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    SPECTRAL DETECTOR
    141.
    发明申请
    SPECTRAL DETECTOR 审中-公开
    光谱检测器

    公开(公告)号：US20110174976A1

    公开(公告)日：2011-07-21

    申请号：US13121418

    申请日：2009-09-28

    Applicant: Eduard J. Meijer ,  Johan Lub

    Inventor： Eduard J. Meijer ,  Johan Lub

    IPC: G02F1/13 ,  F21V9/14 ,  B32B38/00

    CPC classification number: G01J3/2803 ,  G01J3/02 ,  G01J3/0205 ,  G01J3/0224 ,  G01J3/0237 ,  G01J3/0259 ,  G01J3/0289 ,  G01J3/12 ,  G01J3/32 ,  G01J3/36 ,  G01J3/505 ,  G01J3/513 ,  G01J2003/1213 ,  G02B5/201 ,  G02B5/3016 ,  G02F1/13718 ,  G02F2001/13775

    Abstract: The invention relates to a method for manufacturing a spectral detector including a photo detector array and cholesteric liquid crystal material for measuring properties of light over portions of the electromagnetic spectrum. By exposing the cholesteric liquid crystal material for different exposure intensities or exposure times of ultraviolet radiation at different positions on the cholesteric liquid crystal material in a controlled way, portions of the cholesteric liquid crystal material are obtained, each having, in general, its own optical transmission. This invention also relates to a spectral detector manufactured by the inventive method.

    Abstract translation: 本发明涉及一种用于制造光谱检测器的方法，该光谱检测器包括用于测量电磁光谱部分上的光的性质的光电检测器阵列和胆甾型液晶材料。 通过以可控的方式将胆甾型液晶材料暴露于胆甾型液晶材料上的不同位置处的紫外线辐射的不同曝光强度或曝光时间，获得部分胆甾型液晶材料，其通常具有其自身的光学 传输。 本发明还涉及通过本发明方法制造的光谱检测器。

    SPECTROMETER CAPABLE OF ELIMINATING SIDE-TAIL EFFECTS
    142.
    发明申请
    SPECTROMETER CAPABLE OF ELIMINATING SIDE-TAIL EFFECTS 有权
    消除侧尾效应的光谱仪

    公开(公告)号：US20110170099A1

    公开(公告)日：2011-07-14

    申请号：US12987624

    申请日：2011-01-10

    Applicant: Cheng-Hao KO

    Inventor： Cheng-Hao KO

    IPC: G01J3/28

    CPC classification number: G01J3/02 ,  G01J3/0205 ,  G01J3/0259 ,  G01J3/0262 ,  G01J3/20

    Abstract: A spectrometer capable of eliminating side-tail effects includes a body and an input section, a diffraction grating, an image sensor unit and a wave-guiding device, which are mounted in the body. The input section receives a first optical signal and outputs a second optical signal travelling along a first light path. The diffraction grating receives the second optical signal and separates the second optical signal into a plurality of spectrum components, including a specific spectrum component travelling along a second light path. The image sensor unit receives the specific spectrum component. The wave-guiding device includes first and second reflective surfaces opposite to each other and limits the first light path and the second light path between them to guide the second optical signal and the specific spectrum component. The first and second reflective surfaces are separated from a light receiving surface of the image sensor unit by a predetermined gap.

    Abstract translation: 能够消除侧尾效应的光谱仪包括安装在本体中的主体和输入部，衍射光栅，图像传感器单元和波导装置。 输入部分接收第一光信号并输出​​沿着第一光路行进的第二光信号。 衍射光栅接收第二光信号并将第二光信号分离成多个光谱分量，包括沿第二光路行进的特定光谱分量。 图像传感器单元接收特定的光谱分量。 波导装置包括彼此相对的第一和第二反射表面，并限制它们之间的第一光路和第二光路，以引导第二光信号和特定光谱分量。 第一和第二反射表面与图像传感器单元的光接收表面以预定的间隙分开。

    SPECTROMETER
    145.
    发明申请
    SPECTROMETER 有权
    光谱仪

    公开(公告)号：US20100315634A1

    公开(公告)日：2010-12-16

    申请号：US12377358

    申请日：2008-06-09

    Applicant: Katsumi Shibayama

    Inventor： Katsumi Shibayama

    IPC: G01J3/28

    CPC classification number: G01J3/02 ,  G01J3/0208 ,  G01J3/024 ,  G01J3/0259 ,  G01J3/0262 ,  G01J3/0286 ,  G01J3/0291 ,  G01J3/18

    Abstract: In a state that the body portion 4 is regulated by inner wall planes 27, 29, 28 of the package 3 so as not to move in parallel or perpendicularly with respect to the rear plane 4b, the spectroscopic module is directly supported by the package 3, thereby when the spectrometer is downsized, the spectroscopic module 2 can be supported securely and also there is provided securely a positional accuracy between the light incident opening 22a of the package 3, the spectroscopic portion 6 of the spectroscopic module 2 and the light detecting element 7. Further, the lead 23 is buried into the package 3 to give derivation and support by the lead deriving portion 26, thereby the lead deriving portion 26 in itself of the package 3 is allowed to act as a base when wire bonding is conducted to electrically connect the lead 23 with the light detecting element 7, thus preventing breakage and deviation of the spectroscopic module 2.

