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    Hyperspectral imaging systems
    121.
    发明授权
    Hyperspectral imaging systems 有权
    高光谱成像系统

    公开(公告)号：US08174694B2

    公开(公告)日：2012-05-08

    申请号：US11933253

    申请日：2007-10-31

    Applicant: Andrew Bodkin

    Inventor： Andrew Bodkin

    IPC: G01J3/28

    CPC classification number: G01J3/02 ,  G01J3/0205 ,  G01J3/0208 ,  G01J3/021 ,  G01J3/0229 ,  G01J3/0235 ,  G01J3/0294 ,  G01J3/14 ,  G01J3/2803 ,  G01J3/2823 ,  G01J3/36

    Abstract: Hyperspectral imaging system and methods that may be used for imaging objects in three-dimensions are disclosed. A cylindrical lens array and/or a slit array may be used to re-image and divide a field of view into multiple channels. The multiple channels are dispersed into multiple spectral signatures and observed on a two-dimensional focal plane array in real time. The entire hyperspectral data cube is collected simultaneously.

    Abstract translation: 公开了可以用于三维成像对象的高光谱成像系统和方法。 可以使用柱面透镜阵列和/或狭缝阵列来将视场重新图像分割成多个通道。 将多个通道分散到多个光谱特征中，并在二维焦平面阵列上实时观察。 整个高光谱数据立方体被同时收集。

    SPECTRUM MEASURING APPARATUS
    122.
    发明申请
    SPECTRUM MEASURING APPARATUS 有权
    光谱测量装置

    公开(公告)号：US20120105846A1

    公开(公告)日：2012-05-03

    申请号：US13322019

    申请日：2009-05-29

    Applicant: Ryuji Funayama ,  Shinya Kawamata ,  Yasukata Yokochi ,  Masato Endo ,  Yasuhiro Yoshida ,  Kenichi Kitahama

    Inventor： Ryuji Funayama ,  Shinya Kawamata ,  Yasukata Yokochi ,  Masato Endo ,  Yasuhiro Yoshida ,  Kenichi Kitahama

    IPC: G01J3/28

    CPC classification number: G01J3/0229 ,  G01J3/02 ,  G01J3/021 ,  G01J3/0235 ,  G01J3/0294 ,  G01J3/04 ,  G01J3/32 ,  G01J3/36

    Abstract: Disclosed is a spectrum measuring apparatus for shortening such a measurement time period for an object being measured including two or more mutually different measurement portions as is required for the spectrum measurements of the lights from individual measurement portions. The spectrum measuring apparatus comprises a slit group having two or more slits, a spectroscope for separating the lights extracted by the slit group, for the individual slits, and a measuring unit for measuring the intensities of the individual components, which are separated by the spectroscope, for the slits. The individual slits extract such ones of the lights coming from an object being measured including two or more mutually different measurement portions, as come from the individual measurement portions.

    Abstract translation: 本发明公开了一种频谱测量装置，用于根据来自各个测量部分的光的光谱测量所需的，缩短测量对象的测量时间段，包括两个或更多个相互不同的测量部分。 光谱测量装置包括具有两个或更多个狭缝的狭缝组，用于分离由狭缝组提取的光的分光镜，用于各狭缝的测量单元，以及用于测量由分光镜分离的各个部件的强度的测量单元 ，为狭缝。 各个狭缝从各个测量部分提取来自被测量物体的那些光，包括两个或更多个相互不同的测量部分。

    SPECTRUM DETECTOR
    124.
    发明申请
    SPECTRUM DETECTOR 有权
    光谱检测器

    公开(公告)号：US20120057156A1

    公开(公告)日：2012-03-08

    申请号：US13321082

    申请日：2009-08-17

    Applicant: Shiro Sakai ,  Won Chul Seo ,  Dae Won Kim

    Inventor： Shiro Sakai ,  Won Chul Seo ,  Dae Won Kim

    IPC: G01J3/18

    CPC classification number: G01J3/0235 ,  B82Y20/00 ,  G01J3/02 ,  G01J3/0205 ,  G01J3/0259 ,  G01J3/36 ,  G01J3/42 ,  G01J2003/1213

    Abstract: Provided is a spectrum detector capable of being miniaturized and which does not require complicated optical axis alignment. The spectrum detector of the present invention comprises: a substrate; a photodetector formed on the substrate and including a semiconductor having a plurality of convex portions; and a wavelength detection circuit for detecting a wavelength of light transmitted through the plurality of convex portions, from light incident on the photodetector. According to the present invention, a small-sized spectrum detector can be provided which can easily detect a peak wavelength distribution included in light of an unknown wavelength, without the use of optical equipment such as a grating or prism, thus dispensing with the need for the optical axis alignment of a complex optical system.

