SYSTEM AND METHOD FOR DETERMINING THE POSITION OF DEFECTS ON OBJECTS, COORDINATE MEASURING UNIT AND COMPUTER PROGRAM FOR COORDINATE MEASURING UNIT
    103.
    发明申请
    SYSTEM AND METHOD FOR DETERMINING THE POSITION OF DEFECTS ON OBJECTS, COORDINATE MEASURING UNIT AND COMPUTER PROGRAM FOR COORDINATE MEASURING UNIT 审中-公开
    用于确定对象,坐标测量单元的缺陷位置和坐标测量单元的计算机程序的系统和方法

    公开(公告)号:US20150226539A1

    公开(公告)日:2015-08-13

    申请号:US14691097

    申请日:2015-04-20

    Abstract: A system, a method and a coordinate measuring machine is disclosed for determining the position of defects on objects. An interface is provided so that alignment and coordinate information from the inspection device can be sent to the coordinate measuring machine. A special illumination and detection arrangement is used with a plurality of optical elements in order to obtain a signal from defects on the unpatterned object. The light source of the illumination and detection arrangement is a laser light source for providing a partially coherent light beam. A computer calculates from the data provides by the detector array and the alignment and coordinate information of the object from the inspection device a position of the defect on the object.

    Abstract translation: 公开了一种用于确定物体上缺陷位置的系统,方法和坐标测量机。 提供了一个接口,使得来自检查装置的对准和坐标信息可以发送到坐标测量机。 与多个光学元件一起使用特殊的照明和检测装置,以便获得来自未图案化物体上的缺陷的信号。 照明和检测装置的光源是用于提供部分相干光束的激光光源。 计算机根据检测器阵列提供的数据和来自检查装置的物体的对准和坐标信息来计算物体上缺陷的位置。

    DEFECT INSPECTION DEVICE AND DEFECT INSPECTION METHOD
    105.
    发明申请
    DEFECT INSPECTION DEVICE AND DEFECT INSPECTION METHOD 有权
    缺陷检查装置和缺陷检查方法

    公开(公告)号:US20150146200A1

    公开(公告)日:2015-05-28

    申请号:US14396908

    申请日:2013-04-24

    Abstract: To detect an infinitesimal defect, highly precisely measure the dimensions of the detect, a detect inspection device is configured to comprise: a irradiation unit which irradiate light in a linear region on a surface of a sample; a detection unit which detect light from the linear region; and a signal processing unit which processes a signal obtained by detecting light and detecting a defect. The detection unit includes: an optical assembly which diffuses the light from the sample in one direction and forms an image in a direction orthogonal to the one direction; and a detection assembly having an array sensor in which detection pixels are positioned two-dimensionally, which detects the light diffused in the one direction and imaged in the direction orthogonal to the one direction, adds output signals of each of the detection pixels aligned in the direction in which the light is diffused, and outputs same.

    Abstract translation: 为了检测无限小的缺陷,高度精确地测量检测器的尺寸,检测检查装置被配置为包括:照射单元,其照射样品表面上的线性区域中的光; 检测单元,其检测来自所述线性区域的光; 以及信号处理单元,其处理通过检测光而获得的信号并检测缺陷。 检测单元包括:光学组件,其在一个方向上扩散来自样品的光并在与该一个方向正交的方向上形成图像; 以及检测组件,其具有阵列传感器,其中检测像素被二维地定位,其检测沿与所述一个方向正交的方向成像的沿所述一个方向漫射的光,并将每个所述检测像素的输出信号相加, 光漫射的方向,并输出。

    Defect Inspection Apparatus and Defect Inspection Method
    107.
    发明申请
    Defect Inspection Apparatus and Defect Inspection Method 审中-公开
    缺陷检查装置和缺陷检查方法

    公开(公告)号:US20150102229A1

    公开(公告)日:2015-04-16

    申请号:US14551230

    申请日:2014-11-24

    Inventor: Kei SHIMURA

    Abstract: Method for realizing an inspection with short wavelength, high power light source and large numerical aperture, high performance optics to improve defect inspection sensitivity is disclosed. Short wavelength high power laser is realized by using a pulse oscillation type laser suitable for generation of high output power in a short-wavelength region. In addition, a spectral bandwidth of the laser is narrowed down so that amount of chromatic aberration of detection optics with single glass material (i.e. without compensation of chromatic aberration) is lowered to permissible level. Using highly workable glass material to construct the detection optics enables necessary surface accuracy or profile irregularity conditions to be met, even if the number of lenses is increased for large NA or the lens doesn't have a rotationally symmetrical aperture.

    Abstract translation: 公开了实现短波长,高功率光源和大数值孔径检测的方法,提高了高性能光学元件的缺陷检测灵敏度。 通过使用适合于在短波长区域中产生高输出功率的脉冲振荡型激光器来实现短波长大功率激光器。 此外,激光器的光谱带宽变窄,使得具有单一玻璃材料的检测光学器件(即,没有色差的补偿)的色差量降低到允许的水平。 使用高度可加工的玻璃材料来构造检测光学元件,即使对于大NA而言镜片的数量增加或透镜不具有旋转对称的孔径,也能够实现所需的表面精度或轮廓不规则条件。

    PHOTOACOUSTIC MICROSCOPE
    108.
    发明申请
    PHOTOACOUSTIC MICROSCOPE 有权
    光电显微镜

    公开(公告)号:US20150085296A1

    公开(公告)日:2015-03-26

    申请号:US14559312

    申请日:2014-12-03

    Inventor: Hisashi ODE

    Abstract: Provided is a photoacoustic microscope, including: an objective lens configured to collect excitation light into a specimen, the excitation light in a wavelength range that is absorbed by an object to be observed; a detection light optical system configured to (i) form an image of a point light source of detection light in a middle portion of a pupil of the objective lens, the detection light having a wavelength that is different from the wavelength range of the excitation light, and (ii) emit the detection light onto the specimen by means of the objective lens; an optical scanning unit configured to deflect the excitation light and the detection light that enter the objective lens, for scanning the specimen; and a light detection unit configured to detect reflected light of the detection light that is reflected by the specimen.

    Abstract translation: 本发明提供一种光声显微镜,包括:被配置为将激发光收集到样本中的物镜,所述激发光在被观察对象吸收的波长范围内; 检测光光学系统,被配置为:(i)在所述物镜的光瞳的中间部分形成检测光的点光源的图像,所述检测光的波长与所述激发光的波长范围不同 ,和(ii)通过物镜将检测光发射到样品上; 光学扫描单元,被配置为偏转激发光和进入物镜的检测光,用于扫描样本; 以及光检测单元,被配置为检测由所述检体反射的检测光的反射光。

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