公开(公告)号：US09335479B2

公开(公告)日：2016-05-10

申请号：US14351833

申请日：2012-10-09

Applicant: ASTRIUM LIMITED

Inventor： Stephen Sweeney ,  Yaping Zhang

IPC: G01J3/28 ,  G02B6/293 ,  G01J3/42 ,  G01J3/26 ,  G01J3/02 ,  G02B5/22

CPC classification number: G02B6/29389 ,  G01J3/0205 ,  G01J3/26 ,  G01J3/42 ,  G02B5/22 ,  G02B6/29341

Abstract: A device for detecting electromagnetic radiation comprises a waveguide and at least one resonator on a substrate, and a low-refractive index region between each resonator and the substrate. The low-refractive index region has a lower refractive index than a material of the resonator. The low-refractive index region may be annular, and may have a width corresponding to a width of a region in which electromagnetic radiation is concentrated in a whispering-gallery resonant mode. The low-refractive index region may be an air gap between the substrate and the resonator. The device may be a spectrometer for detecting a plurality of predetermined wavelengths of electromagnetic radiation.

Abstract translation: 用于检测电磁辐射的装置包括波导和基板上的至少一个谐振器，以及每个谐振器和基板之间的低折射率区域。 低折射率区域的折射率低于谐振器的材料。 低折射率区域可以是环形的，并且可以具有对应于电磁辐射集中在耳语 - 画廊谐振模式中的区域的宽度的宽度。 低折射率区域可以是衬底和谐振器之间的气隙。 该装置可以是用于检测多个预定波长的电磁辐射的光谱仪。

公开(公告)号：US09304040B2

公开(公告)日：2016-04-05

申请号：US14282067

申请日：2014-05-20

Applicant: Michael K. Yetzbacher ,  Christopher W. Miller ,  Michael J. Deprenger ,  Andrew J. Boudreau

Inventor： Michael K. Yetzbacher ,  Christopher W. Miller ,  Michael J. Deprenger ,  Andrew J. Boudreau

IPC: G01J3/26 ,  G01N21/45 ,  G01N21/41

CPC classification number: G01J3/26 ,  G01J3/021 ,  G01J3/45 ,  G01N21/41 ,  G01N21/45

Abstract: A method of optical spectroscopy and a device for use in optical spectroscopy. The device includes a substrate, and a plurality of etalon cavities affixed to or coupled to the substrate. A signal is received from a Fabry-Perot interferometer. The signal is sampled using the device according to a generalized Nyquist-Shannon sampling criterion. The signal is sampled using the device according to a phase differential criterion for wave number resolution. An input spectrum for the signal is reconstructed based on the signal sampled according to the generalized Nyquist-Shannon sampling criterion and the signal sampled according to the phase differential criterion for wave number resolution.

Abstract translation: 光谱学方法和光谱学中使用的装置。 该器件包括衬底和固定到衬底或耦合到衬底的多个标准具腔。 从法布里 - 珀罗干涉仪接收信号。 使用根据广义奈奎斯坦 - 香农采样标准的装置对信号进行采样。 根据波数分辨率的相位差准则，使用装置对信号进行采样。 基于根据广义奈奎斯特 - 香农采样标准采样的信号和根据波数分辨率的相位差标准采样的信号，重构信号的输入频谱。

公开(公告)号：US09291504B2

公开(公告)日：2016-03-22

申请号：US14702342

申请日：2015-05-01

Applicant: VERIFOOD, LTD.

Inventor： Damian Goldring ,  Dror Sharon ,  Guy Brodetzki ,  Amit Ruf ,  Menahem Kaplan ,  Sagee Rosen ,  Omer Keilaf ,  Uri Kinrot ,  Kai Engelhardt ,  Ittai Nir