    Abstract translation: 提供了能够小型化并且不需要复杂的光轴对准的光谱检测器。 本发明的光谱检测器包括：基板; 形成在所述基板上并包括具有多个凸部的半导体的光电探测器; 以及波长检测电路，用于从入射到光电检测器上的光检测透过多个凸部的光的波长。 根据本发明，可以提供一种小型光谱检测器，其可以容易地检测包括在未知波长的光中的峰值波长分布，而不需要使用诸如光栅或棱镜的光学设备，从而不需要 复合光学系统的光轴对准。

    Signal processing for optical computing system
    125.
    发明授权
    Signal processing for optical computing system 有权
    光学计算系统的信号处理

    公开(公告)号：US07990538B2

    公开(公告)日：2011-08-02

    申请号：US12447595

    申请日：2007-11-01

    Applicant: Michael L. Myrick ,  Robert P. Freese ,  William Soltmann ,  David L. Perkins

    Inventor： Michael L. Myrick ,  Robert P. Freese ,  William Soltmann ,  David L. Perkins

    IPC: G01N31/12

    CPC classification number: G01J3/02 ,  G01J3/021 ,  G01J3/0229 ,  G01J3/0232 ,  G01J3/0235 ,  G01J3/0243 ,  G01J3/0286 ,  G01J3/08 ,  G01J3/28 ,  G01J3/42 ,  G01J2003/1213 ,  G01N2201/1293

    Abstract: The present subject matter relates to methods of high-speed analysis of product samples during production of the product. Light is directed to a portion of a product under analysis and reflected from or transmitted through the product toward optical detectors. Signals from the optical detectors are compared to determine characteristics of the product under analysis. Temperature within the monitoring system may be monitored in order to provide compensation for the signals produced by the optical detectors. The products under analysis may be stationary, moved by an inspection point by conveyor or other means, or may be contained within a container, the container including a window portion through which the product illuminating light may pass.

    Abstract translation: 本主题涉及产品生产过程中产品样品的高速分析方法。 光被引导到被分析产品的一部分，从产品反射或透射到光学检测器。 将来自光学检测器的信号进行比较，以确定正在分析的产品的特性。 可以监视监视系统内的温度，以便为由光学检测器产生的信号提供补偿。 被分析的产品可以是固定的，由检查点通过输送机或其他方式移动，或者可以容纳在容器内，该容器包括产品照明光通过的窗口部分。

    Multi-spectral whole-slide scanner
    127.
    发明授权
    Multi-spectral whole-slide scanner 有权
    多光谱全滑动扫描仪

    公开(公告)号：US07864379B2

    公开(公告)日：2011-01-04

    申请号：US11644564

    申请日：2006-12-23

    Applicant: Artur G. Olszak ,  Chen Liang

    Inventor： Artur G. Olszak ,  Chen Liang

    IPC: G02B6/04 ,  H04N1/04

    CPC classification number: G01J3/2803 ,  G01J3/02 ,  G01J3/0208 ,  G01J3/0235 ,  G01J3/0237 ,  G01J3/10 ,  G01J3/2823 ,  G01N21/253 ,  G01N21/31 ,  G02B21/367

    Abstract: An array microscope scans a slide in rapid sequence at different wavelengths to record multiple spectral images of the sample. Full spatial resolution of the image sensor is realized at each color because pixels are not shared between spectral bands. The object and detector are placed at conjugate distances selected to produce substantially equal magnification with minimum chromatic aberration at all wavelengths to ensure registration of all images. Spectral analysis is carried out by combining the images captured at each wavelength. The greater-than-RGB spectral resolution provided by the combination of images enables the isolation and display of the effects produced by the contemporaneous use of more than two stains on a tissue for improved pathological analysis.

