Abstract:
A transfer carrier comprising a transfer substrate, two aperture arrays, a contact pattern and a semiconductor device. The transfer substrate located on the opposed sides of the transfer substrate to define a cavity on the transfer substrate, the aperture arrays has a top surface and a bottom surface. The two aperture arrays have apertures extending from the top surface through to the bottom surface. The apertures have conductive layers formed on the inner surfaces of the apertures. The contact pattern is located with contacts lo electrically connected to the corresponding conductive layer of the apertures. The semiconductor device has pads arranged in identical pattern as the contact pattern, the semiconductor device being electrically connected to the contacts. The transfer carrier is also manufactured as an integrated circuit package. The transfer carriers and integrated circuit packages are stacked via solder connections.
Abstract:
A multilayer wiring board having a structure in which wiring layers 12A to 12D and insulating layers 11A to 11C are alternately arranged, and in which one or plural kinds of wirings selected from a group of a signal wiring 25 having a signal electrode 15, a power supply wiring 26 having a power supply electrode 16, and a ground wiring 27 having a ground electrode 17 are formed on each of the wiring layers 12A to 12D. The signal wiring 25 and the power supply wiring 26 are alternately provided on the insulating layers. Alternatively, the signal wiring 25 and the ground wiring 27 are alternately provided on the insulating layers.
Abstract:
A base layer of a bent portion of a FPC is formed on the front side thereof with second ground bent lines arranged in a mesh pattern and third ground bent lines intersecting with the second ground bent lines in a lateral direction, and on the back side thereof with first ground bent lines along the bending direction. The first ground bent lines are electrically connected to the second ground bent lines and the third ground bent lines via through holes.
Abstract:
In a transmission circuit board, ground terminal portions (10) are disposed at every other two rows in both end columns. Each of signal circuit layers (20) includes at least a pair of adjacent signal connecting portions electrically connected to a pair of the wiring portions (21, 22) arranged in parallel in a row direction and the column direction different from those on an adjacent signal circuit layer. Each of the ground layers is electrically connected to at least one of the ground terminal portions (10) in the both end columns.
Abstract:
Processes for fabricating a multi-layer circuit assembly and a multi-layer circuit assembly fabricated by such processes are provided. The process includes (a) providing a substrate at least one area of which comprises a plurality of vias, these area(s) having a via density of 500 to 10,000 holes/square inch (75 to 1550 holes/square centimeter); (b) applying a dielectric coating onto all exposed surfaces of the substrate to form a conformal coating thereon; and (c) applying a layer of metal to all surfaces of the substrate. Additional processing steps such as circuitization may be included.
Abstract:
Tuned Electromagnetic Bandgap (EBG) devices, and a method for making and tuning tuned EBG devices are provided. The method includes the steps of providing first and second overlapping substrates, placing magnetically alignable conductive material between the substrates, and applying a magnetic field in the vicinity of the magnetically alignable conductive material to align at least some of the material into conductive vias. The method further includes the steps of physically altering via characteristics of EBG devices to tune the bandpass and resonant frequencies of the EBG devices.
Abstract:
Provided are connection structures for a microelectronic device and methods for forming the structure. A substrate is included having opposing surfaces and a plurality of holes extending through the surfaces. Also included is a plurality of electrically conductive posts. Each post extends from a base to a tip located within a corresponding hole of the substrate. An additional substrate may be provided such that the base of each post is located on a surface thereof. Additional electrically conductive posts may be provided having tips in corresponding holes of the additional substrate. Optionally, a dielectric material may be placed between the substrate and the posts.
Abstract:
For electrical backplanes and the like, a power plane adaptation to improve the propagation of high-speed signals through clearances in an embedded power plane is disclosed. In exemplary embodiments, the power plane is segmented in a high-speed connector region, such that a portion of the metal layer that forms the power plane is retained in the high-speed connector region—but isolated from the power-delivery portion of the power plane. The isolated portion is connected to digital ground, and clearances are formed therein where high-speed signaling throughholes will pass through the region. In some embodiments, various attainable advantages include better manufacturability, better matching and control of high-speed signaling throughhole impedance, and improved noise isolation. Other embodiments are described and claimed.
Abstract:
In a core substrate 30, a ground through hole 36E and a power through hole 36P are disposed in the grid formation, so that electromotive force induced in X direction and Y direction cancel out each other. As a result, even if mutual inductance is reduced and a high frequency IC chip is loaded, electric characteristic and reliability can be improved without generating malfunction or error.
Abstract:
The present invention provides a package substrate which comprises a substrate defined by top and bottom surfaces and having a plurality of perforations; a resin insulation layer configured to implement a multi-level structure disposed on both surfaces of the substrate; a built-up wiring layer implementing the multi-level structure disposed on the resin insulation layer on both surfaces of the substrate; and a semiconductor chip mounting region provided on the top or the bottom surface of the substrate; wherein, a perforation exists on any straight line connecting from the center of the substrate to an arbitrary point on a periphery of the substrate.