efficiently coupling the incident electromagnetic radiation field into an arbitrary plurality (N) of single-mode optical fibres; an optical manipulation device which selectively combines the single-mode signals into a continuous optical spectrum; and an optical detector for detecting the continuous optical spectrum.
Abstract:
A spectroscopic system is described that provides at least one of focus of an excitation beam onto a sample, automatic focus of an optical system of the spectroscopic system for collecting a spectroscopic signal, and/or averaging of excitation intensity over a surface area of the sample.
Abstract:
A terahertz spectroscopic apparatus includes a polarization beam splitter transmitting or reflecting a linearly polarized terahertz wave, a quarter wave plate imparting a phase difference of 90° to a terahertz wave impinging thereon, and an optical member guiding a circularly polarized terahertz wave impinging thereon from the polarization beam splitter via the quarter wave plate to an irradiation surface.
Abstract:
A system embodiment comprises and LED array, an optical plane, optics, a sensor and a controller. The LED array is configured to generate LED light. The optical plane has a plurality of scattering features and with a mixing chamber. The optics is configured to direct the LED light to the optical plane. The plurality of scattering features are configured to reflect a sampled portion of the LED light into the mixing chamber. The mixing chamber is configured to mix the sampled portion of the LED light. The sensor is configured to sense the sampled portion of the LED light received from the mixing chamber. The controller is connected to the sensor and configured to control the LED array using the sensed, sampled portion of the LED light received from the mixing chamber.
Abstract:
A spectral characteristic obtaining apparatus including a light irradiation unit configured to emit light onto a reading object; a spectroscopic unit configured to separate at least a part of diffused reflected light from the light emitted onto the reading object by the light irradiation unit into a spectrum; and a light receiving unit configured to receive the diffused reflected light separated into the spectrum by the spectroscopic unit and to obtain a spectral characteristic. In at least one example embodiment, the light receiving unit is configured to be a spectroscopic sensor array including plural spectroscopic sensors arranged in a direction, and the spectroscopic sensors include a predetermined number of pixels arranged in the direction to receive lights with different spectral characteristics from each other.
Abstract:
Devices and methods for hyperspectral and multispectral imaging are discussed. In particular, Image Mapping Spectrometer systems, methods of use, and methods of manufacture are presented. Generally, an image mapping spectrometer comprises an image mapping field unit, a spectral separation unit, and a selective imager. Image mapping spectrometers may be used in spectral imaging of optical samples. In some embodiments, the image mapping field unit of an image mapping spectrometer may be manufactured with surface shaped diamond tools.
Abstract:
A color separation filter (100), for a solid state image sensor includes a micro lens array (108) adapted to collect a full color spectrum light source (104), a mask layer (120) is attached to the micro lens array (108), the mask layer (120) includes plurality of openings (124), each opening is positioned in front of a single micro lens from the micro lens array. Additionally it includes a first array of prisms (204), each prism is positioned in front of each of the openings, a second array of prisms (212) is attached to the first array of prisms with an optical glue layer (208). Each prism from the first array of prisms is positioned in front of a prism from the second array of prisms to create a symmetrical optical path for the color spectrum light source (304).
Abstract:
Alignment marks 12a, 12b, 12c, and 12d are formed on the flat plane 11a of the peripheral edge portion 11 formed integrally with the diffracting layer 8, and when the lens portion 7 is mounted onto the substrate 2, these alignment marks 12a, 12b, 12c and 12d are positioned to the substrate 2, thereby making exact alignment of the diffracting layer 8 with respect to the light detecting portion 4a of the light detecting element 4, for example, not by depending on a difference in curvature radius of the lens portion 7. In particular, the alignment marks 12a, 12b, 12c and 12d are formed on the flat plane 11a, thereby image recognition is given to exactly detect positions of the alignment marks 12a, 12b, 12c and 12d, thus making it possible to make exact alignment.
Abstract:
Alignment marks 12a, 12b, 12c, and 12d are formed on the flat plane 11a of the peripheral edge portion 11 formed integrally with the diffracting layer 8, and when the lens portion 7 is mounted onto the substrate 2, these alignment marks 12a, 12b, 12c and 12d are positioned to the substrate 2, thereby making exact alignment of the diffracting layer 8 with respect to the light detecting portion 4a of the light detecting element 4, for example, not by depending on a difference in curvature radius of the lens portion 7. In particular, the alignment marks 12a, 12b, 12c and 12d are formed on the flat plane 11a, thereby image recognition is given to exactly detect positions of the alignment marks 12a, 12b, 12c and 12d, thus making it possible to make exact alignment.