    Abstract translation: 阵列显微镜以不同波长的快速序列扫描载玻片以记录样品的多个光谱图像。 由于像素不在光谱带之间共享，因此在每种颜色下实现图像传感器的全空间分辨率。 物体和检测器被放置在所选择的共轭距离处以在所有波长处产生具有最小色差的基本相等的倍率，以确保所有图像的配准。 通过组合在每个波长处拍摄的图像进行光谱分析。 由图像组合提供的大于RGB的光谱分辨率使得能够隔离和显示由组织上同时使用两种以上污渍产生的效果，以改善病理分析。

    IMPROVED SIGNAL PROCESSING FOR OPTICAL COMPUTING SYSTEM
    128.
    发明申请
    IMPROVED SIGNAL PROCESSING FOR OPTICAL COMPUTING SYSTEM 有权
    改进光学计算系统的信号处理

    公开(公告)号：US20100149537A1

    公开(公告)日：2010-06-17

    申请号：US12447595

    申请日：2007-11-01

    Applicant: Michael L. Myrick ,  Robert P. Freese ,  William Soltmann ,  David L. Perkins

    Inventor： Michael L. Myrick ,  Robert P. Freese ,  William Soltmann ,  David L. Perkins

    IPC: G01N21/55 ,  G01N21/59

    CPC classification number: G01J3/02 ,  G01J3/021 ,  G01J3/0229 ,  G01J3/0232 ,  G01J3/0235 ,  G01J3/0243 ,  G01J3/0286 ,  G01J3/08 ,  G01J3/28 ,  G01J3/42 ,  G01J2003/1213 ,  G01N2201/1293

    Abstract: The present subject matter relates to methods of high-speed analysis of product samples during production of the product. Light is directed to a portion of a product under analysis and reflected from or transmitted through the product toward optical detectors. Signals from the optical detectors are compared to determine characteristics of the product under analysis. Temperature within the monitoring system may be monitored in order to provide compensation for the signals produced by the optical detectors. The products under analysis may be stationary, moved by an inspection point by conveyor or other means, or may be contained within a container, the container including a window portion through which the product illuminating light may pass.

    Abstract translation: 本主题涉及产品生产过程中产品样品的高速分析方法。 光被引导到被分析产品的一部分，从产品反射或透射到光学检测器。 将来自光学检测器的信号进行比较，以确定正在分析的产品的特性。 可以监视监视系统内的温度，以便为由光学检测器产生的信号提供补偿。 被分析的产品可以是固定的，由检查点通过输送机或其他方式移动，或者可以容纳在容器内，该容器包括产品照明光通过的窗口部分。

    Variable wavelength radiation source
    129.
    发明授权
    Variable wavelength radiation source 失效
    可变波长辐射源

    公开(公告)号：US07485883B2

    公开(公告)日：2009-02-03

    申请号：US11483931

    申请日：2006-07-10

    Applicant: William G. Gardner, III

    Inventor： William G. Gardner, III

    IPC: G01N21/33

    CPC classification number: A01K63/06 ,  A23L3/26 ,  A23L3/28 ,  F21S10/02 ,  F21V9/30 ,  F21V9/40 ,  F21V14/006 ,  F21W2131/308 ,  F21W2131/405 ,  F21Y2103/00 ,  G01J3/02 ,  G01J3/0216 ,  G01J3/0235 ,  G01J3/0272 ,  G01J3/10 ,  G01J2003/1217 ,  G01J2003/1221

    Abstract: An apparatus for selectively producing one or more of a plurality of wavelength distributions of radiation. The apparatus comprises a primary UV radiation source and one or more wavelength transforming materials separated from the primary UV radiation source, that in response to irradiation by the primary UV radiation source, produce transformed radiation having a wavelength distribution that is different from the wavelength distribution of the primary UV radiation source. None, one, or more than one of the various WT materials can be selected by the apparatus, to allow the primary UV radiation, any individual transformed radiation, or any combination of the various radiations to be to be emitted from the apparatus.

    Abstract translation: 一种选择性地产生多个辐射波长分布中的一个或多个的装置。 该装置包括主UV辐射源和与主UV辐射源分离的一个或多个波长转换材料，响应于主UV辐射源的照射，产生具有不同于波长分布的波长分布的变换辐射 主要的紫外线辐射源。 可以通过该装置来选择不同的一种或多于一种的各种WT材料，以允许主要的UV辐射，任何单独的转换的辐射或者各种辐射的任何组合从设备中发射出来。

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