IPC: G01J3/28 ,  G01J3/45 ,  G01J3/10 ,  G01J3/02 ,  G01J3/12 ,  G01J3/26 ,  G01N21/25

CPC classification number: G01J3/108 ,  G01J3/0205 ,  G01J3/0208 ,  G01J3/0229 ,  G01J3/0256 ,  G01J3/0259 ,  G01J3/0262 ,  G01J3/0264 ,  G01J3/0272 ,  G01J3/0291 ,  G01J3/10 ,  G01J3/12 ,  G01J3/26 ,  G01J3/28 ,  G01J3/2803 ,  G01J3/36 ,  G01J3/45 ,  G01J5/0265 ,  G01J5/10 ,  G01J2003/1226 ,  G01J2003/123 ,  G01J2003/1239 ,  G01N21/255 ,  G01N33/02

Abstract: A spectrometer comprises a plurality of isolated optical channels comprising a plurality of isolated optical paths. The isolated optical paths decrease cross-talk among the optical paths and allow the spectrometer to have a decreased length with increased resolution. In many embodiments, the isolated optical paths comprise isolated parallel optical paths that allow the length of the device to be decreased substantially. In many embodiments, each isolated optical path extends from a filter of a filter array, through a lens of a lens array, through a channel of a support array, to a region of a sensor array. Each region of the sensor array comprises a plurality of sensor elements in which a location of the sensor element corresponds to the wavelength of light received based on an angle of light received at the location, the focal length of the lens and the central wavelength of the filter.

Abstract translation: 光谱仪包括多个隔离光通道，其包括多个隔离光路。 孤立的光路减少光路之间的串扰，并允许光谱仪具有降低的分辨率的长度。 在许多实施例中，隔离的光路包括隔离的平行光路，其允许基本上减小器件的长度。 在许多实施例中，每个隔离的光路从滤光器阵列的滤光片延伸穿过透镜阵列的透镜，通过支撑阵列的通道延伸到传感器阵列的区域。 传感器阵列的每个区域包括多个传感器元件，其中传感器元件的位置基于在该位置处接收的光的角度接收的光的波长，透镜的焦距和透镜的中心波长 过滤。

公开(公告)号：US09270898B2

公开(公告)日：2016-02-23

申请号：US14206198

申请日：2014-03-12

Applicant: Seiko Epson Corporation

Inventor： Tatsuaki Funamoto

IPC: H04N5/243 ,  H04N5/217 ,  G01J3/26 ,  G01J3/28

CPC classification number: H04N5/243 ,  G01J3/26 ,  G01J3/28 ,  G01J3/2823 ,  H04N5/2176

Abstract: A spectroscopic analysis apparatus includes a light source section that radiates light toward an object being imaged, an imaging section that captures light reflected off the object being imaged to acquire an image, a pixel detector that detects an abnormal pixel in the image which is a pixel where a reflectance ratio is greater than or equal to 1 and detects normal pixels in the image each of which is a pixel where the reflectance ratio is smaller than 1, and a light amount corrector that calculates a light amount correction value based on the amounts of light at normal pixels in a pixel area including the abnormal pixel in the image and replaces the amount of light at the abnormal pixel with the light amount correction value.

Abstract translation: 一种光谱分析装置，包括将光朝向成像对象照射的光源部，拍摄被摄体的物体反射以获取图像的摄像部，检测作为像素的图像中的异常像素的像素检测部 其中反射率比大于或等于1并且检测图像中的每个都是反射率小于1的像素的正常像素;以及光量校正器，其基于所述光量校正值 在包括图像中的异常像素的像素区域中的正常像素处的光，并用光量校正值替换异常像素处的光量。

公开(公告)号：US09229219B2

公开(公告)日：2016-01-05

申请号：US14325923

申请日：2014-07-08

Applicant: Seiko Epson Corporation

Inventor： Tomonori Matsushita ,  Tatsuo Urushidani

IPC: G01B9/02 ,  G02B26/00 ,  G01J3/26

CPC classification number: G02B26/001 ,  G01J3/26

Abstract: An Etalon filter includes a first substrate, a second substrate which faces the first substrate, a first optical film which is provided on the first substrate, and a second optical film which is provided on the second substrate to face the first optical film. The reflective characteristic of the first optical film determined by the reflectance of light of each wavelength in a reflective band is different from the reflective characteristic of the second optical film determined by the reflectance of light of each wavelength in the reflective band. The first optical film can have a reflective characteristic with a first wavelength λ1 as a center wavelength, and the second optical film can have a reflective characteristic with a second wavelength λ2 different from the first wavelength as a center wavelength.