    Abstract translation: 在主体部分4由包装3的内壁面27,29,28调节成不相对于后平面4b平行或垂直移动的状态下，分光模块直接由包装件3支撑 由此，当分光计尺寸缩小时，可以牢固地支撑分光模块2，并且还牢固地提供了封装3的入射开口22a，分光模块2的分光部6和光检测元件之间的位置精度 此外，引线23被埋入封装3中以由引线导出部分26导出和支撑，由此当引线接合被引导到封装3本身的引线导出部分26作为基底时 将引线23与光检测元件7电连接，从而防止分光模块2的断裂和偏离。

    Monolithic Offner spectrometer
    147.
    发明授权
    Monolithic Offner spectrometer 有权
    Monolithic Offner光谱仪

    公开(公告)号：US07697137B2

    公开(公告)日：2010-04-13

    申请号：US11729300

    申请日：2007-03-28

    Applicant: Lovell E Comstock, II

    Inventor： Lovell E Comstock, II

    IPC: G01J3/28

    CPC classification number: G01J3/18 ,  G01J3/02 ,  G01J3/0208 ,  G01J3/0259 ,  G01J3/04 ,  G01J3/2823 ,  G02B5/1852

    Abstract: A monolithic Offner spectrometer is described herein as are various components like a diffraction grating and a slit all of which are manufactured by using a state-of-the-art diamond machining process. In one embodiment, a monolithic Offner spectrometer is directly manufactured by using a diamond machining process. In another embodiment, a monolithic Offner spectrometer is manufactured by using molds which are made by a diamond machining process. In yet another embodiment, a diffraction grating is directly manufactured by using a diamond machining process. In still yet another embodiment, a diffraction grating is manufactured by using a mold which is made by a diamond machining process. In yet another embodiment, a slit is directly manufactured by using a diamond machining process.

    Abstract translation: 本文中描述了单片Offner光谱仪，其是各种部件，例如衍射光栅和狭缝，所有这些都是通过使用最先进的金刚石加工工艺制造的。 在一个实施例中，通过使用金刚石加工工艺直接制造单片Offner光谱仪。 在另一个实施例中，通过使用通过金刚石加工工艺制成的模具制造单片偏光谱仪。 在另一个实施例中，通过使用金刚石加工工艺直接制造衍射光栅。 在另一个实施例中，通过使用通过金刚石加工工艺制成的模具来制造衍射光栅。 在另一个实施例中，通过使用金刚石加工工艺直接制造狭缝。

    Spectrometer
    149.
    发明授权
    Spectrometer 有权
    光谱仪

    公开(公告)号：US07605917B2

    公开(公告)日：2009-10-20

    申请号：US11596066

    申请日：2005-07-08

    Applicant: Helmut Teichmann ,  Dietmar Hiller ,  Ulrich Starker

    Inventor： Helmut Teichmann ,  Dietmar Hiller ,  Ulrich Starker

    IPC: G01J3/18

    CPC classification number: G01J3/2803 ,  G01J3/02 ,  G01J3/0205 ,  G01J3/0259 ,  G01J3/0262 ,  G01J3/18

    Abstract: A spectrometer 1A is made up of: an optical body 10 within which a light separation path is set along which an object light to be separated propagates; a light entry slit 16 through which the object light enters; a diffraction grating 17 for spectrally separating the incident object light; and a photodiode array 18 for detecting the object light separated by the diffraction grating 17. As an optical member for optically interconnecting the optical body 10 and the photodiode array 18, an optical connection member 20 is provided, with its light entry surface 21 for the separated object light in contact with the upper surface 11 of the optical body 10, with its light exit surface 22 in contact with the photodiode array 18, with the light exit surface 22 tilted by a specified angle relative to the light entry surface 21. Thus, the spectrometer capable of bringing about sufficient accuracy of placing optical elements in a simple constitution while bringing down cost is realized.

    Abstract translation: 光谱仪1A由以下部分组成：光学体10，其中设置有光分离路径，待分离的物体沿着该光分离路径传播; 物体光进入的光入口狭缝16; 用于光谱分离入射物体光的衍射光栅17; 以及用于检测由衍射光栅17分离的物体光的光电二极管阵列18.作为用于光学互连光学体10和光电二极管阵列18的光学构件，设置有光学连接构件20，其光入射表面21用于 分离的物体光与光学体10的上表面11接触，其光出射表面22与光电二极管阵列18接触，光出射表面22相对于光入射表面21倾斜一定的角度。因此 能够实现能够以简单的结构放置光学元件的足够精度的光谱仪，同时降低成本。

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