Abstract translation: Etalon滤光器包括第一基板，面向第一基板的第二基板，设置在第一基板上的第一光学膜和设置在第二基板上以面对第一光学膜的第二光学膜。 由反射带中的每个波长的光的反射率确定的第一光学膜的反射特性与由反射带中的每个波长的光的反射率确定的第二光学膜的反射特性不同。 第一光学膜可以具有第一波长λ1作为中心波长的反射特性，并且第二光学膜可以具有不同于第一波长的第二波长λ2作为中心波长的反射特性。

公开(公告)号：US20150346479A1

公开(公告)日：2015-12-03

申请号：US14721175

申请日：2015-05-26

Applicant: Seiko Epson Corporation

Inventor： Nozomu HIROKUBO

IPC: G02B26/00 ,  G01J3/26 ,  B81B5/00 ,  B81B7/00 ,  B81B7/02

CPC classification number: G02B26/001 ,  B81B3/0056 ,  G01J3/26

Abstract: A spectroscopic measurement apparatus includes a fixed substrate, a movable substrate, and a wavelength variable interference filter which includes an electrostatic actuator for changing the gap dimension between the substrates, a vibration disturbance detection unit which detects vibration added to the wavelength variable interference filter, and a bias driving unit which applies a feed-forward voltage based on a detected value of the vibration disturbance detection unit to the electrostatic actuator.

Abstract translation: 光谱测量装置包括：固定基板，可移动基板和波长可变干涉滤光器，其包括用于改变基板之间的间隙尺寸的静电致动器;振动扰动检测单元，其检测添加到波长可变干涉滤光器的振动;以及 偏置驱动单元，其将基于振动扰动检测单元的检测值的前馈电压施加到静电致动器。

公开(公告)号：US09182279B2

公开(公告)日：2015-11-10

申请号：US14580925

申请日：2014-12-23

Applicant: Seiko Epson Corporation

Inventor： Danjun Zhao ,  Tetsuo Tatsuda ,  Shinichi Arazaki

IPC: G01J3/28 ,  G01J3/02 ,  G01J3/26

CPC classification number: G01J3/027 ,  G01J3/0205 ,  G01J3/26 ,  G01J3/2803 ,  G01J3/2823 ,  G01J3/32 ,  G01J2003/2826

Abstract: An optical module includes a wavelength variable interference filter that selects light of a predetermined wavelength from incident light, and can change the wavelength of emitted light; a global shutter imaging element that accumulates electric charges while being exposed to the emitted light, and outputs a detection signal in response to the accumulated electric charges; an imaging element controller for setting a photodetection period during which the electric charges are accumulated in the imaging element, and a standby period during which the electric charges accumulated in the imaging elements are reset; and a spectroscopic controller for controlling the wavelength change driving of the emitted light. The imaging element controller sets the duration of the standby period to a minimum drive time for changing the wavelength or greater. The spectroscopic controller starts the wavelength change driving at the start of the standby period.

Abstract translation: 光学模块包括从入射光中选择预定波长的光的波长可变干涉滤光器，并且可以改变发射光的波长; 全局快门成像元件，其在暴露于发光的同时累积电荷，并且响应于所累积的电荷输出检测信号; 成像元件控制器，用于设置成像元件中电荷积聚的光电检测周期;以及复位在成像元件中累积的电荷的待机期间; 以及用于控制发射光的波长变化驱动的光谱控制器。 成像元件控制器将待机时段的持续时间设置为用于改变波长或更大的最小驱动时间。 分光控制器在待机时段开始时开始波长变化驱动。

公开(公告)号：US09140643B2

公开(公告)日：2015-09-22

申请号：US13444116

申请日：2012-04-11

Applicant: Jerome Anthony Bellian ,  Christopher Michael Tolleson

Inventor： Jerome Anthony Bellian ,  Christopher Michael Tolleson

IPC: G01J3/28 ,  G01N21/27 ,  G01N21/55 ,  G01J3/26 ,  G01S17/89 ,  G01S7/48 ,  G01V8/02 ,  G01J3/02 ,  G01N21/31

CPC classification number: G01N21/27 ,  G01J3/027 ,  G01J3/26 ,  G01N21/314 ,  G01N21/55 ,  G01S7/4802 ,  G01S17/89 ,  G01V8/02

Abstract: A system for remotely sensing a target material in situ include a broad-band laser source, at least one tunable filter coupled to the source laser for generating a swept-frequency signal an optical device for splitting the swept-frequency signal into a first illumination signal and second illumination signal, a first optical path for directing the first illumination signal unto the target material and receiving a reflected signal from the target material, a second optical path for receiving the second illumination signal and generating a spectral reference signal, and a controller coupled to the first optical path and the second optical path for adjusting the frequency and spatial resolution of the laser source based at least in part on a comparison of the spectral reference signal and the reflected signal.

Abstract translation: 用于原位遥感目标材料的系统包括宽带激光源，耦合到源激光器的至少一个可调谐滤波器，用于产生扫频频率信号，用于将扫频频率信号分成第一照明信号 和第二照明信号，用于将第一照明信号引导到目标材料并从目标材料接收反射信号的第一光路，用于接收第二照明信号并产生频谱参考信号的第二光路，以及控制器 至少部分地基于频谱参考信号和反射信号的比较来调整激光源的频率和空间分辨率的第一光路和第二光路。

公开(公告)号：US09128279B2

公开(公告)日：2015-09-08

申请号：US13216509

申请日：2011-08-24

Applicant: Akira Sano

Inventor： Akira Sano

IPC: G01N21/25 ,  G01B9/02 ,  G02B26/00 ,  G01J3/26 ,  G01J3/46 ,  G01J3/50

CPC classification number: G02B26/001 ,  G01J3/26 ,  G01J3/46 ,  G01J3/50

Abstract: A wavelength-tunable interference filter comprising a first substrate, a second substrate facing the first substrate, a first reflective film provided on the first substrate, a second reflective film provided on the second substrate, the second reflective film facing the first reflective film, a first electrode provided on the first substrate, and a second electrode provided on the second substrate, the second electrode facing the first electrode, wherein the first electrode includes a first electrode layer and a second electrode layer, the first electrode layer has a first in-plane internal stress which is compressive, and the second electrode layer has a second in-plane internal stress which is tensile.

Abstract translation: 一种波长可调干涉滤光器，包括第一基板，面向第一基板的第二基板，设置在第一基板上的第一反射膜，设置在第二基板上的第二反射膜，与第一反射膜相对的第二反射膜， 设置在第一基板上的第一电极和设置在第二基板上的第二电极，第二电极面对第一电极，其中第一电极包括第一电极层和第二电极层，第一电极层具有第一电极层， 平面内部应力是压缩的，并且第二电极层具有作为拉伸的第二面内内应力。

公开(公告)号：US09109434B2

公开(公告)日：2015-08-18

申请号：US13913462

申请日：2013-06-09

Applicant: Schlumberger Technology Corporation

Inventor： Kentaro Indo ,  Kai Hsu ,  Julian Pop

IPC: G01J3/26 ,  E21B47/10 ,  E21B49/08 ,  G01N21/31

CPC classification number: E21B47/102 ,  E21B49/088 ,  E21B49/10 ,  G01N21/274 ,  G01N21/31 ,  G01N21/85 ,  G01V8/10

Abstract: A system includes a downhole formation fluid sampling tool and a processor. An optical spectrometer of the downhole formation fluid sampling tool is able to measure an optical characteristic of a formation fluid flowing through the downhole formation fluid sampling tool over a plurality of wavelengths. The optical spectrometer generates optical spectra data indicative of this optical characteristic. The processor is designed to receive the optical spectra data generated by the optical spectrometer and to estimate a formation volume factor of the formation fluid based on the optical spectra data.

Abstract translation: 一种系统包括井下地层流体采样工具和处理器。 井下地层流体采样工具的光谱仪能够测量在多个波长上流过井下地层流体取样工具的地层流体的光学特性。 光谱仪产生表示该光学特性的光谱数据。 处理器被设计成接收由光谱仪产生的光谱数据，并且基于光谱数据来估计地层流体的地层容积因子。